JPS6241663U - - Google Patents

Info

Publication number
JPS6241663U
JPS6241663U JP13284985U JP13284985U JPS6241663U JP S6241663 U JPS6241663 U JP S6241663U JP 13284985 U JP13284985 U JP 13284985U JP 13284985 U JP13284985 U JP 13284985U JP S6241663 U JPS6241663 U JP S6241663U
Authority
JP
Japan
Prior art keywords
electron beam
ionization
sample
sample introduction
inlet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13284985U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13284985U priority Critical patent/JPS6241663U/ja
Publication of JPS6241663U publication Critical patent/JPS6241663U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Electron Tubes For Measurement (AREA)
JP13284985U 1985-08-30 1985-08-30 Pending JPS6241663U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13284985U JPS6241663U (enrdf_load_stackoverflow) 1985-08-30 1985-08-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13284985U JPS6241663U (enrdf_load_stackoverflow) 1985-08-30 1985-08-30

Publications (1)

Publication Number Publication Date
JPS6241663U true JPS6241663U (enrdf_load_stackoverflow) 1987-03-12

Family

ID=31032614

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13284985U Pending JPS6241663U (enrdf_load_stackoverflow) 1985-08-30 1985-08-30

Country Status (1)

Country Link
JP (1) JPS6241663U (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000057989A (ja) * 1998-06-18 2000-02-25 Micromass Ltd 質量分析計及び質量分析方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000057989A (ja) * 1998-06-18 2000-02-25 Micromass Ltd 質量分析計及び質量分析方法

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