JPS6241224Y2 - - Google Patents
Info
- Publication number
- JPS6241224Y2 JPS6241224Y2 JP12124579U JP12124579U JPS6241224Y2 JP S6241224 Y2 JPS6241224 Y2 JP S6241224Y2 JP 12124579 U JP12124579 U JP 12124579U JP 12124579 U JP12124579 U JP 12124579U JP S6241224 Y2 JPS6241224 Y2 JP S6241224Y2
- Authority
- JP
- Japan
- Prior art keywords
- light
- sample
- window
- shade
- photodetector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000000523 sample Substances 0.000 claims description 26
- 238000005259 measurement Methods 0.000 claims description 17
- 239000013074 reference sample Substances 0.000 claims description 13
- 238000001514 detection method Methods 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 238000000149 argon plasma sintering Methods 0.000 description 2
- 230000001788 irregular Effects 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Landscapes
- Spectrometry And Color Measurement (AREA)
Description
【考案の詳細な説明】
本考案は光散乱性の試料の分析に適した分光光
度計に関する。[Detailed Description of the Invention] The present invention relates to a spectrophotometer suitable for analyzing light-scattering samples.
2光束分光光度計は光源の変動等が補償できる
ので分析精度が良好である。試料が混濁していた
り不規則な形で光が種々な方向に屈折されるもの
であつたり、粗表面を有するものであつたりする
と試料透過光が種々な方向に広がるので、それら
の光を全部有効に光検出器に入射させて検出感度
を高めるためには受光面が広いエンドオン型光検
出器を用いるのがよい。しかしこの場合でも試料
をなるべく光検出器に近づけないと、試料を出た
光を全部光検出器に入射させることはできない。 A two-beam spectrophotometer has good analysis accuracy because it can compensate for variations in the light source. If the sample is turbid, has an irregular shape that refracts light in various directions, or has a rough surface, the light transmitted through the sample will spread in various directions, so it is necessary to In order to effectively make the light incident on the photodetector and increase the detection sensitivity, it is preferable to use an end-on type photodetector with a wide light-receiving surface. However, even in this case, unless the sample is brought as close to the photodetector as possible, all the light emitted from the sample cannot be made to enter the photodetector.
上述したような試料に対して2光束分光光度計
を構成したものとして第1図に示すようなものが
ある。これは測定試料Sと参照試料Rとに対しエ
ンドオン型光検出器P1,P2を対応させ、各試
料を対応検出器の受光面に近接させたもので、図
外右方で二光束に分割された光が夫々R,Sに入
射する。この構成では参照試料Rにより光源の変
動、光学系の変動は補償されるが2つの光検出器
P1,P2は特性が正確に一致せず、感度の経時
変化も同一ではないから、2つの光検出器を用い
ることによつて測定出力にドリフトが生ずる。こ
の難点は第2図に示す構成の提案によつて解消さ
れるが第2図の構成は一つのエンドオン型光検出
器Pに対し2分割された2光束を互に異なる方向
から入射させ、夫々の入射光路内に参照試料Rと
測定試料Sを設置するようになつており、2つの
試料R,Sは互に当接しないようにする必要から
光検出器Pから離さざるを得ず、試料Sにより散
乱された光を全部光検出器Pに入射させると云う
ことはできない。試料SをPになるべく近づける
ためにはSの寸法が小さいことが必要であり、従
つて任意な形状の試料を扱うことができない。 A two-beam spectrophotometer constructed for the above-mentioned sample is shown in FIG. 1. In this system, end-on type photodetectors P1 and P2 are made to correspond to the measurement sample S and the reference sample R, and each sample is placed close to the light receiving surface of the corresponding detector. The light beams enter R and S, respectively. In this configuration, fluctuations in the light source and optical system are compensated for by the reference sample R, but the characteristics of the two photodetectors P1 and P2 do not exactly match, and the changes in sensitivity over time are not the same, so the two light The use of a detector causes a drift in the measurement output. This difficulty can be solved by proposing the configuration shown in FIG. 2, but the configuration shown in FIG. The reference sample R and measurement sample S are placed in the incident optical path of the photodetector. It cannot be said that all the light scattered by S is incident on the photodetector P. In order to bring the sample S as close to P as possible, the size of S needs to be small, and therefore samples of arbitrary shapes cannot be handled.
本考案は上述した2つの型の2光束分光光度計
の問題点を解消しようとするもので、エンドオン
型光検出器の受光面に凹面を向けて半球状凹面反
射笠を対向させ、この反射笠の頂点付近に窓を穿
つてそこに測定試料Sを配置し得るようにし、同
笠の側面の一個所に比較的小なる窓を設けてそこ
から参照試料を透過した光束を反射笠内に導入す
るようにした2光束分光光度計を提供するもので
ある。以下実施例によつて本考案を説明する。 The present invention is an attempt to solve the problems of the two types of two-beam spectrophotometers mentioned above, and consists of a hemispherical concave reflecting shade facing the light-receiving surface of the end-on type photodetector, and A window is made near the apex of the shade so that the measurement sample S can be placed there, and a relatively small window is provided on one side of the shade to introduce the light beam that has passed through the reference sample into the reflecting shade. A two-beam spectrophotometer is provided. The present invention will be explained below with reference to Examples.
第3図は本考案の一実施例装置の要部を示す。
図でMは分光器で、分光器出射光は透光部と反射
部とが円周方向に交互に並んだ回転鏡Smによつ
て交互に二方向に分割され、分割された2光束は
ミラーm1,m2,m3によつて一方の光束が参
照試料Rに、他方の光束が測定試料Sに入射せし
められるようになつている。Pはエンドオン型光
検出器で右端部の2が受光面である。1は半球状
の凹面反射笠で内面が鏡面になつており、その面
を受光面2に向けて光検出器Pに近接して配置さ
れている。反射笠1の頂点付近には窓Wが穿つて
ありこの窓に接して測定試料Sが設置される。測
定試料Sは試料セルに入れられたものである場合
もあるが被検体から任意に切取つた固体塊の場合
もあり形状は一定しない。形状の一定しない試料
を扱い得ることは本考案の目的の一つである。反
射笠1の側方に小さな窓hが穿つてあり、参照試
料Rを通過した光束がミラーmで反射されてその
小窓hを通して反射笠1内に入射するようになつ
ている。参照試料は光源及び分光器光束分割装置
等の経時変化のモニタが主たる目的であるから測
定試料と同じように光散乱性である必要はなく、
任意の特定物質で適当な大きさのものを用意すれ
ばよい。 FIG. 3 shows the main parts of an apparatus according to an embodiment of the present invention.
In the figure, M is a spectroscope, and the spectrometer output light is divided into two directions alternately by a rotating mirror Sm in which transparent parts and reflection parts are arranged alternately in the circumferential direction, and the two divided beams are mirrored. By m1, m2, and m3, one of the light beams is made to enter the reference sample R, and the other light beam is made to enter the measurement sample S. P is an end-on type photodetector, and 2 at the right end is a light receiving surface. Reference numeral 1 denotes a hemispherical concave reflective shade whose inner surface is a mirror surface, and is placed close to the photodetector P with its surface facing the light receiving surface 2. A window W is bored near the top of the reflective shade 1, and a measurement sample S is placed in contact with this window. The measurement sample S may be placed in a sample cell, or it may be a solid lump arbitrarily cut from the subject, and its shape is not constant. One of the purposes of the present invention is to be able to handle samples with irregular shapes. A small window h is bored on the side of the reflective shade 1, and the light beam passing through the reference sample R is reflected by a mirror m and enters the reflective shade 1 through the small window h. Since the main purpose of the reference sample is to monitor changes over time in the light source, spectrometer beam splitter, etc., it does not need to be light scattering like the measurement sample.
It is sufficient to prepare an appropriate size of any specific material.
以上の構成で測定試料Sに入射した光は同試料
から出るときは相当に散乱されているが側方に散
乱された光でも反射笠1の内面に入射するため反
射され結局は受光面2に入射することになる。従
つて試料Sは受光面2から離れていても実質的に
は受光面に接しているのと同じである。小窓hか
ら入射した参照試料透過光も反射笠1内面で反射
され結局は受光面2に入射する。光検出器Pの出
力は回転鏡Smによる光束の分割と同期して参照
試料側の光の検出信号と測定試料側の光検出信号
とに切換わつているので、図外の周知の測定回路
でこれら両信号を回転鏡による光束分割と同期し
て分離する。 With the above configuration, the light incident on the measurement sample S is scattered considerably when it leaves the sample, but even the light scattered to the side enters the inner surface of the reflective shade 1 and is reflected, eventually reaching the light receiving surface 2. It will be incident. Therefore, even if the sample S is away from the light-receiving surface 2, it is essentially the same as being in contact with the light-receiving surface. The reference sample transmitted light incident through the small window h is also reflected by the inner surface of the reflective shade 1 and eventually enters the light receiving surface 2. The output of the photodetector P is switched into a light detection signal on the reference sample side and a light detection signal on the measurement sample side in synchronization with the division of the light flux by the rotating mirror Sm. These two signals are separated in synchronization with the beam splitting by the rotating mirror.
本考案2光束分光光度計は上述したような構成
で、測定試料は光検出器の受光面から離れていて
も反射笠により全部の散乱光が結局は光検出器の
受光面に入るから感度が良く、参照試料を通つた
光束も反射笠の作用により測定試料を照射する光
束とは離れた方向から反射笠に入射させられるの
で測定試料と参照試料とは任意に遠く設置できる
のであり、相互干渉がないから測定試料として任
意の大きさ、形状のものを分析することができ
る。従つて第4図に示すような大型のレンズ状の
試料でも窓Wの所に置くことができ、更に測定試
料の大きさ、形状の制約が少ない所から第5図に
示すように多数の測定試料をスライド可能に並べ
ておいて順次分析を行うというようなことも可能
となる。第4図、第5図は第3図の装置の他の用
例を示すものなので、光束分割部についての記載
は省略する。 The two-beam spectrophotometer of the present invention has the above-mentioned configuration, and even if the measurement sample is far from the light-receiving surface of the photodetector, all the scattered light eventually enters the light-receiving surface of the photodetector due to the reflective shade, resulting in improved sensitivity. In general, the light beam passing through the reference sample is also incident on the reflector shade from a direction different from the light beam that illuminates the measurement sample due to the effect of the reflector shade, so the measurement sample and the reference sample can be placed arbitrarily far apart, preventing mutual interference. Since there is no such thing, it is possible to analyze samples of any size and shape. Therefore, even a large lens-shaped sample as shown in Fig. 4 can be placed in the window W, and since there are few restrictions on the size and shape of the measurement sample, a large number of measurements can be made as shown in Fig. 5. It is also possible to arrange samples so that they can slide and perform analysis one after another. Since FIGS. 4 and 5 show other examples of the use of the device shown in FIG. 3, the description of the beam splitting section will be omitted.
第1図及び第2図は夫々異なる従来例の平面略
図、第3図は本考案の一実施例装置の要部平面
図、第4、第5図は上記実施例の用法を示す要部
平面図である。
P…光検出器、1…反射笠、2…受光面、S…
測定試料、R…参照試料、W…窓、h…小窓。
1 and 2 are schematic plan views of different conventional examples, FIG. 3 is a plan view of the main part of an embodiment of the device of the present invention, and FIGS. 4 and 5 are plan views of the main part showing the usage of the above embodiment. It is a diagram. P...photodetector, 1...reflection shade, 2...light receiving surface, S...
Measurement sample, R...Reference sample, W...Window, h...Small window.
Claims (1)
半球状凹面反射笠を設け、同反射笠の頂点付近に
窓を穿つて同窓に接して測定試料を配置できるよ
うにし、上記反射笠の側面に小窓を穿つて参照試
料を透過した光束を上記反射笠内に導入するよう
にした2光束分光光度計。 A hemispherical concave reflecting shade is provided with the concave surface facing the light-receiving surface of the end-on type photodetector, a window is bored near the apex of the reflecting shade so that the measurement sample can be placed in contact with the window, and a window is made on the side of the reflecting shade. A two-beam spectrophotometer in which a small window is bored to introduce the light beam that has passed through the reference sample into the reflective shade.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12124579U JPS6241224Y2 (en) | 1979-08-31 | 1979-08-31 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12124579U JPS6241224Y2 (en) | 1979-08-31 | 1979-08-31 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5638832U JPS5638832U (en) | 1981-04-11 |
JPS6241224Y2 true JPS6241224Y2 (en) | 1987-10-22 |
Family
ID=29353399
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12124579U Expired JPS6241224Y2 (en) | 1979-08-31 | 1979-08-31 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6241224Y2 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5880770U (en) * | 1981-10-29 | 1983-06-01 | 本田技研工業株式会社 | Waterproof structure of cooling air intake and exhaust ports for forced air-cooled generators |
JPS58133034A (en) * | 1982-02-03 | 1983-08-08 | Hitachi Ltd | Digital-analog conversion circuit |
JPS60134329U (en) * | 1984-02-17 | 1985-09-06 | パイオニア株式会社 | aperture circuit |
-
1979
- 1979-08-31 JP JP12124579U patent/JPS6241224Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS5638832U (en) | 1981-04-11 |
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