JPS6239016A - Developing device - Google Patents

Developing device

Info

Publication number
JPS6239016A
JPS6239016A JP17849485A JP17849485A JPS6239016A JP S6239016 A JPS6239016 A JP S6239016A JP 17849485 A JP17849485 A JP 17849485A JP 17849485 A JP17849485 A JP 17849485A JP S6239016 A JPS6239016 A JP S6239016A
Authority
JP
Japan
Prior art keywords
processing liquid
sample
developer
supply section
developing solution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17849485A
Other languages
Japanese (ja)
Inventor
Akihiro Endo
章宏 遠藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Priority to JP17849485A priority Critical patent/JPS6239016A/en
Publication of JPS6239016A publication Critical patent/JPS6239016A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To contact a treatment solution of uniform temperature to the material to be developed by a method wherein the treatment solution flowed in from the bottom side of a longitudinally slender aperture runs on the flow passage of the desired length and it overflows, thereby enabling to give a high circulating property on the processing surface of a sample. CONSTITUTION:The developing solution, which is controlled at the prescribed temperature by a temperature regulating unit 2, passes a flow-in duct 4 from a developing solution reservoir 1 by the circulating function of a pump 3, it flows in the bottom part of a developing solution feeding part 7, passes through a filter 8, and it overflows from an aperture part 10. The developing solution is received by an overflow vessel 9, passes through a flow-out duct 5 connected to the bottom part of the vessel 9, and it is circulated to and withdrawn by the developing solution reservoir 1 as shown by the arrow in the diagram. The surface to be treated of the sample 11 is brought sufficiently to come in contact with the developing solution overflowed from the aperture part of the developing solution feeding part 7, and a sample supporting and driving part 12 is reciprocatingly moved horizontally in the direction crossing the long side of the aperture 10. As a result, the temperature and the concentration of the treatment solution on the surface of treatment of the sample can be made uniform.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、IC製造工程の微細パターン形成において使
用する現像装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a developing device used in forming fine patterns in an IC manufacturing process.

〔従来の技術〕[Conventional technology]

ホトリソグラフィ工程においては、露光した試料を現像
装置中に現像処理を施す事により現像パターンを形成す
る。また、現像処理後の現像液残渣等を除去する為、リ
ンス処理も引き続いて行われる。このパターンの解像度
(品位)は、現像処理により最終的に決定される。従っ
て、特に微細パターンを形成する場合は、解像度を十分
維持する必要上、現像処理条件の管理が重要となってく
る。現像パターンの解像度を管理維持する為の主な現像
処理条件としては、現像液の温度、濃度、さらに経時変
化等がある。この為、従来現像装置では、現像液温度を
均一化する為の手段と共に、新たな液を試料表面へ供給
する為の手段がいろいろ講じられてきたが、現在の所必
ずしも十分なものは得られていない。
In the photolithography process, a developed pattern is formed by subjecting an exposed sample to development processing in a developing device. Further, in order to remove developer residue after the development process, a rinsing process is also performed subsequently. The resolution (quality) of this pattern is ultimately determined by the development process. Therefore, especially when forming fine patterns, it is important to manage the development processing conditions in order to maintain sufficient resolution. The main development processing conditions for managing and maintaining the resolution of the developed pattern include the temperature and concentration of the developer, and changes over time. For this reason, in conventional developing devices, various measures have been taken to equalize the temperature of the developer and to supply new liquid to the sample surface, but at present they are not necessarily sufficient. Not yet.

以下、図に基いて、従来の現像装置について説朗する。Hereinafter, a conventional developing device will be explained based on the drawings.

第4図は第1の従来例を示しディップ式により現像処理
を施すもので、装置構成も比較的簡易で、この種の現像
装置としては最も一般的なものである。同図において、
1は現像液容器内槽、2は現像液である。現像液容器外
槽3の側面部には加熱手段5が配設され、これにより現
像液温度制御用の液体4が加熱制御される。また、この
現像液温度制御用の液体4を介して、上記現像液2が所
定温度に制御される。さらに、現像液容器内槽1は支持
手段6により、現像液容器外槽3内に支持されている。
FIG. 4 shows a first conventional example, in which development is carried out by a dip type, and the device configuration is relatively simple and is the most common developing device of this type. In the same figure,
1 is an inner tank of a developer container, and 2 is a developer. A heating means 5 is disposed on the side surface of the outer tank 3 of the developer container, and the heating means 5 controls the heating of the liquid 4 for controlling the temperature of the developer. Further, the developer 2 is controlled to a predetermined temperature via the developer temperature control liquid 4. Further, the developer container inner tank 1 is supported within the developer container outer tank 3 by support means 6 .

そして、試料7を、矢印の方向から現像液2中に浸漬す
る事により、現像処理を施す。
Then, the sample 7 is immersed in the developer 2 from the direction of the arrow to perform a development process.

しかしながら、この第1の従来例のような簡易構成によ
る装置では、現像液2の温度分布が太きくなる。また、
試料7の現像面近傍には、現像反応で劣化した現像液2
が残留する為、現像速度が低下し、現像面での均一な現
像処理を施す事は難しい。これを改善する為に攪拌手段
等により現像液2を対流させ、現像面に絶えず均一に現
像液2を供給させる方法も考えられるが、理想的熱対流
を発生させる事の困難性から、上述した現像液温度の均
一化の問題音も併わせて同時に解消する事Vi難しい。
However, in an apparatus having a simple configuration such as the first conventional example, the temperature distribution of the developer 2 becomes wide. Also,
Near the developing surface of sample 7, there is developer 2 that has deteriorated due to the development reaction.
remains, the development speed decreases and it is difficult to perform uniform development on the development surface. In order to improve this, it is possible to convect the developer 2 using a stirring means or the like to continuously and uniformly supply the developer 2 to the developing surface, but due to the difficulty of generating ideal thermal convection, it is difficult to use the method described above. It is difficult to solve the problem of uniformity of developer temperature and noise at the same time.

また、第5図は第2の実施例を示し、オーバーフロー方
式によね現像処理を施すものである。同図において、1
は現像液槽で、その底部側に設けられた送液管3から、
温度制御された現像液2が矢印の方向へと送流され、現
像液槽1上面部でオーバーフローする。そして、図示す
る如く、試料7をこのオーバーフローする現像液2に浸
漬して、現像処理を行うものである。
Further, FIG. 5 shows a second embodiment, in which development processing is performed by an overflow method. In the same figure, 1
is a developer tank, and from the liquid supply pipe 3 provided on the bottom side,
The temperature-controlled developer 2 is sent in the direction of the arrow and overflows at the upper surface of the developer tank 1. Then, as shown in the figure, the sample 7 is immersed in this overflowing developer 2 to perform a development process.

この第2の従来例では、被処理試料7の現像面に絶えず
現像液を供給出来るという点で、上述の第1の従来例に
比べて現像パターンの品位は改良される。しかし、現像
面の中心部と周辺部で現像液2の流速を均一に維持する
事が困難であるという4丁から、現像面内において均一
に現像処理を施す事は難しい。また、現像液槽1内の現
像液温度を均一化する上で、現像液2の流入方向、流量
等の最適化を図らねばならず、これらの因子を設定、制
御する事は困難である(特公昭58−7709号公報参
照)。
In this second conventional example, the quality of the developed pattern is improved compared to the above-mentioned first conventional example in that the developing solution can be constantly supplied to the developing surface of the sample 7 to be processed. However, since it is difficult to maintain a uniform flow rate of the developer 2 at the center and periphery of the developing surface, it is difficult to perform the developing process uniformly within the developing surface. Furthermore, in order to equalize the developer temperature in the developer tank 1, it is necessary to optimize the inflow direction, flow rate, etc. of the developer 2, and it is difficult to set and control these factors ( (See Japanese Patent Publication No. 58-7709).

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

以上詳述したように、従来の現像装置においては、試料
7の現像面内で、現像液温度並びに現像液供給の均一性
を実現し難く、この為均−でしかも高解像度(品位)の
現像パターンを得る事は困難であるという問題があった
As detailed above, in the conventional developing device, it is difficult to achieve uniformity of developer temperature and developer supply within the development surface of sample 7, and for this reason, it is difficult to achieve uniformity of developer temperature and developer supply within the development surface of sample 7. There was a problem in that it was difficult to obtain a pattern.

また、従来例においては、複数の現像液を用いて連続的
に現像処理する必要がある場合、あるいは現像後、速か
にリンス処理を施す必要がある場合は、装置の構成上の
制約から、これらの処理を施す事が回連であるという問
題もあった。
In addition, in the conventional example, when it is necessary to perform continuous development using multiple developers, or when it is necessary to perform rinsing immediately after development, due to the limitations of the device configuration, There was also the problem that these treatments were repeated.

従って、本発明は以上述べた、高解1′9′!3.(品
位)の現像パターンが得られないという問題と、連続的
な現像処理等を行えないという問題とを解消した、処理
液回収方式の現像装置を提供する事を目的とする。
Therefore, the present invention provides the above-mentioned high resolution 1'9'! 3. It is an object of the present invention to provide a processing liquid recovery type developing device that solves the problems of not being able to obtain a high quality development pattern and not being able to perform continuous development processing.

〔問題点を解決するための手段〕[Means for solving problems]

本発明に係る現像装置は、上面部に試料の一辺と略同等
またはこれより長い平行2辺全長辺とする縦長の開口部
を有し、この開口部から底部側より流入させた処理液を
所望長の流路を経てオーバーフローさせる為の処理液供
給部と、上記オーバーフローする処理液を受けるオーバ
ーフロー槽と、このオーバーフロー槽の処理液を上記処
理液供給部に温度調整して循環させる処理液循環供給部
と、または上記処理液供給部と上記オーバーフロー槽と
上記処理液循環供給部とを1組とし、これを複数組併設
したものと、被処理試料を支持する試料支持駆動部とを
具備したものである。
The developing device according to the present invention has a vertically elongated opening on the top surface having two parallel sides that are approximately equal to or longer than one side of the sample, and the processing liquid is flowed from the bottom side through this opening into the desired amount. a processing liquid supply section for overflowing through a long flow path, an overflow tank for receiving the overflowing processing liquid, and a processing liquid circulation supply for circulating the processing liquid in the overflow tank to the processing liquid supply section after adjusting the temperature. or a set including the processing liquid supply section, the overflow tank, and the processing liquid circulation supply section, and a plurality of sets thereof, and a sample support drive section that supports the sample to be processed. It is.

〔作 用〕[For production]

以上のように、本発明の現像装置におφてけ、上面部に
試料の一辺と略同等またはこれより長い平行2辺全長辺
とする縦長の開口部を有し、この開口部から底部側より
流入させた処理液を所望長の流路を経てオーバーフロー
させる為の処理液供給部を設けたので、上記開口部より
オーバーフローされる処理液はその長辺方向において、
流量及び流出方向が均一化される。
As described above, when placed in the developing device of the present invention, it has a vertical opening on the top surface with two parallel sides that are approximately equal to or longer than one side of the sample, and from this opening, from the bottom side. Since a processing liquid supply section is provided to allow the processing liquid to flow in and overflow through a flow path of a desired length, the processing liquid overflowing from the opening has the following characteristics in its long side direction:
The flow rate and outflow direction are equalized.

また、上記処理液供給部にオーバーフロー槽を設けると
共に、温度調整された処理液を循環させる処理液循環供
給部を設けたので、試料処理面には高循環性を以って、
均一化した温度の処理液が接触する。さらに、試料支持
駆動部を設けたので、処理液供給部の開口部からオーバ
ーフローする処理液に対し、支持された試料の処理面を
くまη、く接触させる事が出来る。
In addition, in addition to providing an overflow tank in the processing liquid supply section, a processing liquid circulation supply section that circulates the temperature-adjusted processing liquid is also provided, so that the sample processing surface has high circulation properties.
The processing liquid at a uniform temperature comes into contact. Furthermore, since the sample support driving section is provided, the processing surface of the supported sample can be brought into close contact with the processing liquid overflowing from the opening of the processing liquid supply section.

さらに、処理液供給部、オーバーフロー槽、及び処理液
循環供給部とを1組とし、これを複数組併設する事によ
り、各組に異なった処理液を循環させて連続的処理を行
う事が出来る。例えば、第1の組に現像液を入れ、第2
の組にリンス液を入れる。そして、まず第1の組を作動
させて現像処理を行い、現像終了後、直ちに第2の組を
作動させてリンス処理を行う。
Furthermore, by arranging multiple sets of the processing liquid supply unit, overflow tank, and processing liquid circulation supply unit as one set, continuous processing can be performed by circulating different processing liquids in each set. . For example, put the developer in the first set, and put the developer in the second set.
Pour the rinse solution into the set. First, the first set is activated to perform a developing process, and immediately after the development is completed, the second set is activated to perform a rinsing process.

〔実施例〕〔Example〕

以下、図に基いて本発明の詳細な説明する、第1図は第
1発明の実施例を示すものである。なおこの現像装置に
おいては、処理液として現像液を用いている。同図にお
いて、1は処理液溜槽(現像液溜槽)であり、2は同種
に付設され、現像液の加熱・冷却手段を備えた温度調整
ユニットである。また、3は現像液を循環させるポンプ
手段である。そして、囲い部13内の支持台(図示せず
)上には、上部にオーバーフロー槽9が配設された処理
液供給部(現保液供給部)7が載置されている。また、
上記現像液溜槽1とこの現像液供給部7の底部側とは、
上記ポンプ手段3を介して流入導管4により接続されて
おり、また現像液溜槽1とオーバーフロー槽9の底部側
とは流出導管5により接続されている。
Hereinafter, the present invention will be explained in detail based on the drawings. FIG. 1 shows an embodiment of the first invention. Note that this developing device uses a developing solution as the processing solution. In the figure, 1 is a processing liquid storage tank (developer storage tank), and 2 is a temperature adjustment unit attached to the same type and provided with means for heating and cooling the developer. Further, 3 is a pump means for circulating the developer. A processing liquid supply section (currently a retained liquid supply section) 7 having an overflow tank 9 disposed above is placed on a support stand (not shown) within the enclosure section 13 . Also,
The developer reservoir tank 1 and the bottom side of the developer supply section 7 are as follows:
They are connected by an inflow conduit 4 via the pump means 3, and the developer reservoir 1 and the bottom side of the overflow tank 9 are connected by an outflow conduit 5.

そして、現像液溜槽1、温度調整ユ;、ット2、ポンプ
手段3、流入導管4及び流出導管5とにより処理液循環
供給部(現像液循環供給部)6が構成される。また、1
2は試料支持駆動部であり、試料(マスク、ウェハ等)
11を水平に支持固定出来ると共に、図示される矢印方
向、すなわち垂直方向及び水平方向へ往復移動出来るよ
う構成されている。
A processing liquid circulation supply section (developer circulation supply section) 6 is constituted by the developer reservoir tank 1, the temperature adjustment unit 2, the pump means 3, the inflow conduit 4, and the outflow conduit 5. Also, 1
2 is a sample support drive unit, which supports the sample (mask, wafer, etc.)
11 can be supported and fixed horizontally, and can also be moved back and forth in the direction of the arrow shown in the figure, that is, in the vertical and horizontal directions.

次に、第2図により上記現像液供給部7及びオーバーフ
ロー槽9の構成を詳細に説明する。この現像液供給部7
は、本実施例では小容積の直方体を成し、水平断面を細
長く絞り込まれた縦長形状とし、またその長辺力\′試
料幅以上の寸法に形成されている。そして、この現像液
供給部7の底部側には、上記流入導管4が接続苫れると
共に、底面より上方の所定位置にはフィルタ8が配設さ
れており、通過する現像液を浄化すると同時に、現像液
供給部7の形状構成と併わせで、長辺方向の流速分布を
均一化するよう機能する。そして、現像液供給部7の上
面部には現像液をオーバー70−させる為の開口部10
が設けられている。さらに、現像液供給部7の上部側に
は、オーバーフローした現像液を受ける為のオーバーフ
ロー槽9が付設されている。このオーバーフロー槽9の
底面部と上記現像液溜槽1とは、流出導管5により接続
される。
Next, the structure of the developer supply section 7 and overflow tank 9 will be explained in detail with reference to FIG. This developer supply section 7
In this embodiment, it forms a rectangular parallelepiped with a small volume, has a vertically elongated shape with a narrow horizontal cross section, and is formed to have a dimension larger than its long side force \' sample width. The inflow conduit 4 is connected to the bottom side of the developer supply section 7, and a filter 8 is disposed at a predetermined position above the bottom surface to purify the developer passing through. Together with the shape and configuration of the developer supply section 7, it functions to equalize the flow velocity distribution in the long side direction. An opening 10 is provided on the upper surface of the developer supply section 7 for overflowing the developer.
is provided. Furthermore, an overflow tank 9 is attached to the upper side of the developer supply section 7 for receiving overflowing developer. The bottom surface of the overflow tank 9 and the developer storage tank 1 are connected through an outflow conduit 5.

ここで、現像液循環供給部6、現像液供給部7、及びオ
ーバーフロー槽9により処理液循環部(現像液循環部)
14が構成される。次に、この現像液循環部14の循f
J!系統について述べる。まず、現像液溜槽1に付設さ
れる温度調整ユニット2により所定温度に制御された現
像液は、ポンプ手段3の循環作用により現像液溜槽1か
ら流入導管4を通って、現像液供給部7の底部に流入す
る。流入した現像液はその水位が増して、フィルタ8を
通過し、開口部10からオーバーフローする。このオー
バーフローした現像液はオーバーフロー槽9で受けられ
、その底部に接続された流出導管5を通って、矢印の如
く現像液溜槽1へと循環回収される。
Here, a processing liquid circulation part (developer circulation part) is formed by the developer circulation supply part 6, the developer supply part 7, and the overflow tank 9.
14 are configured. Next, the circulation f of this developer circulation section 14 is
J! Let's talk about the system. First, the developer whose temperature is controlled to a predetermined temperature by the temperature adjustment unit 2 attached to the developer reservoir 1 is passed from the developer reservoir 1 through the inflow conduit 4 by the circulation action of the pump means 3 to the developer supply section 7. Flow into the bottom. The developer solution that has flowed in increases in water level, passes through the filter 8, and overflows from the opening 10. This overflowing developer is received in an overflow tank 9, and is circulated and recovered to the developer reservoir 1 as shown by the arrow through an outflow conduit 5 connected to the bottom of the overflow tank 9.

従って、上記構成による現像装置を用いて現像処理を行
う場合には、試料11を水平に支持固定した試料支持駆
動部120位ff!l調整をして、試料11の処理面が
現像液供給部7の開口部10よりオーバーフローする現
像液に十分接触するようにする。そして、高さをそのま
まにした状態で、第1図に示す如く試料支持駆動部12
を開口部10の長辺を横切る方向に水平に、所定時間往
復移動させる。
Therefore, when performing a developing process using the developing device having the above configuration, the sample supporting drive section 120 which horizontally supports and fixes the sample 11ff! 1 adjustment so that the treated surface of the sample 11 comes into sufficient contact with the developer overflowing from the opening 10 of the developer supply section 7. Then, with the height unchanged, the sample support drive section 12 is moved as shown in FIG.
horizontally in a direction across the long side of the opening 10 for a predetermined period of time.

なお、第2発明の実施例によれば第3図に示す如く、処
理液循環部14を上述した現像液用の他に、処理液とし
てリンス液を循環させるリンス液循環部34を追加して
並設し、現像装置を構成する事も出来る。ここで、リン
ス処理は以下のような手順で行う。すなわち、現像処理
終了後、まず現像液循環用のポンプ手段3とリンス液循
環用のポンプ手段23とを切り換えて作動させ、リンス
液供給部27の開口部30よりリンス液をオーバーフロ
ーさせる。そして、試料支持駆動部12を速やかにリン
ス液供給部27の設置位置まで移動させ、開口部30か
らオーバー7四−するリンス液に試料11処理面を十分
接触させる。その後、上記現像処理の場合と同様、試料
支持駆動部12を開口部30の長辺を横切る方向に水平
往復移動させて、現像液残渣等を除去する。なお同図に
おいて、21はリンス液溜槽、22は温度調整ユニット
、24は流入導管、25は流出導管、26はリンス液循
環供給部、28はフィルタであり、また29はオーバー
フル一槽である。
According to the embodiment of the second invention, as shown in FIG. 3, in addition to the processing liquid circulation section 14 for the developer described above, a rinsing liquid circulation section 34 for circulating a rinsing liquid as the processing liquid is added. They can also be arranged in parallel to form a developing device. Here, the rinsing process is performed in the following steps. That is, after the development process is completed, first, the pump means 3 for circulating the developer and the pump means 23 for circulating the rinse solution are switched and operated to cause the rinse solution to overflow from the opening 30 of the rinse solution supply section 27. Then, the sample support drive section 12 is quickly moved to the installation position of the rinsing liquid supply section 27, and the processing surface of the sample 11 is brought into sufficient contact with the rinsing liquid flowing over from the opening 30. Thereafter, as in the case of the development process described above, the sample support drive unit 12 is horizontally reciprocated in a direction across the long side of the opening 30 to remove developer residue and the like. In the figure, 21 is a rinsing liquid storage tank, 22 is a temperature adjustment unit, 24 is an inflow conduit, 25 is an outflow conduit, 26 is a rinsing liquid circulation supply section, 28 is a filter, and 29 is an overfull tank. .

またさらに、上記構成において試料支持駆動部12を2
組以上設けて、現像液循環用のポンプ手段3とリンス液
循環用のポンプ手段23とを逐次作動させ、2枚以上の
試料に対し、現像−リンス処理を連続的に施すようにす
る事が出来るのは勿論である。
Furthermore, in the above configuration, the sample support drive section 12 is
It is possible to provide two or more sets and operate the pump means 3 for circulating the developer solution and the pump means 23 for circulating the rinsing solution sequentially, so that the development and rinsing treatments can be continuously performed on two or more samples. Of course it can be done.

〔発明の効果〕〔Effect of the invention〕

以上、詳細に説明したように、本発明によれば処理液供
給部の開口部よりオーバー70−する処理液の流量及び
流出方向がその長辺方向に均一化されると共に、処理液
供給部内においては処理液の循環性と温度均一性が高め
られる。この為、各処理を行う場合には、試料支持駆動
部を上記開口部の長辺を横切る方向に水平往復移動する
事により、試料処理面での処理液温度、濃度が均一化さ
れると共に、これらの経時変化も抑制されるので、高解
像度(品位)の現像パターンを得る事が出来るという効
果がある。
As described above in detail, according to the present invention, the flow rate and outflow direction of the processing liquid exceeding 70 mm from the opening of the processing liquid supply section are made uniform in the long side direction, and the This improves the circulation and temperature uniformity of the processing solution. Therefore, when performing each process, by horizontally reciprocating the sample support drive unit in a direction that crosses the long side of the opening, the temperature and concentration of the processing liquid on the sample processing surface are made uniform, and Since these changes over time are also suppressed, there is an effect that a developed pattern with high resolution (quality) can be obtained.

また、本発明の現像装置においては、処理液供給部、オ
ーバーフロー槽、及び処理液循環供給部とを1組として
、これを2組以上並設する構成とする為、処理液に各種
現像液、及びリンス液を用いる事により、現像−リンス
処理、あるいは複数の現像処理等を連続的に行う事が出
来るので、作業能率が向上するという効果がある。
Furthermore, in the developing device of the present invention, two or more sets of the processing liquid supply section, the overflow tank, and the processing liquid circulation supply section are arranged in parallel, so that the processing liquid includes various developing solutions, By using a rinsing liquid and a rinsing liquid, development-rinse processing or a plurality of development processings can be performed continuously, which has the effect of improving work efficiency.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は第1発明の実施例の現像装置を説明する斜視図
、第2図は第1図の現像装置の要部拡大斜視図、第3図
は第2発明の実施例の現像装置を説明する斜視図、第4
図は第1の従来例の現像装置を説明する要部断面図、第
5図は第2の従来例の現像装置を説明する要部断面図で
ある。 1・・・処理液溜槽、3・・・ポンプ手段、4・・・流
入導管、5・・・流出導管、6・・・処理液循環供給部
、7・・・処理液供給部、9・・・オーバーフロー槽、
10・・・開口部、11・・・試料、12・・・試料支
持駆動部。 特許出願人 沖電気工業株式会社 輩1発朗のrオ性イ?拮兎明用のt+J見目第1図 第2図 71で ! ;区    へ ・5
1 is a perspective view illustrating a developing device according to an embodiment of the first invention, FIG. 2 is an enlarged perspective view of main parts of the developing device shown in FIG. 1, and FIG. 3 is a perspective view illustrating a developing device according to an embodiment of the second invention. Explanatory perspective view, 4th
FIG. 5 is a cross-sectional view of a main part of a first conventional developing device, and FIG. 5 is a cross-sectional view of a main part of a second conventional developing device. DESCRIPTION OF SYMBOLS 1... Processing liquid storage tank, 3... Pump means, 4... Inflow conduit, 5... Outflow conduit, 6... Processing liquid circulation supply part, 7... Processing liquid supply part, 9.・・Overflow tank,
DESCRIPTION OF SYMBOLS 10... Opening part, 11... Sample, 12... Sample support drive part. Patent applicant: Oki Electric Industry Co., Ltd. T + J appearance figure 1 figure 2 figure 71 for antagonist! ; Ward to 5

Claims (2)

【特許請求の範囲】[Claims] (1)上面部に試料の一辺と略同等またはこれより長い
平行2辺を長辺とする縦長の開口部を有し、該開口部か
ら底部側より流入させた処理液を所望長の流路を経てオ
ーバーフローさせる為の処理液供給部と、上記オーバー
フローする処理液を受けるオーバーフロー槽と、該オー
バーフロー槽の処理液を上記処理液供給部に温度調整し
て循環させる処理液循環供給部と、上記処理液供給部の
開口部上に被処理試料を支持する試料支持駆動部とを具
備した事を特徴とする現像装置。
(1) The upper surface has a vertically elongated opening whose long sides are two parallel sides that are approximately equal to or longer than one side of the sample, and the processing liquid flowing from the bottom side through the opening is passed through a flow path of a desired length. a processing liquid supply section for overflowing the processing liquid through the processing liquid supply section; an overflow tank for receiving the overflow processing liquid; a processing liquid circulation supply section for circulating the processing liquid in the overflow tank to the processing liquid supply section with temperature adjustment; A developing device comprising a sample support drive section that supports a sample to be processed above an opening of a processing liquid supply section.
(2)上面部に試料の一辺と略同等またはこれより長い
平行2辺を長辺とする縦長の開口部を有し、該開口部か
ら底部側より流入させた処理液を所望長の流路を経てオ
ーバーフローさせる為の処理液供給部と、上記オーバー
フローする処理液を受けるオーバーフロー槽と、該オー
バーフロー槽の処理液を上記処理液供給部に温度調整し
て循環させる処理液循環供給部とを1組とし、これに他
の組を1組以上併設して、これら処理液供給部の開口部
上に被処理試料を支持する試料支持駆動部とを具備した
事を特徴とする現像装置。
(2) The upper surface has a vertically elongated opening whose long sides are two parallel sides that are approximately equal to or longer than one side of the sample, and the processing liquid flowing from the bottom side through the opening is passed through a flow path of a desired length. A processing liquid supply section for overflowing the processing liquid through the overflow, an overflow tank for receiving the overflow processing liquid, and a processing liquid circulation supply section for circulating the processing liquid in the overflow tank to the processing liquid supply section while adjusting the temperature. 1. A developing device comprising: one set, one or more other sets attached thereto, and a sample support drive section for supporting a sample to be processed over the openings of these processing liquid supply sections.
JP17849485A 1985-08-15 1985-08-15 Developing device Pending JPS6239016A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17849485A JPS6239016A (en) 1985-08-15 1985-08-15 Developing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17849485A JPS6239016A (en) 1985-08-15 1985-08-15 Developing device

Publications (1)

Publication Number Publication Date
JPS6239016A true JPS6239016A (en) 1987-02-20

Family

ID=16049431

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17849485A Pending JPS6239016A (en) 1985-08-15 1985-08-15 Developing device

Country Status (1)

Country Link
JP (1) JPS6239016A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59230652A (en) * 1983-06-14 1984-12-25 Nippon Ranzubaagu Kk Rotary spray apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59230652A (en) * 1983-06-14 1984-12-25 Nippon Ranzubaagu Kk Rotary spray apparatus

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