JPS6235628B2 - - Google Patents
Info
- Publication number
- JPS6235628B2 JPS6235628B2 JP54134260A JP13426079A JPS6235628B2 JP S6235628 B2 JPS6235628 B2 JP S6235628B2 JP 54134260 A JP54134260 A JP 54134260A JP 13426079 A JP13426079 A JP 13426079A JP S6235628 B2 JPS6235628 B2 JP S6235628B2
- Authority
- JP
- Japan
- Prior art keywords
- pin
- address
- wiring
- test
- counter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 53
- 239000011159 matrix material Substances 0.000 claims description 28
- 238000007689 inspection Methods 0.000 claims description 9
- 238000001514 detection method Methods 0.000 description 12
- 238000010586 diagram Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 230000010365 information processing Effects 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13426079A JPS5658667A (en) | 1979-10-19 | 1979-10-19 | Apparatus for continuity test of wiring |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13426079A JPS5658667A (en) | 1979-10-19 | 1979-10-19 | Apparatus for continuity test of wiring |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5658667A JPS5658667A (en) | 1981-05-21 |
| JPS6235628B2 true JPS6235628B2 (cs) | 1987-08-03 |
Family
ID=15124129
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13426079A Granted JPS5658667A (en) | 1979-10-19 | 1979-10-19 | Apparatus for continuity test of wiring |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5658667A (cs) |
-
1979
- 1979-10-19 JP JP13426079A patent/JPS5658667A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5658667A (en) | 1981-05-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN110658400B (zh) | 基于嵌入式的测试方法、微控制器和系统 | |
| CN111693819B (zh) | 检测方法及装置 | |
| US4183459A (en) | Tester for microprocessor-based systems | |
| US20050015213A1 (en) | Method and apparatus for testing an electronic device | |
| TWI644111B (zh) | 用以控制測試器之半導體檢驗方法及裝置 | |
| US4703482A (en) | Universal apparatus for detecting faults in microprocessor systems | |
| JPS6235628B2 (cs) | ||
| CN116482512A (zh) | 一种电源信号自检查的接口电路板、自动测试方法和测试平台 | |
| CN116185735A (zh) | 一种接口测试方法及装置 | |
| WO1981000475A1 (en) | Testor for microprocessor-based systems | |
| JPH0252446A (ja) | 集積回路の試験装置 | |
| US6815969B2 (en) | Semiconductor inspection device capable of performing various inspections on a semiconductor device | |
| KR102467416B1 (ko) | 이종의 피검사 디바이스를 테스트하는 테스트 시스템 | |
| JP2920561B2 (ja) | 1チップマイクロコンピュータのテスト方法 | |
| CN118659172A (zh) | 线束连接装置、及控制器的测试方法 | |
| JP2765096B2 (ja) | 電気系コネクタの接続良否診断装置及び診断方法 | |
| JPS6329277A (ja) | 論理集積回路の試験装置 | |
| KR100505613B1 (ko) | 반도체 메모리 장치의 번인 테스트용 인쇄회로기판 | |
| KR930006962B1 (ko) | 반도체 시험방법 | |
| JP2000097994A (ja) | 半導体試験装置 | |
| JP2721060B2 (ja) | 半導体装置の試験装置 | |
| JP3215600B2 (ja) | Ic試験装置 | |
| JP2595263B2 (ja) | テストパターン自動作成方式 | |
| JP2821302B2 (ja) | 半導体icのテスト方法 | |
| CN116087754A (zh) | 一种电路板的快速检测方法、装置、设备及存储介质 |