JPS6234109B2 - - Google Patents
Info
- Publication number
- JPS6234109B2 JPS6234109B2 JP55025290A JP2529080A JPS6234109B2 JP S6234109 B2 JPS6234109 B2 JP S6234109B2 JP 55025290 A JP55025290 A JP 55025290A JP 2529080 A JP2529080 A JP 2529080A JP S6234109 B2 JPS6234109 B2 JP S6234109B2
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- charging current
- test voltage
- output
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 45
- 238000001514 detection method Methods 0.000 claims description 27
- 238000006243 chemical reaction Methods 0.000 claims description 10
- 238000009413 insulation Methods 0.000 claims description 6
- 239000004020 conductor Substances 0.000 claims description 3
- 230000007547 defect Effects 0.000 claims description 3
- 239000012212 insulator Substances 0.000 claims description 3
- 230000035945 sensitivity Effects 0.000 description 8
- 238000010586 diagram Methods 0.000 description 3
- 230000007257 malfunction Effects 0.000 description 3
- 230000001681 protective effect Effects 0.000 description 2
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 2
- 229920002554 vinyl polymer Polymers 0.000 description 2
- 239000004698 Polyethylene Substances 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- -1 polyethylene Polymers 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
- G01R31/1272—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of cable, line or wire insulation, e.g. using partial discharge measurements
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Relating To Insulation (AREA)
Description
本発明は、電線用スパークテスタに関し、特に
被試験電線に流れる充電電流を検出する検出手段
を改良した電線用スパークテスタに関するもので
ある。
この種の電線用スパークテスタは、JISC3005
「プラスチツク絶縁電線試験方法」に示されてお
り、このテスタは、第１図に示すように、リール
１に巻かれて導体２ａが接地された被試験電線２
を受入れる電極手段３とこの電極手段３と接地間
に交流の試験電圧を印加する交流試験電圧源４と
被試験電線２に流れる充電電流を検出する検出手
段５とから成つている。電極手段３は内部に多数
の玉鎖電極３Ａを収容した電極箱３Ｂから成つて
おり、電極箱３Ｂは碍子６によつて支持されてい
る。尚、第１図において符号７は電極箱３Ｂを保
護する保護箱であり、この保護箱７は接地されて
いる。試験電圧源４は変圧器８から成つており、
その入力端は電圧調整器９及び過電流遮断器１０
を経て交流電源に接続され、出力端は電極箱３Ｂ
と接地との間に接続されている。検出手段５は変
圧器８の出力側に直列接続されて被試験電線２に
流れる充電電流を検出する。この充電電流は被試
験電線２の絶縁物のピンホール、クラツク及び試
験電圧による絶縁破壊に応じて変動しこの絶縁不
良個所を確実に検出するためには検出手段５の動
作電流と応答時間を小さくすることが要求され
る。従来技術ではこの検出手段は定電流動作型の
電磁リレーから成つているので動作電流と応答時
間即ち感度が低く、従つて低い試験電圧では絶縁
不良を検出することができる確率が低かつた。第
３図は試験電圧に対するビニール系とポリエチレ
ン系との２つの絶縁電線の充電電流ａ，ｂと碍子
６に流れる無負荷充電電流ｃとの変化を示す。こ
の場合、検出手段５の検出動作電流ｄを小さく設
定すると、絶縁電線である被試験電線２の絶縁物
に異常がなくても試験電圧の値によつては検出手
段５が距誤動作するので電流感度を高くすること
ができなかつた。
本発明の目的は、検出手段の感度を向上するこ
とができ、且つ誤動作を起すことがない電線用ス
パークテスタを提供することにある。
本発明の実施例を図面を参照して詳細にのべる
と、本発明の電線用スパークテスタは第１図に示
すのと同じ構成を有するが、検出手段５が従来技
術と全く異なる。本発明に用いられる検出手段５
は第２図に示され、この検出手段５は基準回路１
１と検出回路１２と比較回路１４とを含んでい
る。
基準回路１１は、試験電圧を直流に変換する試
験電圧直流変換回路１６から成つている。この試
験電圧直流変換回路１６は充電電流の試験電圧に
対する傾きをＫ、試験電圧をＥ、試験電圧から変
換された直流電力をＩ、その切片をＣとすると、
Ｉ＝KE＋Ｃの出力を発生するように設定されて
いる。但しＫ≧０，Ｃ≧０である。これは後にの
べるように比較回路１４で比較する場合の基準値
であり、従つて検出手段５の動作特性は試験電圧
Ｅに比例することが判る。
検出回路１２は、被試験電線２に流れる充電電
流を直流に変換する充電電流直流変換回路１８
と、この直流をサンプリングし記憶する充電電流
記憶回路２０と、充電電流直流変換回路１８と充
電電流記憶回路２０との出力の差を演算する減算
回路２２とから成つている。従つて、この減算回
路２２にはサンプリングされた充電電流に対する
変化分が出力される。この出力は比較回路１４に
入力され基準回路１１からの基準値と比較され、
減算回路２２の出力が基準値より大きいときに制
御出力回路２４を動作する。制御出力回路２４は
比較回路１４の出力を増巾し別のリレーやカウン
ターを動作させるようになつている。
上記検出手段５において検出対象は充電電流の
保持された基準値に対する変化分となり、また検
出手段５の動作特性、即ち基準回路１１の出力は
検出手段が誤動作することがないように傾きＫを
小さくして電流感度を上げることができる。
先にのべたJISC「プラスチツク絶縁電線試験
方法」による第１図のスパークテスタで試験した
場合をＡとし、この第１図のスパークテスタに第
２図に示された検出手段５を接続した本発明のス
パークテスタで試験した場合をＢとし、Ａ，Ｂの
効果を応答時間とピンホール検出数とについて比
較する。
１ 応答時間
BS規格（BS6346−1969「電源用PVC絶縁ケー
ブル」）またはJCS規格（JCSC56−1978「電線用
スパークテスタ」）に規定の感度試験でその応答
時間はＴ＝20×33.3／（mS）（は金属プレー
ト電極の回転数r.p.m）によつて求めた。その結
果、従来のＡでは動作しなかつたが、本発明のＢ
では8mSで動作し応答時間の速いことが判つた。
２ ピンホール検出数
0.75mm×７外径５mmのビニル電線にガス針９号
（外径0.71mm長さ36.4mmJIS許可番号）によつてそ
の長さ方向に１mm間隔毎に12個のピンホールを設
け、電極箱内を通過させてピンホール検出数を比
較した。第１表は試験電圧を変えたときのピンホ
ール検出数を示す。
The present invention relates to a spark tester for electric wires, and more particularly to a spark tester for electric wires with improved detection means for detecting charging current flowing through the electric wire under test. This kind of electric wire spark tester is JISC3005
``Plastic Insulated Wire Testing Method,'' and this tester uses a wire under test, which is wound on a reel 1 and whose conductor 2a is grounded, as shown in FIG.
It consists of an electrode means 3 for receiving the voltage, an AC test voltage source 4 for applying an AC test voltage between the electrode means 3 and ground, and a detection means 5 for detecting the charging current flowing through the electric wire 2 to be tested. The electrode means 3 consists of an electrode box 3B containing a large number of chain electrodes 3A therein, and the electrode box 3B is supported by an insulator 6. In FIG. 1, reference numeral 7 is a protective box that protects the electrode box 3B, and this protective box 7 is grounded. The test voltage source 4 consists of a transformer 8,
Its input terminal is a voltage regulator 9 and an overcurrent breaker 10
It is connected to the AC power supply through the terminal, and the output end is the electrode box 3B.
and ground. The detection means 5 is connected in series to the output side of the transformer 8 and detects the charging current flowing through the electric wire 2 under test. This charging current varies depending on pinholes and cracks in the insulation of the wire under test 2 and dielectric breakdown due to the test voltage, and in order to reliably detect this insulation defect location, the operating current and response time of the detection means 5 must be reduced. required to do so. In the prior art, this detection means consists of a constant current type electromagnetic relay, so the operating current and response time, that is, the sensitivity is low, and therefore the probability of being able to detect an insulation defect is low at a low test voltage. FIG. 3 shows changes in the charging currents a and b of two vinyl-based and polyethylene-based insulated wires and the no-load charging current c flowing through the insulator 6 with respect to the test voltage. In this case, if the detection operating current d of the detection means 5 is set small, the detection means 5 may malfunction depending on the value of the test voltage even if there is no abnormality in the insulation of the wire under test 2, which is an insulated wire. It was not possible to increase the sensitivity. An object of the present invention is to provide a spark tester for electric wires that can improve the sensitivity of the detection means and does not cause malfunctions. Embodiments of the present invention will be described in detail with reference to the drawings. The spark tester for electric wires of the present invention has the same configuration as shown in FIG. 1, but the detection means 5 is completely different from that of the prior art. Detection means 5 used in the present invention
is shown in FIG. 2, and this detection means 5 is connected to the reference circuit 1
1, a detection circuit 12, and a comparison circuit 14. The reference circuit 11 includes a test voltage DC conversion circuit 16 that converts the test voltage into DC. In this test voltage DC conversion circuit 16, let K be the slope of the charging current with respect to the test voltage, E be the test voltage, I be the DC power converted from the test voltage, and C be its intercept.
It is set to generate an output of I=KE+C. However, K≧0 and C≧0. This is a reference value for comparison in the comparator circuit 14 as will be described later, and it can therefore be seen that the operating characteristics of the detection means 5 are proportional to the test voltage E. The detection circuit 12 includes a charging current DC conversion circuit 18 that converts the charging current flowing through the wire under test 2 into DC.
, a charging current storage circuit 20 that samples and stores this direct current, and a subtraction circuit 22 that calculates the difference between the outputs of the charging current DC conversion circuit 18 and the charging current storage circuit 20. Therefore, a change in the sampled charging current is output to the subtraction circuit 22. This output is input to the comparison circuit 14 and compared with the reference value from the reference circuit 11.
The control output circuit 24 is operated when the output of the subtraction circuit 22 is larger than the reference value. The control output circuit 24 amplifies the output of the comparison circuit 14 and operates another relay or counter. In the detection means 5, the object to be detected is the change in the charging current with respect to the held reference value, and the operating characteristics of the detection means 5, that is, the output of the reference circuit 11, are determined by reducing the slope K to prevent the detection means from malfunctioning. can increase current sensitivity. The case of testing with the spark tester shown in FIG. 1 according to the above-mentioned JISC "Plastic Insulated Wire Testing Method" is referred to as A, and the present invention in which the detection means 5 shown in FIG. 2 is connected to the spark tester shown in FIG. The case of testing with a spark tester will be designated as B, and the effects of A and B will be compared in terms of response time and number of pinholes detected. 1 Response time The response time in the sensitivity test specified in the BS standard (BS6346-1969 "PVC insulated cable for power supply") or JCS standard (JCSC56-1978 "Spark tester for electric wires") is T = 20 × 33.3 / (mS) (is the rotational speed of the metal plate electrode, rpm). As a result, conventional A did not work, but B of the present invention
It was found that the response time was fast, operating at 8mS. 2 Number of pinholes detected 12 pinholes were made at 1mm intervals in the length direction of a 0.75mm x 7 vinyl electric wire with an outer diameter of 5mm using a gas needle No. 9 (outer diameter 0.71mm length 36.4mm JIS permit number). The number of pinholes detected was compared by passing through the electrode box. Table 1 shows the number of pinholes detected when changing the test voltage.
【表】
また、第２表は試験電圧を2KVとしピンホール
検出を繰返したときのピンホール検出数を示す。[Table] Table 2 also shows the number of pinholes detected when the test voltage was 2KV and pinhole detection was repeated.
【表】
尚、このピンホール検出数の試験の感度は上記
１の応答時間で動作するように調整したもので感
度を更に上げれば、更によい結果が期待できる。
本発明によれば、上記のように、誤動作をなく
し、また応答時間を低減し、感度を著しく向上す
ることができ、更に被試験電線の条長計尺毎に充
電電流の記憶を行うので試験用トランス、電極及
びこれらの間の電線の絶縁強度が汚損、水滴の低
下等により低下してもこれらの影響を受けること
なく測定することができる。[Table] Note that the sensitivity of this test for the number of pinholes detected was adjusted to operate at the response time mentioned in 1 above, and if the sensitivity is further increased, even better results can be expected. According to the present invention, as described above, it is possible to eliminate malfunctions, reduce response time, and significantly improve sensitivity.Furthermore, since the charging current is stored for each length of the wire under test, it is possible to Even if the insulation strength of the transformer, the electrodes, and the electric wires between them are reduced due to contamination, droplets of water, etc., the measurement can be performed without being affected by these factors.
第１図はJISC3005による電線用スパークテス
タの概略系統図、第２図は本発明に用いられる検
出手段の概略系統図、第３図は種々の電線につい
て試験電圧と充電電流の関係を示す線図である。
２……被試験電線、２ａ……導体、３……電極
手段、４……試験電圧源、５……検出手段、１１
……基準回路、１２……検出回路、１４……比較
回路、１６……試験電圧直流変換回路、１８……
充電電圧直流変換回路、２０……充電電流記憶回
路、２２……減算回路。
Fig. 1 is a schematic system diagram of a spark tester for electric wires according to JISC3005, Fig. 2 is a schematic system diagram of the detection means used in the present invention, and Fig. 3 is a diagram showing the relationship between test voltage and charging current for various electric wires. It is. 2... Wire under test, 2a... Conductor, 3... Electrode means, 4... Test voltage source, 5... Detection means, 11
...Reference circuit, 12...Detection circuit, 14...Comparison circuit, 16...Test voltage DC conversion circuit, 18...
Charging voltage DC conversion circuit, 20...Charging current storage circuit, 22...Subtraction circuit.
Claims (1)
験電線の絶縁物と導体との間に試験電圧を印加す
る電極手段と、前記被試験電線に流れる充電電流
を検出してその絶縁不良を測定する検出手段とか
ら成る電線用スパークテスタにおいて、前記検出
手段は前記試験電圧を直流電圧に変換する試験電
圧直流変換回路から成る基準回路と、前記被試験
電線に流れる充電電流を直流電流に変換する充電
電流直流変換回路と前記直流電流をサンプリング
し記憶する充電電流記憶回路と前記充電電流直流
変換回路と前記充電電流記憶回路との出力の差を
演算する減算回路とから成る検出回路と、前記基
準回路の出力を基準値とし前記検出回路の減算回
路の出力を前記基準値と比較して前記基準値より
前記減算回路の出力が大きいときに制御出力を発
生する比較回路とを含むことを特徴とする電線用
スパークテスタ。 ２ 前記試験電圧直流変換回路の出力ＩはＩ＝
KE＋Ｃ（但しＫは充電電流の試験電圧に対する
傾き、Ｅは試験電圧、Ｃは出力Ｉの切片でＫ≧
０、Ｃ≧０）に設定されている特許請求の範囲第
１項に記載の電線用スパークテスタ。[Claims] 1. An AC test voltage source, an electrode means for applying a test voltage from the test voltage source between an insulator and a conductor of a wire under test, and a charging current flowing through the wire under test. A spark tester for electric wires comprises a detection means for measuring insulation defects in the electric wire under test, and the detection means includes a reference circuit comprising a test voltage DC conversion circuit for converting the test voltage into a DC voltage, and a charging current flowing through the electric wire under test. A charging current DC conversion circuit that converts the DC current into a DC current, a charging current storage circuit that samples and stores the DC current, and a subtraction circuit that calculates the difference between the outputs of the charging current DC conversion circuit and the charging current storage circuit. a detection circuit; and a comparison circuit that uses the output of the reference circuit as a reference value, compares the output of the subtraction circuit of the detection circuit with the reference value, and generates a control output when the output of the subtraction circuit is greater than the reference value. A spark tester for electric wires, comprising: 2 The output I of the test voltage DC conversion circuit is I=
KE+C (K is the slope of the charging current with respect to the test voltage, E is the test voltage, C is the intercept of the output I, and K≧
0, C≧0).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2529080A JPS56128464A (en) | 1980-03-03 | 1980-03-03 | Spark tester for electric wire |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2529080A JPS56128464A (en) | 1980-03-03 | 1980-03-03 | Spark tester for electric wire |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS56128464A JPS56128464A (en) | 1981-10-07 |
| JPS6234109B2 true JPS6234109B2 (en) | 1987-07-24 |
Family
ID=12161879
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2529080A Granted JPS56128464A (en) | 1980-03-03 | 1980-03-03 | Spark tester for electric wire |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS56128464A (en) |
-
1980
- 1980-03-03 JP JP2529080A patent/JPS56128464A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS56128464A (en) | 1981-10-07 |
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