JPS6232538U - - Google Patents

Info

Publication number
JPS6232538U
JPS6232538U JP12256385U JP12256385U JPS6232538U JP S6232538 U JPS6232538 U JP S6232538U JP 12256385 U JP12256385 U JP 12256385U JP 12256385 U JP12256385 U JP 12256385U JP S6232538 U JPS6232538 U JP S6232538U
Authority
JP
Japan
Prior art keywords
semiconductor wafer
probe card
pin
integrated circuit
diode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12256385U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP12256385U priority Critical patent/JPS6232538U/ja
Publication of JPS6232538U publication Critical patent/JPS6232538U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案の一実施例を示す平面図、第2
図は第1図のA―A′断面図である。 1……プローブカード、2……プローブピン、
3……半導体集積回路素子、4……スクライブラ
イン、5……コンタクトピン、6……発光ダイオ
ード、7……半導体ウエハ、8……電池、9……
電気回路。
Figure 1 is a plan view showing one embodiment of the present invention;
The figure is a sectional view taken along the line AA' in FIG. 1... Probe card, 2... Probe pin,
3...Semiconductor integrated circuit element, 4...Scribe line, 5...Contact pin, 6...Light emitting diode, 7...Semiconductor wafer, 8...Battery, 9...
electric circuit.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 半導体ウエハ上に形成された各集積回路素子の
電気的特性を測定するのに用いるプローブカード
において、カード本体に、半導体ウエハとの接触
を検知するコンタクト検知用ピンと、該ピンの出
力を入力として発光ダイオードを点燈又は消燈さ
せる回路を有することを特徴とするプローブカー
ド。
A probe card used to measure the electrical characteristics of each integrated circuit element formed on a semiconductor wafer has a contact detection pin on the card body that detects contact with the semiconductor wafer, and a device that emits light using the output of the pin as input. A probe card characterized by having a circuit that turns on or off a diode.
JP12256385U 1985-08-09 1985-08-09 Pending JPS6232538U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12256385U JPS6232538U (en) 1985-08-09 1985-08-09

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12256385U JPS6232538U (en) 1985-08-09 1985-08-09

Publications (1)

Publication Number Publication Date
JPS6232538U true JPS6232538U (en) 1987-02-26

Family

ID=31012868

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12256385U Pending JPS6232538U (en) 1985-08-09 1985-08-09

Country Status (1)

Country Link
JP (1) JPS6232538U (en)

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