JPS6230905A - Measuring device for between-gauge-mark distance deviation of test piece - Google Patents

Measuring device for between-gauge-mark distance deviation of test piece

Info

Publication number
JPS6230905A
JPS6230905A JP17021585A JP17021585A JPS6230905A JP S6230905 A JPS6230905 A JP S6230905A JP 17021585 A JP17021585 A JP 17021585A JP 17021585 A JP17021585 A JP 17021585A JP S6230905 A JPS6230905 A JP S6230905A
Authority
JP
Japan
Prior art keywords
pulse
test piece
gauge
pulses
reflected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17021585A
Other languages
Japanese (ja)
Other versions
JPH0789050B2 (en
Inventor
Nario Shibata
柴田 就生
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP60170215A priority Critical patent/JPH0789050B2/en
Publication of JPS6230905A publication Critical patent/JPS6230905A/en
Publication of JPH0789050B2 publication Critical patent/JPH0789050B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PURPOSE:To effect accurate optical measurement, by collecting laser beam reflected from both gauge marks of a test piece and calculating a between- gauge-mark distance from the number of pulses corresponding to the positions of the marks. CONSTITUTION:A synchronous pulse generator 3 generators a pulse with the specified period and supplies the pulse to laser driving unit 4 and pulse reader 8. A luminous unit 5, in synchronization with this pulse, emits laser beam 2 successively parallel with the specified distance. Onto top and bottom gauge marks A, B of the test piece 2, reflecting tapes 10, 10' are applied to reflect the possible incident laser beams on these tapes. A light-collecting unit 6 collects laser beams reflected from the tapes 10, 10' and the collected reflected beams are detected by a sensor 7. At a pulse reader 8, the reflected beams from the tapes 10, 10' are checked for the order of the luminous lamps that emitted this reflected beam. An output unit 9 obtains the number of pulses contained between the taped 10, 10' from the tapes that have been read out and an output is issued for a between-gauge-mark distance from the obtained number of pulses and distance of light emission.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は材料試験における試験片の標点間変位   :
測定装置に関する。
[Detailed Description of the Invention] (Industrial Application Field) The present invention relates to gauge-to-gage displacement of a test piece in material testing:
Concerning a measuring device.

(従来の技術) 引張試験における試験片の標点間伸びの測定は、従来、
伸び計を試験片の標点に直接取りつけて行なっていた。
(Prior art) Measurement of gage elongation of a test piece in a tensile test has conventionally been carried out using
The test was carried out by attaching an extensometer directly to the gauge point of the test piece.

(発明が解決しようとする問題点) しかしながら、−に記試験片に直接取り付ける形式の伸
び計は、実際に試験片に取り付ける作業がめんどうであ
り、かつ取り付は状態が悪ければ伸び計と試験片の標点
との間にスリップが生じて正確な測定ができなくなると
いう問題点があるほか、試験片の破断時に伸び計が放出
されて破損するという問題点があった。
(Problems to be Solved by the Invention) However, with the type of extensometer that is directly attached to the test piece described in -, it is troublesome to actually attach it to the test piece, and if the attachment is in poor condition, the extensometer and test In addition to the problem that slippage occurs between the test piece and the gage, making accurate measurements impossible, there is also the problem that the extensometer is ejected and damaged when the test piece breaks.

(問題点を解決するための手段) 本発明は、上記問題点を解決するため、次のような構成
とした。
(Means for Solving the Problems) In order to solve the above problems, the present invention has the following configuration.

すなわち、本発明にがかる標点間変位測定装置は、所定
の同期パルスを発生するパルス発生装置と、所定の発光
範囲において、その一端部から他端部へ順次前記パルス
発生装置のパルスに同期して所定の間隔で試験片に向け
て平行にレーザー光線を発光する発光部と、試験片から
のレーザー光線を集光する集光部と、該集光部によって
集光されたレーザー光線から、試験片の両枠点によって
反射または遮光されたレーザー光線がいずれのパルスに
該当するものであるかを読み取るパルス読取り部と、該
パルス読取り部の読取り結果に基いて両枠点間のパルス
数を求め、得られたパルス数と発光間隔から試験片の標
点間距離を算出して出力する出力部とをそなえている。
That is, the gauge-to-gage displacement measuring device according to the present invention includes a pulse generator that generates a predetermined synchronizing pulse, and a pulse generator that sequentially synchronizes with the pulses of the pulse generator from one end to the other end in a predetermined light emitting range. a light-emitting part that emits laser beams in parallel toward the test piece at predetermined intervals; a light-concentrating part that collects the laser beam from the test piece; A pulse reading section reads which pulse the laser beam reflected or blocked by the frame point corresponds to, and the number of pulses between the two frame points is calculated based on the reading result of the pulse reading section. It is equipped with an output section that calculates and outputs the gauge distance of the test piece from the number of pulses and the emission interval.

(作用) 同期パルス発生装置からのパルスに同期して、発光部が
所定の発光範囲の一方の端部から他方の端部まで順次試
験片に向けてモ行なレーザー光線を発光する。
(Function) In synchronization with the pulses from the synchronous pulse generator, the light emitting section sequentially emits a powerful laser beam toward the test piece from one end of a predetermined light emitting range to the other end.

このレーザー光線は、試験片を経由して集光部に達し、
試験片のlニドの標点によって反射または遮光された光
線のパルスが読み取られる。そして、両枠点に対応する
パルス間に含まれるパルス数と発光間隔から標点間距離
が算出される。
This laser beam passes through the test piece and reaches the condensing part.
The pulses of light that are reflected or blocked by the reference points on the specimen are read. Then, the gauge distance is calculated from the number of pulses included between the pulses corresponding to both frame points and the emission interval.

(実施例) 以ド、図面にあられされた実施例について説明すれば、
第1図は本発明の構成説明図であって、この標点間変位
測定装置lは、材料試験機に取り付けられた試験片2か
ら離れた位置で使用されるもので、同期パルス発生器3
、レーザードライブ部4、発光部5、集光部6、センサ
7、パルス読取器8、出力部9をそなえてなる。
(Example) Below, the example shown in the drawings will be explained.
FIG. 1 is an explanatory diagram of the configuration of the present invention, and this gauge-to-gauge displacement measuring device 1 is used at a position away from a test piece 2 attached to a material testing machine, and a synchronous pulse generator 3
, a laser drive section 4, a light emitting section 5, a light condensing section 6, a sensor 7, a pulse reader 8, and an output section 9.

同期パルス発生器3は、所定の周期で高周波数(数KH
2乃至数MH2とするのが適当)のパルスを発生する装
置であり、このパルスをレーザードライブ部4とパルス
読取器8に供給する。発光部5は1.記パルス発生器3
からのパルスに同期して、所定の発光範囲(W)内で順
次レーザー光線を平行に発光する部分であり、その発光
範囲は試験月の標点間距離よりも広くなっている。図示
例の発光部5はn個の発光ランプを14ドに等間隔で整
列させて設けたもので、第2図に示す如く、その一方の
端部(Ll)から他方の端部(Ln)に向かって1パル
スごとに発光位置を1個ずつずらしながら発光する。
The synchronous pulse generator 3 generates a high frequency (several KH) at a predetermined period.
This is a device that generates pulses (appropriately 2 to several MH2), and supplies these pulses to the laser drive unit 4 and pulse reader 8. The light emitting part 5 is 1. Pulse generator 3
This is a part that sequentially emits laser beams in parallel within a predetermined light emitting range (W) in synchronization with pulses from the test moon, and the light emitting range is wider than the gauge distance of the test moon. The light emitting unit 5 in the illustrated example has n light emitting lamps arranged in 14 circles at equal intervals, and as shown in FIG. 2, from one end (Ll) to the other end (Ln). Light is emitted while shifting the light emitting position one by one for each pulse.

試験月2の1−下の標点位置A、Bには反射テープ10
.10′が貼Hされており、発光部5から発光されたレ
ーザー光線がこの反射テープ10.10′に当って反射
するようになっている。試験片の他の部分は反射テープ
が貼られていないのでレーザー光線を反射しない。
Test month 2 1- Reflective tape 10 at lower gauge positions A and B
.. 10' is pasted H, and the laser beam emitted from the light emitting part 5 hits this reflective tape 10.10' and is reflected. Other parts of the specimen are not covered with reflective tape and do not reflect the laser beam.

集光部6は試験J4’ 2の反射テープ10.10′か
ら反射されてくるレーザー光線を集光する集光レンズ6
aをそなえ、該集光レンズで集められた反射光がセンサ
7によって検出される。
The condensing unit 6 is a condensing lens 6 that condenses the laser beam reflected from the reflective tape 10.10' of test J4'2.
a, and the reflected light collected by the condenser lens is detected by the sensor 7.

パルス読取器8は、センサ7によって検出された反射光
がいずれのパルスに該当するものかを読み取る装置であ
り、上下の標点−Lに貼着された反射テープ10.10
′からの反射光が、第何番目の発光ランプのものである
かがここで読み取られる。
The pulse reader 8 is a device that reads which pulse the reflected light detected by the sensor 7 corresponds to, and is a device that reads reflective tape 10.10 attached to the upper and lower gauge points -L.
The number of the light emitting lamp that the reflected light from ' is from is read here.

出力部9は、パルス読取器8によって読み取られたパル
スから、): 7’の反射テープ10.10′の間に含
まれるパルス数を求め、得られたパルス数と発光間隔(
隣接するf行な2本のレーザー光線間の距#)とから標
点間距離を求めて出力する部分である。負荷開始前の標
点間パルス数をPk、所定の負荷後の標点間パルス数を
PM、発光間隔をdとすると、標点間の変位6文は、 Δ文= (Pi−Pk)Xd であられされる。
The output unit 9 calculates the number of pulses included between the reflective tape 10 and 10' of ): 7' from the pulses read by the pulse reader 8, and calculates the number of pulses and the emission interval (
This is the part that calculates and outputs the gauge distance from the distance #) between two adjacent f-row laser beams. Assuming that the number of pulses between gauges before the start of loading is Pk, the number of pulses between gauges after a predetermined load is PM, and the emission interval is d, the displacement between gauges 6 sentences is Δ sentence = (Pi-Pk)Xd Hail to you.

なお、発光部5は、各パルス毎に等間隔で位置をずらし
てモ行にレーザー光線を発光することができるものであ
ればよく、第1図に図示したもののかわりに、第3図乃
至第5図に示すような装置を採用することもできる。す
なわち、第3図に示すものは、複数の発光ランプを並設
するかわりに、1個の発光体11と回転多面体12およ
び投光レンズ13をそなえてなるもので、発光体11か
ら発光されたレーザー光線は、回転多面体12によって
投光レンズ13側に反射され、投光レンズ13から試験
片2に向けて平行に投光される。回転多面体12の回転
によって反射面の角度が変わるため、各パルス毎に投光
位置が所定の間隔で規則正しく移動する。
Note that the light emitting unit 5 may be of any type as long as it can emit a laser beam in a straight line by shifting its position at equal intervals for each pulse, and instead of the one shown in FIG. It is also possible to employ a device as shown in the figure. That is, the one shown in FIG. 3 has one light emitting body 11, a rotating polyhedron 12, and a projection lens 13 instead of arranging a plurality of light emitting lamps in parallel. The laser beam is reflected by the rotating polyhedron 12 toward the projection lens 13, and is projected from the projection lens 13 in parallel toward the test piece 2. Since the angle of the reflecting surface changes as the rotating polyhedron 12 rotates, the light projection position moves regularly at predetermined intervals for each pulse.

第4図に示すものは、第3図に示す装置の回転多面体1
2のかわりにカルパー14を設けたもので、ガルバー1
4の微小角度の回動により投光レンズ13からの投光位
置が所定の間隔で規則正しく移動する。
What is shown in FIG. 4 is the rotating polyhedron 1 of the device shown in FIG.
It has Culper 14 instead of Galber 1.
4, the light projection position from the light projection lens 13 moves regularly at predetermined intervals.

第5図に示すものは、−I−記回転多面体12やガルバ
ー14のかわりに音響格子レンズ15を設けたもので、
該音響格子レンズによる回折角の変化によって、投光レ
ンズ13からの投光位置を所定の間隔で規則正しく移動
させるようになっている。
The one shown in FIG. 5 is one in which an acoustic grating lens 15 is provided in place of the -I- rotary polyhedron 12 and the galver 14.
By changing the diffraction angle by the acoustic grating lens, the position of the light projected from the light projecting lens 13 is moved regularly at predetermined intervals.

なお、以−Lの実施例では、いずれも試験片2の標点か
ら反射するレーザー光線を集光して標点の位置に対応す
るパルスを求めるようになっているが、集光部6を試験
片2を挾んで発光部5と反対側に設置し、試験片2の標
点には、発光部5からのレーザー光線を遮光する突起等
の遮光体を取り付けるとともに、標点以外の部分はレー
ザー光線が透過するように構成しておき、遮光された光
線のパルスから標点間距離を求めるようにしてもよい。
In the following embodiments, the laser beam reflected from the gauge point of the test piece 2 is focused to obtain a pulse corresponding to the position of the gauge point. The test piece 2 is placed on the opposite side from the light emitting part 5, and a light shielding body such as a protrusion is attached to the gauge point of the test piece 2 to block the laser beam from the light emitting part 5. It is also possible to configure the light beam to transmit the light beam, and to obtain the gauge distance from the pulse of the blocked light beam.

(発明の効果) 以上の説明から明らかなように、本発明にがかる標点間
食1位測定装置は、レーザー光線を用いて光学的に高精
度の測定を行なうことができるものであり、従来の伸び
計のように試験片にセンサ等を直接取り付ける必要がな
いので、煩雑な取イ4け作業を必要とせず、試験片破損
時に損傷を受けることもなくなった。
(Effects of the Invention) As is clear from the above explanation, the gage snack number 1 measuring device according to the present invention is capable of optically performing high-precision measurement using a laser beam, and is Since there is no need to attach a sensor or the like directly to the test piece as in the case of a meter, there is no need for complicated removal work, and there is no risk of damage when the test piece breaks.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明にかかる標点間変位測定装置の1例をあ
られす構成説明図、第2図はパルスをあられすグラフ、
第3図乃至第5図は異なる実施例をあられす発光部の構
成説明図である。 l・・・標点間変位測定装置  2・・・試験片  3
・・・パルス発生器  5・・・発光部  6・・・集
光部8・・・パルス読取器  9・・・出力部時 許 
出 願 人 株式会社島津製作所代理人  弁理士 菅
 原 弘 志 第2図 第5図
FIG. 1 is a configuration explanatory diagram showing an example of the gauge-to-gauge displacement measuring device according to the present invention, and FIG. 2 is a graph showing pulses.
FIGS. 3 to 5 are explanatory diagrams of the configuration of the light emitting section according to different embodiments. l... Gauge displacement measuring device 2... Test piece 3
... Pulse generator 5 ... Light emitting section 6 ... Focusing section 8 ... Pulse reader 9 ... Output section
Applicant Shimadzu Corporation Representative Patent Attorney Hiroshi Sugawara Figure 2 Figure 5

Claims (1)

【特許請求の範囲】[Claims] (1)所定の同期パルスを発生するパルス発生装置と、
所定の発光範囲において、その一端部から他端部へ順次
前記パルス発生装置のパルスに同期して所定の間隔で試
験片に向けて平行にレーザー光線を発光する発光部と、
試験片からのレーザー光線を集光する集光部と、該集光
部によって集光されたレーザー光線から、試験片の両標
点によって反射または遮光されたレーザー光線がいずれ
のパルスに該当するものであるかを読み取るパルス読取
り部と、該パルス読取り部の読取り結果に基いて両標点
間のパルス数を求め、得られたパルス数と発光間隔から
試験片の標点間距離を算出して出力する出力部とをそな
えてなる試験片の標点間変位測定装置。
(1) A pulse generator that generates a predetermined synchronization pulse;
a light emitting unit that emits a laser beam in parallel toward the test piece from one end to the other end in a predetermined light emitting range at predetermined intervals in synchronization with the pulses of the pulse generator;
A condenser unit that condenses the laser beam from the test piece, and which pulse corresponds to the laser beam reflected or blocked by both gage points of the test piece from the laser beam condensed by the condenser unit. A pulse reading section that reads the pulse reading section, and an output that calculates the number of pulses between both gauges based on the reading results of the pulse reading section, calculates the distance between the gauges of the test piece from the obtained number of pulses and the emission interval, and outputs the result. A gauge-to-gage displacement measuring device for a specimen, comprising:
JP60170215A 1985-07-31 1985-07-31 Material testing machine Expired - Lifetime JPH0789050B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60170215A JPH0789050B2 (en) 1985-07-31 1985-07-31 Material testing machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60170215A JPH0789050B2 (en) 1985-07-31 1985-07-31 Material testing machine

Publications (2)

Publication Number Publication Date
JPS6230905A true JPS6230905A (en) 1987-02-09
JPH0789050B2 JPH0789050B2 (en) 1995-09-27

Family

ID=15900802

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60170215A Expired - Lifetime JPH0789050B2 (en) 1985-07-31 1985-07-31 Material testing machine

Country Status (1)

Country Link
JP (1) JPH0789050B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006337078A (en) * 2005-05-31 2006-12-14 Fujifilm Holdings Corp Sheet-length measuring arrangement, sheet distribution line, sheet cutting line and sheet-length measuring method
JP2014077660A (en) * 2012-10-09 2014-05-01 Fuji Xerox Co Ltd Detector
ES2573353A1 (en) * 2016-03-28 2016-06-07 Universidad De Murcia Optical instrument for non-contact length measurement (Machine-translation by Google Translate, not legally binding)
CN107576570A (en) * 2017-09-27 2018-01-12 江苏法尔胜特钢制品有限公司 The cupping machine of steel wire rope

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5390981A (en) * 1977-01-20 1978-08-10 Yokohama Rubber Co Ltd Tension testing apparatus
JPS58218604A (en) * 1982-06-14 1983-12-19 Mitsutoyo Mfg Co Ltd Method and apparatus for photoelectric type measurement
JPS59151973A (en) * 1983-02-17 1984-08-30 三菱電機株式会社 Swing measuring device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5390981A (en) * 1977-01-20 1978-08-10 Yokohama Rubber Co Ltd Tension testing apparatus
JPS58218604A (en) * 1982-06-14 1983-12-19 Mitsutoyo Mfg Co Ltd Method and apparatus for photoelectric type measurement
JPS59151973A (en) * 1983-02-17 1984-08-30 三菱電機株式会社 Swing measuring device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006337078A (en) * 2005-05-31 2006-12-14 Fujifilm Holdings Corp Sheet-length measuring arrangement, sheet distribution line, sheet cutting line and sheet-length measuring method
JP4619865B2 (en) * 2005-05-31 2011-01-26 富士フイルム株式会社 Sheet length measuring device, sheet sorting line, sheet cutting line, and sheet length measuring method
JP2014077660A (en) * 2012-10-09 2014-05-01 Fuji Xerox Co Ltd Detector
ES2573353A1 (en) * 2016-03-28 2016-06-07 Universidad De Murcia Optical instrument for non-contact length measurement (Machine-translation by Google Translate, not legally binding)
CN107576570A (en) * 2017-09-27 2018-01-12 江苏法尔胜特钢制品有限公司 The cupping machine of steel wire rope

Also Published As

Publication number Publication date
JPH0789050B2 (en) 1995-09-27

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