JPS6230692A - Liquid-phase epitaxial growth apparatus - Google Patents

Liquid-phase epitaxial growth apparatus

Info

Publication number
JPS6230692A
JPS6230692A JP16681285A JP16681285A JPS6230692A JP S6230692 A JPS6230692 A JP S6230692A JP 16681285 A JP16681285 A JP 16681285A JP 16681285 A JP16681285 A JP 16681285A JP S6230692 A JPS6230692 A JP S6230692A
Authority
JP
Japan
Prior art keywords
melt
holding device
substrate holding
partition plate
reservoir
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16681285A
Other languages
Japanese (ja)
Other versions
JPH0310594B2 (en
Inventor
Toshio Sagawa
佐川 敏男
Tsunehiro Unno
恒弘 海野
Mineo Wajima
峰生 和島
Shoji Kuma
隈 彰二
Kazuhiro Kurata
倉田 一宏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Cable Ltd
Original Assignee
Hitachi Cable Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Cable Ltd filed Critical Hitachi Cable Ltd
Priority to JP16681285A priority Critical patent/JPS6230692A/en
Publication of JPS6230692A publication Critical patent/JPS6230692A/en
Publication of JPH0310594B2 publication Critical patent/JPH0310594B2/ja
Granted legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Abstract

PURPOSE:To efficiently grow a multilayer crystal layer on a substrate, by providing plural melt reservoirs and melt housing baths in the upper and lower parts of a holding device for holding vertically plural semiconductor substrates through a slidable partition plate. CONSTITUTION:Plural melt reservoirs 24 are formed on a fixed substrate holding device 27 for vertically holding semiconductor substrates 25 through a slidable partition plate 21 having a perforated hole 29. Melt housing baths 28 in the same number as the melt reservoirs 24 are formed below the substrate holding device 27 through a slidable partition plate 22 having a perforated hole 29. A melt 23 is contained in the plural melt reservoirs 23, and the melt 23 is dropped by the operation of the partition plate 21 one after another and brought into contact with the substrates 25 to grow a crystal. The partition plate 22 is operated to drop the melt 23 in the substrate holding device 27 into the melt housing baths 28 and the operation is repeatedly carried out as much as the number of the melt reservoirs 24.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は液相エピタキシャル成長装置に係り、特に多数
枚の半導体基板上に同時に多層エピタキシャル層を成長
さる成長装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a liquid phase epitaxial growth apparatus, and more particularly to a growth apparatus for simultaneously growing multilayer epitaxial layers on a large number of semiconductor substrates.

[従来の技術] 一般に、■−v族化合物半導体レーザダイオードや発光
ダイオード等の半導体素子のエピタキシャル層成長法と
して、スライドボート法を用いた液相エピタキシシル成
長法が採用されている。
[Prior Art] In general, a liquid phase epitaxial growth method using a slide boat method is employed as an epitaxial layer growth method for semiconductor devices such as ■-V group compound semiconductor laser diodes and light emitting diodes.

ところで、このスライド式エピタキシャル成長法で多層
エピタキシャル層を形成するのは非常に簡便なため研究
や実験等の場合には有効となるが、水平に倒した基板に
融液を接触させるので、1回のエピタキシャル成長工程
によって1枚ないし2枚程度の半導体基板しか処理でき
ず量産には向かなかった。
By the way, forming a multilayer epitaxial layer using this sliding epitaxial growth method is very simple and effective for research and experiments, but since the melt is brought into contact with a horizontally tilted substrate, it is difficult to form a multilayer epitaxial layer in one step. The epitaxial growth process could only process one or two semiconductor substrates, making it unsuitable for mass production.

そこで、多数枚を同時処理ツる方法どして第3図及び第
4図に示す如く、基板保持装置1内の基板2を起立させ
て融液3を重力落下させる方法が考えられた。第3図の
ものは1枚の仕切板4を引いて融液3を落下させ、所定
時間後融液3を装置外へ取り出すようにしたものである
。第4図のらのは第3図のものを改良したものであり、
上方の仕切板5を押して融液3を落下させ、所定時間後
は今度は下方の仕切板6を押して融液3を基板2から分
離させるようにしたものである。
Therefore, as a method for processing a large number of substrates at the same time, as shown in FIGS. 3 and 4, a method was devised in which the substrates 2 in the substrate holding device 1 are stood up and the melt 3 is allowed to fall by gravity. In the one shown in FIG. 3, one partition plate 4 is pulled to allow the melt 3 to fall, and after a predetermined period of time, the melt 3 is taken out of the apparatus. The number shown in Figure 4 is an improved version of the one shown in Figure 3.
The upper partition plate 5 is pushed to cause the melt 3 to fall, and after a predetermined time, the lower partition plate 6 is pushed this time to separate the melt 3 from the substrate 2.

[発明が解決しようとする問題点] しかし、上述した第3図及び第4図のものは、確かに同
時に多数枚エピタキシャル成長させることはできるが、
1回のエピタキシトル成長工程では単相しか成長させる
ことができないという欠点があった。
[Problems to be Solved by the Invention] However, although it is certainly possible to epitaxially grow a large number of layers at the same time in the cases shown in FIGS. 3 and 4 above,
There is a drawback that only a single phase can be grown in one epitaxial growth process.

この欠点を解消したのが特開昭59−189621号公
報に示された押し上げ式と呼ばれるものであり、第3図
及び第4図のものはこれに対して重力落下方式と呼ばれ
る。押し上げ方式は第5A図及び第5B図に示す如く、
ピストン7にJ、っC@積が変化する融液溜め8を下部
ボート9の長手方向に複数個設けると共に、基板保持装
置10とダミー用の空所11とを形成した上部ボート1
2を下部ボート9上にスライド自在に設けて、上部ボー
ト12のスライドにより基板保持装置10を各融液溜め
8上に順次位置決めし、その位置決めの度にピストン7
操作により、融液13を押し上げ、そして降下させ、元
の融液溜めに房して基板14に多層成長させるようにな
っている。
A device which solves this drawback is a so-called push-up type disclosed in Japanese Patent Application Laid-Open No. 59-189621, and the one shown in FIGS. 3 and 4 is called a gravity fall type. The push-up method is as shown in Figures 5A and 5B.
An upper boat 1 in which a piston 7 is provided with a plurality of melt reservoirs 8 whose volumes change in the longitudinal direction of a lower boat 9, and a substrate holding device 10 and a dummy cavity 11 are formed.
2 is slidably provided on the lower boat 9, and the substrate holding device 10 is sequentially positioned on each melt reservoir 8 by sliding the upper boat 12. Each time the substrate holding device 10 is positioned, the piston 7
By operation, the melt 13 is pushed up and then lowered, and is collected in the original melt reservoir to grow multiple layers on the substrate 14.

しかし、この押し上げ方式は融液溜めの増加や上部ボー
トにおける基板保持装置の位置、形状を工夫することに
より、エピタキシセル成長層数または基板保持枚数を任
意に変えることができるという大きな利点があるものの
、本発明者による実験結果では基板保持装置の位置決め
が正確に定まらなかったり、成長中に融液の重みによっ
てピストンが移動したりして、その操作にかなりな熟練
を要するという欠点があることがわかった。
However, although this push-up method has the great advantage that the number of epitaxy cell growth layers or the number of substrates held can be changed arbitrarily by increasing the melt reservoir and devising the position and shape of the substrate holding device in the upper boat. According to experimental results by the present inventors, the positioning of the substrate holding device may not be determined accurately, and the piston may move due to the weight of the melt during growth, which requires considerable skill to operate. Understood.

なお、第4図のものでも、融液収納槽15を第5A図の
ようにボートの長手方向に複数個設けて多層成長させよ
うとした場合、基板保持装置を移動させることには変わ
りがない。
Note that even in the case of the one shown in Fig. 4, if a plurality of melt storage tanks 15 are provided in the longitudinal direction of the boat as shown in Fig. 5A and multilayer growth is attempted, the substrate holding device is still moved. .

[発明の目的] 第1の発明の目的は、基板保持ifを移動させることな
く多数枚の基板に同時に多層エピタキシャル層を成長さ
せることが可能な液相エピタキシャル成長装置を提供す
ることであφ。
[Objective of the Invention] The object of the first invention is to provide a liquid phase epitaxial growth apparatus that can simultaneously grow multilayer epitaxial layers on a large number of substrates without moving the substrate holder if.

また、第1の発明の他の目的は重力落下方式で多層エピ
タキシャル層を成長させることが可能な液相エピタキシ
を戸ル成艮装置を提供することである。
Another object of the first invention is to provide a liquid phase epitaxy forming apparatus capable of growing a multilayer epitaxial layer using a gravity drop method.

第2の発明の目的は、第1の発明の1番目の目的と同じ
く、基板保持装置を移動させることなく多数枚の基板に
同時に多層エピタキシャル層を成長させることが可能な
液相エピタキシャル成長装置を提供することである。
As with the first object of the first invention, the second object of the invention is to provide a liquid phase epitaxial growth apparatus capable of simultaneously growing multilayer epitaxial layers on a large number of substrates without moving the substrate holding device. It is to be.

また、第2の発明の他の目的は押しFげ方式を採用しな
がら操作性の良好な液相エピタキシャル成長装置を提供
することである。
Another object of the second invention is to provide a liquid phase epitaxial growth apparatus that employs a push-down method and has good operability.

[発明の概要] 第1の発明の液相エピタキシャル成長装置は、共通の基
板保持装置上に2個以上の融液溜めを連通させ、その連
通が仕切板によって開閉されることに特徴がある。
[Summary of the Invention] The liquid phase epitaxial growth apparatus of the first invention is characterized in that two or more melt reservoirs are communicated with each other on a common substrate holding device, and the communication is opened and closed by a partition plate.

即ち、第1の発明の液相エピタキシャル成長装置は、実
施例に対応する第1A図〜第1B図に示す如く、スライ
ド式でなく固定式の基板保持装置27上に、これに共通
して連通する融液溜め24を2個以上形成し、各融液溜
め(24a〜24C〉と共通の基板保持装置との間にそ
れぞれスライド自在に仕切板(218〜21C)が設け
られる。
That is, the liquid phase epitaxial growth apparatus of the first invention, as shown in FIGS. 1A to 1B corresponding to the embodiment, is on a substrate holding device 27 that is not a sliding type but a fixed type, and is commonly connected to the substrate holding device 27. Two or more melt reservoirs 24 are formed, and partition plates (218 to 21C) are slidably provided between each melt reservoir (24a to 24C) and a common substrate holding device.

一方、基板保持装置27下には、これに連通ずる融液収
納槽28が融液溜め24と同数形成され、各融液収納槽
(28a〜28C)と基板保持装置27との間にそれぞ
れスライド自在に仕切板(22a〜22C)を設けてい
る。
On the other hand, the same number of melt storage tanks 28 as the melt reservoirs 24 are formed below the substrate holding device 27 and communicated therewith, and slide between each melt storage tank (28a to 28C) and the substrate holding device 27. Partition plates (22a to 22C) are freely provided.

各仕切板の操作により、基板保持装置を移動させること
なくこれに各融液溜めからそれぞれ融液を落下供給し、
また各仕切板を独立に操作して融液の切換え時に異種融
液が混り合うことなく有効に入れ換わるようにしたもの
である。
By operating each partition plate, the melt is dropped and supplied from each melt reservoir to the substrate holding device without moving it,
In addition, each partition plate is operated independently so that different kinds of melts can be exchanged effectively without mixing when switching melts.

また、第2の弁明の液相エピタキシ1?ル成長装置は、
共通の基板保持装置下に2個以上の融液溜めを連通さけ
、その連通が仕切板によって開mされることに特徴があ
る。
Also, the second defense liquid phase epitaxy 1? Le growth equipment is
The feature is that two or more melt reservoirs are communicated with each other under a common substrate holding device, and the communication is opened by a partition plate.

即ち、第2の発明の液相エピタキシャル成長装置は、実
施例に対応する第2A図〜第2B図に示す如く、固定式
の基板保持装置47下に、これに共通して連通する融液
溜め44を2個以上形成し、各融液溜め(44a〜44
c)内にピストン39をそれぞれ取り付ける。
That is, in the liquid phase epitaxial growth apparatus of the second invention, as shown in FIGS. 2A and 2B corresponding to the embodiment, a melt reservoir 44 is provided below a fixed substrate holding device 47 and communicated therewith in common. 2 or more are formed, and each melt reservoir (44a to 44
c) Install the pistons 39 in each.

また、各融液溜め44と基板保持装置47との間にそれ
ぞれスライド自在に仕切板(418〜41C)を設けて
いる。
Furthermore, partition plates (418 to 41C) are provided between each melt reservoir 44 and the substrate holding device 47 so as to be slidable.

各ピストンの操作により、基板保持装置を移動させるこ
となくこれに各融液溜めからそれぞれ融液を押し上げ供
給し、また各仕切板の独立操作により、押し上げた融液
の重みでピストンが移動したり、融液の切換え時に異種
融液が混じり合わないようにしたものである。
By operating each piston, melt is pushed up and supplied from each melt reservoir to the substrate holding device without moving it, and by independent operation of each partition plate, the piston is moved by the weight of the pushed up melt. , to prevent different types of melts from mixing when switching melts.

[実施例1 本発明の実施例を第1A図〜第2B図に基づいて説明す
れば以下の通りである。
[Embodiment 1] An embodiment of the present invention will be described below based on FIGS. 1A to 2B.

第1A図及び第1B図は重力落下方式の液相エピタキシ
ャル成長装置を示す。第1A図の正断面図に示す如く、
装置本体2oの中空室は2枚の仕切板21.22によっ
て上、中、下の3段に仕切られている。上段には融液2
3を溜める融液溜め24、中段には複数の基板25をス
ペーサ26で背中合Vで垂直に支持するU板保持装置2
7下そして下段には融液収納槽28がそれぞれ設けられ
る。
FIGS. 1A and 1B show a liquid phase epitaxial growth apparatus using a gravity drop method. As shown in the front cross-sectional view of Figure 1A,
The hollow chamber of the device main body 2o is partitioned into three stages, upper, middle, and lower, by two partition plates 21 and 22. Melt liquid 2 is in the upper row
A U-plate holding device 2 that vertically supports a plurality of substrates 25 with spacers 26 in a back-to-back V is placed in the middle stage.
Melt liquid storage tanks 28 are provided below 7 and at the lower stage, respectively.

上記2つの仕切板21.22は共に本体両側方向にスラ
イド自在に設けられ、中央部に1通孔29を、成長炉の
外部から操作できるように本体−側から引き出した端部
に操作棒30を係合する係合孔を有しており、上の仕切
板21にあっては、図示状態で融液溜め24と基板保持
装置27との連通を断ち、操作捧30を押し込めば両者
が連通するようになっている。また、下の仕切板22に
あっては、図示状態で基板保持装置27と融液収納[2
8との連通を断ち、操作棒30を押し込めば両者が連通
ずるようになっている。
The two partition plates 21 and 22 are both slidably provided in both directions of the main body, and have a through hole 29 in the center and an operating rod 30 in the end pulled out from the main body side so that they can be operated from outside the growth furnace. In the upper partition plate 21, communication between the melt reservoir 24 and the substrate holding device 27 is cut off in the illustrated state, and when the operation bar 30 is pushed in, the two are communicated with each other. It is supposed to be done. In addition, in the lower partition plate 22, a substrate holding device 27 and a melt storage [2] are provided in the illustrated state.
By cutting off the communication with 8 and pushing in the operating rod 30, the two will communicate with each other.

このような融液溜め24、融液収納槽28、仕切板21
.22及び操作棒30は、第1B図の側面図に示す如く
、1個ではなく2個以上ある。即ち、基板保持装置27
上の本体幅方向に基板保持装置27と連通する融液溜め
24が3個(248〜24c)、これに対応してす板保
持装置27下の本体幅方向にこれと連通ずる融液収納槽
28が3個(288〜28c)並設され、各融液溜め2
4と基板保持装@27とを継ぐ各連通路32及び基板保
持装置27と各融液収納槽28とを継ぐ各連通路に操作
棒30を係合した仕切板が都合6枚(21a 〜21c
 、22a 〜22c )設けられている。
Such melt reservoir 24, melt storage tank 28, partition plate 21
.. As shown in the side view of FIG. 1B, there are two or more operating rods 22 and 30 instead of one. That is, the substrate holding device 27
There are three melt reservoirs 24 (248 to 24c) communicating with the substrate holding device 27 in the width direction of the main body above, and correspondingly there are melt storage tanks communicating with this in the width direction of the main body below the plate holding device 27. 28 (288 to 28c) are arranged in parallel, and each melt reservoir 2
There are a total of six partition plates (21a to 21c) with operating rods 30 engaged in each communication path 32 connecting the substrate holding device 4 and the substrate holding device @27, and in each communication path connecting the substrate holding device 27 and each melt storage tank 28.
, 22a to 22c) are provided.

これらの仕切板21.22は操作棒30によって別個独
立にスライド操作が可能であり、また融液溜め24と融
液収納槽28どの間に位置する基板保持装置27は本体
20に固定される。
These partition plates 21 and 22 can be slid independently by operating rods 30, and the substrate holding device 27 located between the melt reservoir 24 and the melt storage tank 28 is fixed to the main body 20.

さて次に、上記のような溝成における作用を具体的に述
べる。
Next, we will specifically describe the effects of groove formation as described above.

第1A図に示す結晶成長装置本体20をグラフフィト製
で成形し、その大きさを、仕切板スライド方向長さ15
CII11横幅12c+n、高さ12cmとし、中段に
収納した基板保持装置27に30111+11X 30
mmx O,5mmの基板25をグラファイトスペーサ
26を介して背中合せに20枚セットしIC6 第1の融液溜め24aにはG a A 550g、Qa
600(1、丁e 20mg、第2の融液溜め24aに
はGa A 550g、 Ga[300g 、亜鉛eo
omg 、第3の融液溜め24cにはQaAs40g、
QalliOOg 、アルミニウム8g、亜鉛5gをそ
れぞれ秤量添加した。
The crystal growth apparatus main body 20 shown in FIG.
CII11 width 12c+n, height 12cm, 30111+11X 30 on the board holding device 27 stored in the middle shelf.
Set 20 substrates 25 of mm x O, 5 mm back to back through graphite spacers 26, and put IC6 in the first melt reservoir 24a with Ga A of 550 g, Qa.
600 (1, 20 mg, second melt reservoir 24a contains 550 g of Ga A, 300 g of Ga, zinc eo
omg, 40 g of QaAs in the third melt reservoir 24c,
QalliOOg, 8 g of aluminum, and 5 g of zinc were each weighed out.

しかる後に、本体20を液相結晶成長炉に入れ、水素を
流しながら800℃まで昇温し、800℃で3時間放置
後、0.5℃/分の一定速1良で炉の降温を開始した。
After that, the main body 20 was placed in a liquid phase crystal growth furnace, and the temperature was raised to 800°C while flowing hydrogen, and after being left at 800°C for 3 hours, the temperature of the furnace was started to decrease at a constant rate of 0.5°C/min. did.

降温開始して5℃下がったところで、まず上方外の第1
の操作棒30により仕切板21aを押し込み基板保持装
置27内に第1の融液23を満した。ここで操作棒30
は元に戻し、融液23を基板25に接触させてから10
分後、上方外の@2の操作棒30により仕切板22aを
押し込み帖板保持装置27内の融液を第1の融液収納槽
28aに落下させた。
When the temperature starts to drop by 5℃, first the first
The partition plate 21a was pushed in using the operating rod 30 to fill the substrate holding device 27 with the first melt 23. Here the operating rod 30
is returned to its original position, the melt 23 is brought into contact with the substrate 25, and then 10
After a few minutes, the partition plate 22a was pushed in using the operating rod 30 located outside of the upper part @2, causing the melt in the plate holding device 27 to fall into the first melt storage tank 28a.

次に、同様にして上方中央の第3の操作棒30により融
液23を基板25と5分間接触させた後、下方中央の第
4の操作棒30により融液を第2の融液収納槽28bに
落下させ、更に残りの第5及び第6の操作棒30,30
の操作により融液23による2分間の成長を行ない、P
−GaAJ!△S/P−Ga As /n −Ga A
s /n −Ga As W板の三層エピタキシセル結
晶を成長させた。
Next, in the same manner, the melt 23 is brought into contact with the substrate 25 for 5 minutes using the third operation rod 30 located at the upper center, and then the melt 23 is transferred to the second melt storage tank using the fourth operation rod 30 located at the lower center. 28b, and then the remaining fifth and sixth operating rods 30, 30.
Growth was performed for 2 minutes using the melt 23 by the operation of P
-GaAJ! △S/P-Ga As /n-Ga A
A three-layer epitaxial cell crystal of s/n-GaAsW plate was grown.

炉を冷却してから基板25を取り出し評価したところ、
基板の周辺的2mmは厚さ不均一となるが、それ以外の
部分はほぼ均一な成長層が得られた。
After cooling the furnace, the board 25 was taken out and evaluated.
Although the thickness of the peripheral 2 mm of the substrate was non-uniform, a substantially uniform growth layer was obtained in other parts.

この結晶を使用して太陽電池を試作したところ、1セル
当り 0.9Vの起電力を得た。
When a solar cell was prototyped using this crystal, an electromotive force of 0.9V was obtained per cell.

第2A図及び第2B図は押し上げ方式の液相エピタキシ
ャル成長装置を示す。この方式は重力落下方式に比して
融液溜めを基板保持装置の下側に設置することにより重
心を低くすることができ安定性がよい。第2A図の正断
面図に示す如く、装置本体40の中空室は1枚の仕切板
41によって、上、下部に仕切られている。上部には複
数の基板45を背中合せで垂直に支持する固定式の基板
保持装置47が設けられ、その上面には空気抜孔35を
形成した蓋板36が、下面には融液移動孔37を形成し
た底板38がそれぞれ取り付けられる。
FIGS. 2A and 2B show a push-up type liquid phase epitaxial growth apparatus. Compared to the gravity drop method, this method has better stability because the center of gravity can be lowered by installing the melt reservoir below the substrate holding device. As shown in the front sectional view of FIG. 2A, the hollow chamber of the device main body 40 is partitioned into an upper part and a lower part by a single partition plate 41. A fixed substrate holding device 47 that vertically supports a plurality of substrates 45 back to back is provided at the top, and a lid plate 36 with air vent holes 35 formed on its top surface and melt transfer holes 37 formed on its bottom surface. The bottom plates 38 are respectively attached.

また、下部にはピストン39により容積が替わる融液溜
め44が設けられ、ピストンロッド42を係合した操作
棒50を押し込めば融液溜め44内の融液43が基板保
持装置147内に押し上げら −れるようになっている
Further, a melt reservoir 44 whose volume is changed by a piston 39 is provided at the bottom, and when the operating rod 50 engaged with the piston rod 42 is pushed in, the melt 43 in the melt reservoir 44 is pushed up into the substrate holding device 147. - It is now possible to do so.

上記仕切板41は本体両側方向にスライド自在に設けら
れ、これに係合した操作棒50を押すと基板保持装置4
7と融液溜め44との連通を断ち、逆に操作棒50を引
くとその連通を回復させるようになっている。
The partition plate 41 is provided so as to be slidable in both directions of the main body, and when the operating rod 50 engaged with the partition plate 41 is pushed, the substrate holding device 4
7 and the melt reservoir 44, and conversely, when the operating rod 50 is pulled, the communication is restored.

このような融液溜め44、ピストン39、ピストン用操
作棒42、仕切板41及び仕切板用操作棒50は第2B
図の側面図に示づ如く、1個ではなく2個以上ある。即
ち、基板保持装置47下の本体幅方向に基板保持装置4
7と連通する融液溜め44が3個(44a 〜44c 
)並設され、これらにピストン用操作棒50により操作
されるピストン39がそれぞれ嵌装され、さらに基板保
持袋@47と各融液溜め44とを継ぐ各連通路42に仕
切板用操作棒50を係合した仕切板41a〜41cがそ
れぞれ設けられている。
The melt reservoir 44, the piston 39, the piston operating rod 42, the partition plate 41, and the partition plate operating rod 50 are the second B.
As shown in the side view of the figure, there are not one but two or more. That is, the substrate holding device 4 is placed below the substrate holding device 47 in the width direction of the main body.
There are three melt reservoirs 44 (44a to 44c) communicating with
) The pistons 39 which are arranged in parallel and operated by the piston operating rods 50 are respectively fitted, and furthermore, the partition plate operating rods 50 are installed in each communication path 42 connecting the substrate holding bag @ 47 and each melt reservoir 44. Partition plates 41a to 41c are provided, respectively.

さて、上記のような押し上げ方式を採用した構成におい
て、多数種類の組成の成長を行なったところ、前述した
重力落下方式と同じ様な良好な結果が得られた。この場
合において、融液43をピストン39で押し上げるに先
行して仕切板41を引き、融液43の上昇移動を許容す
るが、押し上げ後は仕切板を押して元に戻し融液43の
落下移動を規制する。即ち、ピストン39にではな(仕
切板41によって基板保持装置47中に融液43を保持
させる。したがって、成長中融液の=nみによってピス
トンを押し戻し融液溜め44に融液が戻ることがないた
め、基板全面に良好な多層エピタキシャル結晶を(ηる
ことができる。
Now, in the structure employing the above-mentioned push-up method, when growth of many types of compositions was performed, good results similar to those of the above-mentioned gravity fall method were obtained. In this case, the partition plate 41 is pulled before the melt 43 is pushed up by the piston 39 to allow the melt 43 to move upward, but after being pushed up, the partition plate is pushed back to its original position to prevent the melt 43 from falling. regulate. That is, the melt 43 is held in the substrate holding device 47 by the partition plate 41 rather than by the piston 39. Therefore, during growth, the piston is pushed back and the melt does not return to the melt reservoir 44. Therefore, it is possible to form a good multilayer epitaxial crystal (η) over the entire surface of the substrate.

なお、上記成長装置のいずれの方式の実施例においても
、操作棒を手引によって操作する場合について述べたが
、オートローダを設置して自動的に操作棒を操作して融
液の移動規制を行なうこともできる。
In addition, in each of the embodiments of the above-mentioned growth apparatus, the case where the operating rod is operated by hand is described, but it is also possible to install an autoloader and automatically operate the operating rod to regulate the movement of the melt. You can also do it.

また、融液溜めの個数も3゛個に限定されるものではな
く、融液の容量に応じて装置本体を設計することにより
、その限度において4個にも5個にも増加させることは
容易で、これは溶液溜めを本体の長さ方向にではなく幅
方向に設けたから容易になるのである。本体の幅方向に
設【プることにより、各仕切板あるいはピストンの相互
干渉が防げるからである。
Furthermore, the number of melt reservoirs is not limited to 3, but can easily be increased to 4 or 5 within that limit by designing the main body of the device according to the capacity of the melt. This is made easier because the solution reservoir is provided in the width direction of the main body instead of in the length direction. This is because mutual interference between the partition plates or the pistons can be prevented by providing them in the width direction of the main body.

更に、本発明はQa As /Ga AβΔS半導体結
晶系ばかりではなく、In Ga As P/ In 
P系、その他液相成長法により成長可能な結晶であれば
広く適用できる。
Furthermore, the present invention applies not only to the Qa As /Ga AβΔS semiconductor crystal system but also to the In Ga As P/In
P-based crystals and other crystals that can be grown by liquid phase growth can be widely applied.

[発明の効果] 以上型するに本発明によれば次のような優れた効果を発
揮する。
[Effects of the Invention] To summarize, the present invention exhibits the following excellent effects.

(1)  仕切板の操作のみによって2個以上の溶液溜
めから基板保持装置内に別個に融液を落下供給できるの
で、重力落下方式でありながら、基板保持装置を移動す
ることなく多数枚の半導体基板上に同時に多層エピタキ
シトル成長を行なうことができ、量産性に富む。
(1) Melt liquid can be separately dropped into the substrate holding device from two or more solution reservoirs by simply operating the partition plate, so even though it is a gravity drop method, a large number of semiconductors can be processed without moving the substrate holding device. Multilayer epitaxial growth can be performed simultaneously on a substrate, making it highly suitable for mass production.

(2)  また、ピストンを設けた2個以上の融液溜め
とこれらの上部に連通する基板保持装置との間に、従来
にはないスライド自在な仕切板を設けたことにより、押
し上げ方式でありながら、基板保持装置を移動すること
なく多数枚の半導体基板上に同時に多層エピタキシャル
成長を行なうことができる一方、成長中はピストンにで
はなく仕切板によって基板保持装置内に融液を確実に保
持することができるので、成長中に融液の重みによって
ピストンが移動して融液レベルが変′#J′rjること
がなくなる。したがって、従来のものに比べて熟練を要
さず、操作性が容易で、しかも高品質の多層エピタキシ
ャル結晶が得られる。
(2) In addition, an unprecedented sliding partition plate is provided between two or more melt reservoirs equipped with pistons and a substrate holding device that communicates with the top of these reservoirs, making it possible to use a push-up method. However, while it is possible to simultaneously perform multilayer epitaxial growth on a large number of semiconductor substrates without moving the substrate holding device, it is possible to reliably hold the melt inside the substrate holding device during growth using a partition plate rather than a piston. As a result, the piston does not move due to the weight of the melt during growth and the melt level does not change. Therefore, a multilayer epitaxial crystal of high quality can be obtained, which requires no skill and is easy to operate compared to the conventional method.

【図面の簡単な説明】[Brief explanation of the drawing]

第1A図は本発明を重力落下方式の液相エピタキシャル
成長装置に適用した一実施例を示す正面断面図、第1B
図は第1A図の側面図、第2A図は本発明を押し上げ方
式の液相エピタキシャル成長装置に適用した他の実施例
を示す正面断面図、第2B図は第2Δ図の側面図、第3
図〜第4図は重力落下方式の従来の液相エピタキシVル
成長装置例をそれぞれ示す正面断面図、第5A図は押し
上げ方式の従来の液相エピタキシャル成長装置例を示す
正面断面図、第5B図は第5A図のVB−48線断面図
である。 図中、21.21a 〜210.22.22a 〜22
Cは仕切板、23は融液、24.24a 〜24Gは融
液溜め、25は基板、27は基板保持装置、28.28
a 〜28cは融液収納槽、39はピストン、41.4
1a 〜41cは仕切板、43は融液、44.44a−
44c +、tm液溜め、45は基板、47は基板保持
装置である。
FIG. 1A is a front sectional view showing an embodiment in which the present invention is applied to a liquid phase epitaxial growth apparatus using a gravity drop method, and FIG.
The drawings are a side view of Fig. 1A, Fig. 2A is a front sectional view showing another embodiment in which the present invention is applied to a push-up type liquid phase epitaxial growth apparatus, Fig. 2B is a side view of Fig. 2Δ, and Fig. 3 is a side view of Fig. 1A.
4 to 4 are front sectional views showing examples of conventional liquid phase epitaxial growth apparatuses using a gravity drop method, FIG. 5A are front sectional views showing examples of conventional liquid phase epitaxial growth apparatuses using a push-up method, and FIG. 5B. 5A is a sectional view taken along the line VB-48 in FIG. 5A. In the figure, 21.21a ~ 210.22.22a ~ 22
C is a partition plate, 23 is a melt, 24.24a to 24G are melt reservoirs, 25 is a substrate, 27 is a substrate holding device, 28.28
a to 28c are melt storage tanks, 39 is a piston, 41.4
1a to 41c are partition plates, 43 is a melt, 44.44a-
44c +, a tm liquid reservoir, 45 a substrate, and 47 a substrate holding device.

Claims (2)

【特許請求の範囲】[Claims] (1)半導体基板を垂直に複数枚保持する固定の基板保
持装置上に、これに連通する融液溜めを2個以上形成し
、各溶融液溜めと基板保持装置との間にスライド方向に
応じて融液を融液溜め内に保持する一方、基板保持装置
内に落下移動させる仕切板をそれぞれスライド自在に設
け、基板保持装置下には、これに連通する融液収納槽を
融液溜めと同数形成し、各融液収納槽と基板保持装置と
の間にスライド方向に応じて落下移動した融液を基板保
持装置内に保持する一方、基板保持装置外へ排出して融
液溜めに対応する融液収納槽に収納させる仕切板をそれ
ぞれスライド自在に設けたことを特徴とする液相エピタ
キシャル成長装置。
(1) On a fixed substrate holding device that vertically holds multiple semiconductor substrates, two or more melt reservoirs are formed in communication with the fixed substrate holding device, and the gap between each melt reservoir and the substrate holding device is adjusted according to the sliding direction. While the melt is held in the melt reservoir, partition plates are slidably provided to allow the melt to fall into the substrate holding device, and a melt storage tank is connected to the melt reservoir under the substrate holding device. The same number of melts are formed, and the melt that falls and moves between each melt storage tank and the substrate holder according to the sliding direction is held in the substrate holder, while being discharged to the outside of the substrate holder to serve as a melt reservoir. A liquid phase epitaxial growth apparatus characterized in that partition plates are slidably provided to accommodate the melt in the melt storage tank.
(2)半導体基板を垂直に複数枚保持する固定の基板保
持装置下に、これに連通する融液溜めを2個以上形成し
、各融液溜め内にスライド方向により融液を基板保持装
置内に押し上げる一方、同一融液溜め内に降下収納させ
るピストンをそれぞれ取り付け、各融液溜めと基板保持
装置との間にスライド方向に応じてピストンにより押し
上げられた融液を基板保持装置内に保持する一方、ピス
トンによる融液の昇降を許容する仕切板をそれぞれスラ
イド自在に設けたことを特徴とする液相エピタキシャル
成長装置。
(2) Two or more melt reservoirs are formed under a fixed substrate holding device that vertically holds multiple semiconductor substrates, and the melt is fed into each melt reservoir according to the sliding direction. At the same time, a piston is installed to lower and store the melt in the same melt reservoir, and between each melt reservoir and the substrate holding device, the melt pushed up by the piston according to the sliding direction is held in the substrate holding device. On the other hand, a liquid phase epitaxial growth apparatus is characterized in that partition plates that allow the melt to move up and down by pistons are provided in a slidable manner.
JP16681285A 1985-07-30 1985-07-30 Liquid-phase epitaxial growth apparatus Granted JPS6230692A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16681285A JPS6230692A (en) 1985-07-30 1985-07-30 Liquid-phase epitaxial growth apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16681285A JPS6230692A (en) 1985-07-30 1985-07-30 Liquid-phase epitaxial growth apparatus

Publications (2)

Publication Number Publication Date
JPS6230692A true JPS6230692A (en) 1987-02-09
JPH0310594B2 JPH0310594B2 (en) 1991-02-14

Family

ID=15838121

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16681285A Granted JPS6230692A (en) 1985-07-30 1985-07-30 Liquid-phase epitaxial growth apparatus

Country Status (1)

Country Link
JP (1) JPS6230692A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5518996U (en) * 1978-07-26 1980-02-06

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5518996U (en) * 1978-07-26 1980-02-06

Also Published As

Publication number Publication date
JPH0310594B2 (en) 1991-02-14

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