JPS6228852B2 - - Google Patents

Info

Publication number
JPS6228852B2
JPS6228852B2 JP6147779A JP6147779A JPS6228852B2 JP S6228852 B2 JPS6228852 B2 JP S6228852B2 JP 6147779 A JP6147779 A JP 6147779A JP 6147779 A JP6147779 A JP 6147779A JP S6228852 B2 JPS6228852 B2 JP S6228852B2
Authority
JP
Japan
Prior art keywords
laser
laser beam
damage
photodetector
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP6147779A
Other languages
Japanese (ja)
Other versions
JPS55154443A (en
Inventor
Toshiaki Murahashi
Shoichi Noda
Takao Sawada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP6147779A priority Critical patent/JPS55154443A/en
Publication of JPS55154443A publication Critical patent/JPS55154443A/en
Publication of JPS6228852B2 publication Critical patent/JPS6228852B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination

Description

【発明の詳細な説明】 この発明はレーザーに用いられるミラー、窓等
の光学素子の光損傷を評価する装置に関するもの
である。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus for evaluating optical damage to optical elements such as mirrors and windows used in lasers.

従来、この種の装置として第1図に示すものが
あつた。この図において、1はHe―Neのレーザ
ー、2はミラー、窓等の光学素子、3は上記He
―Neのレーザー光が上記光学素子2に集光され
て生じる散乱光を検知する光検出器である。
Conventionally, there has been a device of this type as shown in FIG. In this figure, 1 is a He-Ne laser, 2 is an optical element such as a mirror or window, and 3 is the He-Ne laser mentioned above.
- This is a photodetector that detects scattered light generated when Ne laser light is focused on the optical element 2.

従来の光散乱評価装置は以上のように構成され
ているが以下に記するような欠点があつた。
Although the conventional light scattering evaluation apparatus is constructed as described above, it has the following drawbacks.

即ち、従来の装置では光損傷による表面状態の
変化を光散乱強度の変化によつて検知している
が、その検知の方法は光検出器から増幅器を経て
記録計に記録したものを読みとるものである。こ
の方法では測定系の応答速度が遅く損傷が決定的
に生じた時の大きな変化にしか追随できない。一
方、光損傷の原因追求のためには損傷の発生、進
行、破壊の各段階を知ることが重要であるにもか
かわらず従来の方法では上記の3段階の時間経移
が非常に速く、観測できない欠点があつた。第2
図に損傷の時間変化の模式図を示す。
In other words, conventional equipment detects changes in surface conditions due to optical damage based on changes in light scattering intensity, but the method of detection is to read the information recorded by a photodetector, an amplifier, and a recorder. be. In this method, the response speed of the measurement system is slow and it is only possible to follow large changes when damage has definitely occurred. On the other hand, in order to investigate the cause of optical damage, it is important to know the stages of damage occurrence, progression, and destruction, but with conventional methods, the time course of the above three stages is very fast, and observation is difficult. There was a drawback that I couldn't do it. Second
The figure shows a schematic diagram of the change in damage over time.

この発明は上記のような従来のものの欠点を除
去するためになされたもので、レーザー装置のレ
ーザー光とは別個のレーザー光を光損傷評価用と
して用い、レーザー装置のレーザー光の光学素子
表面上の入射点に上記別個のレーザー光を照射し
てこの照射面からの散乱光を観察する光検出器を
設けるとともにこの光検出器からの信号を高速に
記録する高速応答記録装置を設けることにより、
光損傷の時間的な変化をとらえ、光損傷の機構解
明に多大な効果をもたらすことのできる装置を提
供することを目的としている。
This invention was made in order to eliminate the drawbacks of the conventional ones as described above, and uses a laser beam separate from the laser beam of the laser device for optical damage evaluation. By providing a photodetector for irradiating the incident point of the separate laser beam and observing the scattered light from the irradiation surface, and providing a high-speed response recording device for recording the signal from this photodetector at high speed,
The purpose of this study is to provide a device that can capture temporal changes in photodamage and have a significant effect on elucidating the mechanism of photodamage.

次に実施例の説明に入る前にこの発明で述べて
いる「光学素子の光損傷」の意味について説明す
る。
Next, before going into the description of the embodiments, the meaning of "optical damage to optical elements" mentioned in this invention will be explained.

まずこの発明における「光学素子」とは、産業
用加工(溶接、溶断、トリミング、表面処置な
ど)用の大出力レーザー又は医療用の出力は小さ
くともレーザー光の絞りこみによつて高出力密度
(W/cm2)になるようなレーザー機器における共
振器ミラー、ビームスプリツター、集光レンズな
どを示すもので、通常使用するレーザー光の波長
に対し、レンズの場合は出来るだけ吸収の少ない
透過率の高い物質が選ばれ、一方反射ミラーでは
出来るだけ反射率を高くするように誘電体多層膜
が用いられている。そしてこのような素子の「光
損傷」とは使用するレーザー光出力が強力な場
合、吸収の少ない材料あるいは反射率の高い材料
を選んでいるにもかかわらず、これらの光学素子
の表面内でくもり、クラツク、割れなどが生じ、
光学素子として用をなさなくなつてしまうことを
意味している。損傷の原因としてはレーザー光吸
収による材料の熱的破壊あるいは高出力密度の場
合の光の電場による強電界破壊がいわれている。
いずれにしてもこれらの光学素子は材料及び加工
面からいずれも極めて高価であること、一旦損傷
が発生するとレーザーシステムが完全に停止して
しまうことなどその損傷はレーザー光出力向上と
共に大きな問題になつている。
First of all, "optical element" in this invention refers to a high-output laser for industrial processing (welding, fusing, trimming, surface treatment, etc.) or a high-output laser for medical use, which has a low output but has a high output density (by narrowing down the laser beam). This refers to resonator mirrors, beam splitters, condensing lenses, etc. in laser equipment that has a wavelength of W/cm 2 ), and in the case of lenses, it has a transmittance with as little absorption as possible for the wavelength of the laser light normally used. A material with a high reflectance is selected, while a dielectric multilayer film is used for the reflective mirror to make the reflectance as high as possible. And "optical damage" to such elements refers to the fact that when the laser light output used is powerful, clouding occurs within the surface of these optical elements, despite the selection of materials with low absorption or high reflectivity. , cracks, cracks, etc. may occur.
This means that it becomes useless as an optical element. The cause of damage is said to be thermal destruction of the material due to absorption of laser light or strong electric field destruction due to the electric field of light in the case of high power density.
In any case, these optical elements are extremely expensive in terms of materials and processing, and once damage occurs, the laser system will stop completely, so damage becomes a big problem as laser light output increases. ing.

以下、この発明の一実施例を図について説明す
る。
An embodiment of the present invention will be described below with reference to the drawings.

第3図において、1は光散乱測定のためのHe
―Neレーザー、6は光損傷評価用のHe―Neレー
ザービーム、2は光学素子、7はHe―Neレーザ
ービーム6の反射光、4は光損傷を誘起するレー
ザービーム、5は光学素子2を透過した後のレー
ザービーム、8は散乱光を集光するためのレン
ズ、3は散乱光を検知する光検出器、9は光検出
器からの信号を受ける高速追随性のよい広帯域増
幅器、10は高速過渡現象記録器、11は記録計
である。
In Figure 3, 1 is He for light scattering measurement.
-Ne laser, 6 is a He-Ne laser beam for optical damage evaluation, 2 is an optical element, 7 is the reflected light of the He-Ne laser beam 6, 4 is a laser beam that induces optical damage, 5 is the optical element 2 8 is a lens for condensing the scattered light; 3 is a photodetector for detecting the scattered light; 9 is a broadband amplifier with good high-speed tracking that receives the signal from the photodetector; 10 is a wideband amplifier that receives the signal from the photodetector; A fast transient phenomenon recorder, 11 is a recorder.

次に動作について説明する。He―Neレーザー
1からのビーム6は損傷を誘起させるレーザービ
ーム4の光学素子2への照射位置に合せて照射
し、反射光7となる。光学素子2の表面の損傷に
よる変化は散乱光の強度変化となり、集光レンズ
8を経て光検出器3に至る。散乱光の変化は光検
出器3によつて電気信号になり広帯域増巾器9を
経て過渡現象記録器10に導びかれ、損傷の初期
過程から進行、破壊にいたる変化を高速記録す
る。
Next, the operation will be explained. The beam 6 from the He--Ne laser 1 is irradiated to the optical element 2 at the irradiation position of the laser beam 4 that induces damage, and becomes reflected light 7. Changes due to damage to the surface of the optical element 2 result in changes in the intensity of the scattered light, which reaches the photodetector 3 via the condenser lens 8 . Changes in the scattered light are converted into electrical signals by the photodetector 3, which are guided to the transient phenomenon recorder 10 via the broadband amplifier 9, and the changes from the initial stage of damage to progress and destruction are recorded at high speed.

なお、上記実施例ではレーザーとしてHe―Ne
レーザー1を用いたものを示したが、この発明は
He―Neレーザー1に限らず光電子増幅管を使用
できる波長領域に発振線をもつレーザーならどれ
でもよい。また、レーザー光4とHe―Neレーザ
ー1からのビーム6の光軸は、第3図では共軸に
ならないように示しているが、ビーム・スプリツ
タを適当に用いて共軸に、すなわちHe―Neレー
ザー1からのレーザー光も光学素子2に垂直入射
するようにしてもよい。
In addition, in the above example, He--Ne was used as the laser.
This invention uses laser 1, but this invention
The laser is not limited to the He--Ne laser 1, but any laser having an oscillation line in a wavelength range in which a photoelectron amplifier tube can be used may be used. Although the optical axes of the laser beam 4 and the beam 6 from the He--Ne laser 1 are shown not to be coaxial in FIG. 3, they can be made co-axial by appropriately using a beam splitter. The laser beam from the Ne laser 1 may also be vertically incident on the optical element 2.

以上のように、この発明によれば光損傷を起さ
せるレーザー光を照射しつつ照射部分に別個のレ
ーザー光を当ててその部分の散乱光の変化を実時
間で高速記録することができ、光損傷の発生、進
行、破壊の過程を正確に観測することができる。
As described above, according to the present invention, it is possible to irradiate a laser beam that causes optical damage while applying a separate laser beam to the irradiated area and record changes in scattered light in that area at high speed in real time. It is possible to accurately observe the process of damage occurrence, progression, and destruction.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の光損傷評価装置を示す構成図、
第2図は損傷による表面変化を示す散乱光強度の
時間変化の模式図、第3図はこの発明の一実施例
を示す光損傷評価装置の構成略図である。 1はHe―Neレーザー、2は光学素子、3は光
検出器、4は光損傷を誘起させるレーザービー
ム、5は透過ビーム、6はHe―Neレーザービー
ム、7はHe―Neレーザービーム反射光、8は散
乱光の集光レンズ、9は広帯域増幅器、10は過
渡現象記録器、11は記録計。なお、図中の同一
符号は同一又は相当部分を示す。
Figure 1 is a configuration diagram showing a conventional optical damage evaluation device.
FIG. 2 is a schematic diagram of temporal changes in scattered light intensity indicating surface changes due to damage, and FIG. 3 is a schematic diagram of the configuration of an optical damage evaluation apparatus showing an embodiment of the present invention. 1 is a He-Ne laser, 2 is an optical element, 3 is a photodetector, 4 is a laser beam that induces optical damage, 5 is a transmitted beam, 6 is a He-Ne laser beam, 7 is a He-Ne laser beam reflected light , 8 is a condensing lens for scattered light, 9 is a broadband amplifier, 10 is a transient phenomenon recorder, and 11 is a recorder. Note that the same reference numerals in the figures indicate the same or equivalent parts.

Claims (1)

【特許請求の範囲】[Claims] 1 光損傷を起させるレーザー光が照射される被
検試料の前記レーザー光の照射位置に上記レーザ
ー光とは別の損傷評価用のレーザー光を入射させ
る手段、上記照射位置から生じる上記損傷評価用
レーザー光の散乱光を観測する光検出器、及びこ
の光検出器からの信号を高速に記録する過渡現象
記録装置よりなるレーザー誘起損傷評価装置。
1. Means for injecting a laser beam for damage evaluation, which is different from the laser beam, into the irradiation position of the laser beam of the test sample that is irradiated with the laser beam that causes photodamage, and a means for evaluating the damage generated from the irradiation position. A laser-induced damage evaluation device consisting of a photodetector that observes scattered laser light and a transient phenomenon recording device that records signals from the photodetector at high speed.
JP6147779A 1979-05-21 1979-05-21 Laser induced damage evaluating apparatus Granted JPS55154443A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6147779A JPS55154443A (en) 1979-05-21 1979-05-21 Laser induced damage evaluating apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6147779A JPS55154443A (en) 1979-05-21 1979-05-21 Laser induced damage evaluating apparatus

Publications (2)

Publication Number Publication Date
JPS55154443A JPS55154443A (en) 1980-12-02
JPS6228852B2 true JPS6228852B2 (en) 1987-06-23

Family

ID=13172176

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6147779A Granted JPS55154443A (en) 1979-05-21 1979-05-21 Laser induced damage evaluating apparatus

Country Status (1)

Country Link
JP (1) JPS55154443A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63259383A (en) * 1987-04-16 1988-10-26 住友金属工業株式会社 Sealing material of metallic smelting vessel and cover

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4624573A (en) * 1984-05-14 1986-11-25 Rahn John P Total optical loss measurement device
US4808813A (en) * 1986-05-05 1989-02-28 Hughes Aircraft Company Self contained surface contamination sensor for detecting external particulates and surface discontinuities
JPS63107079A (en) * 1986-10-23 1988-05-12 Mitsubishi Electric Corp Laser equipment
JPS63107078A (en) * 1986-10-23 1988-05-12 Mitsubishi Electric Corp Laser equipment
JP4532378B2 (en) * 2005-09-28 2010-08-25 アドバンスド・マスク・インスペクション・テクノロジー株式会社 Laser light source operation method
CN102866163A (en) * 2012-09-06 2013-01-09 中国科学院上海光学精密机械研究所 Apparatus and method for detecting laser injury
CN110174245B (en) * 2019-06-20 2024-02-09 中国工程物理研究院激光聚变研究中心 Automatic testing device and testing method for laser-induced damage threshold of optical element

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63259383A (en) * 1987-04-16 1988-10-26 住友金属工業株式会社 Sealing material of metallic smelting vessel and cover

Also Published As

Publication number Publication date
JPS55154443A (en) 1980-12-02

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