JPS6228432B2 - - Google Patents

Info

Publication number
JPS6228432B2
JPS6228432B2 JP52058069A JP5806977A JPS6228432B2 JP S6228432 B2 JPS6228432 B2 JP S6228432B2 JP 52058069 A JP52058069 A JP 52058069A JP 5806977 A JP5806977 A JP 5806977A JP S6228432 B2 JPS6228432 B2 JP S6228432B2
Authority
JP
Japan
Prior art keywords
multiplexer
light emitting
detection elements
emitting diodes
driving
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP52058069A
Other languages
English (en)
Japanese (ja)
Other versions
JPS53143289A (en
Inventor
Noboru Matsuo
Tetsuji Kobayashi
Tooru Sugita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP5806977A priority Critical patent/JPS53143289A/ja
Publication of JPS53143289A publication Critical patent/JPS53143289A/ja
Publication of JPS6228432B2 publication Critical patent/JPS6228432B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP5806977A 1977-05-19 1977-05-19 Semiconductor radiation measuring instrument Granted JPS53143289A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5806977A JPS53143289A (en) 1977-05-19 1977-05-19 Semiconductor radiation measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5806977A JPS53143289A (en) 1977-05-19 1977-05-19 Semiconductor radiation measuring instrument

Publications (2)

Publication Number Publication Date
JPS53143289A JPS53143289A (en) 1978-12-13
JPS6228432B2 true JPS6228432B2 (enExample) 1987-06-19

Family

ID=13073604

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5806977A Granted JPS53143289A (en) 1977-05-19 1977-05-19 Semiconductor radiation measuring instrument

Country Status (1)

Country Link
JP (1) JPS53143289A (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3684010B2 (ja) * 1996-12-26 2005-08-17 キヤノン株式会社 放射線検出装置
DE10114303A1 (de) * 2001-03-23 2002-09-26 Philips Corp Intellectual Pty Verfahren zur Bestimmung der von einem Strahlungssensor absorbierten Strahlungsmenge

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2286393A1 (fr) * 1974-09-27 1976-04-23 Labo Electronique Physique Systeme automatique de reetalonnage permanent pour camera a scintillation
JPS5293383A (en) * 1976-02-02 1977-08-05 Nec Corp Cosmic ray detector

Also Published As

Publication number Publication date
JPS53143289A (en) 1978-12-13

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