JPS62278422A - 光源性能計測装置 - Google Patents

光源性能計測装置

Info

Publication number
JPS62278422A
JPS62278422A JP12198186A JP12198186A JPS62278422A JP S62278422 A JPS62278422 A JP S62278422A JP 12198186 A JP12198186 A JP 12198186A JP 12198186 A JP12198186 A JP 12198186A JP S62278422 A JPS62278422 A JP S62278422A
Authority
JP
Japan
Prior art keywords
light source
light
optical path
observed
measuring device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12198186A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0411811B2 (enrdf_load_html_response
Inventor
Toshiyuki Tanaka
利之 田中
Etsuji Minami
南　悦治
Katsuhiro Kubo
勝裕 久保
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP12198186A priority Critical patent/JPS62278422A/ja
Publication of JPS62278422A publication Critical patent/JPS62278422A/ja
Publication of JPH0411811B2 publication Critical patent/JPH0411811B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP12198186A 1986-05-27 1986-05-27 光源性能計測装置 Granted JPS62278422A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12198186A JPS62278422A (ja) 1986-05-27 1986-05-27 光源性能計測装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12198186A JPS62278422A (ja) 1986-05-27 1986-05-27 光源性能計測装置

Publications (2)

Publication Number Publication Date
JPS62278422A true JPS62278422A (ja) 1987-12-03
JPH0411811B2 JPH0411811B2 (enrdf_load_html_response) 1992-03-02

Family

ID=14824618

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12198186A Granted JPS62278422A (ja) 1986-05-27 1986-05-27 光源性能計測装置

Country Status (1)

Country Link
JP (1) JPS62278422A (enrdf_load_html_response)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008268050A (ja) * 2007-04-23 2008-11-06 Oyo Denki Kk 光軸確認可能な光源装置
JP2009128207A (ja) * 2007-11-26 2009-06-11 Suruga Seiki Kk 光束波面の曲率測定方法及び光束波面の曲率測定装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008268050A (ja) * 2007-04-23 2008-11-06 Oyo Denki Kk 光軸確認可能な光源装置
JP2009128207A (ja) * 2007-11-26 2009-06-11 Suruga Seiki Kk 光束波面の曲率測定方法及び光束波面の曲率測定装置

Also Published As

Publication number Publication date
JPH0411811B2 (enrdf_load_html_response) 1992-03-02

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term