JPS6227682A - Microwave range finder - Google Patents
Microwave range finderInfo
- Publication number
- JPS6227682A JPS6227682A JP16589585A JP16589585A JPS6227682A JP S6227682 A JPS6227682 A JP S6227682A JP 16589585 A JP16589585 A JP 16589585A JP 16589585 A JP16589585 A JP 16589585A JP S6227682 A JPS6227682 A JP S6227682A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- measured
- output
- deltar
- data
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Radar Systems Or Details Thereof (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、周波数変調されたマイクロ波を被測定面へ放
射し、放射波の一部と反射波とをミキシング検波して得
られたビート信号から被測定面までの距離を測定するマ
イクロ波距離測定装置に関する。[Detailed Description of the Invention] [Industrial Application Field] The present invention emits frequency-modulated microwaves to a surface to be measured, and detects the beats obtained by mixing and detecting a part of the emitted waves and the reflected waves. The present invention relates to a microwave distance measuring device that measures the distance from a signal to a surface to be measured.
従来、FM−GWマイクロ波距離測定装置による高炉炉
床における溶銑予備処理時のトピードカーの受銑レベル
の測定では、精度向上のために、過去のデータを保存し
ておき、現在の測定データとの差分である変化量が閾値
(固定値)以上に大きい場合、現在のデータを除外して
測定値として出力しないようにしていた。Conventionally, when measuring the received pig iron level of a torpedo car during hot metal pretreatment at the blast furnace hearth using an FM-GW microwave distance measurement device, past data is saved and compared with current measurement data to improve accuracy. If the amount of change, which is the difference, is larger than a threshold (fixed value), the current data is excluded and not output as a measured value.
この従来のマイクロ波圧#測定位置を溶銑予備処理、特
に脱珪処理時のレベル測定に用いた場合、溶銑上部にス
ラグが大量に発生し、またその変動が大きいため第3図
に示すように、レベル変動量りがスラグの層厚lととも
に大きくなり、閾値が小さい場合、測定不能となってい
た。これを防ぐために閾値を大きくするとスラグが小さ
い場合に精度を低下させることになり、適正な測定が行
なえなかった。When this conventional microwave pressure # measurement position is used for level measurement during hot metal pretreatment, especially during desiliconization, a large amount of slag is generated on the top of the hot metal and its fluctuation is large, so as shown in Figure 3. , the level fluctuation measurement increases with the layer thickness l of the slag, and if the threshold value is small, it becomes impossible to measure. If the threshold value is increased to prevent this, the accuracy will be lowered when the slag is small, making it impossible to perform proper measurements.
本発明は、溶銑上部に発生するスラグの層厚lとマイク
ロ波受信パワー(ビート信号振幅)■との間に第2図に
示すような関係(スラグの層厚lの増加によりビート信
号振幅Vが減衰すること)があること、またスラグの層
厚lとレベル変化量りの間には前述したように第3図に
示すような関係があることを利用し、ビート信号振幅に
応じて閾値を可変設定することにより被測定面の変化(
スラグ発生の有無)にかかわらず適正な測定を可能とし
たものである。The present invention has a relationship as shown in FIG. 2 between the layer thickness l of the slag generated on the top of the hot metal and the microwave reception power (beat signal amplitude) (beat signal amplitude V as the slag layer thickness l increases). The threshold value can be set according to the beat signal amplitude by taking advantage of the fact that the slag layer thickness l and the level change ratio have a relationship as shown in Figure 3, as mentioned above. Variable settings allow changes in the surface to be measured (
This enables proper measurement regardless of the presence or absence of slag generation.
すなわち、本発明のマイクロ波距離測定装置は、閾値を
ビート信号の振幅に応じて可変、設定する閾値演算回路
を備えたことを特徴とする。That is, the microwave distance measuring device of the present invention is characterized by including a threshold calculation circuit that varies and sets the threshold according to the amplitude of the beat signal.
以下、本発明の実施例について図面を参照して説明する
。第1図は本発明のマイクロ波距離測定装置の一実施例
のブロック図である。Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a block diagram of an embodiment of the microwave distance measuring device of the present invention.
マイクロ波回路lは周波数変調されたマイクロ波を放射
し、被測定面から反射波を受けてビート信号を検出し、
増幅回路2に送る。周期計数回路3は増幅回路2で増幅
されたビート信号を受けて、ビー]・信号の周期測定を
行ない、距離演算回路4に送る。距離演算回路4は、ビ
ート周期Tbよ1のメモリ回路5では距離演算回路4の
測定データ8人が一時記憶される。第2のメモリ回路6
では前回の測定データRj−1が一時記憶されるととも
に距離データとして出力され、さらにこのデータが減算
器7に出力される。減算器7は第1のメモリ5の出力R
λから第2のメモリ6の出力Rλ−/を減算し、測定距
離の変化量ΔRを演算する。絶対値演算回路8は減算器
7の出力を受けて、測定距離の変化iRの絶対値1ΔR
1を求め、比較器11に出力する。余波整流回路9は増
幅回路2で増幅されたビート信号を余波整流する。閾値
演算回路10は余波整流回路9の出力とレベル変動量り
が第2図、第3図カラホぼVト= K2 /D (K2
は定数)の関係であることから、閾値Rdを式Rd=A
/V、(Aは定数)により設定する。比較器11ではB
=R,c−lΔR1が演算され、B>0の場合、すなわ
ち絶対値ΔRが閾値RTH内にあるとき第2のメモリ6
に対して第1のメモリ5の出力データR,−を受けとる
転送指令が出力される。これにより、第2のメモリ回路
6のデータRλ−lがRλとなり、外部へ出力される。The microwave circuit l emits frequency-modulated microwaves, receives reflected waves from the surface to be measured, and detects a beat signal.
Send to amplifier circuit 2. The period counting circuit 3 receives the beat signal amplified by the amplifier circuit 2, measures the period of the bee signal, and sends it to the distance calculation circuit 4. In the distance calculation circuit 4, the measurement data of eight people is temporarily stored in the memory circuit 5 of the beat period Tb 1. Second memory circuit 6
Then, the previous measurement data Rj-1 is temporarily stored and output as distance data, and this data is further output to the subtracter 7. The subtracter 7 receives the output R of the first memory 5.
The output Rλ-/ of the second memory 6 is subtracted from λ to calculate the amount of change ΔR in the measured distance. The absolute value calculation circuit 8 receives the output of the subtracter 7 and calculates the absolute value 1ΔR of the change iR in the measured distance.
1 is obtained and output to the comparator 11. The aftermath rectifier circuit 9 rectifies the beat signal amplified by the amplifier circuit 2. The threshold calculation circuit 10 calculates the output of the aftereffect rectification circuit 9 and the level fluctuation as shown in FIGS. 2 and 3.
is a constant), the threshold value Rd can be calculated using the formula Rd=A
/V (A is a constant). B in comparator 11
=R, c-lΔR1 is calculated, and when B>0, that is, when the absolute value ΔR is within the threshold RTH, the second memory 6
A transfer command for receiving the output data R, - of the first memory 5 is output to the first memory 5. As a result, the data Rλ-l of the second memory circuit 6 becomes Rλ and is output to the outside.
以上説明したように本発明は、ビート信号振幅に応じて
閾値を可変、設定することにより、被測定面の変化に左
右されず適正な測定が可能となる効果がある。As explained above, the present invention has the advantage that by varying and setting the threshold value according to the beat signal amplitude, it is possible to perform appropriate measurement regardless of changes in the surface to be measured.
第1図は本発明のマイクロ波距離測定装置の一実施例の
ブロック図、第2図はスラグの層厚lとビート信号振幅
Vbの関係を示すグラフ、第3図はスラグの層厚lとレ
ベル変化量りの関係を示すグラフである。
1:マイクロ波回路、2:増幅回路、
3:周期計数回路、 4:距離演算回路、5:第1のメ
モリ回路、
6:第2のメモリ回路、
7:減算器、 8:絶対値演算回路、9:全波整
流回路、 10:閾値演算回路、11:比較器、
Tし:ビート周期、Rλ:現在測定した距離。
Rえ−I:過去の距離データ、
ΔR:測定距離の変化量。
R緘 :閾値。Fig. 1 is a block diagram of an embodiment of the microwave distance measuring device of the present invention, Fig. 2 is a graph showing the relationship between the slag layer thickness l and the beat signal amplitude Vb, and Fig. 3 is a graph showing the relationship between the slag layer thickness l and the beat signal amplitude Vb. It is a graph showing the relationship between level change measurements. 1: Microwave circuit, 2: Amplification circuit, 3: Period counting circuit, 4: Distance calculation circuit, 5: First memory circuit, 6: Second memory circuit, 7: Subtractor, 8: Absolute value calculation circuit , 9: Full-wave rectifier circuit, 10: Threshold calculation circuit, 11: Comparator,
T: beat period, Rλ: currently measured distance. Re-I: past distance data, ΔR: amount of change in measured distance. R: Threshold.
Claims (1)
波の一部と反射波とをミキシング検波して得られたビー
ト信号から被測定面までの距離を測定し、過去の距離デ
ータを保存しておき現在、測定した距離データとの差分
である変化量がある閾値以上に大きいとき、現在測定し
たデータを除外して測定値として出力しないようにした
マイクロ波距離測定装置において、 前記閾値をビート信号の振幅に応じて可変、設定する閾
値演算回路を備えたことを特徴とするマイクロ波距離測
定装置。[Claims] A frequency-modulated microwave is radiated to a surface to be measured, and a portion of the radiated wave and a reflected wave are mixed and detected, and the distance from the beat signal to the surface to be measured is measured, Microwave distance measurement that saves past distance data and excludes the currently measured data from being output as a measured value when the amount of change from the currently measured distance data is greater than a certain threshold What is claimed is: 1. A microwave distance measuring device comprising: a threshold calculation circuit that varies and sets the threshold according to the amplitude of the beat signal.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16589585A JPS6227682A (en) | 1985-07-29 | 1985-07-29 | Microwave range finder |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16589585A JPS6227682A (en) | 1985-07-29 | 1985-07-29 | Microwave range finder |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6227682A true JPS6227682A (en) | 1987-02-05 |
Family
ID=15821014
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16589585A Pending JPS6227682A (en) | 1985-07-29 | 1985-07-29 | Microwave range finder |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6227682A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02126103U (en) * | 1989-03-29 | 1990-10-17 | ||
JP2015000976A (en) * | 2013-06-18 | 2015-01-05 | 新日鐵住金株式会社 | Travel control method for coke moving machines |
-
1985
- 1985-07-29 JP JP16589585A patent/JPS6227682A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02126103U (en) * | 1989-03-29 | 1990-10-17 | ||
JP2015000976A (en) * | 2013-06-18 | 2015-01-05 | 新日鐵住金株式会社 | Travel control method for coke moving machines |
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