JPS62272158A - 検電装置 - Google Patents
検電装置Info
- Publication number
- JPS62272158A JPS62272158A JP61113770A JP11377086A JPS62272158A JP S62272158 A JPS62272158 A JP S62272158A JP 61113770 A JP61113770 A JP 61113770A JP 11377086 A JP11377086 A JP 11377086A JP S62272158 A JPS62272158 A JP S62272158A
- Authority
- JP
- Japan
- Prior art keywords
- light
- voltage
- sensor head
- optical sensor
- optical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims abstract description 34
- 230000005540 biological transmission Effects 0.000 claims abstract description 16
- 238000001514 detection method Methods 0.000 claims description 16
- 239000013307 optical fiber Substances 0.000 claims description 5
- 230000010287 polarization Effects 0.000 claims description 4
- 238000005259 measurement Methods 0.000 abstract description 6
- 230000005856 abnormality Effects 0.000 abstract description 3
- 230000000694 effects Effects 0.000 abstract description 3
- 230000029553 photosynthesis Effects 0.000 abstract description 2
- 238000010672 photosynthesis Methods 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 6
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 5
- 239000003990 capacitor Substances 0.000 description 3
- 230000005611 electricity Effects 0.000 description 3
- 238000009413 insulation Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000007423 decrease Effects 0.000 description 2
- 230000005674 electromagnetic induction Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 101100464680 Danio rerio pou6f1 gene Proteins 0.000 description 1
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 description 1
- 230000005697 Pockels effect Effects 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000006187 pill Substances 0.000 description 1
- 230000002194 synthesizing effect Effects 0.000 description 1
- 230000033772 system development Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/58—Testing of lines, cables or conductors
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Measurement Of Current Or Voltage (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61113770A JPS62272158A (ja) | 1986-05-20 | 1986-05-20 | 検電装置 |
| US07/046,173 US4814930A (en) | 1986-05-20 | 1987-05-05 | Optical zero-phase current and zero phase voltage sensing arrangement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61113770A JPS62272158A (ja) | 1986-05-20 | 1986-05-20 | 検電装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62272158A true JPS62272158A (ja) | 1987-11-26 |
| JPH0245153B2 JPH0245153B2 (cg-RX-API-DMAC7.html) | 1990-10-08 |
Family
ID=14620691
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61113770A Granted JPS62272158A (ja) | 1986-05-20 | 1986-05-20 | 検電装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US4814930A (cg-RX-API-DMAC7.html) |
| JP (1) | JPS62272158A (cg-RX-API-DMAC7.html) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3175935B2 (ja) * | 1987-09-30 | 2001-06-11 | 株式会社東芝 | 光ファイバ応用センサ |
| JPH0670653B2 (ja) * | 1989-03-31 | 1994-09-07 | 日本碍子株式会社 | 光温度・電気量測定装置 |
| US5365175A (en) * | 1993-01-21 | 1994-11-15 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Method of locating ground faults |
| US6946827B2 (en) * | 2001-11-13 | 2005-09-20 | Nxtphase T & D Corporation | Optical electric field or voltage sensing system |
| US7046867B2 (en) * | 2003-02-14 | 2006-05-16 | Abb Research Ltd | Fiberoptic current sensor having a plurality of sensor heads |
| ATE365330T1 (de) * | 2003-02-14 | 2007-07-15 | Abb Research Ltd | Faseroptischer stromsensor mit mehreren sensorköpfen |
| CN101449174B (zh) * | 2006-04-04 | 2013-07-17 | Abb研究有限公司 | 具有总和检测的光纤电流传感器 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3324393A (en) * | 1963-07-26 | 1967-06-06 | Gen Electric | Magneto-optical electric current sensing arrangement |
| US3786311A (en) * | 1973-01-02 | 1974-01-15 | Gen Electric | Circuit breaker and static trip circuit therefor |
| EP0067683B1 (en) * | 1981-06-12 | 1986-08-20 | Kabushiki Kaisha Meidensha | Electric field detector |
| JPS59147274A (ja) * | 1983-02-10 | 1984-08-23 | Hitachi Ltd | 光方式電界測定装置 |
| US4578639A (en) * | 1984-03-02 | 1986-03-25 | Westinghouse Electric Corp. | Metering system for measuring parameters of high AC electric energy flowing in an electric conductor |
| US4683421A (en) * | 1985-03-29 | 1987-07-28 | Westinghouse Electric Corp. | Drift compensation technique for a magneto-optic current sensor |
| US4755665A (en) * | 1987-07-22 | 1988-07-05 | Square D Company | Light detector and signal processing circuit |
-
1986
- 1986-05-20 JP JP61113770A patent/JPS62272158A/ja active Granted
-
1987
- 1987-05-05 US US07/046,173 patent/US4814930A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US4814930A (en) | 1989-03-21 |
| JPH0245153B2 (cg-RX-API-DMAC7.html) | 1990-10-08 |
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