JPS62261977A - Substrate inspecting device - Google Patents

Substrate inspecting device

Info

Publication number
JPS62261977A
JPS62261977A JP61105454A JP10545486A JPS62261977A JP S62261977 A JPS62261977 A JP S62261977A JP 61105454 A JP61105454 A JP 61105454A JP 10545486 A JP10545486 A JP 10545486A JP S62261977 A JPS62261977 A JP S62261977A
Authority
JP
Japan
Prior art keywords
inspection
pin
board
positioning
printed circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61105454A
Other languages
Japanese (ja)
Inventor
Zenichi Tomita
富田 善一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Original Assignee
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Priority to JP61105454A priority Critical patent/JPS62261977A/en
Publication of JPS62261977A publication Critical patent/JPS62261977A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To perform secure inspection by pushing and inserting positioning pins while a pin for inspection do not contact an inspection part, positioning a substrate accurately, and abutting the pins for inspection on the inspection part properly. CONSTITUTION:A pin board jig 1 is elevated, and the printed board 5 to be inspected is guided by tapered parts 10a and 10a of guide plates almost to an inspection position and mounted on projections 3a and 3a of support parts 3 and 3. Then, a pressure base 11 is lowered to press push rods 12, 12,... against the board 5 and move down the support parts 3 and 3 against springs 15 and 15. Consequently, the pointed guide parts 4a and 4a of the positioning pins 4 and 4 are inserted into positioning holes 9 in the center, the board 5 slid on the projections 3a and 3a and is accurately positioned, and the contact part 2a of the pin 2 for inspection abuts on the inspection part 8 properly to perform secure inspection.

Description

【発明の詳細な説明】 (イ) 産業上の利用分野 本発明は抵抗、コンデンサ等の各種部品を実装し念プリ
ント基板の基板検査装置に関する。
DETAILED DESCRIPTION OF THE INVENTION (a) Field of Industrial Application The present invention relates to a board inspection device for a printed circuit board on which various components such as resistors and capacitors are mounted.

(ロ)従来の技術 従来、この種の基板検査装置は、例えば、特開昭58−
143280号公報等に開示されているように被検査基
板を位置決め固定した後、検査用ビンを備えるビンボー
ド治具を上昇させて検査を行うように構成されており、
前記彼倹食基板のピンボード治具に対する位置決めは基
板の綾部で行われている。
(B) Conventional technology Conventionally, this type of board inspection apparatus has been used, for example, in Japanese Patent Application Laid-Open No.
As disclosed in Japanese Patent No. 143280, etc., after positioning and fixing a board to be inspected, a bin board jig equipped with an inspection bin is raised to perform an inspection.
The positioning of the flexible board with respect to the pin board jig is performed at the tread of the board.

しかし乍ら、上記従来例の場合、被検査基板に寸法誤差
がある場合、検査用ピンが正確入前記波検査基板の検査
点に接触せず、基fi検査に支障を来之丁。
However, in the case of the above-mentioned conventional example, if there is a dimensional error in the board to be tested, the test pins do not accurately touch the test points of the board to be tested, which may cause problems in the standard inspection.

(ハ)発明が解決しようとする間鴨点 零発明は上記従来例の欠点に鑑みなされ念もので、被検
査基板に寸法誤差が生じても検査用ピンが正確に前記被
検査基板の検査点に接触する基板検査装置を提供するこ
とを目的とするものである。
(c) The invention is designed to solve the above-mentioned drawbacks of the conventional example, and even if there is a dimensional error in the board to be inspected, the inspection pins can be accurately placed at the inspection point of the board to be inspected. The object of the present invention is to provide a board inspection device that makes contact with the substrate.

に)問題点を解決するための手段 被検査用プリント基板の検査部に接触する検査用ピンと
、前記プリント基板の位置決め孔【て挿入する位は決め
ピンと、前記プリント基数テ前記々査部に前記検査用ピ
ンが接触していない状態で支持する支持部とを失々同一
面上に備えるピンボード治具と、前記プリント基板を前
記検査用ピンの方向に押圧することにより、前記支持部
を前記ピンポンド治具の方向に移動させ前記位置決め孔
に前記位置決めピンを挿入する押圧部とからなる構成す
る。
(b) Means for solving the problem: An inspection pin that contacts the inspection section of the printed circuit board to be inspected, a positioning pin for the positioning hole of the printed circuit board, and a fixing pin for each inspection section of the printed circuit board. By pressing the printed circuit board in the direction of the test pin, a pinboard jig is provided with a support part that supports the test pin in a state where it is not in contact with the pin board jig, and the support part supports the test pin in a state where the test pin is not in contact with the pin board jig. and a pressing portion that moves in the direction of the pin-pound jig and inserts the positioning pin into the positioning hole.

−)作 用 上記構成に依れば、破検査用プリント基板は支持部によ
り検査部に検査用ピンが接触していないフリーな状!み
で支持され友後、押圧部の押圧により位置決め孔に位置
決めピンが挿入され、前記ぜ プリント基板全移動り八、検査用ピンを適確に検査部に
当接させる。
-) Effect According to the above configuration, the printed circuit board for damage inspection is in a free state where the inspection pins are not in contact with the inspection part due to the support part! After being supported by the pins, the positioning pins are inserted into the positioning holes by the pressure of the pressing part, and the printed circuit board is fully moved to bring the testing pins into proper contact with the testing part.

(へ)実施例 以下、図面を参照しつつ本発明の第1実施例を詳細に説
明する。第1図は第1実施例の断面図、第2図I−i第
1実施例の要部断面図である。
(F) Example Hereinafter, a first example of the present invention will be described in detail with reference to the drawings. FIG. 1 is a sectional view of the first embodiment, and FIG. 2 is a sectional view of essential parts of the first embodiment taken along line I-i.

図中、(1)はアクリル系樹脂より成る載置板(1a)
の水平な上面に多数の検査用ピン+21 +21・・・
を、その外側の四隅に支持部+31 +31を、両側に
位置決めピン+41+41を夫4備えるピンボード治具
である。(5)はコンデンサ(6)、抵抗(7)等を備
える披検査用プリント基板で、前記検査用ピン+41f
4+−が当接する位置には検査部+81+8+・・・が
、前記位置決めピン+41+4+と対応する位置には位
ft&決め孔入tsl islが夫々形成されている。
In the figure, (1) is a mounting plate (1a) made of acrylic resin.
A large number of inspection pins +21 +21...
This is a pin board jig that has support parts +31 at the four outer corners, and positioning pins +41 and +41 on both sides. (5) is a printed circuit board for inspection, which is equipped with a capacitor (6), a resistor (7), etc., and includes the inspection pin +41f.
An inspection portion +81+8+... is formed at the position where 4+- contacts, and a positioning hole tsl isl is formed at a position corresponding to the positioning pin +41+4+.

また、前記fi1.置仮(la)の上面外−にはテーバ
都(10a)(10a)により前記プリント基板(6)
を案内するガイド板(10+ flolが役すられてい
る。
In addition, the fi1. The printed circuit board (6) is attached to the outside of the upper surface of the temporary (la) by Theba (10a) (10a).
A guide board (10+ flol) is used to guide you.

まな、(■)は前記ピンボード治具mの上方に位置し、
下面に多数の押、を棒O″4+121・・・を備える押
えペース(押圧部)で、該押えペースfil)tI′i
降下して前記押え棒(121(121・・・により前記
プリント基fBtfillを下方に押圧する。
Mana (■) is located above the pinboard jig m,
A presser pace (pressing part) equipped with a large number of pressers and rods O''4+121... on the lower surface, the presser pace fil)tI'i
The printing board fBtfill is lowered and pressed downward by the presser bar (121 (121...).

次に、前記検査用ピン(2)、支持部(3)及び位置決
めピン(4)について第2図に従い詳細に説明する。
Next, the inspection pin (2), the support part (3), and the positioning pin (4) will be explained in detail with reference to FIG.

前記検査用ピン(2)は上端に接触部(2a)全備えて
おり、載t&¥1(la)にスプリング+29により上
方に付勢されながら取付けられている。また、前記支持
部:3)は摩擦係数の小さく、且つ、岨摩耗性の高いポ
リアセター/I/系樹脂で形成した略半球状の突子(3
a)をO!i頭した摺動自在の支持棒で構成されており
、−”     、スリーブa3を介して前記載置板(
1a)の取付孔Iに上下移動可能に差し込まれている。
The inspection pin (2) has a contact portion (2a) at its upper end, and is attached to the mounting plate t&¥1 (la) while being biased upward by a spring +29. Further, the support part 3) is a substantially hemispherical protrusion (3) formed of a polyaceter/I/based resin having a small coefficient of friction and high abrasion resistance.
a) O! It is composed of a slidable support rod with an i-head, and is connected to the aforementioned mounting plate (
It is inserted into the mounting hole I of 1a) so that it can move up and down.

また、前記支持部(3)は前記突子(3a)の下面と前
記スリーブ賭の上端との間にスプリング(16)が嵌挿
されており、該スプリング(16)により上方に付勢さ
れている。前記位置決めピン(4)は上端に尖端ガイド
部(4a)を備え、@記載i!(& (1a )に圧入
されている。尚、前記位置決めピン(4)は鍔部(4b
)によって垂直度及び高さが精度良く収付けられている
Further, a spring (16) is fitted between the lower surface of the protrusion (3a) and the upper end of the sleeve bracket, and the support portion (3) is biased upward by the spring (16). There is. The positioning pin (4) is provided with a pointed guide portion (4a) at the upper end, and is provided with a pointed guide portion (4a) as described in @description i! The positioning pin (4) is press-fitted into the flange (4b).
), the verticality and height are accurately determined.

上述のような基黴検査装置では、ビンボード治具甲が上
昇に伴い、ガイド板(IOl tlOiのテーバ5(1
0a)(LOa)にて彼検肴用プリント基板(6)をほ
ぼ検査位置に案内し、支持部t31131の突子(3a
)(3a)上端に載置する。この時、検査部+81 +
8+・・・に検査用ピンi21 +21・・・は接触し
ておらず(第1図)、ま之、ml上記リント基板(6)
は寸法誤差等により、正確な倹食位置より多少ずれてい
るつとの状態で、押えペース(11)は降下し、押え棒
O利匈・・・によりltI記プリプリント基板+51方
に押圧する。これにより、前記支持部+31 +31 
#′iスプリングuaumの付勢に逆らって下方に移動
し、位置決め孔;9t Fe2に位置決めピン+4)I
41の尖端ガイド1(4a)(4a)が挿入し、1lr
I記位置決め孔F9)f9)の中央に#記ガイド部(4
a)(4a)の尖端が来るように前記プリント基板(6
)は+lit記突子(3a)上端を摺動して、正確に位
置決めされる。
In the mold inspection device as described above, as the bin board jig upper rises, the guide plate (IOl tlOi's taber 5 (1
0a) (LOa), guide the printed circuit board (6) for inspection almost to the inspection position, and insert the projection (3a) of the support part t31131.
) (3a) Place it on the top end. At this time, the inspection department +81 +
The inspection pins i21 +21... are not in contact with 8+... (Figure 1), and the lint board (6) above is
is slightly deviated from the correct feeding position due to dimensional errors, etc., and the presser plate (11) descends and presses the preprinted board +51 with the presser bar O. As a result, the support portion +31 +31
Move downward against the bias of #'i spring uaum and insert the positioning pin into the positioning hole; 9t Fe2 +4)I
41 tip guide 1 (4a) (4a) is inserted, 1lr
In the center of the positioning hole F9) f9) marked with #, there is a guide part (4) marked with #.
a) Place the printed circuit board (6) so that the tip of (4a) is
) is accurately positioned by sliding the upper end of the protrusion (3a).

第3図は本発明の第2実施例の要都所面図であり、第2
図と同一部分には同一符号を付しである1図中(l四は
載置板(la)の上面に垂直に植設され念位置決めピン
で、その上端は略半球状の突子(支持部)0ηの貫通孔
−に挿通しており、尖端ガイド部(16a )が前記突
子αη上面から少許突出している。まな、前記突子0?
)はスプリング1wにより上方に付勢支持されている。
FIG. 3 is a plan view of important points of the second embodiment of the present invention, and FIG.
The same parts as those in the figure are given the same reference numerals.In Figure 1, (l4 is a positioning pin installed perpendicularly on the upper surface of the mounting plate (la), and its upper end is a substantially hemispherical protrusion (supporting pin). part) 0η through hole -, and the tip guide part (16a) protrudes a little from the upper surface of the protrusion αη.Well, the protrusion 0?
) is supported and biased upward by a spring 1w.

この第2実施例においても、突子c力上端に載置された
被検査用プリント基板(5)を下方に押圧すると前記突
子αηはスプリング(I9)に逆らって下方に押圧され
、第1実施例と同様に位置決めピンHと位置決め孔(3
)により前記プリント基板(5)は正確に位置決めされ
る。しかも、この第2実施例では、突子θηは位置決め
ビン川に一体に取付けられているので、検査部i81 
f81・・・の多い岐検査用プリント基板(6)には特
にスペース的に有効である。
Also in this second embodiment, when the printed circuit board to be inspected (5) placed on the upper end of the protrusion c force is pressed downward, the protrusion αη is pressed downward against the spring (I9), and the first As in the embodiment, the positioning pin H and the positioning hole (3
), the printed circuit board (5) is accurately positioned. Moreover, in this second embodiment, the protrusion θη is integrally attached to the positioning pin, so the inspection part i81
This is particularly effective in terms of space for a branch inspection printed circuit board (6) that has many f81...

第4図は本発明の第3実施例の要部断面図であり、第2
図と同一部分には同一符号を付している。。
FIG. 4 is a sectional view of main parts of the third embodiment of the present invention, and FIG.
The same parts as those in the figure are given the same reference numerals. .

図中、例は上端が球面状をし、下方側面の一部に鋸歯状
部211 ′t−備える支持部で、貫通孔開の上端から
は位置決めピン(四の尖端ガイド部(23a)が少許突
出している。嘱は、ピンボード治具(l)に回転自在に
取付けられ、前記鋸歯状S圓と螺合する歯車、q均は鋸
歯状部嶽で前記歯車(24!と螺合すると共に、スプリ
ング覇により前記支持部−と離間する方向に付勢された
L字状部材である。尚、前記位置決めピン(地の下fI
WJは前記り字状部材(ハ)に当接している。また、C
2811/i+iTI記り字状部材(社)の端部を収納
する凹部である。
In the figure, the example shows a support part with a spherical upper end and a serrated part 211't on a part of the lower side surface, and a positioning pin (four pointed guide parts (23a)) is slightly inserted from the upper end of the through hole. 1 is a gear that is rotatably attached to the pin board jig (l) and is screwed into the serrated S ring, and q is a gear that is screwed into the serrated part with the gear (24!). , is an L-shaped member that is biased in the direction of separating from the support part by a spring force.
WJ is in contact with the above-mentioned cross-shaped member (c). Also, C
This is a recess that accommodates the end of the 2811/i+iTI calligraphy member (Inc.).

この第3実施例においても、支持部四の上面に載置され
た彼倹査用プリント基板(5)を下方に押圧すると、o
ft記支持部120)はスプリング幻に逆らって下方に
押圧され、第1、第2実施例と同様に位置決めピン:^
と位置決め孔;9)により前記プリント基板(5)ハ正
@に位置決めされる。しかも、この第3実施例では前記
支持部(叫が下方に移動すると、前記歯車;241の回
転により前記り字状部材(至)が上昇し、前記位置決め
ピン(231も上昇するので、前記プリント基板(5)
の位置決めが短時間で行われる。
In this third embodiment as well, when the printed circuit board (5) for inspection placed on the upper surface of the support part 4 is pressed downward, o
ft support part 120) is pressed downward against the force of the spring, and the positioning pin: ^
The printed circuit board (5) is positioned by the positioning hole (9) and the positioning hole (9). Moreover, in this third embodiment, when the supporting portion (the shaft) moves downward, the rotation of the gear 241 causes the cursor-shaped member (to) to rise, and the positioning pin (231) also rises. Board (5)
positioning is done in a short time.

(ト)発明の効果 本発明に依れば、被検査用プリント基板に寸法誤差が生
じても、前記プリント基板を正確に位置決めし、確実な
検査を行うことが出来る基板検査装置を提供し得る。
(G) Effects of the Invention According to the present invention, it is possible to provide a board inspection device that can accurately position the printed circuit board and perform reliable inspection even if a dimensional error occurs in the printed circuit board to be inspected. .

【図面の簡単な説明】[Brief explanation of drawings]

図面は何れも本発明に係り、@1図r/′i第1実施例
の断面図、第2図は@1夫強例の要部断面図、第3図は
vJ2実施例の要部断面図、第4図は第3実施例の要部
Ffr面図である。 (1)・・・ピンボード治具、(2)・・・検査用ピン
、(3)嬌・・・支持部、(4)061M・・・位置決
めピン、(6)・・・被検査用プリント基板、(8)・
・・検査部、(川・・・押えベース(押圧部)、0η・
・・突子−←H→4゜ 出頭大 三#電機株式会社 代理人 弁理士 西寿卓嗣(外1名) 第1図 1? 糖
The drawings are all related to the present invention: @1 Figure r/'i is a cross-sectional view of the first embodiment, Figure 2 is a cross-sectional view of the main part of the @1 example, and Figure 3 is a cross-section of the main part of the vJ2 embodiment. 4 are main part Ffr side views of the third embodiment. (1)... Pin board jig, (2)... Inspection pin, (3) Cap... Support part, (4) 061M... Positioning pin, (6)... For inspected Printed circuit board, (8)・
...Inspection part, (river...presser base (pressing part), 0η.
・・Tsuko-←H→4゜Appearance 3# Denki Co., Ltd. agent Patent attorney Takuji Nishiju (1 other person) Figure 1 1? sugar

Claims (1)

【特許請求の範囲】[Claims] 被検査用プリント基板の検査部に接触する検査用ピンと
、前記プリント基板の位置決め孔に挿入する位置決めピ
ンと、前記プリント基板を前記検査部に前記検査用ピン
が接触していない状態で支持する支持部とを夫々同一面
上に備えるピンボード治具、及び前記プリント基板を前
記検査用ピン側に押圧することにより、前記支持部を前
記ピンボード治具の方向に移動させ、前記位置決め孔に
前記位置決めピンを挿入する押圧部とから成る基板検査
装置。
An inspection pin that contacts an inspection section of a printed circuit board to be inspected, a positioning pin that is inserted into a positioning hole of the printed circuit board, and a support section that supports the printed circuit board in a state where the inspection pin is not in contact with the inspection section. By pressing the pin board jig and the printed circuit board toward the inspection pin side, the support part is moved in the direction of the pin board jig, and the positioning hole is inserted into the positioning hole. A board inspection device consisting of a pressing part into which a pin is inserted.
JP61105454A 1986-05-08 1986-05-08 Substrate inspecting device Pending JPS62261977A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61105454A JPS62261977A (en) 1986-05-08 1986-05-08 Substrate inspecting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61105454A JPS62261977A (en) 1986-05-08 1986-05-08 Substrate inspecting device

Publications (1)

Publication Number Publication Date
JPS62261977A true JPS62261977A (en) 1987-11-14

Family

ID=14408031

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61105454A Pending JPS62261977A (en) 1986-05-08 1986-05-08 Substrate inspecting device

Country Status (1)

Country Link
JP (1) JPS62261977A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012141159A (en) * 2010-12-28 2012-07-26 Hioki Ee Corp Substrate receiving pin, pin board unit, and substrate inspecting device
JP2015021867A (en) * 2013-07-19 2015-02-02 三菱電機株式会社 Semiconductor device test tool

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6135372A (en) * 1984-07-27 1986-02-19 Toshiba Corp Automatic inspecting device for floppy disk device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6135372A (en) * 1984-07-27 1986-02-19 Toshiba Corp Automatic inspecting device for floppy disk device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012141159A (en) * 2010-12-28 2012-07-26 Hioki Ee Corp Substrate receiving pin, pin board unit, and substrate inspecting device
JP2015021867A (en) * 2013-07-19 2015-02-02 三菱電機株式会社 Semiconductor device test tool

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