JPS62255059A - Back damage device - Google Patents

Back damage device

Info

Publication number
JPS62255059A
JPS62255059A JP10044086A JP10044086A JPS62255059A JP S62255059 A JPS62255059 A JP S62255059A JP 10044086 A JP10044086 A JP 10044086A JP 10044086 A JP10044086 A JP 10044086A JP S62255059 A JPS62255059 A JP S62255059A
Authority
JP
Japan
Prior art keywords
tape
work
workpiece
chuck
polishing tape
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10044086A
Other languages
Japanese (ja)
Inventor
Kunihiko Watanabe
邦彦 渡辺
Hatsuyuki Arai
新井 初雪
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SpeedFam Co Ltd
Original Assignee
SpeedFam Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SpeedFam Co Ltd filed Critical SpeedFam Co Ltd
Priority to JP10044086A priority Critical patent/JPS62255059A/en
Publication of JPS62255059A publication Critical patent/JPS62255059A/en
Pending legal-status Critical Current

Links

Landscapes

  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)

Abstract

PURPOSE:To prevent environmental contamination and unnecessary abrasion and to obtain an N1 type simple structure in a back damage device for a silicon wafer, etc. by providing a rotatable chuck, grinding tape carrying means, pressu rizing means and swinging means. CONSTITUTION:A grinding tape 9 which is wound between winding reels 11, 12 and guided by guide rollers 13, 13 travels when a work 2 held by a chuck 3 is rotated by a motor 5. While a holder 17 descends through a guide 18 by a rod 16a of a pressurizing cylinder 16. Then the tape 9 is pressed against the work 2 by the action of a spring 20 of a pressurizing roller 19. The width of the tape 9 is somewhat wider than the radius of the work 2. The tape 9 is positioned eccentrically at one side of the work 2 and grinds the work 2, swinging horizontally along rails 22 by a driving source 23. Water is supplied from a water feeding pipe to the machined portion. There is no scattering of the particles and abrasion of unnecessary portions as separating grinding particles are not used. Thus, it is possible to make the structure of the present device simple and compact.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、シリコンウェハ等のワークにおけるデバイス
活性層の結晶転位制御を目的として該ワークの裏面にダ
メージを与えるためのバックダメージ装置に関するもの
である。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a back damage device for damaging the back surface of a workpiece such as a silicon wafer for the purpose of controlling crystal dislocations in a device active layer of the workpiece. be.

[従来の技術] シリコンウェハ等のワークにおけるデバイス活性層の結
晶転位制御を行うために、該ワークのミラー面とは反対
側の面、即ち裏面側にある深さでダメージを与えると、
上記デバイス面側の結晶転位を低減させ得ることが良く
知られており、はとんど全てのワークにショツトブラス
ト法やラッピング法など種々の方法でバックダメージ処
理が施されている。
[Prior Art] In order to control crystal dislocations in a device active layer in a workpiece such as a silicon wafer, damage is caused to a certain depth on the surface opposite to the mirror surface of the workpiece, that is, on the back surface side.
It is well known that crystal dislocations on the device surface side can be reduced, and back damage treatment is applied to almost all workpieces by various methods such as shot blasting and lapping.

しかしながら′、上記ショツトブラスト法は、研磨剤を
高圧水と共にワークに吹付ける方法であるため、研磨剤
が周囲へ飛散し、環境汚染を生じたり、不必要な部分の
磨耗を生じることが多く、それらを防止した構成にする
と装置全体が大がかりにならざるをえない。
However, since the above-mentioned shot blasting method is a method in which abrasives are sprayed onto the workpiece together with high-pressure water, the abrasives often scatter to the surroundings, causing environmental pollution and unnecessary wear of parts. If such a configuration were to prevent such problems, the entire device would have to be large-scale.

また、ラッピングによる方法も、同様に、遊離砥粒を使
用することからその飛散が生じ、汚染や不必要部分の磨
耗などを生じることになる。
Similarly, the lapping method uses loose abrasive grains, which causes scattering of the abrasive grains, resulting in contamination and abrasion of unnecessary parts.

[発明が解決しようとする問題点] 本発明の課題は、研磨剤の飛散を生じることがなく、且
つ構造が簡単で小形のバックダメージ装置を提供するこ
とにある。
[Problems to be Solved by the Invention] An object of the present invention is to provide a back damage device that does not cause scattering of abrasives, has a simple structure, and is small.

[問題点を解決するための手段] 上記課題を解決するため、本発明のバックダメージ装置
は、加工すべきワークを保持する回転自在のチャックと
、横幅がワークの半径より大きく形成され、且つ片面に
砥粒が塗付された研磨用テープと、上記研磨用チー・ブ
を連続的に移送する移送手段と、チャックで保持された
ワークの半径部分に上記研磨用テープを押付ける加圧手
段と、ワークと研磨用テープとをワークの半径方向へ相
対的に揺動させる揺動手段と、を備えたものとして構成
したことを特徴とするものである。
[Means for Solving the Problems] In order to solve the above problems, the back damage device of the present invention includes a rotatable chuck that holds a workpiece to be machined, a chuck whose width is larger than the radius of the workpiece, and a single-sided chuck. a polishing tape coated with abrasive grains; a transfer means for continuously transporting the polishing tape; and a pressure means for pressing the polishing tape against a radius of a workpiece held by a chuck. , and a swinging means for swinging the workpiece and the polishing tape relative to each other in the radial direction of the workpiece.

[作 用コ ワークがミラー面とは反対側の面即ち裏面を外にした状
態でチャックに保持されると、該チャックの回転と研磨
用テープの移送とが開始され、同時に、加圧手段で研磨
用テープがワークに押付けられる。さらに、駆動手段に
よって研磨用テープとワークとが該ワークの半径方向へ
相対的に揺動変位せしめられる。
[Operation] When the co-work is held in the chuck with the side opposite to the mirror surface, that is, the back side facing out, the rotation of the chuck and the transfer of the polishing tape are started, and at the same time, the polishing is performed by the pressure means. tape is pressed against the workpiece. Furthermore, the polishing tape and the workpiece are relatively oscillatedly displaced in the radial direction of the workpiece by the driving means.

かくして、ワークは回転しながら研磨用テープと摺接し
、その全面が均等に加工されることにより所定のバック
ダメージ処理が施される。
In this way, the workpiece comes into sliding contact with the abrasive tape while rotating, and the entire surface of the workpiece is uniformly processed, thereby receiving a predetermined back damage treatment.

このとき、固定砥粒による研磨であるため砥粒の飛散を
生じるようなことがなく、環境汚染や不必要部分の摩耗
等が発生しない。
At this time, since polishing is performed using fixed abrasive grains, there is no scattering of abrasive grains, and no environmental pollution or wear of unnecessary parts occurs.

[実施例] 以下、本発明の実施例を図面に基づいて詳細に説明する
[Example] Hereinafter, an example of the present invention will be described in detail based on the drawings.

第1図において、lは機体であって、該機体1の内部に
は、シリコンウェハ等のワーク2を吸着等の適宜手段に
より保持する回転自在のチャック3が配設され、該チャ
ック3は、駆動軸4を介してモータ等の駆動源5に連結
されている。
In FIG. 1, l is a machine body, and a rotatable chuck 3 that holds a workpiece 2 such as a silicon wafer by suitable means such as suction is disposed inside the machine body 1, and the chuck 3 is It is connected via a drive shaft 4 to a drive source 5 such as a motor.

上記機体l上に配設された支持フレーム8には、研磨用
テープ9の両端を巻付けた巻取リール11.12と、該
研磨用テープ9の移送を案内する複数のガイドローラ1
3,13.・・・とからなる移送手段10が取付けられ
、且つ、上記チャック3に保持されたワーク2との対応
位置には、上記研磨用テープ9をワーク2に押付けるた
めの加圧手段14が配設されている。
A support frame 8 disposed on the machine body 1 includes a take-up reel 11, 12 around which both ends of the polishing tape 9 are wound, and a plurality of guide rollers 1 for guiding the transport of the polishing tape 9.
3,13. A transfer means 10 consisting of... is attached, and a pressure means 14 for pressing the polishing tape 9 against the work 2 is arranged at a position corresponding to the work 2 held by the chuck 3. It is set up.

上記研磨用テープ9は、第2図から分るように、横幅W
がワーク2の半径より若干大きく形成され、その片面に
は砥粒が塗付せしめられており、ワーク2に対してその
一側へ偏寄した位置に配設されている。
As can be seen from FIG. 2, the polishing tape 9 has a width W
is formed to be slightly larger than the radius of the workpiece 2, one side of which is coated with abrasive grains, and placed at a position biased toward one side of the workpiece 2.

また、研磨用テープ9をワーク2に押付ける上記加圧手
段14は、支持フレーム8に固定された加圧シリンダ1
6のロッド1lliaに、ガイド18を介してホルダ1
7を上下動自在に取付け、このホルダ17に研磨用テー
プ9の幅と略同長の加圧ローラ19を回転目在に取付け
たもので、上記ホルダ17をばね20で加圧方向へ付勢
させ、その付勢力によって研磨剤テープ9をワーク2の
半径部分に押付けるようにしている。
Further, the pressure means 14 for pressing the polishing tape 9 against the workpiece 2 is a pressure cylinder 1 fixed to the support frame 8.
The holder 1 is attached to the rod 1llia of No. 6 through the guide 18.
7 is attached to be movable up and down, and a pressure roller 19 having approximately the same length as the width of the polishing tape 9 is attached to this holder 17 in a rotary position, and the holder 17 is biased in the pressure direction by a spring 20. The abrasive tape 9 is pressed against the radius portion of the workpiece 2 by the biasing force.

上記支持フレーム8は、機体】上に固定されたレール2
2に沿って研磨用テープ9の横幅方向へ移動自在に配設
され、シリンダやモータからなる駆動源23によって揺
動されるようになっている。即ち、上記レール22と駆
動源23とによって支持フレーム8の揺動手段21が構
成されている。
The support frame 8 is a rail 2 fixed on the aircraft body.
2 in the width direction of the polishing tape 9, and is oscillated by a drive source 23 consisting of a cylinder or a motor. That is, the rail 22 and the drive source 23 constitute a swinging means 21 for the support frame 8.

次に、上記構成を有するバックダメージ装置の作用につ
いて説明する。
Next, the operation of the back damage device having the above configuration will be explained.

まず、ワーク2をミラー面とは反対側の面即ち裏面を外
にしだ状態でチャック3に保持させる。
First, the workpiece 2 is held by the chuck 3 with the surface opposite to the mirror surface, that is, the back surface thereof, facing outward.

このとき、加圧ローラ19及び研磨用テープ9は加圧シ
リンダ16により上昇待機している。
At this time, the pressure roller 19 and the polishing tape 9 are on standby to be raised by the pressure cylinder 16.

次に、チャック3を回転させると共に、巻取リール12
を回転させて研磨用テープ9を移送せしめ、加圧シリン
ダ16により加圧ローラ19を下動させて研磨用テープ
9をワーク2に押付ける。さらに、駆動手段23によっ
て支持フレーム8を揺動させ、ワーク2と研磨用テープ
9とを該ワーク2の半径方向へ相対的に揺動変位させる
。このとき。
Next, while rotating the chuck 3, the take-up reel 12
is rotated to transfer the polishing tape 9, and the pressure roller 19 is moved downward by the pressure cylinder 16 to press the polishing tape 9 against the workpiece 2. Furthermore, the support frame 8 is oscillated by the driving means 23, and the workpiece 2 and the polishing tape 9 are oscillated relative to each other in the radial direction of the workpiece 2. At this time.

ワーク2の研磨用テープ9による加工部位には。For the part of the workpiece 2 to be processed by the polishing tape 9.

図示しない給水管を通じて水が供給される。Water is supplied through a water supply pipe (not shown).

かくして、ワーク2は回転しながら研磨用テープ9と摺
接し、その全面が均等に加工されることにより所定のバ
ックダメージ処理が施されることになる。
In this way, the workpiece 2 comes into sliding contact with the polishing tape 9 while rotating, and the entire surface of the workpiece 2 is uniformly processed, thereby being subjected to a predetermined back damage treatment.

上述した装置の動作は、マイクロコンピュータ等の制御
手段により自動的に制御することができる。
The operation of the device described above can be automatically controlled by a control means such as a microcomputer.

[発明の効果] このように、本発明のバックダメージ装置によれば、砥
粒を塗付した研磨用テープでワークを研磨するようにし
たので、遊離砥粒を使用する場合のような砥粒の飛散を
生じることがなく、環境汚染や不必要部分の磨耗等を生
じることなく加工を行うことができる。
[Effects of the Invention] As described above, according to the back damage device of the present invention, since the workpiece is polished with the polishing tape coated with abrasive grains, the abrasive grains are not used in the case where free abrasive grains are used. Processing can be carried out without causing any scattering of particles, environmental pollution, or abrasion of unnecessary parts.

また、研磨用テープをワークに押合けるだけであるから
、高圧水をノズルから噴出させるショツトブラスト法や
、大重量の定盤を回転させるラッピング法に比べ、装置
の構造が簡単になり、それを小形化することができる。
In addition, since the polishing tape is simply pressed onto the workpiece, the structure of the device is simpler than the shot blasting method, in which high-pressure water is ejected from a nozzle, or the lapping method, in which a heavy surface plate is rotated. Can be made smaller.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例を示す断面図、第2図はその
要部平面図である。 2 ロワーク、    3 ・・チャック、9・・研磨
用テープ、10・・移送手段、14・・加圧手段、  
21・・揺動手段。
FIG. 1 is a sectional view showing an embodiment of the present invention, and FIG. 2 is a plan view of the main part thereof. 2 Lower work, 3... Chuck, 9... Polishing tape, 10... Transfer means, 14... Pressure means,
21... Swinging means.

Claims (1)

【特許請求の範囲】 1、加工すべきワークを保持する回転自在のチャックと
、 横幅がワークの半径より大きく形成され、且つ片面に砥
粒が塗付された研磨用テープと、 上記研磨用テープを連続的に移送する移送手段と、 チャックで保持されたワークの半径部分に上記研磨用テ
ープを押付ける加圧手段と、 ワークと研磨用テープとをワークの半径方向へ相対的に
揺動させる揺動手段と、 を備えたことを特徴とするバックダメージ装置。
[Scope of Claims] 1. A rotatable chuck that holds a workpiece to be processed; an abrasive tape having a width larger than the radius of the workpiece and coated with abrasive grains on one side; and the above-mentioned abrasive tape. a pressure means for pressing the polishing tape against a radial portion of the workpiece held by the chuck; and a pressure means for relatively swinging the workpiece and the polishing tape in the radial direction of the workpiece. A back damage device comprising: a swinging means;
JP10044086A 1986-04-30 1986-04-30 Back damage device Pending JPS62255059A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10044086A JPS62255059A (en) 1986-04-30 1986-04-30 Back damage device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10044086A JPS62255059A (en) 1986-04-30 1986-04-30 Back damage device

Publications (1)

Publication Number Publication Date
JPS62255059A true JPS62255059A (en) 1987-11-06

Family

ID=14273996

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10044086A Pending JPS62255059A (en) 1986-04-30 1986-04-30 Back damage device

Country Status (1)

Country Link
JP (1) JPS62255059A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1015802A (en) * 1996-07-10 1998-01-20 Sony Corp Polishing device and polishing method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56140632A (en) * 1980-04-01 1981-11-04 Nec Corp Method for giving strain to semiconductor wafer
JPS58196962A (en) * 1982-05-11 1983-11-16 Matsushita Electric Ind Co Ltd Device for grinding the surface of thin plate

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56140632A (en) * 1980-04-01 1981-11-04 Nec Corp Method for giving strain to semiconductor wafer
JPS58196962A (en) * 1982-05-11 1983-11-16 Matsushita Electric Ind Co Ltd Device for grinding the surface of thin plate

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1015802A (en) * 1996-07-10 1998-01-20 Sony Corp Polishing device and polishing method

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