JPS62250968A - Coating apparatus - Google Patents

Coating apparatus

Info

Publication number
JPS62250968A
JPS62250968A JP9203786A JP9203786A JPS62250968A JP S62250968 A JPS62250968 A JP S62250968A JP 9203786 A JP9203786 A JP 9203786A JP 9203786 A JP9203786 A JP 9203786A JP S62250968 A JPS62250968 A JP S62250968A
Authority
JP
Japan
Prior art keywords
coated
solution
article
size
amount
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9203786A
Other languages
Japanese (ja)
Inventor
Kiyoshi Nakagawa
清 中川
Akitoshi Okawachi
大川内 明利
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP9203786A priority Critical patent/JPS62250968A/en
Publication of JPS62250968A publication Critical patent/JPS62250968A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/16Coating processes; Apparatus therefor
    • G03F7/162Coating on a rotating support, e.g. using a whirler or a spinner

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Coating Apparatus (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

PURPOSE:To supply a solution to an article to be coated in an adequate amount, in the coating of a photoresist, by providing a dripping liquid amount control part for controlling the dripping amount of the solution corresponding to the size of the article to be coated. CONSTITUTION:At first, an article 2 to be coated is placed on a spinner 1 and the size of the article 2 to be coated is detected by a TV camera 10 and an image processing part 11 to be transmitted to a dripping liquid amount control part 8. Whereupon, the dripping liquid amount control part 8 controls the extension and contraction quantity of a pump 4 through a motor 7 and a feed screw mechanism 6 so that a proper amount of a solution 5 is supplied to a dripping nozzle 3 corresponding to the size of the article 2 to be coated. Therefore, the solution 5 is dripped on the article 2 to be coated on the spinner 1 in an adequate amount corresponding to the size of said article 2 and a coating film of uniform thickness distribution is formed by centrifugal force.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、塗布技術、特に、半導体装置の製造における
フォトレジストの塗布工程に適用して有効な技術に関す
る。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a coating technique, particularly to a technique that is effective when applied to a photoresist coating process in the manufacture of semiconductor devices.

[従来の技術] 半導体装置の製造におけるフォトマスク基板や半導体ウ
ェハなどに対するフォトレジストの塗布技術については
、株式会社工業調査会、昭和58年it月15日発行、
[電子材料J 1984年11月号別冊、P67〜P7
1に記載されている。
[Prior Art] Regarding photoresist coating techniques for photomask substrates, semiconductor wafers, etc. in the manufacture of semiconductor devices, see Kogyo Kenkyukai Co., Ltd., published on May 15, 1982,
[Electronic Materials J November 1984 issue, P67-P7
1.

その概要は、回転されるフォトマスク基板や半導体ウェ
ハの中央部に一定量のフォトレジストを滴下させ、遠心
力によって全面に分散させて塗布を行うものである。
The general idea is to drop a certain amount of photoresist onto the center of a rotating photomask substrate or semiconductor wafer, and use centrifugal force to disperse it over the entire surface.

[発明が解決しようとする問題点] しかしながら、上記のような塗布装置では、フォトマス
ク基板や半導体ウェハの面積が変化しても、滴下される
フォトレジストの量が一定であるため、フォトレジスト
の供給量に過不足を生じるという欠点があり、過剰に滴
下されたフォトレジストが無駄になったり、フォトマス
ク基板や半導体ウェハの表面に形成されるフォトレジス
トの膜厚分布が不均一になる原因となっていることを本
発明者は見いだした。
[Problems to be Solved by the Invention] However, in the above-mentioned coating apparatus, the amount of photoresist dropped remains constant even if the area of the photomask substrate or semiconductor wafer changes. This method has the disadvantage of oversupplying or undersupplying the amount of photoresist that is supplied, which can result in wasted photoresist that has been dropped excessively, and can cause uneven thickness distribution of the photoresist formed on the surface of the photomask substrate or semiconductor wafer. The present inventor has discovered that.

本発明の目的は、溶液の無駄を生じることなく、被塗布
物表面に均一な塗布膜を形成することが可能な塗布技術
を提供することにある。
An object of the present invention is to provide a coating technique capable of forming a uniform coating film on the surface of an object to be coated without wasting solution.

本発明の前記ならびにそのほかの目的と新規な特徴は、
本明細書の記述および添付図面から明らかになるであろ
う。
The above and other objects and novel features of the present invention include:
It will become clear from the description herein and the accompanying drawings.

[問題点を解決するための手段] 本願において開示される発明のうち代表的なものの概要
を簡単に説明すれば、次の通りである。
[Means for Solving the Problems] A brief overview of typical inventions disclosed in this application is as follows.

すなわち、被塗布物の大きさに応じて、該被塗布物に滴
下される溶液の量を調整する滴下液量調整部を設けたも
のである。
That is, a dripping liquid amount adjusting section is provided to adjust the amount of solution dripped onto the object to be coated depending on the size of the object to be coated.

[作用] 上記した手段によれば、被塗布物の大きさが変化しても
、常に、被塗布物に溶液を過不足なく供給することが可
能となり、溶液の無駄を生じることなく、被塗布物表面
に均一な塗布膜を形成することができる。
[Function] According to the above-described means, even if the size of the object to be coated changes, it is possible to always supply the solution to the object to be coated in just the right amount and quantity, without wasting the solution. A uniform coating film can be formed on the surface of an object.

[実施例] 第1図は、本発明の一実施例である塗布装置の要部を示
す説明図である。
[Example] FIG. 1 is an explanatory diagram showing the main parts of a coating device that is an example of the present invention.

水平に設けられた回転自在なスピナ1の上には真空吸着
の方法などによって、たとえばフォトマスク基板などの
被塗布物2が着脱自在に固定され、該スピナ1とともに
回転される構造とされている。
An object 2 to be coated, such as a photomask substrate, is removably fixed onto a horizontally installed rotatable spinner 1 by vacuum suction or the like, and is configured to rotate together with the spinner 1. .

スピナ1に固定された被塗布物2の中央部上方には、塗
布ノズル3が設けられ、たとえばベローズなどで構成さ
れるポンプ4を介して、図示しないタンクなどから供給
されるフォトレジストなどの溶液5が滴下されるように
構成されている。
A coating nozzle 3 is provided above the center of the workpiece 2 fixed to the spinner 1, and a solution such as photoresist is supplied from a tank (not shown) through a pump 4 made of, for example, a bellows. 5 is configured to be dropped.

また、ポンプ4には、送りねじ機構6を介してモータ7
が接続され、モータ7の所定の方向への回動量に比例し
たポンプ4の伸縮量に応じて溶液5の滴下ノズル3から
の滴下量が変化される構造とされている。
The pump 4 is also connected to a motor 7 via a feed screw mechanism 6.
is connected, and the amount of solution 5 dripped from the dripping nozzle 3 is changed in accordance with the amount of expansion and contraction of the pump 4, which is proportional to the amount of rotation of the motor 7 in a predetermined direction.

この場合、送りねじ機構6を介してポンプ4を駆動する
モータ7には、滴下液量調整部8が接続されており、送
りねじ機構6の近傍に移動方向に沿って配設され、該送
りねじ機構6の移動量を検出する複数の位置センサ9か
らの情報に基づいて、ポンプ4の伸縮量を制御すること
により、滴下ノズル3から被塗布物2に滴下される溶液
5の量が所望の値に調整可能にされている。
In this case, a dripping liquid amount adjusting section 8 is connected to the motor 7 that drives the pump 4 via the feed screw mechanism 6, and is disposed near the feed screw mechanism 6 along the moving direction. By controlling the amount of expansion and contraction of the pump 4 based on information from a plurality of position sensors 9 that detect the amount of movement of the screw mechanism 6, the desired amount of solution 5 is dripped from the dripping nozzle 3 onto the object 2. The value can be adjusted.

また、スピナlの上方には、該スピナ1に載置される被
塗布物2の大きさを検出するテレビカメラ10が設けら
れ、該テレビカメラ10に接続される画像処理部11に
おいて検出された被塗布物2の大きさが滴下液量調整部
8に伝達されるように構成されている。
Further, a television camera 10 is provided above the spinner l to detect the size of the object 2 to be coated placed on the spinner 1, and an image processing unit 11 connected to the television camera 10 detects the size of the object 2 to be coated. It is configured such that the size of the object 2 to be coated is transmitted to the dripped liquid amount adjusting section 8.

さらに、滴下液量調整部8には、手動設定部12が接読
され、滴下ノズル3から被塗布物2に滴下される溶液5
の量が、外部から所望の値に設定可能にされている。
Further, a manual setting section 12 is read directly into the dripping liquid amount adjusting section 8, and the solution 5 to be dripped from the dripping nozzle 3 onto the object 2 to be coated is
The amount can be set to a desired value from the outside.

以下、本実施例の作用について説明する。The operation of this embodiment will be explained below.

始めに、スピナlの上に被塗布物2が載置され、テレビ
カメラ10および画像処理部11などによって被塗布物
2の大きさが検出されて滴下液量調整部8に伝達される
First, the object 2 to be coated is placed on the spinner 1, and the size of the object 2 to be coated is detected by the television camera 10, the image processing section 11, etc., and is transmitted to the dripping liquid amount adjustment section 8.

そして、滴下液量調整部8は、前記被塗布物2の大きさ
に応じた適量の溶液5が滴下ノズル3から供給されるよ
うにモータ7および送りねじ機構6を介してポンプ4の
伸tlilflを制御し、スピナ1の上に載置された被
塗布物2の上には、該被塗布物2の大きさに応じた量の
溶液5が過不足なく滴下される。
Then, the dripping liquid amount adjusting section 8 controls the pump 4 to extend via the motor 7 and the feed screw mechanism 6 so that an appropriate amount of the solution 5 according to the size of the object 2 to be coated is supplied from the dripping nozzle 3. The solution 5 is dripped onto the object 2 placed on the spinner 1 in an amount corresponding to the size of the object 2.

その後、スピナlが回転され、遠心力の作用によって溶
液5が被塗布物2の全面にねたうて均一の塗布され、該
被塗布物2の表面には、溶液5の無駄を生じることなく
、膜厚の分布が均一な溶液5の塗布膜が形成される。
Thereafter, the spinner 1 is rotated, and the solution 5 is uniformly applied to the entire surface of the object 2 by the action of centrifugal force, without wasting the solution 5 on the surface of the object 2. , a coating film of the solution 5 with a uniform film thickness distribution is formed.

また、上記の説明では、テレビカメラ10および画像処
理部11によって検出された被塗布物2の大きさに基づ
いて被塗布物2に滴下される溶液5の量を制御する場合
について説明したが、たとえば、作業者が被塗布物2の
大きさを判別し、手動設定部12を介して滴下液量調整
部8に溶液5の最適な滴下量を設定することも可能であ
る。
Furthermore, in the above description, the case was explained in which the amount of the solution 5 dropped onto the object to be coated 2 is controlled based on the size of the object to be coated 2 detected by the television camera 10 and the image processing section 11. For example, it is also possible for the operator to determine the size of the object 2 to be coated and set the optimum dripping amount of the solution 5 in the dripping liquid amount adjustment section 8 via the manual setting section 12.

このように、本実施例においては、以下の効果゛を得る
ことができる。
As described above, in this embodiment, the following effects can be obtained.

(1)、ポンプ4によって滴下ノズル3から被塗布物2
に供給される溶液5の量が、モータ7および送りねじ機
構6を介してポンプ4の伸縮を制御する滴下液量調整部
8により、被塗布物2の大きさに応じて最適に制御され
る構造であるため、被塗布物2の大きさが変化しても、
該被塗布物2の大きさに応じて溶液5が過不足なく滴下
され、たとえば過剰に滴下されることに起因する溶液5
の無駄が回避されるとともに、被塗布物2に溶液5の均
一な塗布膜が形成される。
(1) From the dripping nozzle 3 to the object 2 by the pump 4.
The amount of solution 5 supplied to the container is optimally controlled according to the size of the object to be coated 2 by a dripping liquid amount adjustment section 8 that controls expansion and contraction of the pump 4 via a motor 7 and a feed screw mechanism 6. Because of this structure, even if the size of the object 2 to be coated changes,
The solution 5 is dropped in just the right amount depending on the size of the object 2 to be coated, for example, the solution 5 caused by being dropped in excess
In addition, a uniform coating film of the solution 5 is formed on the object 2 to be coated.

(2)、前記(11の結果、フォトマスク基板や半導体
ウェハなどの被塗布物2に、リソグラフィ技術によって
形成されるパターンの寸法精度、ひいては製品の歩留り
が向上される。
(2) As a result of (11) above, the dimensional accuracy of the pattern formed by lithography on the object 2 to be coated, such as a photomask substrate or a semiconductor wafer, and thus the yield of the product are improved.

以上本発明者によってなされた発明を実施例に基づき具
体的に説明したが、本発明は前記実施例に限定されるも
のではなく、その要旨を逸脱しない範囲で種々変更可能
であることはいうまでもない、たとえば、溶液の滴下量
を制御する方法としては、ポンプの伸縮量を調整する方
法に限らず、ポンプの一回の吐出量を比較的小さな値に
一定に設定し、吐出回数を制御することによって調整す
る方法でもよい。
Although the invention made by the present inventor has been specifically explained above based on Examples, it goes without saying that the present invention is not limited to the Examples and can be modified in various ways without departing from the gist thereof. For example, the method of controlling the amount of solution dripping is not limited to adjusting the amount of expansion and contraction of the pump, but it is also possible to set the pump's discharge volume at a constant relatively small value and control the number of discharges. It is also possible to make adjustments by

以上の説明では主として本発明者によってなされた発明
をその背景となった利用分野である半導体装置の製造に
おけるフォトレジストの塗布技術に適用した場合につい
て説明したが、それに限定されるものではなく、被塗布
物に均一な塗布膜を形成することが必要とされる技術に
広く適用できる。
In the above explanation, the invention made by the present inventor was mainly applied to the photoresist coating technology in the manufacturing of semiconductor devices, which is the background field of application, but the invention is not limited thereto. It can be widely applied to techniques that require forming a uniform coating film on a coated object.

[発明の効果] 本願において開示される発明のうち代表的なものによっ
て得られる効果を簡単に説明すれば、下記の通りである
[Effects of the Invention] The effects obtained by typical inventions disclosed in this application are briefly described below.

すなわち、被塗布物に溶液を滴下することによって塗布
を行う塗布装置で、前記被塗布物の大きさに応じて前記
溶液の滴下量を調整する滴下液量調整部が設けられてい
るため、被塗布物の大きさが変化しても、常に、被塗布
物に溶液を過不足なく供給することが可能となり、溶液
の無駄を生じることなく、被塗布物表面に均一な塗布膜
を形成することができる。
That is, in a coating device that performs coating by dropping a solution onto an object to be coated, it is provided with a dripped liquid amount adjustment section that adjusts the amount of the solution dropped according to the size of the object to be coated. Even if the size of the object to be coated changes, it is possible to always supply just the right amount of solution to the object to be coated, and a uniform coating film can be formed on the surface of the object without wasting solution. Can be done.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、本発明の一実施例である塗布装置の要部を示
す説明図である。 1・・・スピナ、2・・・被塗布物、3・・・滴下ノズ
ル、4・・・ポンプ、5・・・溶液、6・・・送りねし
機構、7・・・モータ、8・・・滴下液量調整部、9・
・・位置センサ、10・・・テレビカメラ、11・・・
画像処理部、12・・・手動設定部。 、/−“) 代理人 弁理士  小 川 勝 男 第  1  閃 クーイす1でシプ
FIG. 1 is an explanatory diagram showing the main parts of a coating device that is an embodiment of the present invention. DESCRIPTION OF SYMBOLS 1...Spinner, 2...Object to be coated, 3...Dripping nozzle, 4...Pump, 5...Solution, 6...Feeding mechanism, 7...Motor, 8...・Dropped liquid amount adjustment section, 9・
...Position sensor, 10...TV camera, 11...
Image processing section, 12... manual setting section. ,/-“) Agent Patent Attorney Masaru Ogawa 1st Sen Kuisu 1 de Shipp

Claims (1)

【特許請求の範囲】 1、被塗布物に溶液を滴下することによって塗布を行う
塗布装置であって、前記被塗布物の大きさに応じて前記
溶液の滴下量を調整する滴下液量調整部が設けられてい
ることを特徴とする塗布装置。 2、前記被塗布物を回転させつつ前記溶液を滴下するこ
とによって塗布が行われることを特徴とする特許請求の
範囲第1項記載の塗布装置。 3、前記被塗布物がフォトマスク基板または半導体ウェ
ハであり、前記溶液がフォトレジストであることを特徴
とする特許請求の範囲第1項記載の塗布装置。
[Scope of Claims] 1. A coating device that performs coating by dropping a solution onto an object to be coated, comprising a dripping liquid amount adjustment section that adjusts the amount of the solution to be dropped according to the size of the object to be coated. A coating device characterized by being provided with. 2. The coating apparatus according to claim 1, wherein coating is performed by dropping the solution while rotating the object to be coated. 3. The coating apparatus according to claim 1, wherein the object to be coated is a photomask substrate or a semiconductor wafer, and the solution is a photoresist.
JP9203786A 1986-04-23 1986-04-23 Coating apparatus Pending JPS62250968A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9203786A JPS62250968A (en) 1986-04-23 1986-04-23 Coating apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9203786A JPS62250968A (en) 1986-04-23 1986-04-23 Coating apparatus

Publications (1)

Publication Number Publication Date
JPS62250968A true JPS62250968A (en) 1987-10-31

Family

ID=14043330

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9203786A Pending JPS62250968A (en) 1986-04-23 1986-04-23 Coating apparatus

Country Status (1)

Country Link
JP (1) JPS62250968A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63319078A (en) * 1987-06-22 1988-12-27 Tokyo Electron Ltd Discharger
JPH02131237A (en) * 1988-11-11 1990-05-21 Tokyo Electron Ltd Resist processor
JPH04177823A (en) * 1990-11-13 1992-06-25 Nec Kyushu Ltd Semiconductor manufacturing device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63319078A (en) * 1987-06-22 1988-12-27 Tokyo Electron Ltd Discharger
JPH02131237A (en) * 1988-11-11 1990-05-21 Tokyo Electron Ltd Resist processor
JPH04177823A (en) * 1990-11-13 1992-06-25 Nec Kyushu Ltd Semiconductor manufacturing device

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