JPS62226407A - Manufacture of magnetic head - Google Patents
Manufacture of magnetic headInfo
- Publication number
- JPS62226407A JPS62226407A JP6898686A JP6898686A JPS62226407A JP S62226407 A JPS62226407 A JP S62226407A JP 6898686 A JP6898686 A JP 6898686A JP 6898686 A JP6898686 A JP 6898686A JP S62226407 A JPS62226407 A JP S62226407A
- Authority
- JP
- Japan
- Prior art keywords
- magnetic
- layer
- magnetic layer
- etching
- resist
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 9
- 238000005530 etching Methods 0.000 claims abstract description 21
- 238000000992 sputter etching Methods 0.000 claims abstract description 8
- 239000010410 layer Substances 0.000 claims description 55
- 239000004020 conductor Substances 0.000 claims description 6
- 239000000463 material Substances 0.000 claims description 4
- 238000010030 laminating Methods 0.000 claims description 3
- 239000011241 protective layer Substances 0.000 claims description 3
- 239000000758 substrate Substances 0.000 claims description 3
- 238000000034 method Methods 0.000 abstract description 12
- 239000010409 thin film Substances 0.000 abstract description 4
- 239000010408 film Substances 0.000 abstract description 3
- 229910020641 Co Zr Inorganic materials 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 229910020520 Co—Zr Inorganic materials 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 229910010272 inorganic material Inorganic materials 0.000 description 2
- 239000011147 inorganic material Substances 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 239000009719 polyimide resin Substances 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000035699 permeability Effects 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/31—Structure or manufacture of heads, e.g. inductive using thin films
- G11B5/3163—Fabrication methods or processes specially adapted for a particular head structure, e.g. using base layers for electroplating, using functional layers for masking, using energy or particle beams for shaping the structure or modifying the properties of the basic layers
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Magnetic Heads (AREA)
Abstract
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本命明IIf碗研ヘッドの4造方法に関する。[Detailed description of the invention] [Industrial application field] This article relates to four methods of making Honmei Mei If bowl-ken heads.
従来、基板上に、絶縁層、下部磁性層、導体層、上部磁
性層、保一層上積層することによって成る磁気ヘッドに
おいて、磁性層として高透磁率である% Co−Zr系
スパッタ薄膜紫用い、かつ磁性層のギャップ部近傍が磁
性II!lの他の部分より意図的に薄くしてある構造に
する場合1例えば第2図に示すように、す7トオフ法を
2回行う工程、あるいは第5図に示すようにリフトオフ
法の後にイオンエツチング法を行う工程により形成され
ていた。Conventionally, in a magnetic head formed by laminating an insulating layer, a lower magnetic layer, a conductor layer, an upper magnetic layer, and a holding layer on a substrate, a % Co-Zr based sputtered thin film with high magnetic permeability is used as the magnetic layer. And the vicinity of the gap part of the magnetic layer is magnetic II! If the structure is intentionally made thinner than the other parts of the l It was formed by an etching process.
第2図(e)に示すような磁性)−のギャップ部近傍が
磁性層の他の部分より薄くなっている構造においては、
磁気飽和しにくくかつ発生磁界が急峻になる。In a structure where the vicinity of the magnetic gap is thinner than the other parts of the magnetic layer as shown in FIG. 2(e),
Magnetic saturation is difficult to occur and the generated magnetic field is steep.
しかし、前述の従来技術では、絶縁層4としてレジスト
ヲ用いる場合磁気ヘッドの上部磁性層の形成には適用で
きない。それは、リフトオフ法によりレジストパターン
1勿除去するのと同時に絶縁層4も除去されてしまうか
らであり、上記の従来技術は、絶縁層として、無機材料
(Sin、。However, the above-mentioned prior art cannot be applied to the formation of the upper magnetic layer of a magnetic head when a resist is used as the insulating layer 4. This is because when the resist pattern 1 is removed by the lift-off method, the insulating layer 4 is also removed at the same time, and the above-mentioned conventional technique uses an inorganic material (Sin, etc.) as the insulating layer.
At、O,等)やポリイミド樹脂などを用いた場合にし
か適用できないという問題点を有していた。This method has the problem that it can only be applied when materials such as At, O, etc.) or polyimide resins are used.
上記の無機材料やポリイミド樹脂は、レジストに比較し
てコストが萬い、段差被覆性が悪い、形状加工が困難等
の欠点があり、磁気ヘッドの絶縁層に使用するのは望ま
しくない。又、絶縁ノーの段差被覆性が悪い場合、その
上に形成される導体層や上部磁性ノーが段差部で切断さ
れ、もしくは切断され易い状況になシ、又、当然歩留も
低下する。The above-mentioned inorganic materials and polyimide resins are disadvantageous in that they are expensive compared to resists, have poor step coverage, and are difficult to shape, and are therefore undesirable for use in the insulating layer of a magnetic head. Furthermore, if the step coverage of the insulating layer is poor, the conductor layer or the upper magnetic layer formed thereon will be cut or easily cut at the step, and the yield will naturally decrease.
そこで本発明はこのような問題点を解決するもので、そ
の目的とするところは磁気特性が憬れ、安価で信頼性の
高い磁気ヘッド金高歩留で提供するところにある。SUMMARY OF THE INVENTION The present invention is intended to solve these problems, and its purpose is to provide a magnetic head with poor magnetic properties, low cost, and high reliability with a high gold yield.
本発明の磁気ヘッドの製造方法は、基板上に、絶I&層
、下部磁性ノー、導体層、上部磁性層、保護ノ?4に積
層することによってなる磁気ヘッドの製造工程において
前記下部磁性ノー又は上部磁性層の少なくともどちらか
一万がギャップ部近傍で該磁性1−の他の部分より意図
的に薄くしてある構造の下部又は上部磁性/f#に2回
のパッチのイオンエツチング法により形成し、かつ、1
回目のエツチング終了後に同じパッチにおいて磁性層上
に残存するエツチングマスク材を選択的にエツチング、
除去することを特徴とする。The method for manufacturing a magnetic head of the present invention includes forming an insulating layer, a lower magnetic layer, a conductor layer, an upper magnetic layer, a protective layer, and a protective layer on a substrate. In the manufacturing process of the magnetic head by laminating the magnetic head 1-4, at least one of the lower magnetic layer and the upper magnetic layer 1-1 is intentionally made thinner than other parts of the magnetic layer 1- in the vicinity of the gap part. Formed on the lower or upper magnetic /f# by two patch ion etching methods, and
After the second etching is completed, the etching mask material remaining on the magnetic layer is selectively etched in the same patch.
It is characterized by removal.
第1図は本発明の実施例における上部磁性層の形成工程
上水す図である。(a)において、導体層5上金覆うよ
うに形成され友絶縁層4(レジストで形成されている)
上にCo Zrの磁性薄膜6勿スパツタ装置において堆
積させる。本実施例では、4μm堆積させた。次に(b
)において所望磁性層形状のレジストパターン7を磁性
薄膜上に形成する。テーパ部においてはイオンエツチン
グによるレジストのエツチングレートが大きいのでこの
部分でのレジストの厚み七充分にとらなければならない
が、本実施例では、千垣部で、レジスト厚みが6μmと
なるようにレジストをスピンコードした。次に(0)に
おいて、Co Zr薄gkArガスによシイオンエツ
チングする。本実施例においては、初期のCo −zr
薄mの厚み4μmに対し、半分の2μmだけエツチング
した。Arガス圧4. OX 10−’ Torr、パ
ワー6oowL7)4合、Co−Zrのエツチングレー
トは333A/=で、2μmのエツチングには1時間を
要した。次にこれに連続してレジストのエツチングを行
う。Arガスの代わりにOtガスをエツチング[tのチ
ャ/バー内に尋人し、0.ガス圧4.0X10−4τo
rr 、パワー300Wにて、レジストのみ勿エツチン
グする。この場合レジストのエツチングレートは500
0A/amであるが、C!0−Zrのそれは100A/
jalI以下であり、選択比は50以上である。(C)
でのCo Zrエツチングの終了後に残存していたレ
ジストは、10分の0.ガスでのエツチングで全て除去
されるが、この時のCo Zrのエツチング量は高々1
000Aであり、問題はない。(d)では、再びレジス
トパターン8にパターニングするが、R<(e)でのイ
オンエツチングにおいて、磁性層のギャップ部近傍が磁
性層の他の部分に比較して2μmだけ薄くなるように、
レジストをパターニングする。(e)では(C)と同様
にCo−Zrのイオンエツチングを行い、上部磁性j−
の形成全終了する。該上部磁性層上にはエツチングマス
クであるレジストパターン8がまだ残存しているか%
co Zrの不要部分を全てエツチングしたので既に
レジストである絶縁wt 4が露出しており、残存して
いるレジストパターン8に(C)で行ったのと同様にエ
ツチング除去する場合には、残存レジストの厚みと同じ
厚みだけ絶縁層がエツチングされてし゛まう。しかし、
湿式法で残存レジスト全除去することに比べれば、絶縁
層のダメージは小さい。これはco Zrのエツチング
中にエツチングマスクであるレジストパターン80考面
もArプラズマで同時にたたかれて変質し、腿弐法での
レジストの除去が困難になっており、逆にArプラズマ
にさらされていなかった絶縁層であるレジストの方が湿
式法において除去され易くなっているからであり、もし
、湿式法によりレジストパターン8を除去する場合には
、絶縁層は決定的な損傷を受けてしまう。FIG. 1 is a diagram showing the process of forming an upper magnetic layer in an embodiment of the present invention. In (a), the conductor layer 5 is formed to cover the gold and the insulation layer 4 (formed of resist)
A magnetic thin film 6 of CoZr is deposited on top in a sputtering device. In this example, the film was deposited to a thickness of 4 μm. Then (b
), a resist pattern 7 having a desired magnetic layer shape is formed on the magnetic thin film. Since the etching rate of the resist by ion etching is high in the tapered part, the thickness of the resist in this part must be 70 minutes, but in this example, the resist was spun so that the resist thickness was 6 μm in the tapered part. Coded. Next, at (0), CoZr is ion-etched using a thin gkAr gas. In this example, initial Co-zr
Etching was performed by half of the thickness of 4 μm, which is 2 μm. Ar gas pressure4. The etching rate of Co-Zr was 333 A/=, and it took 1 hour to etch 2 μm. Next, following this, resist etching is performed. Etching Ot gas instead of Ar gas. Gas pressure 4.0X10-4τo
rr, etching only the resist at a power of 300W. In this case, the resist etching rate is 500
0A/am, but C! That of 0-Zr is 100A/
jalI or less, and the selectivity is 50 or more. (C)
The resist remaining after the Co Zr etching at All of it is removed by gas etching, but the amount of Co Zr etched at this time is at most 1
000A, no problem. In (d), the resist pattern 8 is patterned again, but in ion etching with R<(e), the area near the gap of the magnetic layer is made thinner by 2 μm compared to other parts of the magnetic layer.
Pattern the resist. In (e), Co-Zr ion etching is performed in the same manner as in (C), and the upper magnetic j-
The formation of is completely completed. Does the resist pattern 8, which is an etching mask, still remain on the upper magnetic layer?
Since all the unnecessary parts of co Zr have been etched, the resist insulation wt 4 is already exposed, and when the remaining resist pattern 8 is etched away in the same way as in (C), the remaining resist pattern 8 must be removed by etching. The insulating layer is etched by the same thickness. but,
The damage to the insulating layer is small compared to removing all the remaining resist using a wet method. This is because during co-Zr etching, the surface of the resist pattern 80, which is an etching mask, is also hit by Ar plasma and altered in quality, making it difficult to remove the resist using the two-layer method. This is because the resist, which is an insulating layer that has not been removed, is more easily removed by the wet method, and if the resist pattern 8 is removed by the wet method, the insulating layer will be permanently damaged. Put it away.
以上述べたように本発明によれば、磁気ヘッドの製造工
程において、磁性層を2回のバッチのイオンエツチング
法ンこより形成し、かつ、1回目のエツチング終了後に
同じバッチにおいて残存するエツチングマスク材全選択
的に除去すること知より、絶縁層としてレジストを用い
ている磁気ヘッドにおいて磁気特性の優れた磁性層を有
し、安価で信頼性の高い磁気ヘッドが高歩留で得られる
。As described above, according to the present invention, in the manufacturing process of a magnetic head, the magnetic layer is formed by two batches of ion etching, and the etching mask material remaining in the same batch after the first etching is completed. By selectively removing the resist, a magnetic head that uses resist as an insulating layer has a magnetic layer with excellent magnetic properties, and is inexpensive and highly reliable, which can be obtained at a high yield.
第1図(a)〜(e)は、本発明における磁性層の製造
工程を示す図、第2図(a)〜(f)は従来の磁性層の
製造工程?示す図、第3図(a) −= (e)は従来
の磁性層の製造工程を示す図。
1 ・・・基イ反
2・・・下部磁性層
3・・・導体層
4・・・絶縁層
5、7.8・・・レジストパターン
6.9・・・上部磁性層。
以上
(b)
CC)
(el
囁1唱
Cし)
(C)
箪2 回1(a) to 1(e) are diagrams showing the manufacturing process of the magnetic layer in the present invention, and FIGS. 2(a) to 2(f) are diagrams showing the manufacturing process of the conventional magnetic layer. The diagrams shown in FIGS. 3(a) to 3(e) are diagrams showing the conventional manufacturing process of a magnetic layer. 1...Basis 2...Lower magnetic layer 3...Conductor layer 4...Insulating layer 5, 7.8...Resist pattern 6.9...Upper magnetic layer. Above (b) CC) (El Whisper 1 C) (C) Koto 2 times
Claims (1)
保護層を積層することによってなる磁気ヘッドの製造工
程において、前記下部磁性層又は上部磁性層の少なくと
もどちらか一方がギャップ部近傍で該磁性層の他の部分
より意図的に薄くしてある構造の下部又は上部磁性層を
2回のバッチのイオンエッチング法により形成し、かつ
、1回目のエッチング終了後に同じバッチにおいて磁性
層上に残存するエッチングマスク材を選択的にエッチン
グ、除去することを特徴とする磁気ヘッドの製造方法。On the substrate, an insulating layer, a lower magnetic layer, a conductor layer, an upper magnetic layer,
In the manufacturing process of a magnetic head by laminating a protective layer, a structure in which at least one of the lower magnetic layer and the upper magnetic layer is intentionally made thinner than other parts of the magnetic layer near the gap part. The lower or upper magnetic layer is formed by two batches of ion etching, and after the first etching is completed, the etching mask material remaining on the magnetic layer is selectively etched and removed in the same batch. A method of manufacturing a magnetic head.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6898686A JPS62226407A (en) | 1986-03-27 | 1986-03-27 | Manufacture of magnetic head |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6898686A JPS62226407A (en) | 1986-03-27 | 1986-03-27 | Manufacture of magnetic head |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS62226407A true JPS62226407A (en) | 1987-10-05 |
Family
ID=13389493
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6898686A Pending JPS62226407A (en) | 1986-03-27 | 1986-03-27 | Manufacture of magnetic head |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62226407A (en) |
-
1986
- 1986-03-27 JP JP6898686A patent/JPS62226407A/en active Pending
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