JPS62217142A - Photometric part for chemical analysis - Google Patents

Photometric part for chemical analysis

Info

Publication number
JPS62217142A
JPS62217142A JP6187186A JP6187186A JPS62217142A JP S62217142 A JPS62217142 A JP S62217142A JP 6187186 A JP6187186 A JP 6187186A JP 6187186 A JP6187186 A JP 6187186A JP S62217142 A JPS62217142 A JP S62217142A
Authority
JP
Japan
Prior art keywords
light
slide
measurement
optical sensors
chemical analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6187186A
Other languages
Japanese (ja)
Other versions
JPH0617865B2 (en
Inventor
Tadashi Uekusa
植草 正
Takashi Koizumi
孝 小泉
Shunichi Seto
俊一 瀬戸
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Holdings Corp
Original Assignee
Fuji Photo Film Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Photo Film Co Ltd filed Critical Fuji Photo Film Co Ltd
Priority to JP61061871A priority Critical patent/JPH0617865B2/en
Publication of JPS62217142A publication Critical patent/JPS62217142A/en
Publication of JPH0617865B2 publication Critical patent/JPH0617865B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/4738Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474Details of optical heads therefor, e.g. using optical fibres

Abstract

PURPOSE:To permit extremely easy change-over of filters by providing a light source so as to face the position where the measuring surface of a slide is disposed, providing plural pieces of optical sensors to the positions where reflected light can be received and respectively providing interference filters which are different from each other in the wavelengths of the light to be selectively transmitted to the photodetecting surfaces of the respective optical sensors. CONSTITUTION:The light source 3 emits the irradiation light suitable for measurement of the slide 5. The irradiation light passes an irradiation light passage 2C in a block 2 and is made incident perpendicularly on the measuring surface 5a of the slide 5. The reflected light thereof passes a reflected light passage 2D and advances toward the respective optical sensors 4. The interference filters 10 which are different from each other in the wavelengths of the light to be selectively passed are respectively provided on the photodetecting surfaces of the optical sensors 4. The quantity of the reflected light to be received is surely changed by the concn. of the measuring component if the outputs of the optical sensors 4 are electrically changed over. The measurement corresponding to measurement items is thus easily made with good accuracy.

Description

【発明の詳細な説明】 (発明の分野) 本発明は、試料を収容してなる化学分析スライドの測定
面に照射光を照射し、該測定面から反射された反射光を
光センサで受光して該測定面の反射濃度の測定を行なう
化学分析用測光部に関し、特に詳細には、試料中の測定
される成分に応じた良好な測定を行なうことのできる化
学分析用測光部に関するものである。
Detailed Description of the Invention (Field of the Invention) The present invention irradiates a measurement surface of a chemical analysis slide containing a sample with irradiation light, and receives reflected light from the measurement surface with an optical sensor. The present invention relates to a photometric unit for chemical analysis that measures the reflection density of the measurement surface, and more particularly, to a photometric unit for chemical analysis that can perform good measurements according to the components to be measured in a sample. .

(発明の技術的背景および先行技術) 近年、例えば血液や尿等の試料液の小滴を点着供給する
だけで該試料液中に含まれている特定の化学成分または
有形成分を定量分析することのできるドライタイプの化
学分析スライドが開発され(特公昭53−21677号
、特開昭55−164356号等)、実用化されている
(Technical Background and Prior Art of the Invention) In recent years, it has become possible to quantitatively analyze specific chemical components or formed components contained in a sample liquid such as blood or urine by simply applying small droplets of the sample liquid. Dry type chemical analysis slides have been developed (Japanese Patent Publication No. 53-21677, Japanese Patent Application Laid-open No. 55-164356, etc.) and have been put into practical use.

このような化学分析スライドを用いる試料液中の化学成
分等の分析は、試料液を化学分析スライドに点着供給し
た俊、これをインキュベータ(恒温機)内で所定時間恒
温保持(インキュベーション)して呈色反応(色素生成
反応)ざぜ、その呈色光学濃度を光学的に測定し、即ち
、試料液中の被測定成分と化学分析スライドの試薬層に
含まれる試薬との組み合わせにより予め選定された波長
を含む測定用照射光をこの化学分析スライドに照射して
その反射光学濃度を測定し、これにより主として比色法
の原理により被測定物質の含有量を定量分析することに
より行なわれる。
The analysis of chemical components in a sample solution using such a chemical analysis slide involves dot-feeding the sample solution onto the chemical analysis slide, and then incubating it in an incubator for a predetermined period of time. A color reaction (pigment formation reaction) is performed by optically measuring the color optical density, i.e., by combining the component to be measured in the sample solution with the reagent contained in the reagent layer of the chemical analysis slide. This chemical analysis slide is irradiated with measurement irradiation light containing a wavelength and its reflected optical density is measured, thereby quantitatively analyzing the content of the substance to be measured mainly based on the principle of colorimetry.

インキュベーションが終了した後に行なわれる、上記反
射温度測定は、化学分析用測光部により行なわれる。上
記測光部は、化学分析スライドの測定面に照射光を照射
する光源および測定面により反射された照射光の反射光
を受光する光センサを漏えてなり、この光センサの出力
によって測定面の濃度を測定するようになっている。
The above-mentioned reflection temperature measurement, which is performed after the incubation is completed, is performed by a photometer for chemical analysis. The photometry section includes a light source that irradiates the measurement surface of the chemical analysis slide with irradiation light and a light sensor that receives the reflected light of the irradiation light reflected by the measurement surface.The output of this light sensor determines the concentration of the measurement surface. It is designed to measure.

上記測光部の光源は通常タングステンランプ等が用いら
れ、比較的広い波長領域に亘る光を発するものとなって
いる。これに対して測定に有効な波長は、試料中の測定
が行なわれる成分によって異なったものとなる。すなわ
ち、ある測定成分の濃度が変化した場合に測定面からの
反射光の光量が最も顕著に変化する波長の光は測定成分
毎に異なっている。例えばグルコースの測定に対しては
510nm前後の光が最も有効である。従って光センサ
が測定項目に応じて上記特定波長の光のみを選択的に受
光すれば測定成分の濃度を最も効果的に測定することが
できる。光センサに特定の波長の反射光のみを入射させ
るためには光センサの受光面上に、特定の波長の光のみ
を選択的に入射させる干渉フィルタを形成すればよい。
The light source of the photometry section is usually a tungsten lamp or the like, which emits light over a relatively wide wavelength range. On the other hand, effective wavelengths for measurement vary depending on the component in the sample to be measured. That is, the wavelength of light at which the amount of reflected light from the measurement surface changes most significantly when the concentration of a certain measurement component changes varies depending on the measurement component. For example, light around 510 nm is most effective for measuring glucose. Therefore, if the optical sensor selectively receives only the light of the specific wavelength according to the measurement item, the concentration of the component to be measured can be measured most effectively. In order to allow only reflected light of a specific wavelength to enter the optical sensor, an interference filter that selectively allows only light of a specific wavelength to enter may be formed on the light receiving surface of the optical sensor.

しかしながら、測定を行なう項目は複数種類あり、濃度
測定を常に効果的に行なうためには測定項目が変化する
たびに、測定項目に応じた特性を有する干渉フィルタを
光センサの受光面上に配する必要がある。そこで予め複
数の干渉フィルタを用意し、これらの干渉フィルタを機
械的に移動させて所望の干渉フィルタを受光面上に配す
ることが考えられるが、上記のような干渉フィルタの機
構的な切り替えを行なうためには、干渉フィルタの移動
機構が必要になるので測定部の構造がWI雑化、大型化
してしまうという不都合が生じる。
However, there are multiple types of items to be measured, and in order to always perform effective concentration measurements, an interference filter with characteristics corresponding to the measurement item must be placed on the light-receiving surface of the optical sensor each time the measurement item changes. There is a need. Therefore, it is conceivable to prepare multiple interference filters in advance and move these interference filters mechanically to arrange the desired interference filter on the light receiving surface, but it is not possible to mechanically switch the interference filters as described above. In order to do this, a mechanism for moving the interference filter is required, resulting in the inconvenience that the structure of the measuring section becomes complicated and large.

(発明の目的) 本発明は上記のような問題点に鑑みてなされたものであ
り、測定項目によって、所望の特性を有する干渉フィル
タを備えた光センサにより測定を行なうことができ、か
つ使用されるフィルタの切!換えを、装置を大型化させ
ることなく、極めて容易に行なうことのできる化学分析
用測光部を提供することを目的とするものである。
(Object of the Invention) The present invention has been made in view of the above-mentioned problems, and it is possible to perform measurement with an optical sensor equipped with an interference filter having desired characteristics depending on the measurement item, and to use an optical sensor that is equipped with an interference filter having desired characteristics. Turn off the filter! It is an object of the present invention to provide a photometric section for chemical analysis that can be replaced extremely easily without increasing the size of the device.

(発明の構成) 本発明の化学分析用測光部は、光源がスライドの測定面
の配される位置に対向して設けられ、光センサが光源か
ら射出される照射光の反射光を受光可能な位置に複数個
設けられ、各光センサの受光面に、選択的に透過する光
の波長が互いに異なった干渉フィルタがそれぞれ設けら
れたことを特徴とするものである。
(Structure of the Invention) In the photometry section for chemical analysis of the present invention, the light source is provided opposite to the position where the measurement surface of the slide is disposed, and the optical sensor is capable of receiving reflected light of the irradiation light emitted from the light source. It is characterized in that a plurality of interference filters are provided at different positions, and interference filters are provided on the light-receiving surface of each optical sensor, each of which transmits selectively different wavelengths of light.

すなわち、上記測光部において、光源は測定面に対向し
て配され、照射光は測定部に略垂直に入射せしめられる
ので、照射光の反射光は光源の周囲の複数の位置で略同
じ条件で受光可能となる。
In other words, in the photometry section, the light source is arranged to face the measurement surface, and the irradiation light is made to enter the measurement section almost perpendicularly, so that the reflected light of the irradiation light is reflected at multiple positions around the light source under approximately the same conditions. It becomes possible to receive light.

従って上記のように複数の光センサを設け、ざらに各光
センサの受光面上に互いに特性の異なる干渉フィルタを
設けることが可能になり、このようにすれば、測定項目
に応じて光センサの出力を切り換え、測定項目に応じた
特性の干渉フィルタを有する光センサのみを用いて反射
光を検出することができる。従って本発明の測光部によ
れば、機械的なフィルタ切換え手段を用いて測光郡全体
を大型化、複雑化させることなく、電気的な光センサの
切り換えによって、複数の項目について高精な測定を行
なうことができる。
Therefore, as described above, it is possible to provide multiple optical sensors and provide interference filters with different characteristics on the light receiving surface of each optical sensor. By switching the output, it is possible to detect reflected light using only an optical sensor having an interference filter with characteristics according to the measurement item. Therefore, according to the photometry section of the present invention, high-precision measurements can be performed on multiple items by switching the electrical light sensor without making the entire photometry group larger or more complicated using mechanical filter switching means. can be done.

(実/l!態様) 以下、図面を参照して本発明の実施態様について説明す
る。
(Actual/l! Embodiment) Hereinafter, embodiments of the present invention will be described with reference to the drawings.

第1A図および11B図は本発明の一実施態様による化
学分析用測光部の作用を説明するための概略側面図であ
る。
FIGS. 1A and 11B are schematic side views for explaining the operation of a photometric section for chemical analysis according to an embodiment of the present invention.

測光部1は単一のブロック2に光源3および複数の光セ
ンサ4が1矢め込まれてなり、支持部材6により、上面
を露出させて支持されている。上記測光部1により濃度
測定が行なわれる化学分析用スライド5は、第2図に示
ずように、枠部5A内に、支持体、試薬層、展開層を積
層してなる乾式多層フィルム5Bが収容されてなり、裏
面(図中上面)に測定面5aが形成されている。このス
ライド5は表面に設けられた円孔(図示せず)から前記
フィルム5B上に尿、血液等の試料(被測定物質)を所
定m滴下された債、所定時間恒温保持(インキュベーシ
ョン)されて呈色反応せしめられる。またスライド5の
裏面にはバーコード5bが記載されている。このスライ
ド5は裏面が前記支持部材6と接するように支持部材上
にi!置される。
The photometering section 1 has a light source 3 and a plurality of optical sensors 4 embedded in a single block 2, and is supported by a support member 6 with the top surface exposed. As shown in FIG. 2, the slide 5 for chemical analysis on which the concentration is measured by the photometer 1 has a dry multilayer film 5B formed by laminating a support, a reagent layer, and a developing layer in a frame 5A. A measuring surface 5a is formed on the back surface (upper surface in the figure). This slide 5 has a sample (substance to be measured) such as urine or blood dropped onto the film 5B through a circular hole (not shown) provided in the surface for a predetermined number of meters, and is kept at a constant temperature (incubation) for a predetermined period of time. A color reaction is caused. Further, a barcode 5b is written on the back side of the slide 5. This slide 5 is placed i! on the support member so that the back side is in contact with the support member 6. placed.

上記測光部1上には、第1A図に示すようにスライド5
の測光に先立って、スライド5の反射濃度測定値の誤差
を修正するための基準白板7Wおよび基準黒板7Bがレ
バー8によって移動せしめられ、測光部1はこれらの基
準白板7Wおよび基準黒板7Bの反射1度を測定する。
As shown in FIG. 1A, a slide 5 is placed on the photometry section 1.
Prior to photometry, the reference white board 7W and the reference blackboard 7B for correcting errors in the measured reflection density values of the slide 5 are moved by the lever 8, and the photometry section 1 measures the reflection of the reference white board 7W and the reference blackboard 7B. Measure 1 degree.

続いて測光部1上にはスライド5がレバー8に押されて
移動せしめられるが、このスライド5は反射濃度の測定
が行なわれる前に、支持部材6内に設けられたバーコー
ド読取手段9により、裏面に付されたバーコード5bの
読み取りが行なわれる。バーコード5bの読取りが終了
すると、第1B図に示すようにスライド5は、測光部1
上に移動せしめられて測定面5aの反射S度測定が行な
われる。以下、第3図および第4図を参照して本実施態
様の測光部の構造について更に説明する。
Next, a slide 5 is moved onto the photometer 1 by being pushed by a lever 8, but before the reflection density is measured, the slide 5 is read by a barcode reading means 9 provided in the support member 6. , the barcode 5b attached to the back side is read. When the reading of the barcode 5b is completed, the slide 5 moves to the photometer 1 as shown in FIG. 1B.
It is moved upward and the reflection S degree of the measurement surface 5a is measured. The structure of the photometry section of this embodiment will be further explained below with reference to FIGS. 3 and 4.

第3図および第4図はそれぞれ測光部1のブロック2の
断面図および底面図である。ブロック2にはその下部の
中央に光源用嵌合孔2Aが、その周囲に一例として4つ
の光センサ用嵌合孔2Bが形成されている。タングステ
ンランプ等の光源3および4つの光センサ4はそれぞれ
前記光源用嵌合孔2Aおよび光センサ用嵌合孔2Bl、
:嵌め込まれてブロック2に取り付けられる。光源3は
スライド5の測定に適した照射光を発し、この照射光は
、ブロック2内の照射光通路2Cを通過してスライド5
の測定面5aに、該測定面に垂直に入射づる。測定面5
aにより反射された照射光の反射光は、ブロック2内に
形成された反射光通路2Dを通過して各光センサ4に向
かう。
3 and 4 are a sectional view and a bottom view of the block 2 of the photometry section 1, respectively. A light source fitting hole 2A is formed in the center of the lower part of the block 2, and four photosensor fitting holes 2B, for example, are formed around the light source fitting hole 2A. The light source 3 such as a tungsten lamp and the four optical sensors 4 are provided with the light source fitting hole 2A and the optical sensor fitting hole 2Bl, respectively.
: Fitted and attached to block 2. The light source 3 emits illumination light suitable for measuring the slide 5, and this illumination light passes through the illumination light path 2C in the block 2 and the slide 5.
The light is incident on the measurement surface 5a perpendicularly to the measurement surface. Measurement surface 5
The reflected light of the irradiation light reflected by a passes through a reflected light path 2D formed in the block 2 and heads toward each optical sensor 4.

ところで、光源3は、比較的広い波長領域に亘る光を発
するものであるが、前述のように測定に有効な波長は、
スライド5内の試料中の、測定が行なわれる成分によっ
て異なったものとなる。そこで本実施態様の測光部にお
いては、測定する成分に応じて有効な波長の光のみを選
択的に光センサ4に入射させることができるように、4
つの光センサ4の各受光面上に、互いに選択的に透過す
る光の波長の異なる干渉フィルタ10がそれぞれ設けら
れている。すなわち、測定項目に応じて所望の特性の干
渉フィルタ10を有する光センサ4を選択し、選択され
た光センサ4のみを用いて検出を行なうように光センサ
4の出力を電気的に切り換えれば、測定成分の濃度によ
って、受光される反射光の光量を確実に変化させること
ができ、測定項目に応じた高精度な測定を容易に行なう
ことができる。
By the way, the light source 3 emits light over a relatively wide wavelength range, but as mentioned above, the effective wavelengths for measurement are:
It differs depending on the component to be measured in the sample in the slide 5. Therefore, in the photometry section of the present embodiment, the light sensor 4 is configured so that only light having an effective wavelength can be selectively incident on the optical sensor 4 according to the component to be measured.
Interference filters 10 with different wavelengths of light that are selectively transmitted are provided on each light receiving surface of the two optical sensors 4. That is, by selecting the optical sensor 4 having the interference filter 10 with desired characteristics according to the measurement item, and electrically switching the output of the optical sensor 4 so that detection is performed using only the selected optical sensor 4. The amount of reflected light received can be reliably changed depending on the concentration of the component to be measured, and highly accurate measurements can be easily performed depending on the measurement item.

上記のように測定項目によって選択された、4つの光セ
ンサ4のうちの1つの光センサからの出力は、第1B図
に示すように増幅器13およびA/D変換器14へ送ら
れた侵、CPU (中央処理装置)15に送られて処理
され、このように測定された成分の濃度は、必要に応じ
て外部の表示装置(図示せず)に表示されたりする。ま
た4つの光センサのうちのどの光センサを濃度測定に用
いるかは、前記バーコード読取手段9からの情報を前記
CPU15に入力し、CP U 15のシリ御によって
反射1度が測定されるスライド5毎に行なうことができ
る。
The output from one of the four optical sensors 4 selected according to the measurement item as described above is transmitted to the amplifier 13 and A/D converter 14 as shown in FIG. 1B. The concentration of the component is sent to the CPU (central processing unit) 15 for processing, and the concentration of the component thus measured is displayed on an external display device (not shown) as necessary. Further, which of the four optical sensors is used for density measurement is determined by inputting information from the barcode reading means 9 into the CPU 15, and selecting the slide whose reflection rate is measured by the CPU 15's serial control. It can be done every 5.

なお光センサの数、すなわち、必要なフィルタの種類は
、測光部にJ5いて測定される項目の数によって任意に
決めることができる。また各光センサの配置も、全ての
光センサに良好な状態で反射光が入射せしめられる範囲
内で任意に設定することができる。また、本実施態様の
測光部においては上記のように?12敗の光センサを配
設するために、光源3がスライド5に対向して配されて
いるので、光源3による熱がスライド5に影W するこ
とのないよう、スライド5の測定面5aに対向する部分
に断熱フィルタ11が設けられている。(第3図参照)
上述したような、複数の光センサ4を有づる測光部1に
おいては、各光センサについて、照射光の反射光を良好
に受光しつる位置に正確に位置決めすることが必要であ
るので、本実施態様の測光部1のように光源3および光
センサ4がブロック2に嵌め込まれてユニット化されて
いれば各光センサについて精密な位置決めを行なう必要
がなく極めて便利である。すなわち前記ブロック2には
前記光源用嵌合孔2Aおよび光センサ用吹合孔2Bが形
成されているので、測光部1を組み立てる際には光源3
および光センサ4を各嵌合孔に沿ってブロック2に嵌合
させることによって容易に正確な位置に配置せしめるこ
とができる。なお、本発明において、測光部が上記のよ
うにユニット化されていることは必ずしも必要な要件で
はなく、光センサと光源が所定の位置に配されているも
のであれば測光部は任意の構造のものであってよい。
Note that the number of optical sensors, that is, the types of filters required, can be arbitrarily determined depending on the number of items to be measured by the photometer J5. Further, the arrangement of each optical sensor can be arbitrarily set within a range that allows reflected light to be incident on all optical sensors in a good condition. Also, in the photometry section of this embodiment, as described above? In order to arrange the 12-loss optical sensor, the light source 3 is placed opposite the slide 5, so that the measurement surface 5a of the slide 5 is placed so that the heat generated by the light source 3 does not cast a shadow on the slide 5. A heat insulating filter 11 is provided at opposing portions. (See Figure 3)
In the photometry section 1 having a plurality of optical sensors 4 as described above, it is necessary to accurately position each optical sensor at a position where it can receive the reflected light of the irradiated light well. If the light source 3 and the optical sensor 4 are fitted into the block 2 to form a unit like the photometric section 1 of the embodiment, there is no need for precise positioning of each optical sensor, which is extremely convenient. That is, since the light source fitting hole 2A and the light sensor fitting hole 2B are formed in the block 2, when assembling the photometry section 1, the light source 3 is
By fitting the optical sensor 4 into the block 2 along each fitting hole, the optical sensor 4 can be easily placed at an accurate position. In addition, in the present invention, it is not necessarily a necessary requirement that the photometry section be unitized as described above, and the photometry section may have any structure as long as the optical sensor and the light source are arranged at predetermined positions. It may be of.

(発明の効果) 以上説明したように、本発明の化学分析用測光部によれ
ば、複数の光センサを設け、各センサの受光面上に互い
に特性の異なる干渉フィルタを設けたことにより、測定
を行なう項目によって光センサを電気的に切り換えて用
い、測光部を大型化。
(Effects of the Invention) As explained above, according to the photometric section for chemical analysis of the present invention, a plurality of optical sensors are provided and interference filters with different characteristics are provided on the light receiving surface of each sensor, thereby making it possible to perform measurement. The light sensor is electrically switched and used depending on the item being measured, and the photometry section is enlarged.

複雑化させることなく測定項目に応じた高精度な測定を
極めて容易に行なうことができる。
Highly accurate measurements according to measurement items can be performed extremely easily without complication.

【図面の簡単な説明】 第1A図および第1B図は本発明の一実施態様による化
学分析用測光部の作用を説明する概略側面図、 第2図は化学分析スライドを示す斜視図、第3図は上記
実施態様による化学分析用測光部のブロックの断面図、 第4図は上記ブロックの底面図である。 1・・・化学分析用測光部 3・・・光+19i        4・・・光センサ
5・・・化学分析スライド 5a・・・測定面10・・
・干渉フィルタ 第1A図 第旧図 第2図 第3図 第4図 B
[BRIEF DESCRIPTION OF THE DRAWINGS] FIGS. 1A and 1B are schematic side views illustrating the operation of a photometric section for chemical analysis according to an embodiment of the present invention, FIG. 2 is a perspective view showing a chemical analysis slide, and FIG. The figure is a sectional view of the block of the photometric section for chemical analysis according to the above embodiment, and FIG. 4 is a bottom view of the block. 1... Photometering section for chemical analysis 3... Light +19i 4... Optical sensor 5... Chemical analysis slide 5a... Measurement surface 10...
・Interference filter Figure 1A Old diagram Figure 2 Figure 3 Figure 4B

Claims (1)

【特許請求の範囲】[Claims] 試料を収容してなる化学分析スライドの測定面に照射光
を照射する光源、および前記測定面により反射された照
射光の反射光を受光する光センサを備え、該光センサの
出力により前記測定面の濃度測定を行なう化学分析用測
光部において、前記光源が、前記測定面の配される位置
に対向して設けられ、前記光センサが、前記反射光を受
光可能な位置に複数個設けられ、各光センサの受光面に
、選択的に透過する光の波長が互いに異なった干渉フィ
ルタが設けられたことを特徴とする化学分析用測光部。
A light source that irradiates the measurement surface of a chemical analysis slide containing a sample with irradiation light, and a light sensor that receives the reflected light of the irradiation light reflected by the measurement surface, the measurement surface being controlled by the output of the light sensor. In the chemical analysis photometry unit that measures the concentration of 1. A photometric unit for chemical analysis, characterized in that interference filters that selectively transmit light of different wavelengths are provided on the light-receiving surface of each optical sensor.
JP61061871A 1986-03-19 1986-03-19 Photometric unit for chemical analysis Expired - Fee Related JPH0617865B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61061871A JPH0617865B2 (en) 1986-03-19 1986-03-19 Photometric unit for chemical analysis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61061871A JPH0617865B2 (en) 1986-03-19 1986-03-19 Photometric unit for chemical analysis

Publications (2)

Publication Number Publication Date
JPS62217142A true JPS62217142A (en) 1987-09-24
JPH0617865B2 JPH0617865B2 (en) 1994-03-09

Family

ID=13183617

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61061871A Expired - Fee Related JPH0617865B2 (en) 1986-03-19 1986-03-19 Photometric unit for chemical analysis

Country Status (1)

Country Link
JP (1) JPH0617865B2 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5240193A (en) * 1975-09-25 1977-03-28 Toshiba Betsukuman Kk Dividing lens and automatic analysis device with it
JPS546387A (en) * 1977-06-16 1979-01-18 Aroozu Kk Reflecting oximeter
JPS5555233A (en) * 1978-10-13 1980-04-23 Tobias Philip E Scanning head which irradiates white light upon region of sheettlike piece

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5240193A (en) * 1975-09-25 1977-03-28 Toshiba Betsukuman Kk Dividing lens and automatic analysis device with it
JPS546387A (en) * 1977-06-16 1979-01-18 Aroozu Kk Reflecting oximeter
JPS5555233A (en) * 1978-10-13 1980-04-23 Tobias Philip E Scanning head which irradiates white light upon region of sheettlike piece

Also Published As

Publication number Publication date
JPH0617865B2 (en) 1994-03-09

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