JPS62203476U - - Google Patents

Info

Publication number
JPS62203476U
JPS62203476U JP9199386U JP9199386U JPS62203476U JP S62203476 U JPS62203476 U JP S62203476U JP 9199386 U JP9199386 U JP 9199386U JP 9199386 U JP9199386 U JP 9199386U JP S62203476 U JPS62203476 U JP S62203476U
Authority
JP
Japan
Prior art keywords
sample
barcode
measuring device
measurement
sample holder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9199386U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9199386U priority Critical patent/JPS62203476U/ja
Publication of JPS62203476U publication Critical patent/JPS62203476U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP9199386U 1986-06-16 1986-06-16 Pending JPS62203476U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9199386U JPS62203476U (enrdf_load_stackoverflow) 1986-06-16 1986-06-16

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9199386U JPS62203476U (enrdf_load_stackoverflow) 1986-06-16 1986-06-16

Publications (1)

Publication Number Publication Date
JPS62203476U true JPS62203476U (enrdf_load_stackoverflow) 1987-12-25

Family

ID=30953284

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9199386U Pending JPS62203476U (enrdf_load_stackoverflow) 1986-06-16 1986-06-16

Country Status (1)

Country Link
JP (1) JPS62203476U (enrdf_load_stackoverflow)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50152672A (enrdf_load_stackoverflow) * 1974-05-28 1975-12-08
JPS5457968A (en) * 1977-10-18 1979-05-10 Nec Corp Electrical testing unit of semiconductor device and its production
JPS5588350A (en) * 1978-12-27 1980-07-04 Hitachi Ltd Manufacture of semiconductor device
JPS5940871B2 (ja) * 1982-09-17 1984-10-03 工業技術院長 石炭液化処理残「さ」の連続的処理方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50152672A (enrdf_load_stackoverflow) * 1974-05-28 1975-12-08
JPS5457968A (en) * 1977-10-18 1979-05-10 Nec Corp Electrical testing unit of semiconductor device and its production
JPS5588350A (en) * 1978-12-27 1980-07-04 Hitachi Ltd Manufacture of semiconductor device
JPS5940871B2 (ja) * 1982-09-17 1984-10-03 工業技術院長 石炭液化処理残「さ」の連続的処理方法

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