JPS6220152A - Stamper for molding optical disk and its manufacture - Google Patents

Stamper for molding optical disk and its manufacture

Info

Publication number
JPS6220152A
JPS6220152A JP15932585A JP15932585A JPS6220152A JP S6220152 A JPS6220152 A JP S6220152A JP 15932585 A JP15932585 A JP 15932585A JP 15932585 A JP15932585 A JP 15932585A JP S6220152 A JPS6220152 A JP S6220152A
Authority
JP
Japan
Prior art keywords
layer
nickel
stamper
plating
nickel plating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15932585A
Other languages
Japanese (ja)
Other versions
JPH0646462B2 (en
Inventor
Tokuo Okabayashi
岡林 徳雄
Hiroaki Kono
光野 浩昭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Daicel Corp
Original Assignee
Daicel Chemical Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Daicel Chemical Industries Ltd filed Critical Daicel Chemical Industries Ltd
Priority to JP60159325A priority Critical patent/JPH0646462B2/en
Publication of JPS6220152A publication Critical patent/JPS6220152A/en
Publication of JPH0646462B2 publication Critical patent/JPH0646462B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Optical Record Carriers And Manufacture Thereof (AREA)
  • Manufacturing Optical Record Carriers (AREA)

Abstract

PURPOSE:To form a stamper for molding an optical disk made of plastics which forms a conductive layer on an original board without depending upon a silver mirror reaction by providing an electrocast nickel layer on the electroless nickel plating layer. CONSTITUTION:The stamper for molding the optical disk made of plastics is composed of a conductive layer formed by executing the electroless nickel plating onto the original board for electrocasting to have the irregular information of the submicron order and the track, and the electrocast nickel layer formed by electrocasting on the conductive layer. The thickness of the conductive layer of the electroless nickel plating is generally 800-1,500Angstrom and the thickness of the electrocast nickel layer is amount 300mum. The electrocast nickel layer and the electroless nickel plating layer are mutually strongly linked, it is not necessary to remove the conductive layer after electrocasting, different from the conductive film of Ag due to the conventional silver mirror reaction, and the film can be used as the stamper for molding the plastics as it is.

Description

【発明の詳細な説明】 (従来技術) 絶縁物上に金属被膜を形成する際に使用される方法とし
て無電解メッキは周知のものである。しかし、従来の無
電解メッキは絶縁物表面の金属化あるいは導電化を目的
としたものが主であり、得られた無電解メッキ被膜の均
一性には厳密な゛要求がなされていなかった。
DETAILED DESCRIPTION OF THE INVENTION (Prior Art) Electroless plating is a well-known method used to form a metal film on an insulator. However, conventional electroless plating is mainly intended to metalize or conductive the surface of an insulating material, and no strict requirements have been placed on the uniformity of the resulting electroless plating film.

ところが、最近注目を集めている光(磁気)ディスクの
プラスチック製すブストレート?成形、例えば注型、射
出、圧縮成形等で製造する際に使用されるレプリカ金型
いわゆるスメンバーの表面精度には極めて高いものが要
求されている。このスタンパ−は一般にガラス原盤にレ
ジスト原盤布し、所定パターンに露光−硬化し、未硬化
部分を除去して製作された原盤から電鋳によって製作さ
れるが、このレジスト原盤は絶縁体であるため、電鋳作
業の前に導電層を形成する必要がある。従来、この導電
層は銀鏡反応によシ形成されてきたが、銀鏡面は化学的
に不安定で、空気中の酸素で酸化を起して粗面化し、物
理的強度も弱いため電鋳後に銀鏡層を取シ除かねばなら
ず、その結果スタンパ−面の表面精度が低下するという
欠点があった。そのため、電鋳後でも除去する必要のな
い化学的・物理的1(安定な銀鏡反応以外【よる導電膜
を原盤上に無電解メッキによシ形成することが強く要求
されている。
However, what about the plastic plates of optical (magnetic) disks that have been attracting attention recently? 2. Description of the Related Art Replica molds, so-called smembers, used in manufacturing by molding, for example casting, injection molding, compression molding, etc., are required to have extremely high surface precision. This stamper is generally produced by electroforming from a master disc that is produced by applying a resist master cloth to a glass master disc, exposing it to a predetermined pattern, curing it, and removing the uncured parts. However, since this resist master disc is an insulator, , it is necessary to form a conductive layer before the electroforming operation. Conventionally, this conductive layer has been formed by a silver mirror reaction, but the silver mirror surface is chemically unstable, oxidizes with oxygen in the air and becomes rough, and its physical strength is weak, so it cannot be used after electroforming. The silver mirror layer had to be removed, resulting in a disadvantage that the surface precision of the stamper surface was reduced. Therefore, there is a strong demand to form a conductive film on the master by electroless plating, which does not need to be removed even after electroforming, due to chemical and physical properties (other than stable silver mirror reaction).

(発明の目的) 従って、本発明の目的は銀鏡反応によらずに原盤上に導
電層全形成したプラスチック製光ディスク成形用スタン
パ−を提供することKある。
(Object of the Invention) Therefore, an object of the present invention is to provide a stamper for molding a plastic optical disk in which a conductive layer is entirely formed on a master without using a silver mirror reaction.

本発明のさらに他の目的はメッキ後に除去する必要のな
い導電層をニッケル無電解メッキによシ形成する方法を
提供するととKある。
Still another object of the present invention is to provide a method for forming a conductive layer by electroless nickel plating that does not need to be removed after plating.

(発明の構成) 本発明によるプラスチック製光ディスク成形用スタンパ
−はサブミクロンオーダーの凹凸情報やトラックを有す
る電鋳用原盤上に無電解ニッケルメッキを行って形成し
た導電層と、この導電層上に電鋳によって形成した電鋳
ニッケル層とによって構成される。
(Structure of the Invention) The stamper for molding a plastic optical disk according to the present invention includes a conductive layer formed by electroless nickel plating on an electroforming master having submicron-order unevenness information and tracks, and a conductive layer formed on the conductive layer by electroless nickel plating. It is composed of an electroformed nickel layer formed by electroforming.

上記無電解ニッケルメッキの導電層の厚さは一般にso
o へ1500Xであり、電鋳ニッケル層の厚さは約3
00μである。
The thickness of the conductive layer of the above electroless nickel plating is generally so
o to 1500X, and the thickness of the electroformed nickel layer is about 3
00μ.

本発明による電鋳ニッケル層とその上に形成された無電
解ニッケルメッキ層とは互いに強固に結合しておシ、従
来の銀鏡反応によるAgの導電膜とは違って電鋳後導電
層を除去する必要はなく、そのままプラスチック成形用
スタンパ−として使用可能である。
The electroformed nickel layer according to the present invention and the electroless nickel plating layer formed thereon are strongly bonded to each other, and unlike the conventional Ag conductive film formed by silver mirror reaction, the conductive layer is removed after electroforming. There is no need to do this, and the stamper can be used as it is as a stamper for plastic molding.

さらに、本発明によるスタンパ−は成形品へのスタンパ
−転写性に優れ、且つ無電解ニッケルメッキ層の表面の
硬度が銀鏡反応を用いた場合に比べて格段に優れている
ため、スタンパ−の耐久性が大巾に向上する。この理由
は不明であるが、無電解メッキでは還元剤として亜リン
酸塩を用いていることに何らかの関係があるものと考え
られる。
Furthermore, the stamper according to the present invention has excellent stamper transferability to molded products, and the hardness of the surface of the electroless nickel plating layer is much superior to that when silver mirror reaction is used, so the durability of the stamper is improved. Sexuality is greatly improved. The reason for this is unknown, but it is thought that it has something to do with the fact that phosphite is used as a reducing agent in electroless plating.

すなわち、無電解メッキで形成したニッケル膜は単なる
ニッケル単独の電鋳層とは異なってリンを含んだち密な
膜であわ、この膜はスタンパ−を射出金型にセットして
溶融樹脂を射出成形する際の高温度により極めて硬度の
高い膜になるものと考えられる。さらに、上記のような
ち密な膜であるのでスタンパ−の表面平滑性にも優れて
いるので、このスタンパ−から成形したプラスチックサ
ブストレート上しで記録膜を形成して作った光ディスク
のC/N比も大巾に向上する。
In other words, the nickel film formed by electroless plating is different from a simple electroformed layer of nickel alone, and is a dense film containing phosphorus. It is thought that the high temperature during this process results in an extremely hard film. Furthermore, since the stamper is a dense film as mentioned above, the surface smoothness of the stamper is excellent, so the C/N of an optical disc made by forming a recording film on a plastic substrate molded from this stamper can be improved. The ratio also improves greatly.

本発明はさらて上記スタンパ−の製造方法に関するもの
でもある。
The present invention further relates to a method for manufacturing the stamper.

従来一般に、無電解ニッケルメッキに用いられるメッキ
液は可溶性のニッケル塩と、次亜リン酸塩と、pH緩衝
液とを主成分とし、通常は60℃以上、例えば80℃に
加温して析出速度を大きくして用いられる。メッキ液の
分解全防止し、緻密なメッキ層を得るためにはメッキ液
を酸性条件だするのが有効である。
Conventionally, the plating solution used for electroless nickel plating mainly consists of soluble nickel salt, hypophosphite, and pH buffer solution, and is usually heated to 60°C or higher, for example, 80°C to deposit. Used to increase speed. In order to completely prevent decomposition of the plating solution and obtain a dense plating layer, it is effective to subject the plating solution to acidic conditions.

しかし、メッキ液を酸性条件にすると析出速度が小さく
なシ、また析出が均一に開始しないためメッキむらの無
いメッキ層全作ることができない。
However, if the plating solution is made under acidic conditions, the deposition rate is slow and the deposition does not start uniformly, making it impossible to form a complete plating layer without uneven plating.

このことは特に800〜2,000 X程度の薄いメッ
キ層を均一に形成する場合には重大な問題となる。特に
、可溶性ニッケル塩として塩化ニッケルを用いた場合に
は均一なニッケル被膜がメッキ初期段階から得られるが
、硫酸二ソケルの場合には均一なニッケル被膜を得るこ
とができない。この理由は不明であるが、使用する特級
試薬の硫酸ニッケル中には約21)I)m以上のCoが
含まれてお)、これが均一なニッケル被膜の成形に悪影
響を与えているものと考えられる。
This becomes a serious problem especially when a thin plating layer of about 800 to 2,000× is uniformly formed. Particularly, when nickel chloride is used as the soluble nickel salt, a uniform nickel coating can be obtained from the initial stage of plating, but when disokel sulfate is used, a uniform nickel coating cannot be obtained. The reason for this is unknown, but the special grade reagent nickel sulfate used contains approximately 21)I)m or more of Co, which is thought to have an adverse effect on the formation of a uniform nickel film. It will be done.

すなわち、硫酸ニッケルと塩化二ソケルとから調整した
浴中の不純物濃度(ppm )は原子吸光分析の結果以
下の通シである。
That is, the impurity concentration (ppm) in the bath prepared from nickel sulfate and disokel chloride is as follows as a result of atomic absorption spectrometry.

硫酸ニッケル浴は塩化ニッケル浴よフも安全性が良いた
め望ましいものであるが、上記不純COの存在によシ硫
酸ニッケル浴を用いた場合には均一なメッキ層を建浴時
から形成することができない。すなわちCo f 2.
8 ppm含有する硫酸ニッケル浴の場合には建浴時に
被メツキ面積に対してわずか15〜20%しか無電解メ
ッキできず、メッキ回数全20回繰シ返してCOヲ消耗
しCO含有量がo、 s ppm以下になってやっと上
記被メツキ面積の90%に無電解メッキができるだけで
あり、不経済であった。
A nickel sulfate bath is preferable because it is safer than a nickel chloride bath, but due to the presence of impurity CO mentioned above, when a nickel sulfate bath is used, a uniform plating layer must be formed from the time of bath construction. I can't. That is, Co f 2.
In the case of a nickel sulfate bath containing 8 ppm, only 15 to 20% of the area to be plated can be electrolessly plated at the time of bath preparation, and the CO is consumed by repeating the plating a total of 20 times, and the CO content becomes o. , s ppm or less, electroless plating can only be applied to 90% of the area to be plated, which is uneconomical.

本発明は上記欠点を解決したものであり、凹凸の情報ビ
ットおよび/またはトラックを有する電鋳用原盤上に導
電層を形成後、電鋳によってニッケルメッキ層を形成し
、原盤から上記導電層とニッケル電鋳層とを剥離してプ
ラスチック表光ディス成形用スタンパ−を製造する方法
において、上記導電層が無電解ニッケルメッキによって
形成されることを特徴としている。
The present invention solves the above-mentioned drawbacks, and after forming a conductive layer on a master disk for electroforming having uneven information bits and/or tracks, a nickel plating layer is formed by electroforming, and the conductive layer is removed from the master disk. In the method of manufacturing a stamper for plastic optical disc molding by peeling off the nickel electroformed layer, the conductive layer is formed by electroless nickel plating.

上記無電解ニッケルメッキは可溶性ニッケル塩と、次亜
リン酸塩と、pH緩衝剤とを主成分とする無電解ニッケ
ルメッキ浴中に銅イオンを0.1〜41)I)m添加し
た浴中で行われるのが好ましい。
The above-mentioned electroless nickel plating is carried out in an electroless nickel plating bath containing soluble nickel salt, hypophosphite, and pH buffer as main components, to which 0.1 to 41) I)m of copper ions are added. Preferably, it is carried out in

上記浴のpHは酸性領域にし、浴温度が60℃以下にす
るのが好ましい。
The pH of the bath is preferably in the acidic range and the bath temperature is preferably 60°C or less.

上記可溶性ニッケル塩としては硫酸塩、塩酸塩、硝酸塩
等の無機塩が一般に用いられるが、硫酸ニッケルに用い
た場合に特に効果的である。上記次亜リン酸塩は還元剤
であシ一般にはす) IJウム塩が用いられる。上記p
H緩衝剤としては酢酸、クエン酸、コ・・り酸等の有機
酸および/またはこれらの塩や硫酸、塩酸等の無機酸の
アンモニウム塩が用いられ、pH調節剤としては乳酸、
ホ;つ、′酸1等が用いられる。
As the above-mentioned soluble nickel salt, inorganic salts such as sulfate, hydrochloride, and nitrate are generally used, but it is particularly effective when used with nickel sulfate. The above-mentioned hypophosphite is a reducing agent, and IJum salt is generally used. Above p
As the H buffering agent, organic acids such as acetic acid, citric acid, and co-phosphoric acid and/or their salts, and ammonium salts of inorganic acids such as sulfuric acid and hydrochloric acid are used.As the pH adjusting agent, lactic acid,
Acid 1 and the like are used.

本発明では液安定性、浴液の蒸発による環境汚染の防止
および被メッキ材のアルカリ腐食を防止するために浴の
pHf:酸性条件、例えばpH=6〜4に維持し、比較
的低温、例えば60℃以下、好ましくは50〜30℃で
行うのが好ましい。
In the present invention, in order to maintain liquid stability, prevent environmental pollution caused by evaporation of the bath liquid, and prevent alkaline corrosion of the plated material, the pH of the bath is maintained at acidic conditions, e.g., pH=6 to 4, and maintained at a relatively low temperature, e.g. It is preferable to carry out the reaction at a temperature of 60°C or lower, preferably 50 to 30°C.

この点で本発明は従来のメッキ法とは本質的に相違する
In this respect, the present invention is essentially different from conventional plating methods.

上記ニッケル塩の量は浴llに対し金属塩換算で10〜
609/l、好ましくは20〜501/lであり、次亜
リン酸塩は10〜30 j9/l、好ましくは15〜2
09/lであり、pH緩衝剤は所定pHに浴を安定させ
るのに必要な景で、一般には1〜50g/11である。
The amount of the above nickel salt is 10 to 10% in terms of metal salt per liter of bath.
609/l, preferably 20-501/l, and hypophosphite 10-30 j9/l, preferably 15-2
The pH buffer is necessary to stabilize the bath at a predetermined pH, and is generally 1 to 50 g/11.

本発明の特徴は上記のニッケル塩、亜リン酸塩、pH緩
衝剤を主成分とする従来のメッキ液に微量の銅イオンを
添加することにあシ、この銅イオンの添加量は0.1〜
4 ppmであり、好ましくは0.1〜3ppmである
。この量が0.lppm  未満では均一なメッキ層は
形成されず、4ppm’?越えても均一な付着層は得ら
れない。
The feature of the present invention is that a trace amount of copper ions is added to the conventional plating solution mainly composed of the above-mentioned nickel salt, phosphite, and pH buffer, and the amount of copper ions added is 0.1. ~
4 ppm, preferably 0.1 to 3 ppm. This amount is 0. If it is less than lppm, a uniform plating layer will not be formed, and if it is less than 4ppm'? Even if it exceeds the limit, a uniform adhesion layer cannot be obtained.

無電解ニッケルメッキを行うた当っては通常用いられて
いる前処理行程、すなわち感受化−水洗−活性化−水洗
を行う。感受化は一般に還元性の金属塩、例えば塩化第
1錫と塩酸の水溶液中に浸漬して行うことができ、また
、活性化は貴金属塩、例えば塩化パラジウムと塩酸の水
溶液中に浸漬して行うことができる。これら前処理の終
ったレジスト硬化原盤に本発明による無電解メッキ液を
用いて無電解メッキを行う際には浴を撹拌しながら行う
のが好ましい。
When performing electroless nickel plating, the pretreatment steps commonly used are sensitization, water washing, activation, and water washing. Sensitization can generally be carried out by immersion in an aqueous solution of a reducing metal salt such as stannous chloride and hydrochloric acid, and activation can be carried out by immersion in an aqueous solution of a noble metal salt such as palladium chloride and hydrochloric acid. be able to. When carrying out electroless plating using the electroless plating solution according to the present invention on the hardened resist master disc that has undergone these pre-treatments, it is preferable to perform electroless plating while stirring the bath.

以下、実施例を用いて本発明を説明する。The present invention will be explained below using Examples.

実施例 (無電解ニッケルメッキ) レジスト硬化膜を有するテストサンプルを奥野製薬製の
公知脱脂液中に室温で5分間浸漬し、洗浄後、感受化液
(5nc72とHCeffi主体とするもの。奥野製薬
製]に1分間浸漬し、洗浄後、活性化液(pdc4とH
CII金主体とするもの。奥野製薬製)に1分間浸漬し
、洗浄して前処理を行った。
Example (electroless nickel plating) A test sample having a cured resist film was immersed in a known degreasing solution manufactured by Okuno Pharmaceutical Co., Ltd. at room temperature for 5 minutes, and after washing, a sensitizing solution (based mainly on 5nc72 and HCeffi, manufactured by Okuno Pharmaceutical Co., Ltd.) was added. ] for 1 minute, and after washing, soak in the activation solution (pdc4 and H
CII is mainly based on gold. (manufactured by Okuno Pharmaceutical Co., Ltd.) for 1 minute, and was washed for pretreatment.

次に、以下組成のメッキ浴(I)を調整した。Next, a plating bath (I) having the following composition was prepared.

硫酸ニッケル(特級試薬使用)  26g/I1次亜リ
ン酸ナトリウム      21 〃塩化アンモニウム
        3 〃酢酸ナトリウム       
  5 〃ホウ醒             12 〃
pH5,5 との浴液の建浴直後の不純物金属の含有量は原子吸光分
析の結果、以下の通シであった。
Nickel sulfate (using special grade reagent) 26g/I1 Sodium hypophosphite 21 Ammonium chloride 3 Sodium acetate
5 〃Awakening 12 〃
As a result of atomic absorption spectrometry, the content of impurity metals in the bath solution with pH 5.5 immediately after preparation was as follows.

Fe          検出限界(0,0ppm)以
下Zn          Q、lppmco    
     2.8 〃 Cu         検出限界以下 このメッキ浴(I)にCu k CuC1zの形で表1
に示す濃度で添加後、スターラーで撹拌しながら、41
〜43℃の浴温に維持した状態で上記テストサンプルを
5分間浸漬した。得られた無電解ニッケルメッキ膜の厚
さは1.200〜1,500 Xであった0 結果を表1に示す。
Fe Below detection limit (0.0ppm) Zn Q, lppmco
2.8 〃 Cu Below the detection limit In this plating bath (I), Cu k CuC1z Table 1
After adding at the concentration shown in 41.
The test sample was immersed for 5 minutes while maintaining the bath temperature at ~43°C. The thickness of the obtained electroless nickel plating film was 1.200 to 1,500×0. The results are shown in Table 1.

なお表1中のメッキ効率と均一度は下記の評価法による
Note that the plating efficiency and uniformity in Table 1 are based on the following evaluation method.

■〕 メッキ効率 各添加イオンを加えない状態での析出速度(膜厚400
〜500X)を100とした場合の相対値 2)均一度 テストサンプル(76X26X1.5朋)の全表面積に
対するメrツキ形成層の面積の比率(チ)。
■] Plating efficiency Deposition rate without adding each additive ion (film thickness 400
2) Relative value when 500X) is taken as 100 2) Ratio of the area of the metallization layer to the total surface area of the uniformity test sample (76X26X1.5).

−例として、第1図は表1の添加量0の場合のテストサ
ンプルの表面状態を示す図で、この場合の均一度は20
%であり、第2図は表1の添加−1i10.1%の場合
の図で、均一度は100%である。
- As an example, Figure 1 shows the surface condition of the test sample when the addition amount in Table 1 is 0, and the uniformity in this case is 20.
%, and FIG. 2 is a diagram for the case where the addition of -1i in Table 1 is 10.1%, and the uniformity is 100%.

表  1 表1かられかるように、本発明によるCu イオンの添
加によシ無電解メッキ膜の性状は大巾に向上し、建浴直
後から均一なメッキ膜を得ることができる。
Table 1 As can be seen from Table 1, the properties of the electroless plated film are greatly improved by the addition of Cu ions according to the present invention, and a uniform plated film can be obtained immediately after bath preparation.

さらに、本発明のCuイオンの効果とCoイオン濃度と
の関係を調べるために、建浴時にCOCl2を添加して
Co濃度を上昇させて上記と同じ実験を行ったところ、
Co濃度が約s ppmまでは本発明のCuイオン添加
によシ建浴時から均一度を100%にすることができた
Furthermore, in order to investigate the relationship between the effect of the Cu ions of the present invention and the Co ion concentration, we conducted the same experiment as above by adding COCl2 at the time of bath preparation to increase the Co concentration.
By adding Cu ions according to the present invention, it was possible to achieve 100% uniformity from the time of bath construction until the Co concentration was about s ppm.

なお、本発明疋よるCuイオン添加効果の理由を調べる
ためにイオン化列がCuよシも下位の紹tAgclの形
でCuO代シに添加したが、はとんど効果はなかった。
In order to investigate the reason for the effect of adding Cu ions according to the present invention, tAgcl, which is lower in the ionization series than Cu, was added to CuO, but there was almost no effect.

にノケル電鋳) 上記の方法と同じ手順で、直径350朋、中心孔径7.
2朋、厚さ6顛の研摩ガラス盤上にレジストを塗布し、
巾1μのトラック上にPCM変調レーザー光によ多信号
ピントを形成したレジスト硬化原盤上に、無電解ニッケ
ルメッキ層を形成した。
(Nokel electroforming) Using the same procedure as above, a diameter of 350 mm and a center hole diameter of 7.
2. Apply resist on a 6-thick polished glass plate,
An electroless nickel plating layer was formed on a resist hardened master disc on which a multi-signal focus was formed using a PCM modulated laser beam on a track with a width of 1 μm.

こうして得られた無電ニッケルメッキの導電層を有する
原盤を電鋳溶液に浸漬し、垂直面に対し45°の角度を
保ちつつ回転させ、電着面がアノードボックスに対向し
、7cTLの間隔を保つように保持して電鋳した。電鋳
浴の組成は以下のとおシである。
The master plate with the electroless nickel-plated conductive layer obtained in this way is immersed in an electroforming solution and rotated while maintaining an angle of 45° with respect to the vertical plane, so that the electrodeposited surface faces the anode box and a distance of 7 cTL is maintained. It was held and electroformed like this. The composition of the electroforming bath is as follows.

スルファミン酸ニッケル(四水和物)  400g/l
塩化ニッケル(六水和物)      59/l!は 
 う  酸                  3 
0 i/1ビット防止剤           0.5
9/1浴温は50℃で、液全体を10回/hrのサイク
ルで0.4μのメンブレンフィルター貯槽とを通過して
循環させ、原盤の中央部へ向って液が噴出するようにし
た。貯槽中に?i電解ニッケルのコルゲートのカソード
とアノードバッグki61して063A / dm2の
弱電流を通電し、不純物イオンCa+、Fe11+・z
h什・pb(+等を選択的に電着させ電鋳浴を精製した
Nickel sulfamate (tetrahydrate) 400g/l
Nickel chloride (hexahydrate) 59/l! teeth
Oxic acid 3
0 i/1 Bit inhibitor 0.5
9/1 The bath temperature was 50° C., and the entire liquid was circulated through a 0.4μ membrane filter storage tank at a cycle of 10 times/hr, so that the liquid was spouted toward the center of the master. In the storage tank? i Electrolytic nickel corrugated cathode and anode bag ki61 are energized with a weak current of 063 A/dm2, impurity ions Ca+, Fe11+・z
The electroforming bath was purified by selectively electrodepositing H, Pb(+, etc.).

アノードのニッケルには電解ニッケルのベレットを用い
、トータル通電量を215 A 轡hrsにして電鋳全
行った〇 以上のようにして製作したスタンパ−を射出成形機の金
型にセットし、光ディスク用サブストレート全成形した
が、スタンパ−の耐久性は従来のニッケル電鋳によるも
のよシ犬巾に向上した。
An electrolytic nickel pellet was used for the nickel of the anode, and the total current flow was 215 A hrs.The stamper manufactured as above was set in the mold of an injection molding machine to form an optical disc. Although the entire substrate was molded, the durability of the stamper was significantly improved compared to conventional nickel electroforming.

【図面の簡単な説明】 第1・2.2°図は表11C示す均一度の評価法の実施
例で、第1図は従来法によるCuイオン無添加の場合の
無電解ニッケル面の状態を示す写真を模写した図で、ハ
ツチ部分がメッキ層を示し、この場合の均一度は20%
である。 第2図は本発明によるCuイオン添加の場合の第1図と
同様な図で、この場合の均一度は100チである。 特許出願人 ダイセル化学工業株式会社第1図 第2図
[Brief explanation of the drawings] Figures 1 and 2.2 are examples of the uniformity evaluation method shown in Table 11C, and Figure 1 shows the state of the electroless nickel surface when no Cu ions are added using the conventional method. This is a copy of the photograph shown, the hatched area indicates the plating layer, and the uniformity in this case is 20%.
It is. FIG. 2 is a diagram similar to FIG. 1 in the case of adding Cu ions according to the present invention, and the uniformity in this case is 100 cm. Patent applicant: Daicel Chemical Industries, Ltd. Figure 1 Figure 2

Claims (1)

【特許請求の範囲】 1)凹凸の情報ピットおよび/またはトラックを有する
電鋳用原盤上に無電解ニッケルメッキを行って形成した
無電解ニッケルメッキ層と、この無電解ニッケルメッキ
層上に電鋳によって形成された電鋳ニッケル層とによっ
て構成されるプラスチック製光ディスク成形用スタンパ
ー。 2)凹凸の情報ピットおよび/またはトラックを有する
電鋳用原盤上に導電層を形成後、電鋳によってニッケル
メッキ層を形成し、原盤から上記導電層とニッケル電鋳
層とを剥離してプラスチック製光ディスク成形用スタン
パーを製造する方法において、上記導電層が無電解ニッ
ケルメッキによって形成されることを特徴とするスタン
パーの製造方法。 3)上記無電解ニッケルメッキが可溶性ニッケル塩と、
次亜リン酸塩と、pH緩衝剤とを主成分とする無電解ニ
ッケルメッキ浴中に銅イオンを0.1〜4ppm添加し
た浴中で行われることを特徴とする特許請求の範囲第2
項記載の方法。 4)上記浴のpHが酸性領域であり、浴温度が60℃以
下であることを特徴とする特許請求の範囲第2項または
第3項に記載の方法。 5)上記可溶性ニッケル塩が硫酸ニッケルであることを
特徴とする特許請求の範囲第2項に記載の方法。
[Claims] 1) An electroless nickel plating layer formed by electroless nickel plating on an electroforming master having uneven information pits and/or tracks, and an electroforming layer formed on this electroless nickel plating layer. A stamper for molding plastic optical discs, consisting of an electroformed nickel layer formed by 2) After forming a conductive layer on an electroforming master having uneven information pits and/or tracks, a nickel plating layer is formed by electroforming, and the conductive layer and nickel electroforming layer are peeled off from the master to form plastic. A method for manufacturing a stamper for molding optical discs, wherein the conductive layer is formed by electroless nickel plating. 3) The electroless nickel plating has a soluble nickel salt,
Claim 2, characterized in that the plating is carried out in an electroless nickel plating bath containing hypophosphite and a pH buffer as main components, to which 0.1 to 4 ppm of copper ions are added.
The method described in section. 4) The method according to claim 2 or 3, wherein the pH of the bath is in the acidic range and the bath temperature is 60° C. or lower. 5) A method according to claim 2, characterized in that the soluble nickel salt is nickel sulfate.
JP60159325A 1985-07-19 1985-07-19 Optical disk molding stamper and its manufacturing method Expired - Lifetime JPH0646462B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60159325A JPH0646462B2 (en) 1985-07-19 1985-07-19 Optical disk molding stamper and its manufacturing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60159325A JPH0646462B2 (en) 1985-07-19 1985-07-19 Optical disk molding stamper and its manufacturing method

Publications (2)

Publication Number Publication Date
JPS6220152A true JPS6220152A (en) 1987-01-28
JPH0646462B2 JPH0646462B2 (en) 1994-06-15

Family

ID=15691339

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60159325A Expired - Lifetime JPH0646462B2 (en) 1985-07-19 1985-07-19 Optical disk molding stamper and its manufacturing method

Country Status (1)

Country Link
JP (1) JPH0646462B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09106570A (en) * 1996-07-19 1997-04-22 Dainippon Printing Co Ltd Optical recording medium and its production
JP2002212746A (en) * 2001-01-11 2002-07-31 Okuno Chem Ind Co Ltd Electroless nickel plating method to object to be plated which has blind hole

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57120664A (en) * 1981-01-19 1982-07-27 Matsushita Electric Ind Co Ltd Formation of nickel film
JPS607630A (en) * 1983-06-17 1985-01-16 デイスコビジヨン・アソシエイツ Improved molding stamper and manufacture thereof
JPS61248248A (en) * 1985-04-25 1986-11-05 Seiko Epson Corp Method for polishing rear surface of master stamper for optical memory

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57120664A (en) * 1981-01-19 1982-07-27 Matsushita Electric Ind Co Ltd Formation of nickel film
JPS607630A (en) * 1983-06-17 1985-01-16 デイスコビジヨン・アソシエイツ Improved molding stamper and manufacture thereof
JPS61248248A (en) * 1985-04-25 1986-11-05 Seiko Epson Corp Method for polishing rear surface of master stamper for optical memory

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09106570A (en) * 1996-07-19 1997-04-22 Dainippon Printing Co Ltd Optical recording medium and its production
JP2002212746A (en) * 2001-01-11 2002-07-31 Okuno Chem Ind Co Ltd Electroless nickel plating method to object to be plated which has blind hole

Also Published As

Publication number Publication date
JPH0646462B2 (en) 1994-06-15

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