JPS62197012U - - Google Patents

Info

Publication number
JPS62197012U
JPS62197012U JP1987077431U JP7743187U JPS62197012U JP S62197012 U JPS62197012 U JP S62197012U JP 1987077431 U JP1987077431 U JP 1987077431U JP 7743187 U JP7743187 U JP 7743187U JP S62197012 U JPS62197012 U JP S62197012U
Authority
JP
Japan
Prior art keywords
probe
storage device
contact
data
tip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1987077431U
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS62197012U publication Critical patent/JPS62197012U/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/03—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring coordinates of points
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/004—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points
    • G01B7/008—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points using coordinate measuring machines

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)

Description

【図面の簡単な説明】
第１図は本考案に用いる装置のブロツク図であ
る。 １１０……プローブ、１１１……プローブの針
先、１１２……測定器、１２０……第１組のカウ
ンタ（第一記憶装置）、１３０……第２組のカウ
ンタ（第二記憶装置）、１２２……伝送回路、１
４０……デイスプレイ装置。

Claims (1)

  1. 【実用新案登録請求の範囲】 物体の測定装置であつて、 物体との接触に適すように可動の針先を有する
    、接触検出のプローブと； プローブを移動させてその針先と物体との相互
    接触を生じさせその接触後もプローブの移動を継
    続する、物体に対してプローブを移動させる手段
    と； プローブと物体との相対位置の変化を表わす、
    一連の位置信号を発生する第１の信号発生手段と
    ； 上記一連の位置信号を受けてその位置信号に対
    応したデータを蓄える第一記憶装置と； 第一記憶装置からのデータをのみ受けてそのデ
    ータを蓄えるための第二記憶装置にして、プロー
    ブの針先が物体に接触した時点での、プローブと
    物体との相対位置をのみ表わすデータを蓄わえる
    第二記憶装置と； プローブの針先と物体との接触時点に接触信号
    を発生する第２の信号発生手段と； 第一記憶装置から第二記憶装置へのデータ伝送
    回路にして、プローブの針先が物体に接触した後
    もプローブと物体との間の相対移動が継続して第
    一記憶装置が引続いて位置信号を受けることによ
    りプローブの針先が物体に接触した後のプローブ
    と物体との相対位置を表わすデータを第一記憶装
    置が蓄えるようになつたとしても、第二の記憶装
    置には、プローブの針先が物体に接触した時点で
    の、プローブと物体との相対位置をのみ表わすデ
    ータが蓄わえられているようにするために、第一
    記憶装置に蓄えられているデータを第二記憶装置
    へ上記接触信号に応じて伝送させる伝送回路と； プローブの針先が物体に接触した後にプローブ
    と物体との相対移動が生じた場合にあつても、プ
    ローブの針先と物体との接触時点でのプローブと
    物体との相対位置を表わすデータを操作者が認識
    し続けられるように第二記憶装置に蓄えられてい
    るデータを表示するデイスプレイ装置と を備えている物体の測定装置。
JP1987077431U 1979-08-31 1987-05-25 Pending JPS62197012U (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US7162379A 1979-08-31 1979-08-31

Publications (1)

Publication Number Publication Date
JPS62197012U true JPS62197012U (ja) 1987-12-15

Family

ID=22102507

Family Applications (2)

Application Number Title Priority Date Filing Date
JP11904780A Pending JPS5637505A (en) 1979-08-31 1980-08-30 Method of measuring body by movable probe
JP1987077431U Pending JPS62197012U (ja) 1979-08-31 1987-05-25

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP11904780A Pending JPS5637505A (en) 1979-08-31 1980-08-30 Method of measuring body by movable probe

Country Status (5)

Country Link
US (1) US4550418A (ja)
EP (1) EP0025724A1 (ja)
JP (2) JPS5637505A (ja)
KR (1) KR850001282B1 (ja)
CA (1) CA1169942A (ja)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4380873A (en) * 1981-03-12 1983-04-26 The Babcock & Wilcox Company Reset circuit for zero force touch probe
US4779319A (en) * 1981-04-30 1988-10-25 Gte Valeron Corporation Method and apparatus for performing workpiece inspection with a probe
US4978857A (en) * 1981-04-30 1990-12-18 Gte Valenite Corporation Optical data system having flash/receiver head for energizing/receiving information from a battery operated transmitter
GB8508391D0 (en) * 1985-03-30 1985-05-09 Ae Plc Measurement of engineering components
US4945501A (en) * 1987-01-20 1990-07-31 The Warner & Swasey Company Method for determining position within the measuring volume of a coordinate measuring machine and the like and system therefor
DE3702991A1 (de) * 1987-02-02 1988-08-11 Borg Instr Gmbh Ereignis-messeinrichtung
JPS6421306U (ja) * 1987-07-30 1989-02-02
GB8728500D0 (en) * 1987-12-05 1988-01-13 Renishaw Plc Position sensing probe
GB8909357D0 (en) * 1989-04-25 1989-06-14 Renishaw Plc Position determining apparatus
GB9826093D0 (en) * 1998-11-28 1999-01-20 Limited Locating arm for a probe on a coordinate positioning machine

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3403448A (en) * 1965-06-07 1968-10-01 Bendix Corp Gaging device
US3476481A (en) * 1966-01-04 1969-11-04 Jerome H Lemelson Automatic measurement system
US3716839A (en) * 1968-09-04 1973-02-13 Olympus Optical Co Automatic measuring and recording device
US3691353A (en) * 1970-12-14 1972-09-12 Bendix Corp Multimode counting device
US3713139A (en) * 1971-01-25 1973-01-23 Bendix Corp Apparatus and method of determining displacements
US3740532A (en) * 1971-05-25 1973-06-19 Kureha Chemical Ind Co Ltd Digital counter averaging system
US3749501A (en) * 1971-10-01 1973-07-31 Bendix Corp Measuring machine
US3748043A (en) * 1972-03-20 1973-07-24 Bendix Corp Photoelectric interpolating arrangement for reading displacements of divided scales
US4153998A (en) * 1972-09-21 1979-05-15 Rolls-Royce (1971) Limited Probes
JPS5091346A (ja) * 1973-12-12 1975-07-22
US4053989A (en) * 1974-04-30 1977-10-18 Mitsubishi Jukogyo Kabushiki Kaisha Co-ordinates measuring apparatus for an exclusive propeller processing machine
US4118871A (en) * 1978-06-13 1978-10-10 Kearney & Trecker Corporation Binary inspection probe for numerically controlled machine tools

Also Published As

Publication number Publication date
KR850001282B1 (ko) 1985-09-04
US4550418A (en) 1985-10-29
EP0025724A1 (en) 1981-03-25
KR830003728A (ko) 1983-06-22
JPS5637505A (en) 1981-04-11
CA1169942A (en) 1984-06-26

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