JPS62196818A - Vapor deposition device - Google Patents
Vapor deposition deviceInfo
- Publication number
- JPS62196818A JPS62196818A JP4060886A JP4060886A JPS62196818A JP S62196818 A JPS62196818 A JP S62196818A JP 4060886 A JP4060886 A JP 4060886A JP 4060886 A JP4060886 A JP 4060886A JP S62196818 A JPS62196818 A JP S62196818A
- Authority
- JP
- Japan
- Prior art keywords
- vapor
- evaporation source
- gettering
- tank
- arsenic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007740 vapor deposition Methods 0.000 title claims description 9
- 238000001704 evaporation Methods 0.000 claims abstract description 46
- 230000008020 evaporation Effects 0.000 claims abstract description 41
- 238000005247 gettering Methods 0.000 claims abstract description 15
- 239000000758 substrate Substances 0.000 claims abstract description 15
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 abstract description 19
- 229910052785 arsenic Inorganic materials 0.000 abstract description 17
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 abstract description 14
- 229910052733 gallium Inorganic materials 0.000 abstract description 14
- 238000001179 sorption measurement Methods 0.000 abstract description 8
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 abstract description 6
- 229910001218 Gallium arsenide Inorganic materials 0.000 abstract description 6
- 239000013078 crystal Substances 0.000 abstract description 5
- 230000008021 deposition Effects 0.000 abstract description 4
- 230000000873 masking effect Effects 0.000 abstract 1
- 230000000694 effects Effects 0.000 description 3
- MDPILPRLPQYEEN-UHFFFAOYSA-N aluminium arsenide Chemical compound [As]#[Al] MDPILPRLPQYEEN-UHFFFAOYSA-N 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical group [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000001451 molecular beam epitaxy Methods 0.000 description 1
- 239000000376 reactant Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000007738 vacuum evaporation Methods 0.000 description 1
Landscapes
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野]
観察窓が蒸気の堆積により(もるのを防止した蒸気堆積
層fliiIこ関するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] This invention relates to a vapor deposition layer in which an observation window is prevented from accumulating vapor.
第2図は従来の蒸気堆積装置であってこ\では分子線エ
ピタキシ装置を示す断面図であり、(1)は檜で6つて
こ\では図では省略された真空ポンプ大気導入パルプ、
内部点検口等により、内部を真空にしたり大気圧にして
内部を点検したりできる真空槽、(2a) 、 (2b
)はいずれも主蒸発源であって、こ〜では前者がガリウ
ム蒸発源、後者が砒素蒸発源、(3)はガリウム蒸発源
(2a)、砒素蒸発源(2b)からのガリウム蒸気、砒
素蒸気を付着させ、ガリウム砒素堆積層をその上に形成
される基板、(4)は基板(3)を加熱し、ガリウム砒
素堆積層の結晶性を改善させるヒータ、(5)は真空槽
(1)に取り付けられ、ガリウム蒸発源(2a)砒素蒸
発源翰、基板(3)、ヒータ(4)等を真空槽【1)の
外から観察するための観察窓。Fig. 2 is a cross-sectional view showing a conventional vapor deposition apparatus, which is a molecular beam epitaxy apparatus;
Vacuum chambers (2a), (2b) that can be inspected using an internal inspection port, etc. that makes the interior vacuum or atmospheric pressure.
) are all main evaporation sources, and here the former is a gallium evaporation source, the latter is an arsenic evaporation source, and (3) is the gallium vapor and arsenic vapor from the gallium evaporation source (2a) and the arsenic evaporation source (2b). (4) is a heater that heats the substrate (3) to improve the crystallinity of the gallium arsenide deposited layer; (5) is a vacuum chamber (1); An observation window is attached to the gallium evaporation source (2a), the arsenic evaporation source (2a), the substrate (3), the heater (4), etc. from outside the vacuum chamber (1).
(6)は観察しない時に、観察窓(5)にガリウム蒸気
、特に砒−A蒸気が付着するのを閉じること薔こより軽
減し、観察する時に開くシヤツクである。(6) is a shell that is closed to prevent gallium vapor, especially arsenic-A vapor, from adhering to the observation window (5) when not observing, and is open when observing.
従来の蒸気堆積装置は上記のよう(こ構成されていたの
で、基板(3)に入射するガリウムや砒素の原子の個数
の比を最適番こして1例えば原子数比率か1=1となる
ガリウム砒素単結晶/aを成長させるよう蚤こなってお
り、また、観察窓(53からこの成長させる過程で内部
で異常が生じていないかを観察するようニナっている。Since the conventional vapor deposition apparatus was constructed as described above, the ratio of the number of gallium and arsenic atoms incident on the substrate (3) is optimized to 1, for example, gallium with an atomic ratio of 1=1. The arsenic single crystal /a is being grown, and the observation window (53) is being used to observe whether there are any abnormalities occurring inside the growing process.
上記のような従来の蒸気堆積装置では以ドに述べるよう
に主蒸発源(2b)からの砒素の蒸気が、観察窓(5)
1こ付着して、槽(1)内部が観察できなくなり頻繁に
槽(1)内を大気圧にして付着した砒素堆積物を除去す
る作業を行う必要があるといった問題点があった。In the conventional vapor deposition apparatus as described above, arsenic vapor from the main evaporation source (2b) is passed through the observation window (5) as described below.
If arsenic deposits were deposited, it became impossible to observe the inside of the tank (1), and there was a problem in that it was necessary to frequently reduce the pressure inside the tank (1) to atmospheric pressure to remove the deposits of arsenic.
すなわち、砒素の蒸気は、一旦槽(1)内の構造物の表
面に付着しても離れやすい、いわゆる再蒸発しやすい性
質があり、砒素蒸発源(2b)が、観察窓(5)から見
通しの位置になくとも7ヤンタ(6)で遮蔽していても
再蒸発を繰り返すことをこより、観察窓(5)1こ到達
しこれを曇らしてしまうのである。In other words, even if arsenic vapor adheres to the surface of a structure in the tank (1), it easily separates and reevaporates easily. Even if it is not in the position of 7 yanta (6), the repeated re-evaporation will reach the observation window (5) and cloud it.
この発明は、上記の如き問題点を解決するため疹こなさ
れたもので、主蒸発源(2b)からの砒素等の観察窓(
5)をくもらせる蒸気が発生していても、この窓(5)
に付着しないようにして、上記の除去作業の回数を減ら
すことのできる蒸気堆積装置を得ることを目的とする。This invention has been developed to solve the above-mentioned problems.
Even if steam is generated that fogs the window (5)
It is an object of the present invention to provide a vapor deposition device that can reduce the number of times the above-mentioned removal work is performed by preventing the vapor from adhering to the surface.
この発明に係る蒸気堆積装置は、主蒸発源が大気からS
断された槽内に設けられ、この槽内に置かれた基板上1
こ蒸気を放出して蒸気堆積層を形成し、観察窓が前記槽
の壁(こ設けられ、前記槽内部の観察を可能にし、ゲッ
タリング用蒸発源か、前記主蒸発源から放出されるもの
のうちt&も再蒸発しやすい蒸気と比較して、自身は勿
論、この蒸気と反応物も再蒸発し難いものである蒸気を
、前者蒸気の気流の存在する前記観察窓近傍の吸着壁お
よび空間に向け、かつ、前記基板、前記主蒸発源および
前記観察窓を避けて放出するようにしたものである。In the vapor deposition apparatus according to the present invention, the main evaporation source is S from the atmosphere.
1 on the substrate placed in the tank and placed in the tank.
This vapor is released to form a vapor deposit layer, and an observation window is provided on the wall of the tank to enable observation of the inside of the tank, and to detect whether the vapor is emitted from the gettering evaporation source or the main evaporation source. Of these, vapors that are difficult to re-evaporate not only themselves but also the reactants are difficult to re-evaporate, compared to vapors that are easy to re-evaporate. The light is emitted toward the substrate, avoiding the substrate, the main evaporation source, and the observation window.
この発明昏こおいては、ゲッタリング用蒸発源からの蒸
気が観察窓近傍の吸着壁疹こ付着し、主として、この堆
積層のゲッタリング作用曇こより主蒸発源からこの壁面
に入射してくる蒸気の再蒸発を少くし、観察窓がくもる
のを防止する。In this invention, vapor from the gettering evaporation source adheres to the adsorption wall near the observation window, and mainly enters the wall surface from the main evaporation source due to the gettering action of this deposited layer. Reduces steam re-evaporation and prevents fogging of the observation window.
第1図はこの発明の一実施例を示す断面図であり、C1
)ないしく6)は従来のものと同一または相当部分であ
り、(1)は主蒸発源(2a) 、 (zb) 、基板
(3)、ヒータ(4)、観察窓(5)など鴫こ直接蒸気
が入射せず、主蒸発源(2a)、(2b)から観察窓(
5)4こ向う蒸気流が存在する空間近傍に自身の蒸気を
放出するゲッタリング用蒸発源であって、この実施例で
はもう一つのガリウム蒸発源、(8)はゲッタリング用
蒸発源(7)の蒸気の放出方向を制限する遮蔽板、(9
)は蒸発源(1)の蒸気を堆積させ、他の蒸気を吸着す
る吸宥壁で6って、この実施例では槽+1)内壁の一部
である。FIG. 1 is a sectional view showing one embodiment of the present invention, and C1
) or 6) are the same or equivalent parts as the conventional one, and (1) is the main evaporation source (2a), (zb), substrate (3), heater (4), observation window (5), etc. Steam does not directly enter the observation window (
5) A gettering evaporation source that emits its own vapor in the vicinity of the space where vapor flows from the four sides exist, and in this embodiment, another gallium evaporation source, (8) is a gettering evaporation source (7). ), a shielding plate (9
) is an absorption wall that deposits the vapor of the evaporation source (1) and adsorbs other vapors, and 6 is a part of the inner wall of the tank +1) in this embodiment.
この実施例は上記のよう薯こ構成したので、従来のもの
1こゲッタリング用蒸発源(7)、a蔽板(8)を付加
したのみである刀)ら、従来のものと同様に基板(11
上薯こ、ガリウム砒素の単結晶を成長させたり。Since this embodiment has the above-mentioned configuration, the substrate is the same as the conventional one. (11
This includes growing single crystals of gallium arsenide.
堆積中の槽(1)内部を観察窓(5)から観察できるよ
うになっていることは云うまでもない。Needless to say, the inside of the tank (1) during deposition can be observed through the observation window (5).
ところで、ゲッタリング用蒸気源(7)のガリウム蒸気
は観察窓(5)近傍の吸着壁(9)に付着しこの部分に
入射してくる砒素蒸気と結合して、この蒸気が再蒸発す
るのを防止したり、一部は、空間で砒素と結合して再蒸
発し無い蒸気に変え観察窓(5)Iこ至るまでの槽(1
)内壁に付着きせること番こより、前記の問題点が解決
できるようえすっている。By the way, the gallium vapor from the gettering vapor source (7) adheres to the adsorption wall (9) near the observation window (5) and combines with the arsenic vapor that enters this area, causing this vapor to reevaporate. A part of the tank (1
) We are trying to solve the above problem by making it adhere to the inner wall.
なお、上記実施例では、基板(3)上にガリウム砒le
エピタキシギル成長させる場合について述べたが、必ず
しも単結晶を成長させなくとも、従って基板は、ガリウ
ム砒素、ガリウムアルミニウム砒素、あるいはケルマニ
ウム等の単結晶である必要もなく、また、ガリウム砒素
の代に、砒素単体でも逆憂こ、ガリウムアルミニウム砒
素を成長する場合であってもよ(、これを−膜化すると
、主蒸発源のうちそれらから放出する蒸気の最も再蒸発
しやすいものと比べ、ケンタリング再蒸発源7)>ら放
出する蒸気および前者との化合物との蒸気が再蒸発し難
い材料をそれぞれの蒸発源に選択すればよい。In addition, in the above embodiment, gallium arsenide was deposited on the substrate (3).
Although we have described the case of epitaxial growth, it is not necessary to grow a single crystal, so the substrate does not need to be a single crystal of gallium arsenide, gallium aluminum arsenide, or kermanium, and instead of gallium arsenide, Even when growing gallium aluminum arsenic, arsenic alone is a cause for concern, and when it is grown into a film, the vapor emitted from them is the most likely to re-evaporate among the main evaporation sources. Re-evaporation source 7) Materials in which the vapor emitted from the re-evaporation source 7) and the vapor in combination with the former are difficult to re-evaporate may be selected for each evaporation source.
また、上記実施例では、分子線エピタ千シ成艮をさせる
場合番ζついて述べたが、この例のカリウム原子と砒素
原子の堆積レートを精密Eこコントロールしない真空蒸
着一般にも適用でき、ざらCζ、スパンタリングの場合
lこも適用できることは云ろまでもない。In addition, in the above embodiment, the case where molecular beam epitaxial growth is achieved was described, but this example can also be applied to general vacuum evaporation in which the deposition rate of potassium atoms and arsenic atoms is not precisely controlled. , it goes without saying that this can also be applied in the case of sputtering.
また、上記実施例でガリウムと砒素はそれぞれガリウム
蒸発源(2a)砒素蒸発源(2b)から蒸発させる場合
であったか、両首の混合物または化合物を1つの蒸発源
力)ら蒸発させてもよいことは云うまでもない。Also, in the above example, gallium and arsenic were evaporated from a gallium evaporation source (2a) and an arsenic evaporation source (2b), respectively, or a mixture or compound of both may be evaporated from a single evaporation source. Needless to say.
また、上記実施例では吸着壁(9)は槽(1)内壁の一
部の場合でめったが、専用の得造体を観察を妨げない窓
15) Icより近い1iZmに設けその壁面を利用す
るとより効果的である。In addition, in the above embodiment, the suction wall (9) was rarely used as a part of the inner wall of the tank (1), but if a special structure is installed at 1iZm nearer than the window 15) Ic that does not obstruct observation, and that wall surface is utilized. more effective.
この発明は以上説明したとおり、ゲッタリング用蒸発源
からの蒸気番こよる観察窓近傍の槽内壁上に形成される
堆積層のゲッタリング作用番こより主蒸発源からの蒸気
がこの壁面薔こ一旦入射し毎蒸発して、観察窓に到達し
、これを曇らせるのを防止して、この(もりを除去する
作業回数を減少させる効果がある。As explained above, this invention utilizes the gettering action of the deposited layer formed on the inner wall of the tank in the vicinity of the observation window, in which the vapor from the gettering evaporation source is transferred to the wall surface once. This has the effect of reducing the number of times the fog is removed by preventing it from evaporating and reaching the observation window and fogging it.
第1図はこの発明の一実施例を示す断面図、第2図は従
来の蒸気堆積装置を示す断面図である。
図に2いて、(1)は槽、(2a) 、 (2b)はい
ずnも主蒸発源、(3)は基板、(5)は観察窓、(7
)はゲッタリング用蒸発源、(9)は吸着壁である。
なお、各図中同一符号は同一、または相当部分を示す。FIG. 1 is a sectional view showing an embodiment of the present invention, and FIG. 2 is a sectional view showing a conventional vapor deposition apparatus. In Figure 2, (1) is the tank, (2a) and (2b) are the main evaporation sources, (3) is the substrate, (5) is the observation window, and (7) is the main evaporation source.
) is an evaporation source for gettering, and (9) is an adsorption wall. Note that the same reference numerals in each figure indicate the same or corresponding parts.
Claims (1)
置かれた基板上に蒸気を放出して蒸気堆積層を形成する
主蒸発源と、 前記槽の壁に設けられ前記槽内部の観察を可能にする観
察窓と、 前記主蒸発源から放出される蒸気のうちのいずれかと比
較して、自身は勿論、この蒸気との反応物も再蒸発し難
いものである蒸気を、前記蒸気の気流の存在する前記観
察窓近傍の吸着壁および空間に向け、かつ、前記基板、
前記主蒸発源および前記観察窓を避けて放出するゲッタ
リング用蒸発源とを 備えた蒸気堆積装置。(1) A main evaporation source that is provided in a tank that is shielded from the atmosphere and that emits vapor to form a vapor deposited layer on a substrate placed in the tank, and a main evaporation source that is provided on the wall of the tank and is located inside the tank. an observation window that allows observation of the vapors emitted from the main evaporation source; toward the suction wall and space near the observation window where a vapor airflow exists, and the substrate;
A vapor deposition apparatus comprising: the main evaporation source; and a gettering evaporation source that emits water while avoiding the observation window.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4060886A JPS62196818A (en) | 1986-02-24 | 1986-02-24 | Vapor deposition device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4060886A JPS62196818A (en) | 1986-02-24 | 1986-02-24 | Vapor deposition device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS62196818A true JPS62196818A (en) | 1987-08-31 |
Family
ID=12585233
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4060886A Pending JPS62196818A (en) | 1986-02-24 | 1986-02-24 | Vapor deposition device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62196818A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6863772B2 (en) * | 2002-10-09 | 2005-03-08 | Taiwan Semiconductor Manufacturing Co., Ltd | Dual-port end point window for plasma etcher |
-
1986
- 1986-02-24 JP JP4060886A patent/JPS62196818A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6863772B2 (en) * | 2002-10-09 | 2005-03-08 | Taiwan Semiconductor Manufacturing Co., Ltd | Dual-port end point window for plasma etcher |
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