JPS6350394A - Molecular beam crystal growth device - Google Patents

Molecular beam crystal growth device

Info

Publication number
JPS6350394A
JPS6350394A JP19077086A JP19077086A JPS6350394A JP S6350394 A JPS6350394 A JP S6350394A JP 19077086 A JP19077086 A JP 19077086A JP 19077086 A JP19077086 A JP 19077086A JP S6350394 A JPS6350394 A JP S6350394A
Authority
JP
Japan
Prior art keywords
electron beam
crystal growth
substrate
molecular beam
chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19077086A
Other languages
Japanese (ja)
Other versions
JPH0657632B2 (en
Inventor
Nobuhiro Kawaguchi
悦弘 川口
Hajime Asahi
一 朝日
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP19077086A priority Critical patent/JPH0657632B2/en
Publication of JPS6350394A publication Critical patent/JPS6350394A/en
Publication of JPH0657632B2 publication Critical patent/JPH0657632B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Crystals, And After-Treatments Of Crystals (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)

Abstract

PURPOSE:To monitor the thickness, etc., of the crystal on a substrate and to control the epitaxy of the crystal by connecting an electron beam generating chamber to a molecular beam crystal growth chamber through a partition wall, projecting the generated electron beam on the substrate arranged in the molecular beam crystal growth chamber, and detecting the reflected electron beam from the substrate with a detector. CONSTITUTION:The molecular beam crystal growth device is provided with the molecular beam crystal growth chamber 2, wherein the substrate 1 is arranged and a crystal is epitaxially grown on the substrate 1, and an evacuation pump 4 for evacuating the chamber. The device has the following structure. Namely, (a) the electron beam generating chamber 12 furnished with an electron beam source 13 is connected to the molecular beam crystal growth chamber 2 through the partition wall 11, (b) the evacuation pump 15 for evacuating the chamber is connected to the electron beam generating chamber 12, (c) an electron beam transmitting hole 17 for radiating an electron beam 16 from the electron beam source 13 on the substrate 1 is provided to the partition wall 11, and (d) an electron beam detector 17' for detecting the electron beam 16' obtained by the diffraction and reflection of the electron beam 16 on the substrate 1 is furnished in the molecular beam crystal growth chamber 2.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、基板上に、結晶を、分子線を用いて、エピタ
キシャル成長させる分子線結晶成長装置に関し、とくに
、結晶を基板上にエピタキシャル成長させている過程に
おいて、基板上にエピタキシャル成長する結晶の厚さな
どを監視することができ、さらには、基板上に結晶をエ
ピタキシャル成長させるのを制御することができる分子
線結晶成長@置に関する。
DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention relates to a molecular beam crystal growth apparatus for epitaxially growing crystals on a substrate using molecular beams, and particularly relates to a process of epitaxially growing crystals on a substrate. The present invention relates to a molecular beam crystal growth system that can monitor the thickness of a crystal epitaxially grown on a substrate, and furthermore, can control the epitaxial growth of a crystal on a substrate.

従来の技術 従来、基板上を配し、その基板上に結晶を、分子線を用
いてエピタキシャル成長させる分子線結晶成長用室と、
その分子線結晶成長用室を排気する排気用ポンプとを有
し、しかして、分子線結晶成長用室を排気用ポンプを用
いて排気しながら、分子線結晶成長用室内に分子線を導
入させ、そして、その分子線を基板に照射させることに
よって、基板上に結晶をエビタキシャ層成長させるよう
にした分子線結晶成長装置が提案されている。
BACKGROUND OF THE INVENTION Conventionally, a molecular beam crystal growth chamber is provided with a substrate and epitaxially grows a crystal on the substrate using molecular beams.
The molecular beam crystal growth chamber is evacuated using the exhaust pump, and the molecular beam is introduced into the molecular beam crystal growth chamber. A molecular beam crystal growth apparatus has been proposed in which an epitaxy layer of crystals is grown on a substrate by irradiating the molecular beam onto the substrate.

発明が解決しようとする問題点 ところで、従来、このような分子線結晶成長装置におい
て、基板上に結晶をエピタキシャル成長させている過程
において、基板上にエピタキシャル成長する結晶の厚さ
などを原子層厚オーダまでも、監視することができ、さ
らには、基板上に結晶をエピタキシャル成長させるのを
制御することができる、ということが所望とされている
Problems to be Solved by the Invention By the way, conventionally, in the process of epitaxially growing a crystal on a substrate in such a molecular beam crystal growth apparatus, the thickness of the crystal epitaxially grown on the substrate has to be on the order of atomic layer thickness. It would be desirable to be able to monitor and further control the epitaxial growth of crystals on a substrate.

このため、分子線結晶成長用室内に電子線発生源を配し
、そして、それからの電子線を基板に照射させ、その結
果、基板から回折反射して得られる反則電子線を検出す
ることが考えられる。
For this reason, it has been proposed to place an electron beam generation source in the molecular beam crystal growth chamber, irradiate the substrate with the electron beam, and detect the resulting foul electron beam that is diffracted and reflected from the substrate. It will be done.

しかしながら、このようにした場合、電子線発生源が分
子線結晶成長用室内に配されているので、分子線結晶成
長用室内を、基板上に分子線を用いて結晶を成長させる
のに適した圧力にした状態において、その圧力が低いと
いうことで、電子線発生源の機能が低下乃至劣化する、
という欠点を有していた。
However, in this case, since the electron beam generation source is placed inside the molecular beam crystal growth chamber, the inside of the molecular beam crystal growth chamber is suitable for growing crystals on the substrate using molecular beams. In a pressurized state, the function of the electron beam source decreases or deteriorates due to the low pressure.
It had the following drawback.

問題点を解決覆るだめの手段 よって、本発明は、そのような欠点のない、新規な分子
線結晶成長装置を提案せんとするものである。
By means of solving and overcoming the problems, the present invention seeks to propose a novel molecular beam crystal growth apparatus free of such drawbacks.

本発明による分子線結晶成長1!i′置は、従来の分子
線結晶成長装置の場合と同様に、基板を配し、その基板
上に結晶を分子線を用いてエピタキシャル成長させる分
子線結晶成長用室と、その分子線結晶成長用室を排気す
る排気用ポンプとを有する。
Molecular beam crystal growth according to the present invention 1! As in the case of conventional molecular beam crystal growth equipment, the i' position is a molecular beam crystal growth chamber in which a substrate is arranged and crystals are epitaxially grown on the substrate using molecular beams, and a chamber for molecular beam crystal growth. It has an exhaust pump for evacuating the chamber.

しかしながら、本発明による分子線結晶成長装置は、こ
のような構成を有する分子線結晶成長装置において、そ
の分子線成長用室に、隔壁を介して、電子線発生用源を
配している電子線発生用室が連結され、また、電子線発
生用!に、それを排気する、分子線結晶成長用室用の排
気用ポンプとは別の排気用ポンプが連結され、さらに、
上記隔壁に、上記電子線発生源からの電子線を上記基板
に照射させるべく、上記分子線成長用室内に通過させる
電子線通過用孔が設けられ、また、上記分子線成長用室
に、上記電子線にもとすき上記基板から回折反射して得
られる反射電子線を検出する電子線検出器が設けられて
いる。
However, in the molecular beam crystal growth apparatus according to the present invention having such a configuration, an electron beam generation source is arranged in the molecular beam growth chamber through a partition. The generation chambers are connected and can also be used for electron beam generation! An evacuation pump separate from the evacuation pump for the molecular beam crystal growth chamber is connected to evacuate the chamber, and further,
The partition wall is provided with an electron beam passage hole through which the electron beam from the electron beam generation source passes into the molecular beam growth chamber in order to irradiate the substrate, and the molecular beam growth chamber is provided with an electron beam passage hole. An electron beam detector is provided for detecting the reflected electron beam obtained by diffraction and reflection from the substrate.

作用・効果 このよ、うな本発明による分子線結晶成長装置によれば
、従来の分子線結晶成長装置の場合と同様に、分子線結
晶成長装置をその排気用ポンプを用いて排気しながら、
分子線結晶成長用室内に分子線を導入させることによっ
て、基板上に結晶をエピタキシャル成長させることがで
きる。
Effects and Effects According to the molecular beam crystal growth apparatus according to the present invention, as in the case of conventional molecular beam crystal growth apparatuses, while evacuating the molecular beam crystal growth apparatus using its exhaust pump,
By introducing molecular beams into the molecular beam crystal growth chamber, crystals can be epitaxially grown on the substrate.

しかしながら、本発明による分子線結晶成長装置の場合
、結晶を基板上にエピタキシャル成長させている過程に
おいて、電子線発生源を移動させることによって、電子
線検出器によって、基板上にエピタキシャル成長する結
晶の厚さなどを監視でき、または電子線検出器の出力に
よって、結晶のエピタキシャル成長を制御することがで
きる。
However, in the case of the molecular beam crystal growth apparatus according to the present invention, in the process of epitaxially growing a crystal on a substrate, by moving the electron beam generation source, the thickness of the crystal epitaxially grown on the substrate is determined by an electron beam detector. etc., or the epitaxial growth of the crystal can be controlled by the output of an electron beam detector.

また、電子m発生用室の排気を、分子線結晶成長用室用
とは別の排気用ポンプを用いて行なうことができるので
、電子線発生用室を、電子線発生源の機能を不必要に低
下乃至劣化させない、高い圧力に維持することができる
。従って、分子線結晶成長用室内を、基板上に結晶を成
長させるのに適した圧力にした状態において、電子線発
生源の機能が、電子線発生源が配されている雰囲気の圧
力が低いということで、低下乃至劣化する、という欠点
を有効に回避することかできる。
In addition, since the electron m generation chamber can be evacuated using a pump separate from that for the molecular beam crystal growth chamber, the function of the electron beam generation chamber and electron beam source is not required. It is possible to maintain high pressure without causing any drop or deterioration. Therefore, when the pressure in the molecular beam crystal growth chamber is set to a level suitable for growing crystals on the substrate, the function of the electron beam source is that the pressure of the atmosphere in which the electron beam source is placed is low. By doing so, the disadvantage of reduction or deterioration can be effectively avoided.

実施例 次に、図面を伴なって本発明による分子線結晶成長装置
の実施例を述べよう。
Embodiment Next, an embodiment of the molecular beam crystal growth apparatus according to the present invention will be described with reference to the drawings.

本発明による分子線結晶成長装置の実施例は、従来の分
子線結晶成長装置の場合と同様に、基板1を配置し、そ
の基板1上に結晶を分子線を用いてエピタキシャル成長
させる分子線結晶成長用室2と、それに開閉手段3を介
して連結している、分子線結晶成長用室を排気するため
の排気用ポンプ4とを有する。
In the embodiment of the molecular beam crystal growth apparatus according to the present invention, as in the case of a conventional molecular beam crystal growth apparatus, a substrate 1 is arranged, and a crystal is grown epitaxially on the substrate 1 using molecular beams. It has a chamber 2 and an exhaust pump 4 connected thereto via an opening/closing means 3 for evacuating the chamber for molecular beam crystal growth.

この場合、分子線結晶成長用室2内には、分子線結晶成
長装置外における原料ガス源5及び6からの原料ガスを
それぞれ受は且つ、それらをそれぞれ噴出させる分子線
噴出器7及び8のノズル9及び10が延長されている。
In this case, the molecular beam crystal growth chamber 2 includes molecular beam ejectors 7 and 8 that receive the source gases from source gas sources 5 and 6 outside the molecular beam crystal growth apparatus, respectively, and eject them, respectively. Nozzles 9 and 10 are extended.

また、分子線結晶成長用室2に、障壁11を介して、電
子線発生用室12が連結され、その電子線発生用室12
内に、それ自体は公知の秤々の電子線発生源13が配さ
れ、また、分子線結晶成長用室12が、開閉手段14を
介して、他の排気用ポンプ15に連結されている。この
場合、障壁11には、電子線発生源からの電子線16を
、分子線結晶成長用室2内に配されている基板1に照射
させるべく、分子線結晶成長用室2内に通過させる電子
線通過用孔17を有している。
Further, an electron beam generation chamber 12 is connected to the molecular beam crystal growth chamber 2 via a barrier 11.
A well-known scale electron beam source 13 is disposed therein, and the molecular beam crystal growth chamber 12 is connected to another exhaust pump 15 via an opening/closing means 14 . In this case, the barrier 11 allows the electron beam 16 from the electron beam generation source to pass through the molecular beam crystal growth chamber 2 in order to irradiate the substrate 1 arranged in the molecular beam crystal growth chamber 2. It has a hole 17 for electron beam passage.

一方、分子線結晶成長用室2に、基板1に電子線16が
照射されることにもとずき、基板1から回折反射して得
られる反射電子線16を受け、その反射電子線の強度に
応じた強度で発光する蛍光板17が配されているととも
に、その蛍光板17上の発光強度を目視で監視するため
の監視用窓18が設けられている。
On the other hand, based on the electron beam 16 being irradiated onto the substrate 1, the molecular beam crystal growth chamber 2 receives the reflected electron beam 16 obtained by diffraction and reflection from the substrate 1, and the intensity of the reflected electron beam is A fluorescent screen 17 that emits light with an intensity corresponding to the brightness is provided, and a monitoring window 18 for visually monitoring the intensity of light emitted from the fluorescent screen 17 is provided.

以上が本発明による分子線結晶成長装置の実施例の構成
である。
The above is the configuration of the embodiment of the molecular beam crystal growth apparatus according to the present invention.

このような本発明による分子線結晶成長装置の実施例に
よれば、分子線結晶成長用室2内に基板2を配し、それ
を図示させる加熱手段によって、加熱した状態で、分子
線結晶成長用室2を排気用ポンプ4を用いて排気させな
がら、分子線結晶成長用室2内に、原料ガス源5から、
分子線噴出器7及びそのノズル9を介して、例えばホス
フィンを導入させるとともに、分子線噴出器8及びその
ノズル10を介して、例えばトリエチルインジウムを導
入させ、そして、分子線結晶成長用室2内を例えば5X
10−’T。
According to such an embodiment of the molecular beam crystal growth apparatus according to the present invention, the substrate 2 is disposed in the molecular beam crystal growth chamber 2, and the substrate 2 is heated by the heating means shown in FIG. While evacuating the chamber 2 using the exhaust pump 4, a source gas source 5 is introduced into the molecular beam crystal growth chamber 2.
For example, phosphine is introduced through the molecular beam jetter 7 and its nozzle 9, and triethyl indium, for example, is introduced through the molecular beam jetter 8 and its nozzle 10, and then inside the molecular beam crystal growth chamber 2. For example, 5X
10-'T.

rrの圧力に維持させることによって、以板1上に、I
nPでなる結晶を、良好にエピタキシャル成長させるこ
とができる。
By maintaining the pressure at rr, I
A crystal made of nP can be grown epitaxially well.

また、このように、基板1上に結晶をエピタキシャル成
長させている過程において、または、その前から、電子
線発生用室12をその排気用ポンプ15を用いて排気さ
せ、そして、電子線発生源13を移動させれば、それか
らの電子線16が基板1を照射し、それにもとずき基板
1から回折反射して得られる反[子線16′が蛍光板1
7を照射し、その蛍光板17が反射電子線の強度に応じ
た歯磨で発光し、その発光強度を監視用窓18を通じて
監視することができる。このため、分子線結晶成長用室
2内に導入される原料ガス源5及び6からのホスフィン
及びトリエチルインジウムの諺を制御することによって
、基板1上にエピタキシャル成長する■npでなる結晶
のエピタキシトル成長を制御させることができる。
In addition, during or before the process of epitaxially growing a crystal on the substrate 1, the electron beam generation chamber 12 is evacuated using the exhaust pump 15, and the electron beam generation source 13 is evacuated using the evacuation pump 15. When the electron beam 16 is moved, the substrate 1 is irradiated with the electron beam 16, and the electron beam 16' obtained by diffraction and reflection from the substrate 1 is reflected on the fluorescent screen 1.
7, the fluorescent screen 17 emits light according to the intensity of the reflected electron beam, and the emitted light intensity can be monitored through the monitoring window 18. Therefore, by controlling the amount of phosphine and triethyl indium introduced into the molecular beam crystal growth chamber 2 from the raw material gas sources 5 and 6, epitaxial growth of a crystal made of np is epitaxially grown on the substrate 1. can be controlled.

さらに、上述したような監視乃至制御がでさるだめに用
いる電子線16を発生する電子線発生II!13を配し
ている電子線発生用室12の排気を、分子線結晶成長用
v2用の排気用ポンプ4とは別の排気用ポンプ15を用
いて行うことができるので、電子線通過用孔17を、例
えば直径5mmというような比較的小さな孔に予めして
おくことによって、電子線発生用室2内を例えば5X1
0’Torrというような電子線発生源13の機能を不
必要に低下乃至劣化させない′、分子線結晶成長用室2
に比し高い圧力に維持させることができる。
Further, the electron beam generation II! generates the electron beam 16 used for monitoring and control as described above! The electron beam generation chamber 12 in which the electron beam generation chamber 13 is located can be evacuated using an evacuation pump 15 that is different from the evacuation pump 4 for molecular beam crystal growth V2. 17 into a relatively small hole, for example, 5 mm in diameter, the inside of the electron beam generation chamber 2 is made into a 5×1 hole, for example.
The molecular beam crystal growth chamber 2 does not unnecessarily lower or deteriorate the function of the electron beam generation source 13 such as 0' Torr.
It is possible to maintain a higher pressure than the

なお、上述においては、基板上にInPでなる結晶をエ
ピタキシャル成長させる場合につき述べたが、他の種々
の材料でなる結晶をエピタキシャル成長させることもで
きる。
In the above description, a case has been described in which a crystal made of InP is epitaxially grown on a substrate, but crystals made of various other materials can also be grown epitaxially.

また、蛍光板17を、電子線検知器として用いた場合に
つき述べたが、その電子線検出器として、反射電子線1
6′を受けて、電気的出力を出力する、それ自体は公知
の種々の電子線検出器を用い、その電気的出力によって
自動的に、分子線結晶成長用室2に導入されるガスの岳
を1,11御させることもでき、その他、本発明の精神
を脱することなしに、種々の変型、変更をなし得るであ
ろう。
In addition, although the fluorescent screen 17 is used as an electron beam detector, the reflected electron beam 1
6' and outputs an electrical output, using various well-known electron beam detectors, and the electrical output automatically detects the amount of gas introduced into the molecular beam crystal growth chamber 2. 1 or 11, and various other modifications and changes may be made without departing from the spirit of the present invention.

【図面の簡単な説明】[Brief explanation of drawings]

図は、本発明による分子線結晶成長装置の実施例を示す
路線的断面図である。 1・・・・・・・・・・・・・・・基板2・・・・・・
・・・・・・・・・分子線結晶成長用室4.15・・・
・・・排気用ポンプ 5.6・・・・・・・・・原料ガス源 7.8・・・・・・・・・分子線噴出器9.10・・・
・・・ノズル
The figure is a linear cross-sectional view showing an embodiment of the molecular beam crystal growth apparatus according to the present invention. 1・・・・・・・・・・・・・・・Substrate 2・・・・・・
・・・・・・Molecular beam crystal growth chamber 4.15...
... Exhaust pump 5.6 ... Raw material gas source 7.8 ... Molecular beam ejector 9.10 ...
···nozzle

Claims (1)

【特許請求の範囲】 基板を配し、その基板上に結晶を分子線を用いてエピタ
キシャル成長させる分子線結晶成長用室と、 上記分子線結晶成長用室を排気する排気用ポンプとを有
する分子線結晶成長装置において、上記分子線成長用室
に、隔壁を介して、電子線発生源を配している電子線発
生用室が連結され、 上記電子線発生用室に、それを排気する、上記排気用ポ
ンプとは別の排気用ポンプが連結され、 上記隔壁に、上記電子線発生源からの電子線を上記基板
に照射させるべく、上記分子線成長用室内に通過させる
電子線通過用孔が設けられ、上記分子線成長用室に、上
記電子線にもとずき上記基板から回折反射して得られる
反射電子線を検出する電子線検出器が設けられているこ
とを特徴とする分子線結晶成長装置。
[Claims] A molecular beam comprising a molecular beam crystal growth chamber in which a substrate is arranged and a crystal is epitaxially grown on the substrate using a molecular beam, and an exhaust pump for evacuating the molecular beam crystal growth chamber. In the crystal growth apparatus, an electron beam generation chamber in which an electron beam generation source is arranged is connected to the molecular beam growth chamber via a partition wall, and the electron beam generation chamber is evacuated to the electron beam generation chamber. An evacuation pump different from the evacuation pump is connected, and the partition wall has an electron beam passage hole for passing the electron beam from the electron beam generation source into the molecular beam growth chamber in order to irradiate the substrate with the electron beam. The molecular beam growth chamber is provided with an electron beam detector for detecting a reflected electron beam obtained by diffraction and reflection from the substrate based on the electron beam. Crystal growth equipment.
JP19077086A 1986-08-15 1986-08-15 Molecular beam crystal growth equipment Expired - Lifetime JPH0657632B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19077086A JPH0657632B2 (en) 1986-08-15 1986-08-15 Molecular beam crystal growth equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19077086A JPH0657632B2 (en) 1986-08-15 1986-08-15 Molecular beam crystal growth equipment

Publications (2)

Publication Number Publication Date
JPS6350394A true JPS6350394A (en) 1988-03-03
JPH0657632B2 JPH0657632B2 (en) 1994-08-03

Family

ID=16263433

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19077086A Expired - Lifetime JPH0657632B2 (en) 1986-08-15 1986-08-15 Molecular beam crystal growth equipment

Country Status (1)

Country Link
JP (1) JPH0657632B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0277114A (en) * 1988-09-13 1990-03-16 Sony Corp Epitaxial growth method
JPH02175689A (en) * 1988-12-27 1990-07-06 Mitsubishi Electric Corp Epitaxial device of molecular beam
WO2000016372A1 (en) * 1998-09-11 2000-03-23 Japan Science And Technology Corporation High energy electron diffraction apparatus

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0277114A (en) * 1988-09-13 1990-03-16 Sony Corp Epitaxial growth method
JPH02175689A (en) * 1988-12-27 1990-07-06 Mitsubishi Electric Corp Epitaxial device of molecular beam
WO2000016372A1 (en) * 1998-09-11 2000-03-23 Japan Science And Technology Corporation High energy electron diffraction apparatus
US6677581B1 (en) 1998-09-11 2004-01-13 Japan Science And Technology Corporation High energy electron diffraction apparatus

Also Published As

Publication number Publication date
JPH0657632B2 (en) 1994-08-03

Similar Documents

Publication Publication Date Title
JP2987379B2 (en) Method for epitaxial growth of semiconductor crystal
US5463977A (en) Method of and apparatus for epitaxially growing chemical compound crystal
US5525156A (en) Apparatus for epitaxially growing a chemical compound crystal
DenBaars et al. Atomic layer epitaxy for the growth of heterostructure devices
JPS6350394A (en) Molecular beam crystal growth device
JPH07153692A (en) Method and equipment for making thin film grow on semiconductor substrate
US4842679A (en) Method for the production of semiconductor devices
JP2934740B2 (en) Equipment for epitaxial growth of semiconductor crystals
JP2773849B2 (en) Vapor phase growth method and photoexcited vapor phase epitaxy apparatus
JPH05243283A (en) Epitaxial growth device and growth method
JP2723906B2 (en) Thin film crystal growth control method
JPS6272590A (en) Particle beam intensity detector for particle beam epitaxial device
JPH0251489A (en) Molecular ray crystal growing device
JP2603898B2 (en) Thin film growth method and thin film growth apparatus using supersonic molecular beam
Schmidt et al. A compact VCE growth system for in situ studies of epitaxy
GB2190400A (en) Process for growing GaAs monocrystal film
JPS6278186A (en) Corpuscular ray epitaxial apparatus
JPH05234913A (en) Organic metal chemical vapor growth equipment
JPH06112129A (en) Semiconductor crystal growth device
JPH05251344A (en) Molecular-beam epitaxial method
JPS6134987A (en) Manufacture of semiconductor laser
JPS61132591A (en) Device for controlling intensity of particle beam in particle beam epitaxial apparatus
JPS61219792A (en) Detecting and controlling device for intensity of particle beam in epitaxial apparatus using particle beam
JPH033228A (en) Semiconductor manufacturing apparatus
JPS6469595A (en) Method for molecular beam crystal growth of group iii-v compound semiconductor

Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term