JPS62180780U - - Google Patents
Info
- Publication number
- JPS62180780U JPS62180780U JP6925986U JP6925986U JPS62180780U JP S62180780 U JPS62180780 U JP S62180780U JP 6925986 U JP6925986 U JP 6925986U JP 6925986 U JP6925986 U JP 6925986U JP S62180780 U JPS62180780 U JP S62180780U
- Authority
- JP
- Japan
- Prior art keywords
- pin
- test head
- lock
- passed
- base
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000006835 compression Effects 0.000 claims description 4
- 238000007906 compression Methods 0.000 claims description 4
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6925986U JPH0624782Y2 (ja) | 1986-05-08 | 1986-05-08 | ロツクピン装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6925986U JPH0624782Y2 (ja) | 1986-05-08 | 1986-05-08 | ロツクピン装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62180780U true JPS62180780U (enExample) | 1987-11-17 |
| JPH0624782Y2 JPH0624782Y2 (ja) | 1994-06-29 |
Family
ID=30909827
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6925986U Expired - Lifetime JPH0624782Y2 (ja) | 1986-05-08 | 1986-05-08 | ロツクピン装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0624782Y2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0274050A (ja) * | 1988-09-09 | 1990-03-14 | Tokyo Electron Ltd | 検査装置 |
-
1986
- 1986-05-08 JP JP6925986U patent/JPH0624782Y2/ja not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0274050A (ja) * | 1988-09-09 | 1990-03-14 | Tokyo Electron Ltd | 検査装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0624782Y2 (ja) | 1994-06-29 |