JPS62175608A - Ultrasonic thickness measuring apparatus - Google Patents
Ultrasonic thickness measuring apparatusInfo
- Publication number
- JPS62175608A JPS62175608A JP1759686A JP1759686A JPS62175608A JP S62175608 A JPS62175608 A JP S62175608A JP 1759686 A JP1759686 A JP 1759686A JP 1759686 A JP1759686 A JP 1759686A JP S62175608 A JPS62175608 A JP S62175608A
- Authority
- JP
- Japan
- Prior art keywords
- inspected
- thickness
- vibrators
- probe
- crack
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000007547 defect Effects 0.000 claims description 15
- 230000005540 biological transmission Effects 0.000 claims description 6
- 238000002604 ultrasonography Methods 0.000 claims description 6
- 238000000034 method Methods 0.000 claims description 3
- 239000000523 sample Substances 0.000 abstract description 10
- 230000001678 irradiating effect Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 7
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 3
- 238000005259 measurement Methods 0.000 description 2
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 238000009683 ultrasonic thickness measurement Methods 0.000 description 1
Landscapes
- Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は被検体の厚みの他に欠陥位置及び欠陥深さ等の
検出の行える超音波厚み計測装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to an ultrasonic thickness measuring device capable of detecting not only the thickness of an object but also defect positions, defect depths, and the like.
従来の超音波厚み計測装置は分割型の垂直探触子を用い
て、プラント等に用いられる部材の厚みを計測するため
の専用機であった。Conventional ultrasonic thickness measuring devices are specialized machines for measuring the thickness of members used in plants, etc., using a split-type vertical probe.
しかしながら最近プラント工場等では配管等の厚みを計
測する場合、厚みと同時に腐食孔(ピット)等の欠陥の
進展深さも同時に計測されることが望まれるが、前述し
たように従来の超音波厚み計測装置では部材の厚みしか
計測できないという問題点を有していた。However, recently, when measuring the thickness of piping in plants, etc., it is desirable to measure the depth of defects such as corrosion holes (pits) at the same time as the thickness, but as mentioned above, conventional ultrasonic thickness measurement The problem with this device is that it can only measure the thickness of the member.
本発明は前記問題点に鑑みてなされたもので、その目的
とするところは被検体の厚さとピット深さやキレツ深さ
等の欠陥の位置及び深さをも計測することが可能な超音
波厚み計測装置を提供することにある。The present invention has been made in view of the above-mentioned problems, and its purpose is to provide ultrasonic thickness that can also measure the thickness of a specimen and the position and depth of defects such as pit depth and crack depth. The objective is to provide a measuring device.
〔問題点を解決するための手段および作用〕本発明は前
記目的を達成するために送信信号を発する送信器と、前
記送信信号によって振動して超音波を発し被検体に対し
て異なる入力角度でこの超音波を照射する少くとも2つ
の振動子からなる第1の振動子と、被検体によって反射
された超音波を受ける第2の振動子と、前記第2の振動
子から送られる信号を受信する受信器と、前記受信器か
ら送られる信号を処理して被検体の厚さ及び被検体が有
する欠陥に関するデータを算出する処理回路と、を具備
することを特徴とする。[Means and effects for solving the problems] In order to achieve the above object, the present invention includes a transmitter that emits a transmission signal, and a transmitter that vibrates according to the transmission signal and emits ultrasonic waves at different input angles to a subject. A first transducer consisting of at least two transducers that irradiates this ultrasound, a second transducer that receives the ultrasound reflected by the subject, and receives a signal sent from the second transducer. and a processing circuit that processes signals sent from the receiver to calculate data regarding the thickness of the object and defects that the object has.
以下図面に基づいて本発明の1実施例を詳細に説明する
。第1図は本実施例に係仝超音波厚み計測装置の構成ブ
ロック図である。同期信号発生回路1は送信器3、ゲー
ト回路5、カウンタ7に同期信号を供給する。送信器3
は同期信号発生回路1から送られる同期信号によって探
触子9の中の振動子11,13.15に送信信号を送る
。第2図はこの探触子9の拡大断面図であり、この探触
子9の中には4個の振動子11,13,15゜17が設
けられ、振動子11.13は筐体19の底面に対して斜
めになるように設られ、振動子15.17はC体の底面
に平行になるように設けられる。振動子11,13.1
5はコネクタ21を介して送信器3に接続され送信器3
から送信信号が送られると振動して超音波を発し、これ
を被検体に照射する。振動子17はコネクタ23を介し
て受信器25に接続され、被検体によって反射された超
音波を受けると振動し受信信号を受信器25に送るもの
である。An embodiment of the present invention will be described in detail below based on the drawings. FIG. 1 is a block diagram of the configuration of an ultrasonic thickness measuring device according to this embodiment. A synchronization signal generation circuit 1 supplies a synchronization signal to a transmitter 3, a gate circuit 5, and a counter 7. Transmitter 3
sends a transmission signal to the transducers 11, 13, and 15 in the probe 9 in response to a synchronization signal sent from the synchronization signal generation circuit 1. FIG. 2 is an enlarged cross-sectional view of this probe 9. Four transducers 11, 13, and 15 degrees 17 are provided in this probe 9, and the transducers 11 and 13 are located in a housing 19. The vibrators 15 and 17 are installed parallel to the bottom surface of the C body. Vibrator 11, 13.1
5 is connected to the transmitter 3 via the connector 21 and the transmitter 3
When a transmission signal is sent from the device, it vibrates and emits ultrasonic waves, which are then irradiated onto the subject. The vibrator 17 is connected to the receiver 25 via the connector 23 and vibrates upon receiving the ultrasound reflected by the subject and sends a received signal to the receiver 25.
再び第1図に戻りゲート回路5は前記同期信号発生回路
1からの同期信号によって開にされる。Returning to FIG. 1 again, the gate circuit 5 is opened by the synchronizing signal from the synchronizing signal generating circuit 1.
受信器25は振動子17から送られる信号を受信し、こ
のゲート回路5を介して処理回路27に供給する。また
カウンタ7は前記同期信号発生回路1から供給される同
期信号の立上りに同期してリセットされ、クロックパル
ス発振器33から生成されるクロックパルスをカウント
する。このカウンタ7の計数値は処理回路27に加えら
れる。処理回路27は受信′ri25から送られる信号
およびカウンタ7の計数値を処理して、被検体の厚さ及
び欠陥位置・欠陥深さ等を算出する。表示器29は処理
回路27によって算出された被検体の厚さを表示する。The receiver 25 receives the signal sent from the vibrator 17 and supplies it to the processing circuit 27 via the gate circuit 5 . Further, the counter 7 is reset in synchronization with the rise of the synchronization signal supplied from the synchronization signal generation circuit 1, and counts the clock pulses generated from the clock pulse oscillator 33. The counted value of this counter 7 is added to the processing circuit 27. The processing circuit 27 processes the signal sent from the receiver'ri 25 and the count value of the counter 7, and calculates the thickness of the object, the defect position, the defect depth, etc. The display 29 displays the thickness of the subject calculated by the processing circuit 27.
表示器31は処理回路27によって算出された被検体の
欠陥位置・欠陥深さ等の情報を表示する。The display 31 displays information such as the defect position and defect depth of the object calculated by the processing circuit 27.
次に本実施例の動作について説明する。第3図は被検体
35に欠陥がない場合の説明図であり、同図に示すよう
に被検体35に探触子9を接触させ、送信器3を駆動さ
せて、振動子11,13゜15を振動させ超音波を生成
しこれを被検体35に照射すると、振動子17は振動子
15から発せられ被検体35の底面で反射された超音波
Aのみを受信する。そして受信器25は振動子17がら
送られる信号を受信し、これをゲート回路5を介して処
理回路27に送り、処理回路27ではこのときのカウン
タ7の計数値とともに演算処理を行い被検体35の厚さ
を算出し、表示器29に表示させる。Next, the operation of this embodiment will be explained. FIG. 3 is an explanatory diagram when there is no defect in the object 35. As shown in the figure, the probe 9 is brought into contact with the object 35, the transmitter 3 is driven, and the transducers 11, 13° When the transducer 15 is vibrated to generate ultrasonic waves, which are irradiated onto the subject 35, the transducer 17 receives only the ultrasonic waves A emitted from the transducer 15 and reflected from the bottom surface of the subject 35. Then, the receiver 25 receives the signal sent from the vibrator 17, sends it to the processing circuit 27 via the gate circuit 5, and the processing circuit 27 performs arithmetic processing together with the count value of the counter 7 at this time. The thickness is calculated and displayed on the display 29.
第4図は被検体35に亀裂37がある場合の説明図であ
り、この場合には振動子17は振動子15から発せられ
被検体35の底面で反射された超音波Aと、振動子15
.17から発せられ亀裂37で反射された超音波Bを受
信する。受信器25はこれらの信号を受信し、ゲート回
路5を介して処理回路27に人力し、処理回路27でカ
ウンタ7の計数値をもとに被検体35の厚さ及び亀裂3
7の位置・深さ等が算出される。被検体35の厚さは表
示器29に表示され、亀裂37の位置及び深さ等の情報
は表示器31に表示される。FIG. 4 is an explanatory diagram when there is a crack 37 in the object 35. In this case, the transducer 17 emits ultrasonic waves A emitted from the object 35 and reflected from the bottom surface of the object 35, and
.. The ultrasonic wave B emitted from the crack 37 and reflected by the crack 37 is received. The receiver 25 receives these signals and sends them to the processing circuit 27 via the gate circuit 5.The processing circuit 27 calculates the thickness of the object 35 and the crack 3 based on the count value of the counter 7.
The position, depth, etc. of 7 are calculated. The thickness of the object 35 is displayed on the display 29, and information such as the position and depth of the crack 37 is displayed on the display 31.
このように本実施例では被検体の厚さの他に被検体の有
する欠陥に関する情報も計測することができる。In this way, in this embodiment, in addition to the thickness of the test object, information regarding defects in the test object can also be measured.
以上詳細に説明したように本発明によれば被検体の厚さ
の他に被検体の有する亀裂等の欠陥の位置及び深さ等の
データをも計測することができる。As described in detail above, according to the present invention, it is possible to measure not only the thickness of the object but also data such as the position and depth of defects such as cracks in the object.
第1図は超音波厚み計測装置の構成ブロック図、第2図
は探触子の断面図、第3図は被検体に欠陥かない場合の
厚み計測の動作を説明する図、第4図は被検体に欠陥が
ある場合の厚み計測動作を説明する図である。
3・・・送信器、11,13,15.17・・・振動子
、25・・・受信器、27・・・処理回路。
第2図
第3図 第4ン1Figure 1 is a block diagram of the configuration of the ultrasonic thickness measuring device, Figure 2 is a cross-sectional view of the probe, Figure 3 is a diagram explaining the thickness measurement operation when there is no defect in the specimen, and Figure 4 is the diagram of the specimen. FIG. 6 is a diagram illustrating a thickness measurement operation when a specimen has a defect. 3... Transmitter, 11, 13, 15.17... Vibrator, 25... Receiver, 27... Processing circuit. Figure 2 Figure 3 Figure 4-1
Claims (1)
対して異なる入力角度でこの超音波を照射する少くとも
2つの振動子からなる第1の振動子と、 波検体によって反射された超音波を受ける第2の振動子
と、 前記第2の振動子から送られる信号を受信する受信器と
、 前記受信器から送られる信号を処理して被検体の厚さ及
び被検体が有する欠陥に関するデータを算出する処理回
路と を具備することを特徴とする超音波厚み計測装置。[Scope of claims] Consisting of a transmitter that generates a transmission signal, and at least two transducers that vibrate in response to the transmission signal to generate ultrasound and irradiate the ultrasound at different input angles to the subject. a first transducer; a second transducer that receives the ultrasound reflected by the wave sample; a receiver that receives the signal sent from the second transducer; and processes the signal sent from the receiver. 1. An ultrasonic thickness measuring device comprising: a processing circuit that calculates data regarding the thickness of an object to be examined and defects that the object has.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1759686A JPS62175608A (en) | 1986-01-29 | 1986-01-29 | Ultrasonic thickness measuring apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1759686A JPS62175608A (en) | 1986-01-29 | 1986-01-29 | Ultrasonic thickness measuring apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS62175608A true JPS62175608A (en) | 1987-08-01 |
Family
ID=11948269
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1759686A Pending JPS62175608A (en) | 1986-01-29 | 1986-01-29 | Ultrasonic thickness measuring apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62175608A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102590354A (en) * | 2012-03-02 | 2012-07-18 | 河北省电力研究院 | Probe for performing ultrasonic detection on internal thread tube |
-
1986
- 1986-01-29 JP JP1759686A patent/JPS62175608A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102590354A (en) * | 2012-03-02 | 2012-07-18 | 河北省电力研究院 | Probe for performing ultrasonic detection on internal thread tube |
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