JPS62174608A - Pattern detector - Google Patents

Pattern detector

Info

Publication number
JPS62174608A
JPS62174608A JP1663086A JP1663086A JPS62174608A JP S62174608 A JPS62174608 A JP S62174608A JP 1663086 A JP1663086 A JP 1663086A JP 1663086 A JP1663086 A JP 1663086A JP S62174608 A JPS62174608 A JP S62174608A
Authority
JP
Japan
Prior art keywords
inspected
base member
films
detection device
pattern detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1663086A
Other languages
Japanese (ja)
Inventor
Akira Sase
佐瀬 昭
Takeo Osada
長田 太計男
Isamu Kawamata
川又 勇
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP1663086A priority Critical patent/JPS62174608A/en
Publication of JPS62174608A publication Critical patent/JPS62174608A/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To keep flatness and to fix an object to be inspected with good accuracy even in case of detecting transmitted light by using a transparent flexible films and vacuum-sucking the object to be inspected to a table keeping the flatness. CONSTITUTION:A frame part 14 is provided surrounding a base plate 12 and the plate 12 and the transparent flexible films 13 are fitted airtightly and a channel for vacuum suction is formed. Then, the thin films 13 such as the Mylar films are laid in layers on the upper part of the object 2 to be inspected held on the plate 12 and vacuum-sucked by a sucker 4 connected with a suction port of a frame part 14. When the films 13 are vacuum-sucked in this way, the films 13 are stuck to the object 12 to be inspected and fixed uniformly by the air pressure. On this occasion, the air is impressed on the plate 12 from the vertical directions and the deformation is extremely small. Further, when the base plate is constituted of a transparent member such as a glass plate, and optical path is maintained extending over the whole area to be inspected by it and an optical axis is not changed because the deformation is small.

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明はパターン検出装置、特にフォトマスクのように
撓み易く、透過光検出を必要とする対象の場合に用いる
パターン検出装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to a pattern detection device, and particularly to a pattern detection device used for objects such as photomasks that are easily bent and require transmitted light detection.

〔発明の背景〕[Background of the invention]

光学的方法によってパターンを検出し、検出信号を画像
処理して欠陥の検査などを行うパターン検出装置ではご
般に対象物を光学系の焦点深度内に平面度を保って取付
ける必要がある。例えば、プリント基板やフォトマスク
、その他回路基板の光学的自動検査装置では、検出分解
能の関係から等倍〜拡大してパターン検出する場合が多
く、焦、d深度は0.2tays程度であることが多い
、しかし対象となるプリント基板やフォトマスクはそり
In a pattern detection apparatus that detects a pattern using an optical method and performs image processing of the detection signal to inspect for defects, it is generally necessary to mount an object within the depth of focus of the optical system while maintaining flatness. For example, in optical automatic inspection equipment for printed circuit boards, photomasks, and other circuit boards, patterns are often detected at the same magnification or magnification due to the detection resolution, and the focal depth and d depth may be approximately 0.2 tays. There are many, but the target printed circuit boards and photomasks are warped.

ねじれ、たわみがあり、平面度を保って取付ける必要が
ある。このため従来は平面度の良いテーブル上に真空吸
引して固定したり、ガラス板などで押えつけたりしてい
た。
There is twisting and bending, so it is necessary to maintain flatness when installing. For this reason, in the past, they were fixed by vacuum suction on a flat table, or held down with a glass plate or the like.

第6図に示したものは真空吸引して取付けるのに用いる
固定装置の断面図で、1は検査対象2を保持する面に真
空吸引用の穴3が設けられているステージ部、4は吸引
装置を示している。
What is shown in Fig. 6 is a cross-sectional view of the fixing device used for vacuum suction and attachment, in which 1 is a stage part in which a hole 3 for vacuum suction is provided on the surface that holds the inspection object 2, and 4 is a suction The device is shown.

この固定装置は、上方から照明してパターンを検出する
場合に多く用いられるもので、検査対象2を乗せるステ
ージ部1は内部に部屋を持ち、真空ポンプや吸引ブロア
などの吸引袋[4に接続されており、上面に設けられた
多数の穴3を通して検査対象を吸引固定するようになっ
ている。この固定装置は内部にリブを設は自重や負圧に
よる変形を防ぐ構造が可能であり、上面の平面度を確保
しておけば、検査対象2はこれに沿って固定されるので
、吸引固定すると同時に平面度を得ることができる。し
かし、透過光検出を行う場合に使用できないのは明らか
である。また、透明なフィルムマスクのような検査対象
を反射光式で検出しようとする場合には吸引用の穴の影
響を無視できない。
This fixing device is often used when detecting a pattern by illuminating it from above. The stage section 1 on which the inspection object 2 is placed has an internal chamber and is connected to a suction bag [4] such as a vacuum pump or suction blower. The object to be inspected is suctioned and fixed through a large number of holes 3 provided on the top surface. This fixing device has ribs inside to prevent deformation due to its own weight and negative pressure, and if the flatness of the top surface is ensured, the inspection object 2 will be fixed along this, so it can be fixed by suction. At the same time, flatness can be obtained. However, it is clear that it cannot be used when performing transmitted light detection. Furthermore, when attempting to detect an inspection object such as a transparent film mask using a reflected light method, the influence of the suction holes cannot be ignored.

しかし、パターン検出装置の検査対象には種々のものが
あり、それぞれ最した照明法、検出法がある。すなわち
、フォトマスクの様に透明、不透明が明確な対象では透
過光を検出する方法が適しているが、従来の真空吸引し
てテーブル上に固定する方法では照明部で吸引するため
両立せず、ガラス板などを乗せる方法では平面度が悪く
なる欠点を持っていた。
However, there are various objects to be inspected by the pattern detection apparatus, and each has its own optimal illumination method and detection method. In other words, a method that detects transmitted light is suitable for objects that are clearly transparent or opaque, such as a photomask, but the conventional method of vacuum suction and fixing the object on a table is incompatible because the suction is performed at the illumination part. The method of placing a glass plate, etc., had the disadvantage of poor flatness.

〔発明の目的〕[Purpose of the invention]

本発明の目的は、透過光を検出する場合でも平面度を保
って精度良く検査対象を固定することのできるパターン
検出装置を提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a pattern detection device that can maintain flatness and accurately fix an object to be inspected even when detecting transmitted light.

〔発明の概要〕[Summary of the invention]

本発明は、負圧で吸引して固定装置に平面度を保って取
付けられる検査対象のパターンを光学的方法によって検
出するパターン検出装置において、前記固定装置が、前
記検査対象を保持するベース部材と、該ベース部材上の
前記検査対象を覆う透明可撓膜と、該ベース部材の周囲
をとりまいて設けられ該ベース部材及び前記透明可撓膜
が気密に取付けられ負圧吸引用の流路を形成するフレー
ム部材とからなっていることを特徴とするものである。
The present invention provides a pattern detection device that uses an optical method to detect a pattern of an object to be inspected, which is attached to a fixing device by suction with negative pressure while maintaining flatness, in which the fixing device is connected to a base member that holds the object to be inspected. , a transparent flexible membrane covering the inspection object on the base member, and a flow path for negative pressure suction provided surrounding the base member, the base member and the transparent flexible membrane being airtightly attached. It is characterized in that it consists of a frame member that is formed.

本発明は透明可撓膜を用いることによって検査対象を平
面度を保ったテーブルへ真空吸引するようにすれば、吸
引口を検査対象の周囲に配置できることに着目してなさ
れたものである。
The present invention was made with the focus on the fact that by using a transparent flexible membrane to vacuum suction the test object onto a table that maintains its flatness, suction ports can be placed around the test object.

〔発明の実施例〕[Embodiments of the invention]

以下、実施例について説明する。 Examples will be described below.

第5図は本発明のパターン検出装置の一実施例の概念を
示す説明図、第1図は第5図の固定装置の説明図である
。なお、第5図では検査対象の固定装置の詳細は省略し
である。第5図に示したパターン検出装置では、検査し
ようとする検査対象2は固定装置5によって所定の位置
に固定されるが、この時、検査対象2は検出光学系6に
対して平面度が保たれていることが必要である。検査対
象2のパターンを透過光で検出しようとする場合、照明
光学系7は検出光学系6と検査対象2をはさんで配置さ
れる。光学系6,7と検査対象2はその検査範囲内を相
対的に移動する必要があり、この例では固定袋[5が駆
動機構8によって移動させられる。したがって、透過光
を検出する場合。
FIG. 5 is an explanatory diagram showing the concept of one embodiment of the pattern detection device of the present invention, and FIG. 1 is an explanatory diagram of the fixing device of FIG. 5. In addition, in FIG. 5, details of the fixing device to be inspected are omitted. In the pattern detection device shown in FIG. 5, the inspection object 2 to be inspected is fixed at a predetermined position by the fixing device 5, but at this time, the inspection object 2 is kept flat with respect to the detection optical system 6. It is necessary to be sagging. When the pattern of the inspection object 2 is to be detected using transmitted light, the illumination optical system 7 is arranged to sandwich the detection optical system 6 and the inspection object 2. The optical systems 6 and 7 and the inspection object 2 must be moved relatively within the inspection range, and in this example, the fixed bag [5 is moved by the drive mechanism 8. Therefore, when detecting transmitted light.

固定装置5は、検査範囲内を移動しても光軸を遮ぎるこ
とがあってはならず、光学的に同一特性でなければなら
ない、すなわち検査対象2をガラス板などではさんで固
定する場合、たわみや厚みの変化によって光軸が変化し
たり焦点位置が変化してはならないのである。検査装置
は一般的に、検出光学系6で得られた電気信号をディジ
タル化する2値化回路9と、画像信号から欠陥部を摘出
する欠陥判定部10、及び装置全体の動作を制御する制
御部11からなる。
The fixing device 5 must not block the optical axis even if it moves within the inspection range, and must have the same optical characteristics. In other words, when the inspection object 2 is fixed by sandwiching it between glass plates, etc. The optical axis and focal position must not change due to changes in deflection or thickness. The inspection device generally includes a binarization circuit 9 that digitizes the electrical signal obtained by the detection optical system 6, a defect determination section 10 that extracts defective parts from the image signal, and a control that controls the operation of the entire device. Consisting of 11 parts.

第1図において、2は検査対象、12は検査対象を保持
するベース板、13はベース板12上の検査対象2を覆
う透明可撓膜、14はベース板12をとりまいて設けら
れ、ベース板12及び透明可撓膜13が気密に取付けら
れ負圧吸引用の流路を形成するフレーム部、4は吸引装
置を示している。この固定装置ではベース板12上に保
持された検査対象2の上部にマイラフィルムのような薄
い透明可撓膜13を重ね、フレーム部14の吸引口に接
続された吸引装置4によって負圧に吸引される。このよ
うに負圧に吸引すると、透明可撓膜13は検査対象2に
密着し一様に大気圧で固定される。この際ベース板12
には上下の方向から大気が印加されることになり変形は
極めて小さい。
In FIG. 1, 2 is an object to be inspected, 12 is a base plate that holds the object to be inspected, 13 is a transparent flexible film that covers the object 2 to be inspected on the base plate 12, and 14 is provided surrounding the base plate 12. A frame portion 4 indicates a suction device to which the plate 12 and the transparent flexible membrane 13 are airtightly attached to form a flow path for negative pressure suction. In this fixing device, a thin transparent flexible film 13 such as Mylar film is placed on top of the inspection object 2 held on a base plate 12, and the film is sucked into negative pressure by a suction device 4 connected to a suction port in a frame part 14. be done. When suctioned to negative pressure in this manner, the transparent flexible membrane 13 comes into close contact with the inspection object 2 and is uniformly fixed at atmospheric pressure. At this time, the base plate 12
Since the atmosphere is applied from above and below, deformation is extremely small.

第2図は他の実施例の透過光検出用のパターン検出装置
の固定装置の説明図で、第5図及び第1図と同一部分に
は同一符号が付しである。この実施例ではベース板15
をガラス板のような透明部材で構成してあり、それによ
って検査すべき全域に渡って光路が確保され、変形が少
いため、光軸変化を生じさせることはない。
FIG. 2 is an explanatory diagram of a fixing device of a pattern detection device for detecting transmitted light according to another embodiment, and the same parts as in FIGS. 5 and 1 are given the same reference numerals. In this embodiment, the base plate 15
is made of a transparent member such as a glass plate, which ensures an optical path over the entire area to be inspected, and because there is little deformation, there is no change in the optical axis.

第3図はさらに他の実施例の上方照明の検出系を有する
パターン検出装置の固定装置の説明図で。
FIG. 3 is an explanatory diagram of a fixing device of a pattern detection device having a detection system for upward illumination according to still another embodiment.

第5図及び第1図と同一部分には同一符号が付しである
。透明材料上にパターンが形成されている場合、パター
ンの反射率が低ければ、ベース板12を高反射率表面に
、逆にパターンが金属蒸着のように高反射率であればベ
ース板12を低反射率表面にすることによって、コント
ラストの良いパターン検出が可能となる。
The same parts as in FIG. 5 and FIG. 1 are given the same reference numerals. When a pattern is formed on a transparent material, if the reflectance of the pattern is low, the base plate 12 is made to have a high reflectance surface, and conversely, if the pattern has a high reflectance such as metal vapor deposition, the base plate 12 is made to have a low reflectance. By using a reflectance surface, pattern detection with good contrast becomes possible.

第4図はさらに他の実施例の厚さの異なる検査対象に適
用するパターン検出装置の固定装置の説明図で、第5図
及び第1図と同一部分には同一符号が付しである。この
ように検査対象の厚さが異なる場合には、その厚さに応
じたシート17を検査対象2とベース板との間に敷くこ
とによって常にパターン面を同一位置に固定することが
できるので、検出系の焦点調整を行う必要がない。
FIG. 4 is an explanatory diagram of a fixing device of a pattern detection device applied to inspection objects having different thicknesses according to still another embodiment, and the same parts as in FIGS. 5 and 1 are given the same reference numerals. When the thicknesses of the objects to be inspected differ in this way, by placing the sheet 17 corresponding to the thickness between the object to be inspected 2 and the base plate, the pattern surface can always be fixed at the same position. There is no need to adjust the focus of the detection system.

これらの実施例によれば次のような効果がある。These embodiments have the following effects.

(1)検査対象の上下を透明材料で構成することが可能
で、照明部から検出部に至る光路を遮ぎる位置に他の機
構を配置する必要がないので透過光検出に適用できる。
(1) The upper and lower parts of the inspection object can be made of transparent materials, and there is no need to arrange other mechanisms at positions that block the optical path from the illumination section to the detection section, so it can be applied to transmitted light detection.

(2)吸引中には上下方向から大気圧が作用するので、
真空吸引による機構の変形はなく、構造を小形にできる
(2) During suction, atmospheric pressure acts from above and below, so
There is no deformation of the mechanism due to vacuum suction, and the structure can be made smaller.

(3)真空吸引による変形がないので、ベース部の平面
度に沿って検査対象を固定できる。
(3) Since there is no deformation due to vacuum suction, the inspection object can be fixed along the flatness of the base part.

(4)ベース部を高反射面とするか、高反射面を有する
シートを敷けば、透明材料表面に低反射(例えば黒色)
部のパターンを有する検査対象を反射光で検出できる。
(4) If the base part has a highly reflective surface or a sheet with a highly reflective surface is laid, the surface of the transparent material will have low reflection (for example, black color).
It is possible to detect an object to be inspected having a pattern of parts using reflected light.

(5)ベース部を低反射面とするか、低反射面を有する
シートを敷けば、透明材料表面に高反射(たとえば金属
蒸着)部のパターンを有する検査対象を反射光で検出で
きる。
(5) By making the base part a low-reflection surface or by laying a sheet with a low-reflection surface, an object to be inspected having a pattern of highly reflective (for example, metal vapor deposited) parts on the surface of the transparent material can be detected by reflected light.

(6)ベース部に検査対象の厚さに応じたシートを敷く
ことによって、常にパターン面を同一高さにすることが
できるので、厚さの異なる対象に対しても特別な調整機
構が不要となる。
(6) By placing a sheet on the base that corresponds to the thickness of the object to be inspected, the pattern surface can always be kept at the same height, so no special adjustment mechanism is required even for objects of different thickness. Become.

〔発明の効果〕〔Effect of the invention〕

本発明は、透明光を検出する場合でも平面度を保って精
度良く検査対象を固定することのできるパターン検出装
置を提供可能とするもので、産業上の効果の大なるもの
である。
INDUSTRIAL APPLICATION This invention makes it possible to provide a pattern detection device that can maintain flatness and accurately fix an inspection target even when detecting transparent light, and has great industrial effects.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明のパターン検出装置の一実施例の固定装
置の説明図、第2図、第3図及び第4図は同じくそれぞ
れ異なる実施例の固定装置の説明図、第5図は本発明の
パターン検出装置の一実施例の概念を示す説明図、第6
図は従来のパターン検出装置の固定装置の説明図である
6 2・・・検査対象、4・・・吸引装置、5・・・固定装
置、6・・・検出光学系、7・・・照明光学系、8・・
・駆!l!IJ機構、12・・・ベース板、13・・・
透明可撓膜、14・・・フレーム部。 代理人 弁理士 長崎博男81..:、、、、:、e”
ly−+− (ほか1名) 芋 1 月 4・・・ 唄ダ1表! 14・・・  ツム−AH # 3 口 芽4 目
FIG. 1 is an explanatory diagram of a fixing device of an embodiment of the pattern detection device of the present invention, FIGS. 2, 3, and 4 are explanatory diagrams of fixing devices of different embodiments, and FIG. Explanatory diagram showing the concept of one embodiment of the pattern detection device of the invention, No. 6
The figure is an explanatory diagram of a fixing device of a conventional pattern detection device. Optical system, 8...
・Kaku! l! IJ mechanism, 12... base plate, 13...
Transparent flexible film, 14...frame part. Agent: Patent attorney Hiroo Nagasaki 81. .. :、、、:、e"
ly-+- (1 other person) Potato January 4th... Uta 1 table! 14... Tsum-AH #3 Mouth bud 4 eyes

Claims (1)

【特許請求の範囲】 1、負圧で吸引して固定装置に平面度を保つて取付けら
れる検査対象のパターンを光学的方法によつて検出する
パターン検出装置において、前記固定装置が、前記検査
対象を保持するベース部材と、該ベース部材上の前記検
査対象を覆う透明可撓膜と、該ベース部材の周囲をとり
まいて設けられ該ベース部材及び前記透明可撓膜が気密
に取付けられ負圧吸引用の流路を形成するフレーム部材
とからなつていることを特徴とするパターン検出装置。 2、前記ベース部材が、透明材である特許請求の範囲第
1項記載のパターン検出装置。 3、前記ベース部材の前記検査対象を保持する表面が、
高反射率を有している特許請求の範囲第1項記載のパタ
ーン検出装置。 4、前記ベース部材の前記検査対象を保持する表面が、
低反射率を有している特許請求の範囲第1項記載のパタ
ーン検出装置。 5、前記ベース部材が、その表面に前記検査対象の表面
の高さを一定にするため挿入するシートを有している特
許請求の範囲第1項記載のパターン検出装置。
[Scope of Claims] 1. In a pattern detection device that uses an optical method to detect a pattern of an inspection target that is attached to a fixing device while maintaining flatness by suctioning with negative pressure, the fixing device a base member that holds a base member, a transparent flexible film that covers the test object on the base member, and a transparent flexible film that surrounds the base member, and that the base member and the transparent flexible film are airtightly attached to each other, and that the base member and the transparent flexible film are attached to each other in a negative pressure state. 1. A pattern detection device comprising a frame member forming a suction channel. 2. The pattern detection device according to claim 1, wherein the base member is made of a transparent material. 3. The surface of the base member that holds the inspection object,
The pattern detection device according to claim 1, which has a high reflectance. 4. The surface of the base member that holds the inspection object,
The pattern detection device according to claim 1, which has a low reflectance. 5. The pattern detection device according to claim 1, wherein the base member has a sheet inserted on its surface to make the height of the surface of the object to be inspected constant.
JP1663086A 1986-01-28 1986-01-28 Pattern detector Pending JPS62174608A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1663086A JPS62174608A (en) 1986-01-28 1986-01-28 Pattern detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1663086A JPS62174608A (en) 1986-01-28 1986-01-28 Pattern detector

Publications (1)

Publication Number Publication Date
JPS62174608A true JPS62174608A (en) 1987-07-31

Family

ID=11921682

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1663086A Pending JPS62174608A (en) 1986-01-28 1986-01-28 Pattern detector

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2338026A1 (en) * 2008-09-30 2011-06-29 Airbus Operations GmbH Method for measuring and/or testing waviness of a planar textile
CN102879180A (en) * 2011-07-14 2013-01-16 致茂电子股份有限公司 Measuring device for light emitting diode
JP2013024584A (en) * 2011-07-15 2013-02-04 Topcon Corp Inspection apparatus
JP2013024860A (en) * 2011-07-14 2013-02-04 Chroma Ate Inc Test device for led
WO2018014720A1 (en) * 2016-07-22 2018-01-25 大连理工大学 Method and device for measuring surface shape of honeycomb core

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2338026A1 (en) * 2008-09-30 2011-06-29 Airbus Operations GmbH Method for measuring and/or testing waviness of a planar textile
CN102879180A (en) * 2011-07-14 2013-01-16 致茂电子股份有限公司 Measuring device for light emitting diode
JP2013024860A (en) * 2011-07-14 2013-02-04 Chroma Ate Inc Test device for led
JP2013024584A (en) * 2011-07-15 2013-02-04 Topcon Corp Inspection apparatus
WO2018014720A1 (en) * 2016-07-22 2018-01-25 大连理工大学 Method and device for measuring surface shape of honeycomb core
US10852129B2 (en) 2016-07-22 2020-12-01 Dalian University Of Technology Method and device for measuring surface shape of honeycomb core

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