JPS62167176U - - Google Patents

Info

Publication number
JPS62167176U
JPS62167176U JP5569186U JP5569186U JPS62167176U JP S62167176 U JPS62167176 U JP S62167176U JP 5569186 U JP5569186 U JP 5569186U JP 5569186 U JP5569186 U JP 5569186U JP S62167176 U JPS62167176 U JP S62167176U
Authority
JP
Japan
Prior art keywords
tab
electrode
printed circuit
circuit board
smaller
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5569186U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0518708Y2 (fr
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1986055691U priority Critical patent/JPH0518708Y2/ja
Publication of JPS62167176U publication Critical patent/JPS62167176U/ja
Application granted granted Critical
Publication of JPH0518708Y2 publication Critical patent/JPH0518708Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1986055691U 1986-04-14 1986-04-14 Expired - Lifetime JPH0518708Y2 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1986055691U JPH0518708Y2 (fr) 1986-04-14 1986-04-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1986055691U JPH0518708Y2 (fr) 1986-04-14 1986-04-14

Publications (2)

Publication Number Publication Date
JPS62167176U true JPS62167176U (fr) 1987-10-23
JPH0518708Y2 JPH0518708Y2 (fr) 1993-05-18

Family

ID=30883824

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1986055691U Expired - Lifetime JPH0518708Y2 (fr) 1986-04-14 1986-04-14

Country Status (1)

Country Link
JP (1) JPH0518708Y2 (fr)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01161170A (ja) * 1987-12-18 1989-06-23 Japan Synthetic Rubber Co Ltd 集積回路部品の試験装置
JPH02156168A (ja) * 1988-12-07 1990-06-15 Nec Corp 選別装置
JPH02148483U (fr) * 1989-05-19 1990-12-17
JPH07113840A (ja) * 1993-09-21 1995-05-02 Micron Technol Inc 半導体ダイの試験に使用される交換可能な基板を備えたキャリア

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS601574A (ja) * 1983-06-20 1985-01-07 Ibiden Co Ltd プリント配線板検査用治具回路板

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS601574A (ja) * 1983-06-20 1985-01-07 Ibiden Co Ltd プリント配線板検査用治具回路板

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01161170A (ja) * 1987-12-18 1989-06-23 Japan Synthetic Rubber Co Ltd 集積回路部品の試験装置
JPH02156168A (ja) * 1988-12-07 1990-06-15 Nec Corp 選別装置
JPH02148483U (fr) * 1989-05-19 1990-12-17
JPH07113840A (ja) * 1993-09-21 1995-05-02 Micron Technol Inc 半導体ダイの試験に使用される交換可能な基板を備えたキャリア

Also Published As

Publication number Publication date
JPH0518708Y2 (fr) 1993-05-18

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