JPS62166505U - - Google Patents
Info
- Publication number
- JPS62166505U JPS62166505U JP5205986U JP5205986U JPS62166505U JP S62166505 U JPS62166505 U JP S62166505U JP 5205986 U JP5205986 U JP 5205986U JP 5205986 U JP5205986 U JP 5205986U JP S62166505 U JPS62166505 U JP S62166505U
- Authority
- JP
- Japan
- Prior art keywords
- optical system
- objective lens
- position detector
- positioning device
- eyepiece
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Control Of Position Or Direction (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5205986U JPS62166505U (enExample) | 1986-04-09 | 1986-04-09 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5205986U JPS62166505U (enExample) | 1986-04-09 | 1986-04-09 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS62166505U true JPS62166505U (enExample) | 1987-10-22 |
Family
ID=30876889
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5205986U Pending JPS62166505U (enExample) | 1986-04-09 | 1986-04-09 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62166505U (enExample) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57167651A (en) * | 1981-04-07 | 1982-10-15 | Mitsubishi Electric Corp | Inspecting device for surface of semiconductor wafer |
-
1986
- 1986-04-09 JP JP5205986U patent/JPS62166505U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57167651A (en) * | 1981-04-07 | 1982-10-15 | Mitsubishi Electric Corp | Inspecting device for surface of semiconductor wafer |