JPS6216458U - - Google Patents
Info
- Publication number
- JPS6216458U JPS6216458U JP10729685U JP10729685U JPS6216458U JP S6216458 U JPS6216458 U JP S6216458U JP 10729685 U JP10729685 U JP 10729685U JP 10729685 U JP10729685 U JP 10729685U JP S6216458 U JPS6216458 U JP S6216458U
- Authority
- JP
- Japan
- Prior art keywords
- inductively coupled
- coupled plasma
- emission spectrometer
- sample
- frequency inductively
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000007853 buffer solution Substances 0.000 claims description 3
- 239000013522 chelant Substances 0.000 claims description 2
- 238000002347 injection Methods 0.000 claims description 2
- 239000007924 injection Substances 0.000 claims description 2
- 238000000034 method Methods 0.000 claims description 2
- 239000008213 purified water Substances 0.000 claims description 2
- 239000011347 resin Substances 0.000 claims description 2
- 229920005989 resin Polymers 0.000 claims description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 2
- 238000009616 inductively coupled plasma Methods 0.000 claims 5
- 238000004458 analytical method Methods 0.000 claims 2
- 230000003287 optical effect Effects 0.000 claims 2
- 239000002253 acid Substances 0.000 claims 1
- 238000004140 cleaning Methods 0.000 claims 1
- 238000005070 sampling Methods 0.000 claims 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 4
- 239000000523 sample Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000010828 elution Methods 0.000 description 1
- 238000005375 photometry Methods 0.000 description 1
- 239000012488 sample solution Substances 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
Landscapes
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Description
第１図は本考案の一実施例について、その概略
構成を示す系統図である。第２図は同じく他の一
実施例である。第３図は本考案の説明用工程図で
ある。
１……試料注入部、２……緩衝溶液、３……定
流量ポンプ、４……定流量ポンプ、５……キレー
ト樹脂カラム、６……噴霧器、７……プラズマ炎
、８……高周波発生部および測光部、９……制御
器、１０……塩酸、１１……試料検出器、１２…
…試料自動採取部、１３……定流量ポンプ、Ａ…
…試料溶液、Ｂ……塩酸、Ｃ……緩衝溶液（また
は精製水）、Ｄ……イオン吸着（濃縮）、Ｅ……
溶出、Ｆ……洗浄、Ｔ……時間。
FIG. 1 is a system diagram showing a schematic configuration of an embodiment of the present invention. FIG. 2 similarly shows another embodiment. FIG. 3 is an explanatory process diagram of the present invention. 1... Sample injection part, 2... Buffer solution, 3... Constant flow pump, 4... Constant flow pump, 5... Chelate resin column, 6... Sprayer, 7... Plasma flame, 8... High frequency generation part and photometry part, 9...controller, 10...hydrochloric acid, 11...sample detector, 12...
...Automatic sample collection section, 13...Constant flow pump, A...
...sample solution, B...hydrochloric acid, C...buffer solution (or purified water), D...ion adsorption (concentration), E...
Elution, F...washing, T...time.
Claims (1)
部を有する高周波誘導結合プラズマ発光分光分析
装置において、試料採取部から噴霧器へ分析目的
試料が移動する過程の途中にキレート樹脂カラム
を具備することを特徴とする高周波誘導結合プラ
ズマ発光分光分析装置。 (2) 上記(1)の装置において、緩衝溶液または精
製水がカラムに連続的に流入することを特徴とす
る高周波誘導結合プラズマ発光分光分析装置。 (3) 上記(1)の装置において、分析目的試料の採
取部が一定量の試料を一時的に滞在させるロート
状貯槽であることを特徴とする高周波誘導結合プ
ラズマ発光分光分析装置。 (4) 上記(1)の装置において試料採取部がオート
サンプラーやフラクシヨンコレクターに接続され
、試料の採取とカラムへの酸の注入およびカラム
の洗浄の諸工程を自動的に行う機能を有すること
を特徴とする高周波誘導結合プラズマ発光分光分
析装置。[Scope of Claim for Utility Model Registration] (1) In a high-frequency inductively coupled plasma emission spectrometer having a sample collection section that uses the suction force of a constant flow pump, during the process in which the sample for analysis is transferred from the sample collection section to the atomizer. A high frequency inductively coupled plasma emission spectrometer, characterized in that it is equipped with a chelate resin column. (2) A high-frequency inductively coupled plasma optical emission spectrometer in the apparatus of (1) above, characterized in that a buffer solution or purified water continuously flows into the column. (3) A high-frequency inductively coupled plasma optical emission spectrometer in the apparatus of (1) above, characterized in that the sampling part for the sample for analysis is a funnel-shaped storage tank in which a certain amount of the sample temporarily stays. (4) In the device described in (1) above, the sample collection section is connected to an autosampler or a fraction collector, and has the function of automatically performing various steps such as sample collection, injection of acid into the column, and column cleaning. A high-frequency inductively coupled plasma emission spectrometer featuring:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10729685U JPS6216458U (en) | 1985-07-12 | 1985-07-12 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10729685U JPS6216458U (en) | 1985-07-12 | 1985-07-12 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6216458U true JPS6216458U (en) | 1987-01-31 |
Family
ID=30983447
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10729685U Pending JPS6216458U (en) | 1985-07-12 | 1985-07-12 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6216458U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016223836A (en) * | 2015-05-28 | 2016-12-28 | 王子ホールディングス株式会社 | Analysis method for metal in high-salinity sample |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57184966A (en) * | 1981-05-09 | 1982-11-13 | Hitachi Ltd | Analyzer for alkali earth metal contained in liquid |
| JPS60108732A (en) * | 1983-10-21 | 1985-06-14 | ザ ダウ ケミカル カンパニ− | Method of continuously measuring concentration of various trace element in liquid stream containing whole highly dissolved solid matter |
-
1985
- 1985-07-12 JP JP10729685U patent/JPS6216458U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57184966A (en) * | 1981-05-09 | 1982-11-13 | Hitachi Ltd | Analyzer for alkali earth metal contained in liquid |
| JPS60108732A (en) * | 1983-10-21 | 1985-06-14 | ザ ダウ ケミカル カンパニ− | Method of continuously measuring concentration of various trace element in liquid stream containing whole highly dissolved solid matter |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016223836A (en) * | 2015-05-28 | 2016-12-28 | 王子ホールディングス株式会社 | Analysis method for metal in high-salinity sample |
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