JPS62158363U - - Google Patents

Info

Publication number
JPS62158363U
JPS62158363U JP4643286U JP4643286U JPS62158363U JP S62158363 U JPS62158363 U JP S62158363U JP 4643286 U JP4643286 U JP 4643286U JP 4643286 U JP4643286 U JP 4643286U JP S62158363 U JPS62158363 U JP S62158363U
Authority
JP
Japan
Prior art keywords
plate according
inspection plate
reflection surface
diffused reflection
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4643286U
Other languages
Japanese (ja)
Other versions
JPH0515099Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4643286U priority Critical patent/JPH0515099Y2/ja
Publication of JPS62158363U publication Critical patent/JPS62158363U/ja
Application granted granted Critical
Publication of JPH0515099Y2 publication Critical patent/JPH0515099Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、本考案の検査用プレートの一例を示
す平面図、第2図は第1図の―線における断
面図、第3図および第4図はそれぞれ本考案の他
の実施例のウエル断面図、第5図〜第10図は、
それぞれ本考案の他の実施例のウエル平面図であ
る。 1……プレート本体、2……ウエル、22……
乱反射面、23……底面。
FIG. 1 is a plan view showing an example of the test plate of the present invention, FIG. 2 is a sectional view taken along the line - in FIG. 1, and FIGS. 3 and 4 are wells of other embodiments of the present invention. The sectional views, FIGS. 5 to 10, are
FIGS. 3A and 3B are well plan views of other embodiments of the present invention, respectively; FIGS. 1... Plate body, 2... Well, 22...
Diffuse reflection surface, 23...bottom surface.

Claims (1)

【実用新案登録請求の範囲】 1 プレート本体の上面に、内壁の少なくとも一
部に乱反射面が形成されたウエルを有する検査用
プレート。 2 前記プレート本体は合成樹脂製である実用新
案登録請求の範囲第1項に記載の検査用プレート
。 3 前記プレート本体はガラス製である実用新案
登録請求の範囲第1項に記載の検査用プレート。 4 前記乱反射面は、底面を除く内壁に形成され
ている実用新案登録請求の範囲第2項に記載の検
査用プレート。 5 前記乱反射面は物理的処理方法により形成さ
れる実用新案登録請求の範囲第1項に記載の検査
用プレート。 6 前記乱反射面は化学的処理方法により形成さ
れる実用新案登録請求の範囲第1項に記載の検査
用プレート。
[Claims for Utility Model Registration] 1. An inspection plate having, on the upper surface of the plate body, a well in which a diffused reflection surface is formed on at least a portion of the inner wall. 2. The inspection plate according to claim 1, wherein the plate main body is made of synthetic resin. 3. The inspection plate according to claim 1, wherein the plate main body is made of glass. 4. The inspection plate according to claim 2, wherein the diffused reflection surface is formed on the inner wall excluding the bottom surface. 5. The inspection plate according to claim 1, wherein the diffused reflection surface is formed by a physical processing method. 6. The inspection plate according to claim 1, wherein the diffused reflection surface is formed by a chemical treatment method.
JP4643286U 1986-03-28 1986-03-28 Expired - Lifetime JPH0515099Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4643286U JPH0515099Y2 (en) 1986-03-28 1986-03-28

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4643286U JPH0515099Y2 (en) 1986-03-28 1986-03-28

Publications (2)

Publication Number Publication Date
JPS62158363U true JPS62158363U (en) 1987-10-07
JPH0515099Y2 JPH0515099Y2 (en) 1993-04-21

Family

ID=30866089

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4643286U Expired - Lifetime JPH0515099Y2 (en) 1986-03-28 1986-03-28

Country Status (1)

Country Link
JP (1) JPH0515099Y2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003507736A (en) * 1999-08-20 2003-02-25 スティフチュンク フュル ディアグノスティシュ フォルシュンク Method for measuring substances using the evanescence field method
JP2008530567A (en) * 2005-06-23 2008-08-07 エス アール ユー バイオシステムズ,インコーポレイテッド Biosensor substrate structure to reduce optical interference effects

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003507736A (en) * 1999-08-20 2003-02-25 スティフチュンク フュル ディアグノスティシュ フォルシュンク Method for measuring substances using the evanescence field method
JP2008530567A (en) * 2005-06-23 2008-08-07 エス アール ユー バイオシステムズ,インコーポレイテッド Biosensor substrate structure to reduce optical interference effects

Also Published As

Publication number Publication date
JPH0515099Y2 (en) 1993-04-21

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