JPH0193549U - - Google Patents

Info

Publication number
JPH0193549U
JPH0193549U JP19104887U JP19104887U JPH0193549U JP H0193549 U JPH0193549 U JP H0193549U JP 19104887 U JP19104887 U JP 19104887U JP 19104887 U JP19104887 U JP 19104887U JP H0193549 U JPH0193549 U JP H0193549U
Authority
JP
Japan
Prior art keywords
tube
semiconductor devices
inspection
appearance
inspecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19104887U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP19104887U priority Critical patent/JPH0193549U/ja
Publication of JPH0193549U publication Critical patent/JPH0193549U/ja
Pending legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案の一実施例による半導体装置
の外観検査用チユーブを示す斜視図、第2図は従
来の半導体装置の外観検査用チユーブを示す斜視
図である。 図において、2は外観検査用チユーブ、3は不
良品、4はふた、5は溝を示す。なお、図中、同
一符号は同一、又は相当部分を示す。
FIG. 1 is a perspective view showing a tube for appearance inspection of a semiconductor device according to an embodiment of the present invention, and FIG. 2 is a perspective view showing a conventional tube for appearance inspection of a semiconductor device. In the figure, 2 is a tube for visual inspection, 3 is a defective product, 4 is a lid, and 5 is a groove. In addition, in the figures, the same reference numerals indicate the same or equivalent parts.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 半導体装置の外観を検査し選別する工程におい
て半導体装置を収納する透明の外観検査用チユー
ブのチユーブ上面にチユーブの長手方向に沿つて
摺動可能な分割された板状のふたを複数個備えた
ことを特徴とする半導体装置の外観検査用チユー
ブ。
In the process of inspecting and sorting the appearance of semiconductor devices, a transparent appearance inspection tube for storing semiconductor devices is provided with a plurality of divided plate-shaped lids that are slidable along the longitudinal direction of the tube on the top surface of the tube. A tube for external inspection of semiconductor devices characterized by:
JP19104887U 1987-12-15 1987-12-15 Pending JPH0193549U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19104887U JPH0193549U (en) 1987-12-15 1987-12-15

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19104887U JPH0193549U (en) 1987-12-15 1987-12-15

Publications (1)

Publication Number Publication Date
JPH0193549U true JPH0193549U (en) 1989-06-20

Family

ID=31481976

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19104887U Pending JPH0193549U (en) 1987-12-15 1987-12-15

Country Status (1)

Country Link
JP (1) JPH0193549U (en)

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