JPS62154434A - Evaluation device for discharge controlling resistor of electron gun - Google Patents

Evaluation device for discharge controlling resistor of electron gun

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Publication number
JPS62154434A
JPS62154434A JP29535885A JP29535885A JPS62154434A JP S62154434 A JPS62154434 A JP S62154434A JP 29535885 A JP29535885 A JP 29535885A JP 29535885 A JP29535885 A JP 29535885A JP S62154434 A JPS62154434 A JP S62154434A
Authority
JP
Japan
Prior art keywords
electron gun
chamber
getter
knocking
evaluation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP29535885A
Other languages
Japanese (ja)
Inventor
Hiroshi Ozaki
小崎 宏
Hiromichi Taguchi
田口 博通
Yasuo Tsuchiya
土谷 康夫
Hiroyuki Goto
後藤 弘幸
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP29535885A priority Critical patent/JPS62154434A/en
Publication of JPS62154434A publication Critical patent/JPS62154434A/en
Pending legal-status Critical Current

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  • Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)

Abstract

PURPOSE:To aim at simplification in evaluation work and retrenchment in material expenses, by installing an electron gun chamber where an electron gun having a discharge control resistor is housed and set up, performing exhaust and knocking, and performing characteristic measurement for the electron gun. CONSTITUTION:In this device, there are provided with an electron gun chamber 11 which sets up an electron gun 1 having discharge controlling resistors R1 and R2 inside, and a getter chamber 12 which sets up a getter material inside and is capable of performing its getting work, and also an interconnecting fine tube 13 forming the required ventilation resistance is installed between both chambers, and in this electron gun chamber 1, for example, at both ends of this chamber, there are provided with terminal leading-out parts 21 and 22 required for knocking handling and characteristic evaluation of the electron gun 1 housed in this chamber 11. And, each inside of both these chambers 11 and 12 is exhausted by a vacuum pump, performing its gethering work with the getter material, and these chambers are yet more turned to high vacuum. Under this state, high voltage of two times or so is impressed on the specified part of the electron gun 1 and knocking handling takes place. Each fixed voltage is impressed and, for example, a cathode current Ik characteristic is measured.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はテレビジョン受像管、そのほかの各種電子管に
用いる電子銃の、放電制御抵抗体における残留ガスにつ
いての良否を評価するに用いて好適な電子銃の放電制御
抵抗体の評価装置に関する。
[Detailed Description of the Invention] [Industrial Application Field] The present invention is suitable for use in evaluating the quality of residual gas in discharge control resistors of electron guns used in television picture tubes and other various electron tubes. The present invention relates to an evaluation device for a discharge control resistor of an electron gun.

〔発明の概要〕[Summary of the invention]

本発明は、最終的に構成する陰極線管とは別に、放電制
御抵抗体を有する電子銃を収容配置する電子銃室を設け
てここにおいて、排気及びノッキングを行い電子銃の特
性測定を行うことによって放電制御抵抗体の評価を行う
ことができるようにし、評価作業の簡単化と、材料経費
の節減をはかる。
The present invention provides an electron gun chamber in which an electron gun having a discharge control resistor is housed, separate from the final cathode ray tube, and performs exhaust and knocking in this chamber to measure the characteristics of the electron gun. To enable evaluation of discharge control resistors, simplify evaluation work, and reduce material costs.

〔従来の技術〕[Conventional technology]

陰極線管の電子銃においては、電極間、或いは電極と他
部との間において放電が生じ、この時流れる大電流によ
ってこれに付随する回路部品等に破損を生じさせるなど
の不都合を回避するために、例えば特開昭55−860
55号(特願昭53−157129号)等にもその開示
があるように、電子銃に大電流が流れることを抑制する
放電制御抵抗体を接続することが行われる。例えば第4
図に示すように、陰極線管の電子銃(1)は、陰極線管
管体(2)のネック部(3)内に収容され、カソードに
と、例えば第1〜第5グリツドG1〜G5が順次配列さ
れて成る。この場合、第3〜第5グリツドG3〜G5に
よってユニポテンシャル型の主電子レンズが構成される
ものであり、第3及び第5グリツドには高電圧HV、す
なわち陽極電圧が与えられる。第3及び第5グリツドG
3及びG5への給電は、例えば管体(11のファンネル
部(4)の内面に塗布され、高電圧+1Vが印加された
カーボン塗膜等より成る内部導電膜(5)に、第5グリ
ツドG5にとりつけた弾性金属リード片(6)の遊端を
弾性的に接触させ、第5グリツドG5及び第3グリッド
G3間を抵抗体R1を通じて接続することによって行う
。そして、他の電極K。
In the electron gun of a cathode ray tube, discharge occurs between the electrodes or between the electrodes and other parts, and in order to avoid problems such as damage to associated circuit parts etc. due to the large current flowing at this time, , for example, JP-A-55-860
As disclosed in Japanese Patent Application No. 53-157129, etc., a discharge control resistor is connected to the electron gun to suppress the flow of a large current. For example, the fourth
As shown in the figure, the electron gun (1) of the cathode ray tube is housed in the neck (3) of the cathode ray tube body (2), and the cathode is connected to the cathode and the first to fifth grids G1 to G5 are sequentially connected to each other. It consists of an array. In this case, the third to fifth grids G3 to G5 constitute a unipotential main electron lens, and a high voltage HV, that is, an anode voltage, is applied to the third and fifth grids. 3rd and 5th grid G
Power is supplied to the fifth grid G5 through an internal conductive film (5) made of a carbon film or the like applied to the inner surface of the funnel part (4) of the tube body (11) and to which a high voltage of +1V is applied. This is done by bringing the free ends of the elastic metal lead pieces (6) attached to the electrodes into elastic contact and connecting the fifth grid G5 and the third grid G3 through the resistor R1.Then, the other electrode K.

G1.G2及びG3に関しては、ネック部(3)の端部
に封着したステム(7)に貫通配設した対応する端子ピ
ン(8)に夫々導線によって連結し、各端子ピン(8)
から給電を行うようになされているが、低電圧の印加さ
れる特にフォーカス電極、すなわち第4グリツドG4と
、これに対応する端子ピン(8)との接続を抵抗R2を
介して行う。これら抵抗R1及びR2には、通常の状態
では電流が流れないものであり、特性上何らの影響がな
いが、放電による電流が流れようとするときは、これが
電流抑制の効果を生じる。このようにしてこれら抵抗R
1及びR2が放電制御の効果を奏し、陰極線管の動作時
に、不都合な放電電流によって、再生画像に大きな乱れ
を生じたり部品破損等の発生を回避するようにしている
G1. Regarding G2 and G3, each terminal pin (8) is connected by a conductive wire to a corresponding terminal pin (8) which is disposed through a stem (7) sealed to the end of the neck part (3).
In particular, the focus electrode to which a low voltage is applied, that is, the fourth grid G4, and the corresponding terminal pin (8) are connected via a resistor R2. Under normal conditions, no current flows through these resistors R1 and R2, and there is no effect on their characteristics; however, when a current due to discharge attempts to flow, this produces a current suppression effect. In this way these resistances R
1 and R2 have the effect of controlling the discharge, thereby avoiding large disturbances in reproduced images and damage to parts due to undesirable discharge current during operation of the cathode ray tube.

これら放電制御抵抗体R1及びR2としては、例えばセ
ラミック抵抗体が用いられる。このセラミック抵抗体と
は、カーボンを含む円柱状のセラミック材の成型体を酸
素雰囲気中で焼成し、表面においては、カーボンを炭酸
ガスCO2として消失させて高抵抗化して絶縁表皮を形
成し、内部においてはカーボンが残存することによって
所要の比抵抗を有する抵抗体として動作させるという構
造を採るものである。ところが、例えばこのセラミック
抵抗体より成る放電制御抵抗体を管体内に配置する場合
、ときとして完成された電子管においてこの抵抗体内部
から残留CO2ガスが放出し、これがカソードの熱電子
放出能を低下させる。このように電子銃が封入された完
成管において抵抗体の不都合によって電子管に不良品が
生じることは、著しく労力、材料費等の損失を招来する
For example, ceramic resistors are used as these discharge control resistors R1 and R2. This ceramic resistor is made by firing a cylindrical molded ceramic material containing carbon in an oxygen atmosphere.On the surface, the carbon disappears as carbon dioxide gas CO2, increasing the resistance and forming an insulating skin. The structure employs a structure in which carbon remains to operate as a resistor having a required specific resistance. However, when a discharge control resistor made of a ceramic resistor is placed inside the tube, residual CO2 gas is sometimes released from inside the resistor in the completed electron tube, which reduces the thermionic emission ability of the cathode. . In this way, in a completed tube in which an electron gun is enclosed, the occurrence of defective electron tubes due to defects in the resistor causes significant losses in labor, material costs, and the like.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

本発明は、完成管におけるとほぼ同等の条件下で放電制
御抵抗体の評価を行うことができる電子銃の放電制御抵
抗体の評価装置を提供し、上述したカソードの熱電子放
出能の低下等による電子管の不良品の発生率の低下をは
かる。
The present invention provides an evaluation device for a discharge control resistor of an electron gun, which is capable of evaluating a discharge control resistor under substantially the same conditions as in a finished tube, and the reduction in the thermionic emission ability of the cathode described above. aims to reduce the incidence of defective electron tubes.

〔問題点を解決するための手段〕[Means for solving problems]

本発明は第1図に示すように、放電制御抵抗体R1,R
2を有する電子銃(1)を内部に配置する電子銃室(1
1)と、ゲッタ材を内部に配置し、その飛唾作業を行う
ことのできるゲッタ室(12)とを設け、両室(11)
及び(12)間にこれら室(11)及び(12)間を所
要の通気コンダクタンスを有する、云い換えれば所要の
通気抵抗を形成する連通細管(13)を設ける。
As shown in FIG. 1, the present invention includes discharge control resistors R1, R
an electron gun chamber (1) in which an electron gun (1) having a
1) and a getter chamber (12) in which getter material is placed and the spitting work can be performed, and both chambers (11) are provided.
A communicating thin tube (13) is provided between the chambers (11) and (12) to have the required ventilation conductance, or in other words, to form the required ventilation resistance.

そして、電子銃室(11)には、例えばその両端部に、
この室(11)に収容した電子銃(11の、ノッキング
処理及び特性評価に必要な端子導出部(21)及び(2
2)を設ける。
In the electron gun chamber (11), for example, at both ends thereof,
The terminal lead-out portion (21) and (2) necessary for knocking treatment and characteristic evaluation of the electron gun (11) housed in this chamber (11)
2) will be provided.

そして、両室(11)及び(12)内を真空ポンプによ
って排気し、気密的に封止して室(11)及び(12)
内を高真空度に保持すると共にゲッタ室(12)内のゲ
ッタ材を飛唾して更に高真空度とする。この状態で、電
子銃(1)の所定部に対して端子導出部(21)及び(
22)を通じて最終的に電子銃(11が用いられる電子
管における動作時の高電圧HVの2倍程度の高電圧を印
加して例えば電子銃(11の各電極が存在する「ぼりコ
などのWI後の完成管における放電原因や不安定動作の
原因を排除するためのノッキング処理を行う。(23)
はその高電圧源を示す、そして、同様に端子導出部(2
1)及び(22)を通じて電子銃Tl)の各電極に所要
の電圧例えば同様に最終的に構成する電子管の動作時に
おける各固定電圧を印加して、例えばカソード電流Iに
特性を測定する。
Then, the insides of both chambers (11) and (12) are evacuated using a vacuum pump, and the chambers (11) and (12) are sealed airtight.
The inside of the getter chamber (12) is maintained at a high degree of vacuum, and the getter material in the getter chamber (12) is sputtered to further increase the degree of vacuum. In this state, the terminal lead-out portion (21) and (
22), a high voltage that is approximately twice as high as the high voltage HV during operation in the electron tube in which the electron gun (11 is used) is finally applied, for example, after WI such as a "boriko" in which each electrode of the electron gun (11) is present. Perform knocking treatment to eliminate causes of discharge and unstable operation in completed tubes. (23)
indicates the high voltage source, and similarly the terminal lead-out part (2
Through steps 1) and (22), a required voltage, for example, each fixed voltage during operation of the electron tube to be finally constructed, is applied to each electrode of the electron gun Tl), and the characteristics of, for example, the cathode current I are measured.

〔作用〕[Effect]

上述の本発明装置による放電制御抵抗体の評価は、上述
したように電子銃(1)の例えばカソード電流1にの特
性を測定することによって行い得る。
Evaluation of the discharge control resistor using the above-described apparatus of the present invention can be performed by measuring the characteristics of the electron gun (1), for example, the cathode current 1, as described above.

この時、放電制御抵抗体R1及びR2が良品である場合
は、その特性は第2図に示すように、ノ・ノキング電圧
の印加と共に、カソード電流IKは急峻な立上りを示す
が、抵抗体R1またはR2が、残留ガスが存在する不良
品である場合は、抵抗体R1またはR2から放出される
ガスによるカソード材へのイオンボンバードによってそ
の電子放出が阻害されることによって、第3図に示すよ
うに、その立ち上りの急峻性と直線性が悪化するので、
カソード電流1にの特性によって抵抗体R1及びR2を
評価することができる。
At this time, if the discharge control resistors R1 and R2 are of good quality, the cathode current IK shows a steep rise as the knocking voltage is applied, as shown in FIG. Alternatively, if R2 is a defective product with residual gas, the electron emission is inhibited by ion bombardment of the cathode material by the gas released from resistor R1 or R2, as shown in FIG. In addition, the steepness and linearity of the rise deteriorate, so
The resistors R1 and R2 can be evaluated based on the characteristics of the cathode current 1.

そして、本発明装置によれば、ゲ・ンタリング及びノッ
キング処理を行って後、特性評価をなすので、電子銃(
1)を殆んど実際の電子管として組込んだと同等の条件
下で測定することができる。そして、また、このように
ゲッタリングを行うにもかかわらず、これを電子銃室(
11)と別室のすなわち所要のコンダクタンスをもって
連通したゲッタ室(12)で行うようにしたので、ゲッ
タ材が抵抗体或いは電子銃(1)に不必要に付着して特
性劣化等を来すことが有効に回避される。
According to the device of the present invention, the characteristics are evaluated after the gentering and knocking processes are performed, so the electron gun (
1) can be measured under almost the same conditions as when installed as an actual electron tube. And, also, despite performing gettering in this way, this is the electron gun chamber (
11), that is, in a getter chamber (12) that communicates with the required conductance, there is no possibility that the getter material will unnecessarily adhere to the resistor or electron gun (1) and cause characteristic deterioration. effectively avoided.

尚、実際上、セラミック抵抗体における良否、すなわち
例えば残留ガスの有無は、一般にこの抵抗体の製造ロフ
ト毎で決る。つまり、成るロットでは殆んど全く生ずる
ことがなく、成るロットでは生じるという傾向を示す。
In practice, the quality of a ceramic resistor, ie, the presence or absence of residual gas, is generally determined by the manufacturing loft of the resistor. In other words, it shows a tendency that it almost never occurs in lots that are different, and that it occurs in lots that are different.

したがって、各ロット毎にいくつかの抵抗体を抽出して
その評価を行うことによって各ロットに関する抵抗体の
評価に置き換えて考えることができるので、実際は全て
の抵抗体に関して本発明装置による評価をする必要はな
く、ロフト毎にいくつか行えば良い。
Therefore, by extracting and evaluating several resistors for each lot, it is possible to replace the evaluation with the evaluation of the resistors for each lot, so in reality, all the resistors are evaluated by the device of the present invention. It's not necessary, just do a few for each loft.

〔実施例〕〔Example〕

第1図を参照して、更に本発明装置の一例を詳細に説明
する。
An example of the apparatus of the present invention will be further explained in detail with reference to FIG.

被測定の電子銃(1)は、例えば第4図で説明したと同
様にカソードに、第1〜第5グリツドG1〜G5を有し
、第3及び第5グリツドG3及びG5に放電制御抵抗体
R1が接続され、第4グリツドG4に放電制御抵抗体R
2が接続されて成る。
The electron gun (1) to be measured has first to fifth grids G1 to G5 on the cathode, for example, as explained in FIG. 4, and discharge control resistors are installed in the third and fifth grids G3 and G5. R1 is connected, and a discharge control resistor R is connected to the fourth grid G4.
2 are connected.

本発明装置の電子銃室(11)と、ゲッタ室(12)と
更にこれらを連通ずる連通細管(13)とは夫々ガラス
管によって構成して互いに溶着連通することによって構
成し得る。
The electron gun chamber (11), the getter chamber (12), and the communicating thin tube (13) communicating these in the apparatus of the present invention may each be constructed of glass tubes and may be constructed by welding and communicating with each other.

電子銃室(11)は、例えば一端(lla )に、例え
ば内径が611程度、長さが40菖−程度の所要の通気
コンダクタンスをもってゲッタ室(12)と連通させる
連通細管(13)が設けられる。
The electron gun chamber (11) is provided, for example, at one end (lla) with a communicating thin tube (13) having an inner diameter of about 611 mm and a length of about 40 mm and communicating with the getter chamber (12) with a required ventilation conductance. .

また、電子銃室(11)の両端(lla )及び(ll
b )には、夫々端子導出部(21)及び(22)が設
けられる。端子導出部(22)は最終的に得る電子管に
おける端子ピンと同様に例えばカソードK、第1゜第2
及び第4グリッドG1.G2及びG、の各端子、更に実
際にはカソードKを加熱するヒータ(図示せず)の各端
子ピン(14)がN3J!i配匿されて成る。また、他
方の端子導出部(21)は、第5グリツドG5に連結さ
れた弾性全屈リード片(6)と連結される端子ピン(1
5)が貫通されて成る。これら端子導出部(22)及び
(21)の各端子ピン(14)及び(15)は、夫々ス
テム(16)及び(17)に貫通配設して、これらステ
ム(16)及び(17)を電子銃室(11)の両端に封
着することによって構成し得る。そして、これらステム
(16)及び(17)の各中心部には、夫々排気ポンプ
に連通され排気後に封止されるチップオフ管(18)と
、前述の連通細管(13)とが貫通配置される。
Also, both ends (lla) and (ll) of the electron gun chamber (11) are
b) are provided with terminal lead-out portions (21) and (22), respectively. The terminal lead-out portion (22) is similar to the terminal pin in the electron tube that is finally obtained.
and fourth grid G1. Each terminal of G2 and G, and in fact each terminal pin (14) of a heater (not shown) that heats the cathode K, is N3J! It is made up of i-distributed information. Further, the other terminal lead-out portion (21) has a terminal pin (1) connected to the elastic fully bent lead piece (6) connected to the fifth grid G5.
5) is penetrated. The terminal pins (14) and (15) of these terminal lead-out parts (22) and (21) are provided through the stems (16) and (17), respectively, so that these stems (16) and (17) It can be constructed by sealing both ends of the electron gun chamber (11). In the center of each of these stems (16) and (17), a tip-off tube (18) that is communicated with the exhaust pump and sealed after exhausting, and the above-mentioned communication thin tube (13) are arranged to penetrate through the center of each of the stems (16) and (17). Ru.

また、ゲッタ室(12)内にはゲッタ材を有するゲッタ
コンテナ(19)が収容配設され、コンテナ(19)へ
の通電加熱、或いは高周波加熱によって、ゲッタリング
、すなわちゲッタ材の飛唾を行う。
Further, a getter container (19) containing a getter material is accommodated in the getter chamber (12), and gettering, that is, spitting of the getter material, is performed by heating the container (19) with electricity or by high-frequency heating. .

そして、電子ajc(11へのノッキングは、端子部(
21)及び(22)から通常におけると同様に第5及び
第3グリツドG5及びG3と、第4グリツドG4及び他
の電極との間に上述したように高圧印加をなすことによ
って行う。
Then, the knocking to the electronic ajc (11) occurs at the terminal part (
From 21) and (22), this is done by applying high voltage as described above between the fifth and third grids G5 and G3 and the fourth grid G4 and other electrodes in the same way as usual.

また、特性評価は、電子銃(11の各電極に各端子導出
部(22)及び(21)の各端子ビン(14)及び(1
5)の夫々に夫々所要の電圧を印加して第2図及び第3
図で説明したカソード電流IK特性を測定することによ
って行う。
In addition, the characteristic evaluation was performed on each terminal lead-out portion (22) and (21) of each terminal bin (14) and (1) of each electrode of the electron gun (11).
5) by applying the required voltage to each of Figures 2 and 3.
This is done by measuring the cathode current IK characteristics explained in the figure.

尚、上述した例では、電子銃+11が第1〜第5グリツ
ド01〜G5を有するユニポテンシャル主電子レンズ構
成の電子銃構成とした場合であるが、そのほか種々の構
成による電子銃+11における抵抗体評価に通用するこ
ともできる。
In the above example, the electron gun +11 has a unipotential main electron lens configuration having the first to fifth grids 01 to G5, but the resistor in the electron gun +11 has various other configurations. It can also be used for evaluation.

〔発明の効果〕〔Effect of the invention〕

上述の本発明によれば、最終的に電子銃が袋層される例
えば陰掻線管管体とは別の測定用の電子銃室(11)と
ゲッタ室(12)とを有する管体内で、抵抗体評価を行
うようにしたので、完成管において不良品が発見される
場合に比し、格段に労力及び材料経費の節減がはかられ
、材料経費においては、従来のl/lo以下にとどめ得
た。
According to the above-described present invention, the electron gun is finally placed in a tube having an electron gun chamber (11) for measurement and a getter chamber (12), which are separate from the scratch tube tube body, for example. Since we now perform resistor evaluation, compared to cases where defective products are discovered in finished pipes, labor and material costs can be significantly reduced, and material costs have been reduced to less than the conventional l/lo. I was able to stop it.

また、本発明装置によれば、ゲッタリング及びノンキン
グ処理を行うことができるようにしたので、その評価は
最終的に用いられる電子管におけると同等の条件下での
評価となり、きわめて正しい評価ができることになるな
ど多くの利益を有する。
In addition, since the device of the present invention is capable of performing gettering and non-king processing, the evaluation can be performed under the same conditions as the electron tube that will ultimately be used, making it possible to perform extremely accurate evaluations. It has many benefits such as:

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明装置の一例の断面図、第2図及び第3図
はその評価の特性曲線図、第4図は本発明の説明に供す
る電子管の要部の構成図である。 +11は電子銃、(11)は電子銃室、(12)はゲッ
タ室、(19)はゲッタコンテナ、(13)は連通細管
、(21)及び(22)は端子導出部である。
FIG. 1 is a sectional view of an example of the device of the present invention, FIGS. 2 and 3 are characteristic curve diagrams for evaluation thereof, and FIG. 4 is a configuration diagram of the main parts of an electron tube used for explaining the present invention. +11 is an electron gun, (11) is an electron gun chamber, (12) is a getter chamber, (19) is a getter container, (13) is a communicating thin tube, and (21) and (22) are terminal lead-out portions.

Claims (1)

【特許請求の範囲】[Claims] 放電制御抵抗体を有する電子銃を内部に配置する電子銃
室と、ゲッタ材を内部に配置するゲッタ室とが所要の通
気コンダクタンスをもって連通されて成り、上記電子銃
室には、上記電子銃に対する高圧印加のノッキング処理
と、特性測定のための端子導出部を有し、上記電子銃室
及びゲッタ室内の排気と上記ゲッタ材の飛唾処理後に上
記電子銃に対するノッキング処理と、上記放電制御抵抗
体の特性評価を行うことができるようにした電子銃の放
電制御抵抗体の評価装置。
An electron gun chamber in which an electron gun having a discharge control resistor is disposed and a getter chamber in which a getter material is disposed are communicated with each other with a required ventilation conductance. It has a knocking treatment for applying high voltage and a terminal lead-out part for measuring characteristics, and after exhausting the electron gun chamber and the getter chamber and spitting treatment for the getter material, it performs a knocking treatment for the electron gun and the discharge control resistor. An evaluation device for the discharge control resistor of an electron gun, which enables the evaluation of the characteristics of the electron gun.
JP29535885A 1985-12-25 1985-12-25 Evaluation device for discharge controlling resistor of electron gun Pending JPS62154434A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP29535885A JPS62154434A (en) 1985-12-25 1985-12-25 Evaluation device for discharge controlling resistor of electron gun

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP29535885A JPS62154434A (en) 1985-12-25 1985-12-25 Evaluation device for discharge controlling resistor of electron gun

Publications (1)

Publication Number Publication Date
JPS62154434A true JPS62154434A (en) 1987-07-09

Family

ID=17819583

Family Applications (1)

Application Number Title Priority Date Filing Date
JP29535885A Pending JPS62154434A (en) 1985-12-25 1985-12-25 Evaluation device for discharge controlling resistor of electron gun

Country Status (1)

Country Link
JP (1) JPS62154434A (en)

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