JPH0429176B2 - - Google Patents

Info

Publication number
JPH0429176B2
JPH0429176B2 JP6864382A JP6864382A JPH0429176B2 JP H0429176 B2 JPH0429176 B2 JP H0429176B2 JP 6864382 A JP6864382 A JP 6864382A JP 6864382 A JP6864382 A JP 6864382A JP H0429176 B2 JPH0429176 B2 JP H0429176B2
Authority
JP
Japan
Prior art keywords
cathode
emission
grid
color picture
picture tube
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP6864382A
Other languages
Japanese (ja)
Other versions
JPS58186136A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6864382A priority Critical patent/JPS58186136A/en
Publication of JPS58186136A publication Critical patent/JPS58186136A/en
Publication of JPH0429176B2 publication Critical patent/JPH0429176B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J9/00Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
    • H01J9/42Measurement or testing during manufacture

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)

Description

【発明の詳細な説明】 〔発明の技術分野〕 本発明はカラー受像管の検査方法に係り、特に
エミツシヨン特性を劣化する要因をもつたカラー
受像管を早期に検出し、再生工程に送ると共に、
その情報を製造工程に利用することが可能なカラ
ー受像管の検査方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a method for inspecting color picture tubes, and in particular, detects color picture tubes with factors that deteriorate their emission characteristics at an early stage, and sends them to a regeneration process.
The present invention relates to a color picture tube inspection method that allows the information to be used in the manufacturing process.

〔発明の技術的背景とその問題点〕[Technical background of the invention and its problems]

カラー受像管の製造は通常次のような工程順に
よつて行なわれる。
The manufacture of color picture tubes is usually carried out in the following process order.

先ず、内面に赤、緑、青の各色に発光する蛍光
体層からなる蛍光スクリーンが被着形成されか
つ、シヤドウマスクの装着されたパネルと、内部
導電膜の被着形成されたフアンネル及びネツクか
らなるフアンネルネツクとをフリツトガラスなど
で封着して所謂コンプリートバルブを形成する。
First, a fluorescent screen consisting of a phosphor layer that emits red, green, and blue colors is adhered to the inner surface, a panel is attached with a shadow mask, and a funnel and a net are formed with an inner conductive film adhered thereto. The funnel neck is sealed with frit glass or the like to form a so-called complete bulb.

次にこのコンプリートバルブのネツク開放端よ
りステム上に組立てられた電子銃を挿入し、ネツ
クとステムとを溶着する。
Next, the electron gun assembled on the stem is inserted into the open end of the neck of this complete valve, and the neck and stem are welded together.

次にステムに設けられた排気管を介して管内を
排気し、その排気管を封止する。
Next, the inside of the tube is evacuated through an exhaust pipe provided in the stem, and the exhaust pipe is sealed.

次にゲツターフラツシを行ない管内を高真空に
する。
Next, perform a getter flush to create a high vacuum inside the tube.

次にパネルの側壁部に防爆バンドを取付ける。 Next, attach the explosion-proof band to the side wall of the panel.

次にカソードエージング工程を経て高圧処理
(耐電圧処理)を行なつた後、各種の成品検査を
行なう。この成品検査には種々の検査項目がある
が、その1つにエミツシヨン検査がある。
Next, after undergoing a cathode aging process and high-pressure treatment (voltage resistance treatment), various product inspections are performed. This product inspection includes various inspection items, one of which is an emission inspection.

このエミツシヨン検査にはカソードの速動性を
評価するエミツシヨンの立上り特性と、カソード
のエミツシヨン能力を評価する飽和エミツシヨン
特性とがある。
This emission test includes an emission rise characteristic that evaluates the rapid movement of the cathode, and a saturation emission characteristic that evaluates the cathode's emission ability.

次にこのエミツシヨンの立上り特性の検査を第
1図及び第2図により説明する。
Next, inspection of the rise characteristics of this emission will be explained with reference to FIGS. 1 and 2.

即ち内面に蛍光スクリーン1が被着形成されか
つこの蛍光スクリーン1と所定間隔をもつてシヤ
ドウマスク2が配置されたパネル3と、内部導電
膜4及びこの内部導電膜4に電気的に接続された
陽極端子5の形成されたフアンネル6と、このフ
アンネル6に溶着されたネツク7に溶着されたス
テム8上に組立てられてネツク7内に配置された
ヒータ9、カソード10、第1グリツド11、第
2グリツド12、第3グリツド13及び第4グリ
ツド14より構成された電子銃とを具備するカラ
ー受像管において、陽極端子5に内部導電膜4を
介して電気的に接続された第4グリツド14とス
テム8を介して電気的に接続された第3グリツド
13及び第2グリツド12とに電源15から+
200〜300Vの電圧を印加し、第1グリツド11を
直接接地し、カソード10に定格の電圧を印加
し、かつカソード電流計16を介して接地した状
態でヒータ9に定格電圧を印加して、第2図に示
す曲線25のように流れるカソード電流が規定値
になつた時の時間tを読んでカソードのエミツシ
ヨンの立上り特性を検査する。
That is, a panel 3 having a fluorescent screen 1 adhered thereon and a shadow mask 2 disposed at a predetermined distance from the fluorescent screen 1, an internal conductive film 4, and an anode electrically connected to the internal conductive film 4. A funnel 6 on which a terminal 5 is formed, a heater 9 assembled on a stem 8 welded to a neck 7 welded to the funnel 6, and arranged in the neck 7, a cathode 10, a first grid 11, a second grid. In a color picture tube equipped with an electron gun composed of a grid 12, a third grid 13, and a fourth grid 14, the fourth grid 14 and the stem are electrically connected to the anode terminal 5 via the internal conductive film 4. The third grid 13 and the second grid 12 are electrically connected via the
Applying a voltage of 200 to 300 V, directly grounding the first grid 11, applying the rated voltage to the cathode 10, and applying the rated voltage to the heater 9 while grounding through the cathode ammeter 16, The rise characteristic of the cathode emission is examined by reading the time t when the cathode current flowing as shown in the curve 25 shown in FIG. 2 reaches a specified value.

このようなエミツシヨンの立上り特性の検査に
おいては、カソード10から射出された電子は第
1図に示した矢印17のように第1グリツド1
1、第2グリツド12、第3グリツド13、第4
グリツド14に衝突し捕捉される。
In such an inspection of the emission rise characteristic, the electrons emitted from the cathode 10 are transferred to the first grid 1 as indicated by the arrow 17 shown in FIG.
1, 2nd grid 12, 3rd grid 13, 4th grid
It collides with the grid 14 and is captured.

また飽和エミツシヨン特性検査は第3図に示す
ように陽極端子5及び内部導電膜4を介して第4
グリツド14に電源18から定格の高圧を印加
し、第3グリツド13に電源19から定格のフオ
ーカス電圧を印加し、第2グリツド12に電源2
0から+200〜300Vの電圧を印加し、第1グリツ
ドを直接接地し、カソード10に定格の電圧を印
加し、かつカソード電流計10を介して接地し、
偏向ヨークを正常の装着位置の近くに装着して動
作させることにより電子ビーム21を蛍光スクリ
ーン1一ぱいに走査させて行なわれる。
In addition, the saturation emission characteristic test is carried out through the anode terminal 5 and the internal conductive film 4, as shown in FIG.
A rated high voltage is applied to the grid 14 from the power supply 18, a rated focus voltage is applied to the third grid 13 from the power supply 19, and a power supply 2 is applied to the second grid 12.
Applying a voltage of 0 to +200 to 300 V, directly grounding the first grid, applying a rated voltage to the cathode 10, and grounding via the cathode ammeter 10,
By mounting and operating the deflection yoke near its normal mounting position, the electron beam 21 is scanned over the fluorescent screen 1.

このような飽和エミツシヨン特性の検査ではカ
ソード10から射出された電子ビームは蛍光スク
リーン1やシヤドウマスク2及び図示しないマス
ククレームなどに衝突し、斜線221,222で示
したように捕捉される。
In such a test of saturation emission characteristics, the electron beam emitted from the cathode 10 collides with the fluorescent screen 1, the shadow mask 2, the mask claim (not shown), etc., and is captured as indicated by diagonal lines 22 1 and 22 2 .

従つてこのエミツシヨン検査によれば、カソー
ド10のエミツシヨン能力が低く、必要とされる
カソード電流値が取出せないカラー受像管や、各
グリツド11,12,13,14やシヤドウマス
ク2や蛍光体スクリーン1などに排気工程やカソ
ードエージング工程で充分に取り除けなかつた残
留ガス源を有するカラー受像管に対しては、第1
図及び第3図に示した検査方法で測定中にガス放
出が起り、エミツシヨンが低下するので、エミツ
シヨン不良として検知可能であり、このようなカ
ラー受像管はエミツシヨン不良の要因をもつもの
としてリジエクトできる。
Therefore, according to this emission test, the cathode 10 has a low emission capacity and the required cathode current value cannot be obtained from the color picture tube, the grids 11, 12, 13, 14, the shadow mask 2, the phosphor screen 1, etc. For color picture tubes that have residual gas sources that could not be sufficiently removed during the exhaust process or cathode aging process,
With the inspection method shown in Figures and Figure 3, gas is released during measurement and the emission decreases, so it can be detected as a defective emission, and such a color picture tube can be rejected as having the cause of a defective emission. .

しかしながらフアンネル6とネツク7の境界の
フアンネルのフルート部61に残留ガス源を持つ
カラー受像管や実際の動作中に高圧電極と低圧電
極との間に発生する管内放電によりカソード10
を劣化するものは第1図や第3図に示した従来の
検査方法では電子ビームが衝突する部分の範囲外
に残留ガス源があるので、充分に検知できないと
云う問題がある。
However, the color picture tube has a residual gas source in the flute part 61 of the funnel at the boundary between the funnel 6 and the net 7, and the cathode 10 due to the discharge inside the tube that occurs between the high voltage electrode and the low voltage electrode during actual operation.
There is a problem in that the conventional inspection methods shown in FIGS. 1 and 3 cannot sufficiently detect the residual gas source outside the area where the electron beam collides.

更にカラー受像管がテレビジヨンセツトに組み
込まれ動作状態では、管や偏向ヨークの製造のば
らつきなどによりカソードから放出された電子ビ
ームの一部がフアンネルのフルート部61に衝突
するものがある。このように電子ビームの一部が
フアンネルのフルート部61に衝突すると、従来
の検査方法ではこのフアンネルのフルート部61
に残留ガス源をもつカラー受像管はエミツシヨン
不良の原因をもつものとして検知されないまま出
荷されるため、得意先のセツト組立ラインや市場
に出てからエミツシヨン不良として返却されるも
のがでると云う問題もある。
Further, when a color picture tube is installed in a television set and is in operation, a portion of the electron beam emitted from the cathode may collide with the flute portion 61 of the funnel due to manufacturing variations in the tube or deflection yoke. When a part of the electron beam collides with the flute portion 6 1 of the funnel in this way, the conventional inspection method
Color picture tubes with a residual gas source are shipped without being detected as having an emission defect, resulting in the problem that some of them are returned as emission defects after they reach the customer's set assembly line or on the market. There is also.

〔発明の目的〕[Purpose of the invention]

本発明は前記従来の諸問題に鑑みてなされたも
のであり、エミツシヨン劣化の要因を持ちなが
ら、従来の検査方法では検知されなかつたカラー
受像管を製造工程内で事前に検知し、リジエクト
できるカラー受像管の検査方法を提供することを
目的としている。
The present invention has been made in view of the above-mentioned conventional problems, and is a color picture tube that can detect and reject color picture tubes in advance during the manufacturing process, which have the cause of emission deterioration but are not detected by conventional inspection methods. The purpose is to provide a method for inspecting picture tubes.

〔発明の概要〕[Summary of the invention]

即ち本発明は排気、ゲツタフラツシユ、高圧処
理、カソードエージングの各工程を終了したカラ
ー受像管について、ヒータ電圧を定格より下げか
つ接地電位の第1グリツドに対するカソード電圧
を定格より上げてカソード電流を定格より多く
し、陽極端子に印加する高圧を定格より高くする
と共に、偏向ヨークを正常の装着位置よりも電子
銃側に後退させて前記カラー受像管のフアンネル
のフルート部に電子ビームを衝突させて所定時間
処理したのち、カソードのエミツシヨンの立上が
り特性及びカソードの飽和エミツシヨン特性を検
査するエミツシヨン検査を行なうことを特徴とす
るカラー受像管の検査方法である。
That is, the present invention applies to color picture tubes that have undergone the steps of evacuation, getter flushing, high pressure treatment, and cathode aging. At the same time, the high voltage applied to the anode terminal is made higher than the rated value, and the deflection yoke is moved back toward the electron gun from its normal mounting position to cause the electron beam to collide with the flute portion of the funnel of the color picture tube for a predetermined period of time. This color picture tube inspection method is characterized in that, after the treatment, an emission inspection is performed to inspect the rise characteristics of the cathode emission and the saturation emission characteristics of the cathode.

〔発明の実施例〕[Embodiments of the invention]

次に第4図により本発明のカラー受像管の検査
方法の一実施例を説明する。図中従来例と同一符
号は同一部分を示す。
Next, an embodiment of the color picture tube inspection method of the present invention will be explained with reference to FIG. In the figure, the same reference numerals as in the conventional example indicate the same parts.

即ち、内面に蛍光スクリーン1が被着形成され
かつこの蛍光スクリーン1と所定間隔をもつてシ
ヤドウマスク2が配設されたパネル3と、内部導
電膜4及びこの内部導電膜4に電気的に接続され
た陽極端子5の形成されたフアンネル6と、この
フアンネルに溶着されたネツク7に溶着されたス
テム8とに組立てられてネツク7内に配置された
ヒータ9、カソード10、第1グリツド11,第
2グリツド12、第3グリツド13及び第4グリ
ツド14より構成された電子銃とを具備するカラ
ー受像管は排気、ゲツタフラツシユ、高圧処理、
カソードエージングの各工程を終了したのち、陽
極端子5から内部導電膜4を介して電気的に接続
された第4グリツド14に電源28から定格より
数%高い電圧を印加し、第3グリツド13に電源
19より定格の電圧、第2グリツド12に電源2
0より定格の電圧をそれぞれ印加し、第1グリツ
ド11を直接接地し、ヒータ9電圧を定格より数
%下げかつ接地電位の第1グリツド11に付する
カソード電圧を定格より上げてカソード電流計1
6に示されるカソード電流を定格より数%多く
し、かつ図示しない偏向ヨークを正常の位置より
電子銃側(後方)に後退させて電子ビーム31が
フアンネル6のフルート部61にも衝突するよう
にして数10分間のランニング処理を行なう。
That is, a panel 3 having a fluorescent screen 1 deposited on its inner surface and a shadow mask 2 disposed at a predetermined distance from the fluorescent screen 1, an internal conductive film 4, and electrically connected to the internal conductive film 4. A heater 9, a cathode 10, a first grid 11, a first grid 11, a cathode 10, a heater 9, a cathode 10, a first grid 11, a first grid 11, a funnel 6 on which an anode terminal 5 is formed, and a stem 8 welded to a neck 7 welded to the funnel. The color picture tube is equipped with an electron gun consisting of a second grid 12, a third grid 13 and a fourth grid 14, and is equipped with exhaust, getter flash, high pressure processing,
After each step of cathode aging is completed, a voltage several percent higher than the rated voltage is applied from the power supply 28 to the fourth grid 14, which is electrically connected from the anode terminal 5 through the internal conductive film 4. Rated voltage from power supply 19, power supply 2 to second grid 12
Apply the rated voltages from 0 to 0, directly ground the first grid 11, lower the voltage of the heater 9 by a few percent from the rated voltage, raise the cathode voltage applied to the first grid 11 at ground potential from the rated value, and then connect the cathode ammeter 1.
The cathode current shown in 6 is increased by a few percent over the rated value, and the deflection yoke (not shown) is moved back from its normal position toward the electron gun (rearward) so that the electron beam 31 also collides with the flute portion 61 of the funnel 6. Perform a running process for several 10 minutes.

このようにカソード電流を多くしかつ陽極電圧
を高くすると共に、偏向ヨークの位置を正常の位
置よりも後退させるのは、フアンネルのフルート
部61にカソード10から電子ビームを加速して
高エネルギーの電子ビームをより多く衝突させ、
フアンネルのフルート部61の残留ガス源から効
果的にガス放出を起こさせ、その結果生じるエミ
ツシヨンの低下をエミツシヨン検査で測定してエ
ミツシヨン不良の要因をもつものとしてリジエク
トするためと、放電の要因を持つカラー受像管に
対する放電を促進させるためである。
The purpose of increasing the cathode current and the anode voltage as well as retracting the position of the deflection yoke from its normal position is to accelerate the electron beam from the cathode 10 to the flute portion 61 of the funnel to generate a high-energy beam. Make more electron beams collide,
In order to effectively cause gas release from the residual gas source in the flute section 61 of the funnel, and to measure the resulting drop in emission in an emission inspection and reject it as a cause of emission failure, and to identify the cause of discharge. This is to promote electrical discharge to the color picture tube.

このようにすることによりカソード10から射
出された電子ビームは蛍光スクリーン1やシヤド
ウマスク2及び図示しないマスククレームなどに
衝突し、斜線221,222で示したように捕捉さ
れると共に、フアンネルのフルート部61にも斜
線223で示したように衝突し、このフアンネル
のフルート部61の残留ガス源からのガス放出を
促進させることができ、その結果生じるエミツシ
ヨンの低下をエミツシヨン検査で測定してエミツ
シヨン不良の要因をもつものとしてリジエクトす
ることが可能となる。
By doing so, the electron beam emitted from the cathode 10 collides with the fluorescent screen 1, the shadow mask 2, the mask claim (not shown), etc., and is captured as shown by diagonal lines 22 1 and 22 2 . It also collides with the part 6 1 as shown by the diagonal line 22 3 , which can promote gas release from the residual gas source in the flute part 6 1 of this funnel, and the resulting drop in emissions can be measured by an emission test. This makes it possible to reject it as having the cause of an emission failure.

なお、前記実施例では4個のグリツドを有する
電子銃を具備するカラー受像管について述べた
が、他の形の電子銃を具備するカラー受像管にも
そのまま適用できることは勿論である。
In the above embodiment, a color picture tube equipped with an electron gun having four grids was described, but it goes without saying that the present invention can also be applied to color picture tubes equipped with electron guns of other shapes.

〔発明の効果〕〔Effect of the invention〕

上述のように本発明によれば、テレビジヨンセ
ツトメーカー並びに市場におけるエミツシヨン不
良率を極めて少なくすることができ、また製造工
程内でエミツシヨン不良の要因をもつものを早期
に発見でき、その情報を製造工程に利用すること
で品質事故を未然に防止することが可能となり、
その工業的価値は極めて大である。
As described above, according to the present invention, it is possible to extremely reduce the emission defect rate in television set manufacturers and the market, and it is possible to discover factors causing emission defects at an early stage in the manufacturing process, and to use this information in the manufacturing process. By using it in the process, it is possible to prevent quality accidents,
Its industrial value is extremely large.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来のカソードの立上り特性検査方法
を示す説明図、第2図はカソード電流の立上り時
間を示す曲線図、第3図は従来の飽和エミツシヨ
ン特性検査方法を示す説明図、第4図は本発明の
カラー受像管の検査方法の一実施例を示す説明図
である。 1……蛍光スクリーン、2……シヤドウマス
ク、3……パネル、4……内部導電膜、5……陽
極端子、6……フアンネル、61……フアンネル
のフルート部、7……ネツク、8……ステム、9
……ヒータ、10……カソード、11……第1グ
リツド、12……第2グリツド、13……第3グ
リツド、14……第4グリツド、15,18,1
9,20,28……電源。
Fig. 1 is an explanatory diagram showing a conventional cathode rise characteristic testing method, Fig. 2 is a curve diagram showing the cathode current rise time, Fig. 3 is an explanatory diagram showing a conventional saturation emission characteristic testing method, and Fig. 4 FIG. 1 is an explanatory diagram showing an embodiment of the color picture tube inspection method of the present invention. DESCRIPTION OF SYMBOLS 1... Fluorescent screen, 2... Shadow mask, 3... Panel, 4... Internal conductive film, 5... Anode terminal, 6... Funnel, 6 1 ... Flute part of funnel, 7... Network, 8... ...Stem, 9
... Heater, 10 ... Cathode, 11 ... First grid, 12 ... Second grid, 13 ... Third grid, 14 ... Fourth grid, 15, 18, 1
9, 20, 28...Power supply.

Claims (1)

【特許請求の範囲】[Claims] 1 排気、ゲツタフラツシユ、高圧処理、カソー
ドエージングの各工程を終了したカラー受像管に
ついて、ヒータ電圧を定格より下げかつ接地電位
の第1グリツドに対するカソード電圧を定格より
上げてカソード電流を定格より多くし、陽極端子
に印加する高圧を定格より高くすると共に、偏向
ヨークを正常の装置位置よりも電子銃側に後退さ
せて前記カラー受像管のフアンネルのフルート部
に電子ビームを衝突させて所定時間処理したの
ち、カソードのエミツシヨンの立上がり特性及び
カソードの飽和エミツシヨン特性を検査するエミ
ツシヨン検査を行なうことを特徴とするカラー受
像管の検査方法。
1. For the color picture tube that has undergone the exhaust, getter flush, high pressure treatment, and cathode aging steps, the heater voltage is lowered below the rated value, and the cathode voltage relative to the first grid at ground potential is increased above the rated value to increase the cathode current above the rated value. The high voltage applied to the anode terminal is made higher than the rated value, the deflection yoke is moved back toward the electron gun from the normal device position, and the flute part of the funnel of the color picture tube is made to collide with the electron beam and processed for a predetermined period of time. A method for inspecting a color picture tube, characterized in that an emission inspection is performed to inspect the rise characteristic of the cathode emission and the saturation emission characteristic of the cathode.
JP6864382A 1982-04-26 1982-04-26 Inspecting method of color picture tube Granted JPS58186136A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6864382A JPS58186136A (en) 1982-04-26 1982-04-26 Inspecting method of color picture tube

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6864382A JPS58186136A (en) 1982-04-26 1982-04-26 Inspecting method of color picture tube

Publications (2)

Publication Number Publication Date
JPS58186136A JPS58186136A (en) 1983-10-31
JPH0429176B2 true JPH0429176B2 (en) 1992-05-18

Family

ID=13379603

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6864382A Granted JPS58186136A (en) 1982-04-26 1982-04-26 Inspecting method of color picture tube

Country Status (1)

Country Link
JP (1) JPS58186136A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5012194A (en) * 1989-09-05 1991-04-30 Raytheon Company Method testing electron discharge tubes

Also Published As

Publication number Publication date
JPS58186136A (en) 1983-10-31

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