JPS6214769B2 - - Google Patents
Info
- Publication number
- JPS6214769B2 JPS6214769B2 JP51055474A JP5547476A JPS6214769B2 JP S6214769 B2 JPS6214769 B2 JP S6214769B2 JP 51055474 A JP51055474 A JP 51055474A JP 5547476 A JP5547476 A JP 5547476A JP S6214769 B2 JPS6214769 B2 JP S6214769B2
- Authority
- JP
- Japan
- Prior art keywords
- measurement
- optical path
- radiant beam
- gas
- reflector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 claims description 62
- 230000003287 optical effect Effects 0.000 claims description 51
- 239000007789 gas Substances 0.000 claims description 49
- 230000005855 radiation Effects 0.000 claims description 49
- 239000000779 smoke Substances 0.000 claims description 16
- 230000005540 biological transmission Effects 0.000 claims description 15
- 230000003595 spectral effect Effects 0.000 claims description 14
- 239000002912 waste gas Substances 0.000 claims description 13
- 238000010521 absorption reaction Methods 0.000 claims description 12
- 239000000203 mixture Substances 0.000 claims description 12
- 238000012545 processing Methods 0.000 claims description 8
- 238000001514 detection method Methods 0.000 claims description 6
- 235000013405 beer Nutrition 0.000 claims description 4
- 238000006243 chemical reaction Methods 0.000 claims description 2
- 230000001678 irradiating effect Effects 0.000 claims description 2
- 239000002245 particle Substances 0.000 claims description 2
- 239000000523 sample Substances 0.000 description 14
- 230000004907 flux Effects 0.000 description 11
- 230000004888 barrier function Effects 0.000 description 9
- 238000010586 diagram Methods 0.000 description 6
- 238000000034 method Methods 0.000 description 6
- 238000011156 evaluation Methods 0.000 description 4
- 239000011521 glass Substances 0.000 description 4
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 4
- 239000007787 solid Substances 0.000 description 4
- UGFAIRIUMAVXCW-UHFFFAOYSA-N Carbon monoxide Chemical compound [O+]#[C-] UGFAIRIUMAVXCW-UHFFFAOYSA-N 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- 230000001419 dependent effect Effects 0.000 description 3
- 239000003546 flue gas Substances 0.000 description 3
- 230000007935 neutral effect Effects 0.000 description 3
- 238000005070 sampling Methods 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 3
- 239000006096 absorbing agent Substances 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 238000005260 corrosion Methods 0.000 description 2
- 230000007797 corrosion Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 229920003002 synthetic resin Polymers 0.000 description 2
- 239000000057 synthetic resin Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000002835 absorbance Methods 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 230000002238 attenuated effect Effects 0.000 description 1
- 230000008033 biological extinction Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000003749 cleanliness Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 239000003517 fume Substances 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000002329 infrared spectrum Methods 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000012432 intermediate storage Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- ORUIBWPALBXDOA-UHFFFAOYSA-L magnesium fluoride Chemical compound [F-].[F-].[Mg+2] ORUIBWPALBXDOA-UHFFFAOYSA-L 0.000 description 1
- 229910001635 magnesium fluoride Inorganic materials 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 239000005401 pressed glass Substances 0.000 description 1
- 239000011241 protective layer Substances 0.000 description 1
- 238000000746 purification Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
- G01N21/53—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke
- G01N21/534—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke by measuring transmission alone, i.e. determining opacity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/85—Investigating moving fluids or granular solids
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE2521934A DE2521934C3 (de) | 1975-05-16 | 1975-05-16 | Vorrichtung zur Bestimmung der Konzentrationen von Komponenten eines Abgasgemisches |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS51141681A JPS51141681A (en) | 1976-12-06 |
| JPS6214769B2 true JPS6214769B2 (US08063081-20111122-C00044.png) | 1987-04-03 |
Family
ID=5946767
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP51055474A Granted JPS51141681A (en) | 1975-05-16 | 1976-05-17 | Method of and instrument for optically measuring concentration of gaseous component |
Country Status (6)
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007232402A (ja) * | 2006-02-27 | 2007-09-13 | Denso Corp | 光学式ガス検知装置 |
Families Citing this family (68)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2601985C2 (de) * | 1976-01-16 | 1978-02-16 | Mannesmann AG, 4000 Düsseldorf | Fotometrisches Staubmeßgerät |
| US4078896A (en) * | 1977-01-21 | 1978-03-14 | International Telephone And Telegraph Corporation | Photometric analyzer |
| US4097743A (en) * | 1977-04-19 | 1978-06-27 | Moisture Systems Corp. | Moisture analyzing method and apparatus |
| NL85378C (US08063081-20111122-C00044.png) * | 1978-11-29 | |||
| DE2918084C3 (de) * | 1979-05-04 | 1982-04-08 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | Gerät zur Bestimmung der Extinktionen von Komponente eines Abgasgemisches |
| FR2464470A1 (fr) * | 1979-08-29 | 1981-03-06 | Econics Corp | Appareil electro-optique d'analyse d'un gaz de carneau |
| DE2945608A1 (de) * | 1979-11-12 | 1981-05-21 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | Vorichtung zur bestimmung der konzentrationen von aus verschiedenen gasen und gegebenenfalls rauchteilchen bestehenden komponenten eines abgasgemisches |
| US4413911A (en) * | 1981-04-24 | 1983-11-08 | Measurex Corporation | Gas analyzer with fluid curtain |
| GB2110818B (en) * | 1981-11-14 | 1985-05-15 | Ferranti Ltd | Non-dispersive gas analyser |
| DE3206427A1 (de) * | 1982-02-23 | 1983-09-01 | Siemens AG, 1000 Berlin und 8000 München | Messeinrichtung fuer die optische gasanalyse |
| US4632563A (en) * | 1983-02-28 | 1986-12-30 | The Syconex Corporation | In-situ gas analyzer |
| US4640621A (en) * | 1983-06-17 | 1987-02-03 | Eastern Technical Associates, Inc. | Transmissometer and optical elements therefor |
| EP0145877B1 (de) * | 1983-11-04 | 1989-08-02 | Hartmann & Braun Aktiengesellschaft | Fotometer zur kontinuierlichen Analyse eines Mediums (Gas oder Flüssigkeit) |
| US4572663A (en) * | 1983-12-22 | 1986-02-25 | Elliott Turbomachinery Co., Inc. | Method and apparatus for selectively illuminating a particular blade in a turbomachine |
| US4746218A (en) * | 1984-06-12 | 1988-05-24 | Syconex Corporation | Gas detectors and gas analyzers utilizing spectral absorption |
| SE450913B (sv) * | 1984-08-10 | 1987-08-10 | Hans Georg Edner | Gaskorrelerad lidar |
| US4647777A (en) * | 1985-05-31 | 1987-03-03 | Ametrek, Inc. | Selective gas detector |
| JPH0711695B2 (ja) | 1985-09-25 | 1995-02-08 | 富士写真フイルム株式会社 | 撮影用ハロゲン化銀カラー感光材料の処理方法 |
| US4851327A (en) | 1986-07-17 | 1989-07-25 | Fuji Photo Film Co., Ltd. | Photographic color photosensitive material with two layer reflective support |
| DE3624567A1 (de) * | 1986-07-21 | 1988-03-24 | Sick Optik Elektronik Erwin | Spektralanalytisches gasmessgeraet |
| JPH06105346B2 (ja) | 1986-11-07 | 1994-12-21 | 富士写真フイルム株式会社 | ハロゲン化銀カラ−写真感光材料の処理方法 |
| US4895081A (en) * | 1987-04-08 | 1990-01-23 | General Signal Corporation | Gravimetric feeder, especially adapted for use in a calorimetry system |
| US4893315A (en) * | 1987-04-08 | 1990-01-09 | General Signal Corporation | Calorimetry system |
| US4809190A (en) * | 1987-04-08 | 1989-02-28 | General Signal Corporation | Calorimetry system |
| US4846081A (en) * | 1987-04-08 | 1989-07-11 | General Signal Corporation | Calorimetry system |
| US4795262A (en) * | 1987-07-29 | 1989-01-03 | The Regents Of The Univerity Of Michigan | Liquid chromatography absorbance detector |
| DE3928081C2 (de) * | 1989-08-25 | 1998-05-07 | Bosch Gmbh Robert | Vorrichtung zur Erfassung der Trübung von Gasen |
| US5060505A (en) * | 1989-09-12 | 1991-10-29 | Sensors, Inc. | Non-dispersive infrared gas analyzer system |
| US5220179A (en) * | 1990-02-06 | 1993-06-15 | Helmut Katschnig | Method of and apparatus for detecting the presence of vapor and/or smoke in the outgoing air of a device for heating materials |
| JP3162708B2 (ja) * | 1990-04-09 | 2001-05-08 | コモンウェルス・サイエンティフィック・アンド・インダストリアル・リサーチ・オーガニゼイション | 飛行機内での使用のための検出システム |
| US5281256A (en) * | 1990-09-28 | 1994-01-25 | Regents Of The University Of Michigan | Gas chromatography system with column bifurcation and tunable selectivity |
| US5210702A (en) * | 1990-12-26 | 1993-05-11 | Colorado Seminary | Apparatus for remote analysis of vehicle emissions |
| US5401967A (en) * | 1990-12-26 | 1995-03-28 | Colorado Seminary Dba University Of Denver | Apparatus for remote analysis of vehicle emissions |
| GB9210674D0 (en) * | 1992-05-19 | 1992-07-01 | Gersan Ets | Method and apparatus for examining an object |
| US5288310A (en) * | 1992-09-30 | 1994-02-22 | The Regents Of The University Of Michigan | Adsorbent trap for gas chromatography |
| US5510269A (en) * | 1992-11-20 | 1996-04-23 | Sensors, Inc. | Infrared method and apparatus for measuring gas concentration including electronic calibration |
| US5371367A (en) * | 1993-04-13 | 1994-12-06 | Envirotest Systems Corp. | Remote sensor device for monitoring motor vehicle exhaust systems |
| US5352901A (en) * | 1993-04-26 | 1994-10-04 | Cummins Electronics Company, Inc. | Forward and back scattering loss compensated smoke detector |
| US5424842A (en) * | 1993-04-27 | 1995-06-13 | Cummins Electronics Company, Inc. | Self-cleaning system for monitoring the opacity of combustion engine exhaust using venturi effect |
| DE4400963C2 (de) * | 1994-01-14 | 1997-07-17 | Sick Ag | Verfahren und Vorrichtung zur Überwachung des Zustandes von in einem fluiddurchströmten Kanal eingeschalteten Filteranordnungen |
| US5751216A (en) * | 1994-09-27 | 1998-05-12 | Hochiki Kabushiki Kaisha | Projected beam-type smoke detector and receiving unit |
| DE4443016A1 (de) * | 1994-12-02 | 1996-06-05 | Sick Optik Elektronik Erwin | Gasanalytisches Meßgerät |
| US5621213A (en) * | 1995-07-07 | 1997-04-15 | Novitron International Inc. | System and method for monitoring a stack gas |
| JPH09152696A (ja) | 1995-11-30 | 1997-06-10 | Fuji Photo Film Co Ltd | ハロゲン化銀カラー写真感光材料 |
| JP3383499B2 (ja) | 1995-11-30 | 2003-03-04 | 富士写真フイルム株式会社 | ハロゲン化銀カラー写真感光材料 |
| DE19611290C2 (de) * | 1996-03-22 | 1998-04-16 | Draegerwerk Ag | Gassensor |
| US5770156A (en) * | 1996-06-04 | 1998-06-23 | In Usa, Inc. | Gas detection and measurement system |
| US6010665A (en) * | 1996-10-18 | 2000-01-04 | In Usa, Inc. | Multi-wavelength based ozone measurement method and apparatus |
| US5831267A (en) * | 1997-02-24 | 1998-11-03 | Envirotest Systems Corp. | Method and apparatus for remote measurement of exhaust gas |
| JP2003513272A (ja) * | 1999-11-04 | 2003-04-08 | レール・リキード−ソシエテ・アノニム・ア・ディレクトワール・エ・コンセイユ・ドゥ・スールベイランス・プール・レテュード・エ・レクスプロワタシオン・デ・プロセデ・ジョルジュ・クロード | 高温プロセスガスの化学種および温度の連続モニタリング方法 |
| US6536649B1 (en) | 2000-07-28 | 2003-03-25 | Advanced Micro Devices, Inc. | Method of preventing residue contamination of semiconductor devices during furnace processing |
| KR100359237B1 (ko) * | 2000-12-22 | 2002-11-04 | 재단법인 포항산업과학연구원 | 분진농도 측정장치 |
| US6822216B2 (en) * | 2002-01-08 | 2004-11-23 | Honeywell International, Inc. | Obscuration detector |
| US20050030628A1 (en) * | 2003-06-20 | 2005-02-10 | Aegis Semiconductor | Very low cost narrow band infrared sensor |
| CA2536371A1 (en) * | 2003-08-26 | 2005-03-10 | Redshift Systems Corporation | Infrared camera system |
| US7221827B2 (en) * | 2003-09-08 | 2007-05-22 | Aegis Semiconductor, Inc. | Tunable dispersion compensator |
| JP2007514961A (ja) * | 2003-10-07 | 2007-06-07 | アイギス セミコンダクター インコーポレイテッド | Ｃｔｅが一致する透明基板上にヒータを有する調整可能な光フィルタ |
| US7262856B2 (en) * | 2004-05-25 | 2007-08-28 | Hobbs Douglas S | Microstructured optical device for remote chemical sensing |
| GB2422897A (en) * | 2005-02-02 | 2006-08-09 | Pcme Ltd | A monitor for monitoring particles flowing in a stack |
| GB0700677D0 (en) * | 2007-01-12 | 2007-02-21 | Servomex Group Ltd | Probe |
| DE502007006240D1 (de) | 2007-03-24 | 2011-02-24 | Sick Engineering Gmbh | Verschmutzungsmessung |
| US8467066B2 (en) | 2008-09-29 | 2013-06-18 | Johanson Holdings Llc | Mixture segregation testing devices and methods |
| JP5349996B2 (ja) * | 2009-02-10 | 2013-11-20 | 一般財団法人電力中央研究所 | ガス濃度測定装置 |
| US11534081B2 (en) * | 2009-08-06 | 2022-12-27 | Peter Theophilos Banos | Methods of and devices for monitoring the effects of cellular stress and damage resulting from radiation exposure |
| CN103547910A (zh) * | 2011-05-20 | 2014-01-29 | 株式会社堀场制作所 | 测量单元及气体分析装置 |
| DE102016223440A1 (de) * | 2016-11-25 | 2018-05-30 | Robert Bosch Gmbh | Partikelmessvorrichtung und Verfahren zur Bestimmung charakteristischer Größen eines Aerosols |
| CN110967310A (zh) * | 2019-11-18 | 2020-04-07 | 湖北中烟工业有限责任公司 | 一种烟草红外光谱数据与外观质量评分相关性的分析方法 |
| JP7289272B2 (ja) * | 2019-11-27 | 2023-06-09 | ポリマー キャラクタライゼーション，エセ．アー． | 試料中の成分吸光度を測定するための赤外線検出器および方法 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS49106875A (US08063081-20111122-C00044.png) * | 1973-01-23 | 1974-10-09 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1623071U (de) | 1951-02-10 | 1951-05-10 | Semperit Gummiwaren G M B H | Weichgummi-hand- und montagelampe mit montagegeraet. |
| DE1279371B (de) | 1962-03-27 | 1968-10-03 | Sick Erwin | Vorrichtung zur Messung der Rauchdichte in Schornsteinen |
| US3472594A (en) * | 1966-06-06 | 1969-10-14 | Philips Corp | Multi-channel atomic absorption spectrometer |
| DE1623071B2 (de) * | 1967-02-03 | 1971-09-09 | Sick, Erwin, 8021 Icking | Photoelektronisches rauchdichtemessgeraet |
| DE2130331C3 (de) | 1971-06-18 | 1978-06-29 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | Verfahren und Vorrichtung zur Bestimmung der Konzentrationen der Komponenten eines aus zwei Gasen und Rauch bestehenden Gemisches |
| US3790797A (en) | 1971-09-07 | 1974-02-05 | S Sternberg | Method and system for the infrared analysis of gases |
| DE2218536A1 (de) * | 1972-04-17 | 1973-10-25 | Durag Apparatebau Gmbh | Truebungsmessgeraet fuer gase und fluessigkeiten |
| US3860818A (en) * | 1972-04-27 | 1975-01-14 | Texas Instruments Inc | Atmospheric pollution monitor |
| US3796887A (en) * | 1972-05-17 | 1974-03-12 | Itt | Photometric analyzer |
| US3885162A (en) * | 1973-10-31 | 1975-05-20 | Contraves Goerz Corp | Optical measuring apparatus |
-
1975
- 1975-05-16 DE DE2521934A patent/DE2521934C3/de not_active Expired
-
1976
- 1976-05-11 US US05/685,425 patent/US4126396A/en not_active Expired - Lifetime
- 1976-05-14 FR FR7614704A patent/FR2311296A1/fr active Granted
- 1976-05-14 GB GB20004/76A patent/GB1531844A/en not_active Expired
- 1976-05-14 IT IT23321/76A patent/IT1062070B/it active
- 1976-05-17 JP JP51055474A patent/JPS51141681A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS49106875A (US08063081-20111122-C00044.png) * | 1973-01-23 | 1974-10-09 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007232402A (ja) * | 2006-02-27 | 2007-09-13 | Denso Corp | 光学式ガス検知装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| GB1531844A (en) | 1978-11-08 |
| JPS51141681A (en) | 1976-12-06 |
| DE2521934C3 (de) | 1978-11-02 |
| DE2521934A1 (de) | 1976-11-18 |
| FR2311296B1 (US08063081-20111122-C00044.png) | 1981-09-25 |
| FR2311296A1 (fr) | 1976-12-10 |
| DE2521934B2 (de) | 1978-03-02 |
| IT1062070B (it) | 1983-06-25 |
| US4126396A (en) | 1978-11-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS6214769B2 (US08063081-20111122-C00044.png) | ||
| US3861809A (en) | Confocal cavity optical gas sensor | |
| EP0480753B1 (en) | Optical analytical instrument and method | |
| US4945250A (en) | Optical read head for immunoassay instrument | |
| US4201916A (en) | Ultraviolet radiation sensor for use in liquid purification system | |
| US3796887A (en) | Photometric analyzer | |
| US4632563A (en) | In-situ gas analyzer | |
| US5512757A (en) | Spectrophotometer and optical system therefor | |
| IE43515B1 (en) | Infrared gas analyzer having pressure and temperature compensation | |
| JPS6116010B2 (US08063081-20111122-C00044.png) | ||
| WO1999066311A9 (en) | Infrared multiple gas analyzer and analysis | |
| US4977325A (en) | Optical read system and immunoassay method | |
| US5693945A (en) | Gas analyzer | |
| JPS5847657B2 (ja) | リユウタイブンセキキ | |
| JPH08304282A (ja) | ガス分析装置 | |
| US4647777A (en) | Selective gas detector | |
| WO2005029048A1 (en) | Gas sensor | |
| JPS6189543A (ja) | デユアルビームスペクトル透過率の測定方法及び装置 | |
| US5055692A (en) | System for measuring ambient pressure and temperature | |
| US4076425A (en) | Opacity measuring apparatus | |
| US4794258A (en) | Spectroanalytical gas measuring apparatus | |
| JPS6182142A (ja) | ガス流中におけるガスの濃度測定装置 | |
| CN108827906A (zh) | 一种近红外光谱多组分气体在线检测系统及方法 | |
| GB2057680A (en) | Electro-optical flue gas analyzer | |
| US3383515A (en) | Dual beam null method and apparatus for determining the concentration of impurities in a sample |
