JPS6214195A - Aging of el panel - Google Patents

Abstract

(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

[Detailed Description of the Invention] [Summary] This invention presents an aging method for manufacturing a display panel in which matrix electrodes are arranged, minimizing dielectric breakdown within the panel and stabilizing the panel characteristics. It is.

[Industrial application field]

The present invention is applied to display panels.
o-luminescence) panel aging method.

For example, in the manufacture of matrix-structured EL display panels in which a transparent electrode, a dielectric light-emitting layer, and a back electrode are formed on a panel substrate, it is common to perform an aging treatment on the countless light-emitting cells arranged in the panel plane. It is.

During such aging treatment, especially when dielectric breakdown occurs,
It is essential to minimize electrode damage due to fracture.

[Conventional technology]

Figure 6 shows electrodes formed on a transparent substrate by means such as smoke deposition.

1 is a partial cross-sectional view of a thin film EL panel in which a light emitting layer, a dielectric layer, etc. are laminated. An example of a panel configuration will be explained according to the drawings.

The glass substrate 1 has one electrode (
For example, a conductive ITOv electrode 2 is formed as an X electrode). The surface of the ITO film electrode 2 has a dielectric layer 3 and a light emitting layer 4.
．． Furthermore, after dielectric layers 5° are sequentially laminated on the light emitting layer, the other Y electrode 6 having a high light reflectance is deposited.

In order to stabilize the panel characteristics, the board with the above-mentioned panel assembly has been assembled, for example, between the X and Y electrodes.

1(1011z AC pulse voltage 1(10~2(10
Aging is performed by applying the voltage over a period of time.

[Problem that the invention seeks to solve]

By the way, during the aging process, the dielectric layer 3
For example, if there is a layer defect due to a pinhole or the like in 5 and 5, dielectric breakdown of the dielectric layer will cause electrode damage. Furthermore, if the pulse voltage is continued to be applied while the dielectric breakdown occurs,
As the temperature around the defect increases, the damage to one electrode becomes a larger trace in proportion to the applied power, which eventually develops into electrode disconnection.

There is a problem in that it can lead to fatal defects as a display panel.

Further, even if an attempt is made to reduce the trace of destruction by narrowing the pulse width of the applied voltage, the voltage is applied continuously at a period of 1 (1011z), so destruction often occurs continuously and the trace expands.

[Means for Solving the Problems] FIG. 1 shows the dielectric breakdown detection circuit of the present invention, which is provided to minimize panel damage due to dielectric breakdown during the aging process, and how the display panel is operated by the output of the detection circuit. This stops the drive for a certain period of time.

Display panel] Circuit 12 or 1 for detecting dielectric breakdown of O
4 is designed to detect distortion occurring in the high-voltage pulse waveform applied to the panel using a comparator.

The output 19 or 20 of the comparator 12 or 14 determines the one shot multi-high break circuit 2.
4, the plurality of timing pulse generation circuits 2
1 and 22 are stopped for a certain period of time, and after that period of time has elapsed.

The pulse generating circuits 21 and 22 are operated again.

[For production]

The Et panel aging means is such that the comparator 12 or 14 constantly monitors the presence or absence of dielectric breakdown due to the alternating current pulse.

At the time of dielectric breakdown, the pulse waveform is distorted and becomes, for example, the waveform 17 shown in the circuit in Figure 2, so this is detected by comparing it with the pulse waveform 18 on the reference side, and the detection output 19 (or 20) is used. Then, the one-shot multi-high break 24 (circuit element labeled O/S in the figure) is activated via the OR element 23.

In this way, it is possible to control the timing pulse generation circuit to stop for a certain period of time determined by the circuit constants inside the 0/S element at the beginning of the failure, thereby suppressing the thermal rise in the area around the defect and minimizing the damage caused by the failure in the panel defect. can be suppressed.

〔Example〕

The present invention will be described in detail below with reference to FIGS. 1 to 3 showing an embodiment of the aging method of the present invention.

Fig. 1 is a circuit embodiment diagram explaining the misfire 1 gaaging means, Fig. 2 is a diagram explaining the main part means for detecting the previous destruction, and Fig. 3 shows the timing generation circuit for a certain period of time following the destruction detection. ('r) is an operation waveform timing diagram for stopping.

The reference numerals for the main parts of one circuit in FIG. 1 are as follows.

CLK is a common timing generation circuit for panel drive.

P (Xe) is a timing generation circuit 21 for the high voltage pulse Xe that drives the X side electrode 2 of the panel. P (Ye) is a timing generation circuit 22 for a high-voltage pulse Ye that drives the Y-side electrode 5 of the same panel.

P (Xr) is a generation circuit for the X (!I reference pulse Xr) used in the destruction detection means, and P (Yr) is a generation circuit for the Y side group single pulse Yr used in the destruction detection means.

The high voltage pulse Xe (or Ye) applied to the X (!1.!I electric pole (or Y (ljll electrode)) is supplied to the EL panel 10 via the panel driver circuit 11 (or 13).

The Xe pulse or Ye pulse of the panel driver circuit 11 (or 13), together with the corresponding comparison reference pulses Xr and Yr, respectively, are sent to the X comparators 12, -
and is input to the Y comparator 14.

Further, the circuit element 24 marked 10/S in FIG. 1 is a one-shot multi-high break. The circuit element 24 is.

An OR element 23 is inserted so as to be operated by the reset pulse 19 or 20 from either side of the X, Y comparators 12, 14.

The Ye high voltage pulse waveform applied to the panel 10 is constantly monitored by a reference pulse Yr provided for destruction detection, and if kTh! If there is an abnormality such as destruction, the waveform of the high-voltage driver pulse Ye applied to the corresponding electrode in the panel IO will be distorted, and the comparator 14 will detect this distortion. Then, the cent pulse 2 is output from the detection comparator 14.
0 is output.

Figure 2 shows that due to dielectric breakdown, the high voltage pulse Xe on the X side,
It is a circuit diagram of the main part of the destruction detection, from which the X-side reset pulse 19 is issued, schematically showing the reference pulse Xr to be compared with Xe and the difference between the input waveforms 17 and 18 of the mutual comparators 12.

Comparison pulses Xe and Xr of the comparator 12 in the figure are provided with input terminal dividing circuits 15 and 16 made of series capacitors, respectively.

O/ activated by the X side cent pulse 19 output.
The S circuit element 24 operates a plurality of timing pulse generating circuits P (Xe) and P (Y
e) to stop its operation. Therefore, the high voltage driver pulses Xe and Ye for driving the valve are also turned off.

FIG. 3 shows the operation timing waveforms of the main circuit section of the present invention which detects the dielectric breakdown of the EL panel and stops the timing pulse generation circuit after the detection.

Further, FIG. 4 shows a panel drive waveform that makes the "P stop" mentioned above for a certain period of time T.

Fig. 5 fal shows E by the conventional aging drive power supply circuit.
Figure tb1 is a cell front view comparing electrode damage in the cell portion of the panel and electrode damage 3 of the display cell caused by the aging drive power supply circuit of the present invention.

In the embodiment described above, an example was shown in which distortion of the voltage waveform at the time of dielectric breakdown of the panel is detected, but this can also be detected using the current waveform at the time of breakdown.

(Effects of the Invention) As explained above, according to the aging drive power supply circuit of the present invention, damage to the panel electrodes due to dielectric breakdown of the EL panel can be minimized, and as a result, damage to the panel can be prevented. Therefore, highly reliable aging treatment will be performed.

[Brief explanation of the drawing]

FIG. 1 is a diagram showing an embodiment of the aging circuit of the present invention. FIG. 2 is a diagram illustrating the main part means for detecting previous destruction. FIG. 3 is a timing chart of operation waveforms for detecting dielectric breakdown and stopping panel drive. FIG. 4 is a panel drive waveform diagram when P is stopped. Figure 5 (al) and (b) are cell front views comparing the electrode damage of the display cells. Figure 6 is a cross-sectional view of the EL panel. In the figure, 10 is the display panel. 12 and 14 are the cell front views comparing the electrode damage of the display cells. Detection circuit. 19 and 20 are outputs of detection circuits 12 and 14, respectively.

Claims (1)

[Claims] Circuit (12) for detecting dielectric breakdown of display panel (10)
[or (14)] and a plurality of timing pulse generation circuits (21) that drive the display panel (10) by the output (19) [or (20)] of the detection circuit (12) [or (14)]; A method for aging an EL panel, comprising: a circuit (24) for stopping the output signal of (22) for a certain period of time.