JPS62133696A - Thin film el display device - Google Patents
Thin film el display deviceInfo
- Publication number
- JPS62133696A JPS62133696A JP60274582A JP27458285A JPS62133696A JP S62133696 A JPS62133696 A JP S62133696A JP 60274582 A JP60274582 A JP 60274582A JP 27458285 A JP27458285 A JP 27458285A JP S62133696 A JPS62133696 A JP S62133696A
- Authority
- JP
- Japan
- Prior art keywords
- thin film
- light
- display element
- layer
- transparent electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000010409 thin film Substances 0.000 title claims description 14
- 239000012212 insulator Substances 0.000 claims description 13
- 239000000758 substrate Substances 0.000 claims description 10
- 239000010408 film Substances 0.000 description 7
- 238000000034 method Methods 0.000 description 5
- 230000005684 electric field Effects 0.000 description 4
- 239000011521 glass Substances 0.000 description 4
- 238000000149 argon plasma sintering Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 239000012780 transparent material Substances 0.000 description 2
- 238000007738 vacuum evaporation Methods 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 238000005566 electron beam evaporation Methods 0.000 description 1
- 238000001017 electron-beam sputter deposition Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000006386 memory function Effects 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 230000001902 propagating effect Effects 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
Landscapes
- Electroluminescent Light Sources (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
[発明の技術分野]
本発明は、発光のコントラストを高めた薄膜EL表示素
子に関する。DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a thin film EL display element with enhanced contrast in light emission.
[発明の技術的背景]
一般に薄膜EL表示素子としては、ガラス基板等の透明
基板上に透明電極、絶縁体層、発光体層、再び絶縁体層
、ついで背面電極が順次積層された2重絶縁構造(以下
MISI構造と称する。)のものと、このMISI構造
において透明電極と発光体層の間の絶縁体層が省かれた
形の単一絶縁構造(以下MIS構造と称する。)のもの
がある。[Technical Background of the Invention] Generally, a thin film EL display element is a double insulation device in which a transparent electrode, an insulator layer, a light emitter layer, an insulator layer, and a back electrode are sequentially laminated on a transparent substrate such as a glass substrate. structure (hereinafter referred to as MISI structure) and a single insulating structure (hereinafter referred to as MIS structure) in which the insulating layer between the transparent electrode and the light emitting layer is omitted in this MISI structure. be.
このような簿膜EL表示素子において、通常背面電極の
Affl以外は透明な材料が積層され、その形成方法は
一般的に次の如くである。In such a film EL display element, transparent materials are usually laminated except for the back electrode Affl, and the method for forming the transparent materials is generally as follows.
即ち、ガラス基板面に真空蒸着法あるいはスパッタ法等
により透明電極の材料のITO膜を被着形成し、このI
TO膜を写真蝕刻法(以下PEP法と称する。)により
所定のパターンに形成する。That is, an ITO film, which is a transparent electrode material, is formed on the surface of a glass substrate by vacuum evaporation or sputtering, and the ITO film is
The TO film is formed into a predetermined pattern by photolithography (hereinafter referred to as PEP method).
この面に金属酸化物からなる絶縁体層、ついで例えばZ
nS :Mn等からなる発光体層、再び前記絶縁体層を
順次電子ビーム蒸着法あるいはスパッタ法等により、そ
れぞれ所定の厚さに形成する。An insulator layer made of metal oxide is applied to this surface, and then, for example, Z
A light emitting layer made of nS:Mn or the like and the insulating layer are sequentially formed to a predetermined thickness by electron beam evaporation or sputtering, respectively.
その後、Aflを真空蒸着法おるいはスパッタ法で被着
し、PEP法により背面電極としての所定のパターンを
形成する。また、MIS型薄膜EL表示素子においても
、絶縁体層の一方が省かれる以外、上記MISI構造の
形成方法と同様である。Thereafter, Afl is deposited by vacuum evaporation or sputtering, and a predetermined pattern as a back electrode is formed by PEP. Also, in the MIS type thin film EL display element, the method for forming the MISI structure is the same as described above except that one of the insulating layers is omitted.
こうした形成方法によるMIS型薄膜EL表示素子の構
造例としては特開昭54−116891、同58−21
6392及び同59−141194等かおる。Examples of structures of MIS type thin film EL display elements using such a formation method include JP-A-54-116891 and JP-A-58-21.
6392 and 59-141194 etc.
[発明の技術的背景とその問題点]
このような構造の薄膜EL表示素子においては、透明電
極のパターン形成後に2次元的に連続な例えばZnS:
Mnからなる発光体層を形成するため、次のような問題
がある。即ち、
(1)発光体層内の発光現象は3次元的であり、外部に
取りだせる光量は全光量の約173程度である。残りの
273の光量は沿面方向への伝播過程で繰り返される反
射おるいは背面への透過又は吸収によって失われていく
。この状態を第2図に示す。[Technical background of the invention and its problems] In a thin film EL display element having such a structure, after forming a pattern of a transparent electrode, a two-dimensionally continuous film such as ZnS:
Forming a light emitter layer made of Mn poses the following problems. That is, (1) The light emission phenomenon within the light emitter layer is three-dimensional, and the amount of light that can be taken out to the outside is about 173 of the total amount of light. The remaining 273 amounts of light are lost due to repeated reflections, transmission to the back surface, or absorption during the propagation process in the creeping direction. This state is shown in FIG.
図中、符号1は、ガラス基板等の透明基板であり、その
上に透明電極2、絶縁体層3、発光体層4、絶縁体層3
及び背面電極5が順次積層されている。In the figure, reference numeral 1 indicates a transparent substrate such as a glass substrate, on which a transparent electrode 2, an insulator layer 3, a light emitting layer 4, an insulator layer 3, etc.
and a back electrode 5 are sequentially laminated.
同図に示すように、発光体層4は2次元的連続層である
ため、透明電極2と背面電極5が対向する発光領域以外
おるいは非選択領域にも発光が認められる。この光の散
乱が原因となってコントラストが低下する。As shown in the figure, since the light-emitting layer 4 is a two-dimensional continuous layer, light emission is observed in areas other than the light-emitting area where the transparent electrode 2 and the back electrode 5 face each other, or in non-selected areas. This scattering of light causes a decrease in contrast.
(2)透明電極2のパターンが形成された上に発光体層
4が設けられるため、電極端部に電界が集中し、発光体
層4の中を貫通する絶縁破壊が起り易い。(2) Since the light-emitting layer 4 is provided on the patterned transparent electrode 2, the electric field is concentrated at the electrode end, and dielectric breakdown that penetrates the light-emitting layer 4 is likely to occur.
[発明の目的]
本発明はかかる点に対処してなされたもので、発光体層
の光の散乱を防止してコントラストを向上するとともに
耐電圧を高めた薄膜EL表示素子、特にMIS型薄膜E
L表示素子を提供しようとするものである。[Object of the Invention] The present invention has been made in view of the above-mentioned problems, and is directed to a thin film EL display element, particularly an MIS type thin film E, which prevents light scattering in the light emitting layer to improve contrast and withstand voltage.
The present invention aims to provide an L display element.
[発明の概要]
本発明の上記目的は、透明基板上に形成する透明電極と
透明電極上に形成する発光体層を同一のパターンに形成
することにより、また前記パターンの溝部分を光吸収姓
のある絶縁体で充填することにより達せられる。[Summary of the Invention] The above object of the present invention is to form a transparent electrode formed on a transparent substrate and a light emitter layer formed on the transparent electrode in the same pattern, and also to form grooves of the pattern into a light absorbing layer. This can be achieved by filling it with a certain amount of insulator.
[発明の実施例]
以下、図面に示す一実施例について本発明の詳細な説明
する。なお、全図面において、同一部分については同一
符号を付記しておる。[Embodiment of the Invention] The present invention will be described in detail below with reference to an embodiment shown in the drawings. In addition, in all the drawings, the same parts are denoted by the same reference numerals.
第1図は、本発明の一実施例の断面構造を示すもので、
ガラス基板等の透明基板1上にITOの透明電極2が所
定のパターンに形成されており、その上に透明電極2と
同一のパターンのzns :Mnの発光体層4が形成さ
れている。更に上記パターンの凹部を埋めるように、光
学ハンドキャップがおよそ28V以下となるような×の
値を有するS! C+ から成る黒色絶縁体層6が
形成され、その上に例えばBaT!03又はPbTiO
3等の強誘電体からなる絶縁体層3及びA℃電極即ち背
面電極5が順次積層されている。なお、第1図中の点A
及び比較のために従来のMIS構造の断面を示す第3図
中の点Bは、それぞれ最も電界が集中する場所を示す。FIG. 1 shows a cross-sectional structure of an embodiment of the present invention.
A transparent electrode 2 made of ITO is formed in a predetermined pattern on a transparent substrate 1 such as a glass substrate, and a light emitting layer 4 made of zns:Mn in the same pattern as the transparent electrode 2 is formed thereon. Furthermore, S! having a value of x such that the optical hand cap is approximately 28V or less is filled in the recessed portion of the pattern. A black insulator layer 6 of C+ is formed on which is formed, for example BaT! 03 or PbTiO
An insulator layer 3 made of a ferroelectric material such as No. 3 and an A° C. electrode, that is, a back electrode 5 are sequentially laminated. Note that point A in Figure 1
Point B in FIG. 3, which shows a cross section of a conventional MIS structure for comparison, indicates the location where the electric field is most concentrated.
本実施例の構造では、ZnS:Mnの絶縁性を有する発
光体層4がITO膜を所定の電極パターンに形成すると
き、同時に同じパターンに形成されるので、点Aにおけ
る電界の集中度は、第3図に示す従来のMIS構造にお
ける点Bでのそれよりはるかに軽減される。また、第1
図に示す構造では、ZnS:Mnの発光体層4がカスケ
ード状になっており、ITO電極間に存在する溝部分が
5ixC+xの黒色絶縁体6で埋められているため、選
択ラインの発光が非選択ラインに漏れることはない。特
に、ITO電極の配設方向に対し直交する方向に伝播し
ていく光は、従来構造においては、高反射率のAI背面
電極5面で反射するため、この方向のハレーションは大
であるが、本実施例の構造によれば、これが全く認めら
れず、全体として光の散乱は著しく軽減された。In the structure of this embodiment, when the ITO film is formed into a predetermined electrode pattern, the light emitting layer 4 having an insulating property of ZnS:Mn is formed in the same pattern at the same time, so the degree of concentration of the electric field at point A is The reduction is much greater than that at point B in the conventional MIS structure shown in FIG. Also, the first
In the structure shown in the figure, the ZnS:Mn light emitting layer 4 is in a cascade shape, and the grooves between the ITO electrodes are filled with a black insulator 6 of 5ixC+x, so that the selected line does not emit light. It will not leak into the selection line. In particular, in the conventional structure, light propagating in a direction perpendicular to the direction in which the ITO electrodes are arranged is reflected by the high-reflectivity AI back electrode 5 surface, so halation in this direction is large. According to the structure of this example, this was not observed at all, and light scattering was significantly reduced as a whole.
更に本実施例においては、絶縁体層3として用いた強誘
電体の残留分極により印加電圧を低くすることができる
とともに、ヒステリシス現象を呈するため、メモリ機能
が期待できる。Furthermore, in this example, the applied voltage can be lowered due to the residual polarization of the ferroelectric material used as the insulator layer 3, and since it exhibits a hysteresis phenomenon, a memory function can be expected.
[発明の効果]
以上の説明からも明らかなように、本発明の薄膜EL表
示素子は、選択画素の発光の非選択領域へ漏れを防止す
ることができ、高いコントラストを得ることができる。[Effects of the Invention] As is clear from the above description, the thin film EL display element of the present invention can prevent light emission from selected pixels from leaking to non-selected areas, and can obtain high contrast.
また、透明電極と絶縁性を有する発光体層が一体形成さ
れるため、そのパターンの端部における電界集中を弱め
ることができ、耐電圧を向上することができると共に、
透明電極の抵抗値を下げる手段としてこの電極の膜厚を
厚くすることができるため、容易に大表示容量の薄膜E
L表示素子が実現可能となる。In addition, since the transparent electrode and the insulating light emitter layer are integrally formed, the electric field concentration at the end of the pattern can be weakened, and the withstand voltage can be improved.
As a means of lowering the resistance value of the transparent electrode, the film thickness of this electrode can be increased, so it is easy to create a thin film E with a large display capacity.
It becomes possible to realize an L display element.
第1図は本発明の一実施例の構造を示す断面図、第2図
及び第3図は、従来の薄膜EL表示素子の構造を示す断
面図である。
1・・・・・・・・・透明基板
2・・・・・・・・・透明電極
3・・・・・・・・・絶縁体層
4・・・・・・・・・発光体層
5・・・・・・・・・背面電極
6・・・・・・・・・黒色絶縁体層
出願人 株式会社 東芝
代理人 弁理士 須 山 佐 −
第1図
第2図FIG. 1 is a sectional view showing the structure of an embodiment of the present invention, and FIGS. 2 and 3 are sectional views showing the structure of a conventional thin film EL display element. 1...Transparent substrate 2...Transparent electrode 3...Insulator layer 4...Light emitter layer 5... Back electrode 6... Black insulating layer Applicant Toshiba Corporation Representative Patent attorney Sasu Suyama - Figure 1 Figure 2
Claims (2)
び背面電極を順次積層してなる薄膜EL表示素子におい
て、前記透明電極と前記発光体層は同一のパターンで形
成されてなることを特徴とする薄膜EL表示素子。(1) In a thin film EL display element in which a transparent electrode, a light emitter layer, an insulator layer, and a back electrode are sequentially laminated on a transparent substrate, the transparent electrode and the light emitter layer are formed in the same pattern. A thin film EL display element characterized by:
で充填されてなることを特徴とする特許請求の範囲第1
項記載の薄膜EL表示素子。(2) The concave portion of the pattern is filled with a light-absorbing insulator.
Thin film EL display element as described in .
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60274582A JPS62133696A (en) | 1985-12-05 | 1985-12-05 | Thin film el display device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60274582A JPS62133696A (en) | 1985-12-05 | 1985-12-05 | Thin film el display device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS62133696A true JPS62133696A (en) | 1987-06-16 |
Family
ID=17543752
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60274582A Pending JPS62133696A (en) | 1985-12-05 | 1985-12-05 | Thin film el display device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62133696A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20030044565A (en) * | 2001-11-30 | 2003-06-09 | 오리온전기 주식회사 | Organic light emitting diode having black matrix and manufacturing method thereof |
-
1985
- 1985-12-05 JP JP60274582A patent/JPS62133696A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20030044565A (en) * | 2001-11-30 | 2003-06-09 | 오리온전기 주식회사 | Organic light emitting diode having black matrix and manufacturing method thereof |
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