JPS62123538U - - Google Patents

Info

Publication number
JPS62123538U
JPS62123538U JP1125686U JP1125686U JPS62123538U JP S62123538 U JPS62123538 U JP S62123538U JP 1125686 U JP1125686 U JP 1125686U JP 1125686 U JP1125686 U JP 1125686U JP S62123538 U JPS62123538 U JP S62123538U
Authority
JP
Japan
Prior art keywords
light
measured
emitting element
holder
receiving elements
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1125686U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1125686U priority Critical patent/JPS62123538U/ja
Publication of JPS62123538U publication Critical patent/JPS62123538U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP1125686U 1986-01-29 1986-01-29 Pending JPS62123538U (enExample)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1125686U JPS62123538U (enExample) 1986-01-29 1986-01-29

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1125686U JPS62123538U (enExample) 1986-01-29 1986-01-29

Publications (1)

Publication Number Publication Date
JPS62123538U true JPS62123538U (enExample) 1987-08-05

Family

ID=30798302

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1125686U Pending JPS62123538U (enExample) 1986-01-29 1986-01-29

Country Status (1)

Country Link
JP (1) JPS62123538U (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010151527A (ja) * 2008-12-24 2010-07-08 Internatl Business Mach Corp <Ibm> ムラ評価装置、ムラ評価方法、ディスプレイ検査装置、およびプログラム

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6049238A (ja) * 1983-08-30 1985-03-18 Nec Corp 発光素子の指向角測定装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6049238A (ja) * 1983-08-30 1985-03-18 Nec Corp 発光素子の指向角測定装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010151527A (ja) * 2008-12-24 2010-07-08 Internatl Business Mach Corp <Ibm> ムラ評価装置、ムラ評価方法、ディスプレイ検査装置、およびプログラム
US8368750B2 (en) 2008-12-24 2013-02-05 International Business Machines Corporation Non-uniformity evaluation apparatus, non-uniformity evaluation method, and display inspection apparatus and program

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