JPS62116775A - Plasma cvd device - Google Patents

Plasma cvd device

Info

Publication number
JPS62116775A
JPS62116775A JP25483885A JP25483885A JPS62116775A JP S62116775 A JPS62116775 A JP S62116775A JP 25483885 A JP25483885 A JP 25483885A JP 25483885 A JP25483885 A JP 25483885A JP S62116775 A JPS62116775 A JP S62116775A
Authority
JP
Japan
Prior art keywords
plasma
cavity resonator
forming gas
substrate
film forming
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP25483885A
Other languages
Japanese (ja)
Inventor
Toru Den
透 田
Masao Sugata
菅田 正夫
Noriko Kurihara
栗原 紀子
Hiroyuki Sugata
裕之 菅田
Kenji Ando
謙二 安藤
Osamu Kamiya
神谷 攻
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP25483885A priority Critical patent/JPS62116775A/en
Publication of JPS62116775A publication Critical patent/JPS62116775A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To improve energy application and th rate of forming thin films by using a cavity resonator having a movable short-circuiting plate for plasma generation. CONSTITUTION:The cavity resonator 2 is used for plasma generation. A non-film forming gas is converted to plasma when the non-film forming gas is introduced into the cavity resonator 2 and microwaves are applied thereto. The plasma is released from the cavity resonator 2. The electrons in the plasma are accelerated by the diverging magnetic field of a ceramic coil 3 and is directed toward a substrate 9. A film forming gas is decomposed by contacting the activated plasma when the film forming gas is supplied just before the substrate 9; at the same time, the film forming gas collides against the substrate 9 and deposits the thin film on the substrate 9. The impedance matching of a waveguide 6 for the microwaves and the cavity resonator 2 is controlled to an optimum state at all times by vertically moving the short-circuiting plate 4 of the cavity resonator 2. The reaction conditions of a plasma CVD device are thereby adjusted to the optimum conditions.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、薄膜形成に用いられるCVD  (化学的気
相成長)装置に関し、特にプラズマCVD装置に関する
ものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to a CVD (chemical vapor deposition) apparatus used for forming thin films, and particularly to a plasma CVD apparatus.

本明細書において、粒子とは、ラジカル、イオン、原T
、分子、超微粒子等の励起活性種をいう。また、ビーム
とは、流れ方向に断面積がほぼ一定の噴流のことをいい
、その断面形状は問わないものである。
In this specification, particles include radicals, ions, and
, molecules, ultrafine particles, and other excited active species. In addition, a beam refers to a jet having a substantially constant cross-sectional area in the flow direction, and its cross-sectional shape is not limited.

[従来の技術] 従来、薄膜形成に用いられてきた高周波プラズマCVD
装置は、反応室内に薄膜の元となる成膜ガス(原料ガス
)を送り込み、高周波放電によってプラズマを作り、成
膜ガスを分解するとともに、活性化エネルギーを4えて
反応室内に配置された基体上に薄膜を形成するものであ
った。
[Conventional technology] High-frequency plasma CVD, which has been conventionally used for thin film formation
The device feeds a film-forming gas (raw material gas), which is the source of a thin film, into a reaction chamber, creates plasma by high-frequency discharge, decomposes the film-forming gas, and applies activation energy to the substrate placed in the reaction chamber. It formed a thin film on the surface.

[発明が解決しようとする問題点] しかしながら、従来装置においては、装置の構造L、高
周波放電によるエネルギーを効率よく使うことができな
かった。このため、基体1での薄膜の生成率も悪く、外
部からの加熱を必要としていた。また、成膜反応がプラ
ズマの雰囲気中で行なわれるため、反応室の内壁面にも
不要な膜が付若してしまうという欠点があった。
[Problems to be Solved by the Invention] However, in the conventional device, due to the structure L of the device, energy generated by high frequency discharge could not be used efficiently. For this reason, the rate of thin film formation on the substrate 1 was poor, and external heating was required. Furthermore, since the film-forming reaction is carried out in a plasma atmosphere, there is a drawback that an unnecessary film is also deposited on the inner wall surface of the reaction chamber.

本発明は、エネルギー付午を効率化し、薄膜の生成率を
向上させたプラズマCVD装置を提供することを目的と
するものである。
SUMMARY OF THE INVENTION An object of the present invention is to provide a plasma CVD apparatus that uses energy more efficiently and improves the thin film production rate.

[問題点を解決するためのL段] 本発明は、プラズマの発生に短絡板の移動可能な空胴共
振器を用いたプラズマCVD装置である。
[L stage for solving problems] The present invention is a plasma CVD apparatus that uses a cavity resonator with a movable shorting plate to generate plasma.

本発明における空」→共振器とは、導波管の両端を導体
で短絡したものであり、石英板を介してマイクロ波を付
テすることによって内部を共振状態とし、プラズマを発
生するようにしたものである。本発明に用いられる空胴
共振器は、片方の短絡板を移動可能とし、内部容量を可
変としたものであり、インピーダンス整合をとることが
できる。また、プラズマとなる非成膜ガスは空胴共振器
内に送り込まれ、反応ガスとなる成膜ガスは空胴共振器
の出口近傍で供給される。
In the present invention, a resonator is a waveguide whose both ends are short-circuited with a conductor, and by applying microwaves through a quartz plate, the inside becomes resonant and plasma is generated. This is what I did. In the cavity resonator used in the present invention, one of the shorting plates is movable and the internal capacitance is variable, so that impedance matching can be achieved. Further, a non-film-forming gas that becomes plasma is sent into the cavity resonator, and a film-forming gas that becomes a reaction gas is supplied near the outlet of the cavity resonator.

[作 用] 空胴共振器内に順次送り込まれる非成膜ガスは、マイク
ロ波によって励起されプラズマとなる。このプラズマガ
スが出口から放出される時に、空胴共振器あ出口近傍か
ら成膜ガスが供給される。この結果、成膜ガスは活性化
したプラズマガスと接触して分解され、基体に到達した
時にこの成膜ガスの粒子は基体上で再結合し、薄膜が堆
積される。
[Function] The non-film forming gas that is sequentially fed into the cavity resonator is excited by the microwave and becomes plasma. When this plasma gas is discharged from the outlet, a film forming gas is supplied from the vicinity of the cavity resonator outlet. As a result, the film-forming gas comes into contact with the activated plasma gas and is decomposed, and when it reaches the substrate, the particles of this film-forming gas recombine on the substrate, depositing a thin film.

[実施例] 第1図は本発明の一実施例を示すプラズマCVD装置の
概略構成図である。図中、lはプラズマCVD装置、2
は空胴共振器、3は磁場発生器となる磁気コイル、9は
基体である。
[Example] FIG. 1 is a schematic diagram of a plasma CVD apparatus showing an example of the present invention. In the figure, l is a plasma CVD device, 2
3 is a cavity resonator, 3 is a magnetic coil serving as a magnetic field generator, and 9 is a base body.

第1図において、空胴共振器2には非成膜ガス供給管7
が設けられ、出口近傍には、磁気コイル3が配置され、
この磁気コイル3と基体9との間には、成膜ガス供給管
8が設けられている。一方、マイクロ波は導波管6によ
り運ばれ、石英板5を介して空胴共振器z内に送られる
In FIG. 1, a non-film forming gas supply pipe 7 is provided in the cavity resonator 2.
is provided, and a magnetic coil 3 is arranged near the outlet,
A film forming gas supply pipe 8 is provided between the magnetic coil 3 and the base 9. On the other hand, the microwave is carried by the waveguide 6 and sent into the cavity resonator z via the quartz plate 5.

本実施例における磁場発生器は、外部電源により励磁さ
れる磁気コイルであるが、その外に永久磁石等を用いる
ことができる。この磁気コイルは、空胴共振器2内で発
生したプラズマを発散磁界により引き出すために用いら
れる。
The magnetic field generator in this embodiment is a magnetic coil excited by an external power source, but a permanent magnet or the like may also be used. This magnetic coil is used to draw out the plasma generated within the cavity resonator 2 using a divergent magnetic field.

また、本実施例における空調共振器の短絡板4は、図に
示すようにチョーク構造となっている。
Further, the shorting plate 4 of the air conditioning resonator in this embodiment has a choke structure as shown in the figure.

これは、短絡板4を移動可能とした場合、短絡板4と空
胴共振器2との接続部に壁面電流が流れ。
This is because when the shorting plate 4 is made movable, a wall current flows through the connection between the shorting plate 4 and the cavity resonator 2.

損失が大きくなるためであり、このようなチョーク構造
とすることによって、壁面電流による損失をできるだけ
少なくすることができる。
This is because the loss increases, and by using such a choke structure, the loss due to the wall current can be minimized.

上記構成において、非成膜ガスを空胴共振器2内に送り
込むとともに、マイクロ波をかえると、非成膜ガスはプ
ラズマとなり空胴共振器2から放出される。このプラズ
マ中の電子は、磁気コイル3の発散磁界によって加速さ
れ、基体に向う。この電子の動きに伴ってイオンも引き
ずられるように基体に向う。この時、基体の直前から成
膜ガスを供給すると、成膜ガスは活性化したプラズマガ
スと接触して分解する。同時に成膜ガスはプラズマガス
とともに基体9に衝突する。この基体上において1分解
された成膜ガスは再結合し、薄膜となって堆積する。
In the above configuration, when the non-film forming gas is sent into the cavity resonator 2 and the microwave is changed, the non-film forming gas becomes plasma and is emitted from the cavity resonator 2. Electrons in this plasma are accelerated by the divergent magnetic field of the magnetic coil 3 and move toward the substrate. Along with this movement of electrons, ions are also dragged toward the substrate. At this time, when a film-forming gas is supplied from just before the substrate, the film-forming gas comes into contact with the activated plasma gas and decomposes. At the same time, the film forming gas collides with the substrate 9 together with the plasma gas. The decomposed film-forming gas is recombined on this substrate and deposited as a thin film.

上記実施例において、空胴共振器2の短絡板4を上下に
移動することによって、導波管と空胴共振器とのインピ
ーダンス整合は常に最適状態となるよう制御される。
In the above embodiment, by moving the shorting plate 4 of the cavity resonator 2 up and down, the impedance matching between the waveguide and the cavity resonator is always controlled to be in the optimum state.

[発明の効果] 以上説明したように1本発明によれば空胴共振器にプラ
ズマ発生室として用いることにより、マイクロ波のエネ
ルギーを効率よくかえることができ、外部から熱を加え
ることなく低温で膜の生成を行うことができる。また、
成膜ガスが基体の直前で供給されるので、より多くの粒
子(ラジカル、イオン、原子、分子等)を基体りに集め
ることができる。
[Effects of the Invention] As explained above, according to the present invention, by using a cavity resonator as a plasma generation chamber, it is possible to efficiently change the energy of microwaves, and to generate heat at low temperatures without applying heat from the outside. Film production can be performed. Also,
Since the film forming gas is supplied just before the substrate, more particles (radicals, ions, atoms, molecules, etc.) can be collected on the substrate.

特に1本発明における空胴共振器は、短絡板が移動可能
であるため、導波管と空胴共振器とのインピーダンス整
合を容易に調整することができ、反応条件を常に最適な
状態に合わせることができる。
In particular, in the cavity resonator according to the present invention, since the shorting plate is movable, the impedance matching between the waveguide and the cavity resonator can be easily adjusted, and the reaction conditions are always adjusted to the optimum state. be able to.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例を示す装置の概略構成図であ
る。 2・・・空胴共振器、3・・・磁気コイル、4・・・短
絡板、6・・・導波管、9・・・基体。
FIG. 1 is a schematic diagram of an apparatus showing an embodiment of the present invention. 2... Cavity resonator, 3... Magnetic coil, 4... Short circuit plate, 6... Waveguide, 9... Substrate.

Claims (1)

【特許請求の範囲】[Claims] 1)短絡板の調節可能な空胴共振器を有することを特徴
とするプラズマCVD装置。
1) A plasma CVD apparatus characterized by having a cavity resonator with an adjustable shorting plate.
JP25483885A 1985-11-15 1985-11-15 Plasma cvd device Pending JPS62116775A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25483885A JPS62116775A (en) 1985-11-15 1985-11-15 Plasma cvd device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25483885A JPS62116775A (en) 1985-11-15 1985-11-15 Plasma cvd device

Publications (1)

Publication Number Publication Date
JPS62116775A true JPS62116775A (en) 1987-05-28

Family

ID=17270555

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25483885A Pending JPS62116775A (en) 1985-11-15 1985-11-15 Plasma cvd device

Country Status (1)

Country Link
JP (1) JPS62116775A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4908330A (en) * 1988-02-01 1990-03-13 Canon Kabushiki Kaisha Process for the formation of a functional deposited film containing group IV atoms or silicon atoms and group IV atoms by microwave plasma chemical vapor deposition process
US4908329A (en) * 1988-02-01 1990-03-13 Canon Kabushiki Kaisha Process for the formation of a functional deposited film containing groups II and VI atoms by microwave plasma chemical vapor deposition process
US4914052A (en) * 1988-02-01 1990-04-03 Canon Kabushiki Kaisha Process for the formation of a functional deposited film containing groups III and V atoms by microwave plasma chemical vapor deposition process
JPH03193880A (en) * 1989-08-03 1991-08-23 Mikakutou Seimitsu Kogaku Kenkyusho:Kk Method and device for forming film at high rate by microwave plasma cvd under high pressure

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4908330A (en) * 1988-02-01 1990-03-13 Canon Kabushiki Kaisha Process for the formation of a functional deposited film containing group IV atoms or silicon atoms and group IV atoms by microwave plasma chemical vapor deposition process
US4908329A (en) * 1988-02-01 1990-03-13 Canon Kabushiki Kaisha Process for the formation of a functional deposited film containing groups II and VI atoms by microwave plasma chemical vapor deposition process
US4914052A (en) * 1988-02-01 1990-04-03 Canon Kabushiki Kaisha Process for the formation of a functional deposited film containing groups III and V atoms by microwave plasma chemical vapor deposition process
JPH03193880A (en) * 1989-08-03 1991-08-23 Mikakutou Seimitsu Kogaku Kenkyusho:Kk Method and device for forming film at high rate by microwave plasma cvd under high pressure

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