JPS6211001Y2 - - Google Patents

Info

Publication number
JPS6211001Y2
JPS6211001Y2 JP1982128528U JP12852882U JPS6211001Y2 JP S6211001 Y2 JPS6211001 Y2 JP S6211001Y2 JP 1982128528 U JP1982128528 U JP 1982128528U JP 12852882 U JP12852882 U JP 12852882U JP S6211001 Y2 JPS6211001 Y2 JP S6211001Y2
Authority
JP
Japan
Prior art keywords
wafer
facet
arms
vacuum chamber
turntable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1982128528U
Other languages
Japanese (ja)
Other versions
JPS5933248U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP12852882U priority Critical patent/JPS5933248U/en
Publication of JPS5933248U publication Critical patent/JPS5933248U/en
Application granted granted Critical
Publication of JPS6211001Y2 publication Critical patent/JPS6211001Y2/ja
Granted legal-status Critical Current

Links

Description

【考案の詳細な説明】 本考案は真空室内に於てシリコンその他のウエ
ハを一定方向に揃えるに適したウエハのフアセツ
ト合せ装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a wafer face alignment device suitable for aligning silicon or other wafers in a fixed direction in a vacuum chamber.

従来同一の真空室内に成膜装置及びエツチング
装置等のウエハ処理装置の複数組を設け、該真空
室内に送り込まれたウエハに順次各装置による処
理を施すようにしたものが知られるが、該ウエハ
に対する処理条件をその処理後に解析出来ること
が望ましく、そのためには真空室内に供給された
ウエハをその室内に於て一定方向に揃えることが
必要となる。
Conventionally, it is known that multiple sets of wafer processing equipment, such as film forming equipment and etching equipment, are installed in the same vacuum chamber, and the wafers sent into the vacuum chamber are sequentially processed by each equipment. It is desirable to be able to analyze the processing conditions for the wafer after the processing, and for this purpose it is necessary to align the wafers supplied into the vacuum chamber in a certain direction within the chamber.

本考案はかかる必要を満足することを目的とし
たもので、真空室1内にフアセツト2aを備えた
略円形のウエハ2を載置して昇降と回転自在のテ
ーブル3を設け、該テーブル3の外周に該ウエハ
2の周縁2bを押圧する開閉自在のアーム4,4
と、該フアセツト2aを介しての光線を受光して
該テーブル3の回転を停止させる2組のセンサ
5,5を設けて成る。
The present invention aims to satisfy this need, and includes a vacuum chamber 1 in which a substantially circular wafer 2 with a facet 2a is placed, and a table 3 that can be raised and lowered and rotated freely. Openable and closable arms 4, 4 that press the peripheral edge 2b of the wafer 2 on the outer periphery
Two sets of sensors 5, 5 are provided for receiving the light beam passing through the facet 2a and stopping the rotation of the table 3.

設け、各アーム4,4は真空室1と一体のベー
スブラケツト22のピン23に揺動自在に取付け
られ、これらアーム4,4の後端に捲回して設け
たワイヤ24がロータリアクチユエータ34によ
り正逆回転する捲取ローラ25で捲取られると各
アーム4,4はばね26,26に抗して閉じ側に
揺動するようにしたことを特徴とする。
Each arm 4, 4 is swingably attached to a pin 23 of a base bracket 22 integral with the vacuum chamber 1, and a wire 24 wound around the rear end of these arms 4, 4 connects to a rotary actuator 34. Each arm 4, 4 swings toward the closing side against springs 26, 26 when it is rolled up by a winding roller 25 which rotates in forward and reverse directions.

第1図はその1例を示すもので、真空室1内に
はクリーニング用RF電極6を備えたクリーニン
グ装置7とエツチング用RF電極8を備えたエツ
チング装置9とが設けられ、ウエハ2は該室1内
のターンテーブル10に載せられて各装置7,9
の処理位置へ移送される。該ウエハ2は略円形で
その一部にフアセツト2aを備え、該真空室1の
側方の1対のカセツト装置35,35の一方から
コンベア状の搬送装置11aとフアセツト合せ装
置12を介してターンテーブル10上に送り出さ
れ、或は該ターンテーブル10上から収容リフト
装置13及び搬送装置11bを介して他方のカセ
ツト装置35に収容される。14は該ターンテー
ブル10の複数個所に形成された透孔で、各透孔
14の1側に長孔15を介して連通するウエハ2
よりも小径の小孔16を設けるようにした。フア
セツト合せ装置12のテーブル3は円形に形成さ
れ、真空室1の底部1aに固定の軸受部17を介
して挿通したシリンダ18とモータ19とにより
昇降回転自在の支軸20で支承されるものとし、
該支軸20の一部をスプライン軸20aに構成し
てモータ19の回転が伝達されるようにした。該
テーブル3はターンテーブル10の下方に位置し
て設けた搬送装置11aのさらに下方からシリン
ダ18で上昇し、その上昇に際して該搬送装置1
1a上のウエハ2を載せ、ターンテーブル10の
透孔14を介して上方のフアセツト合め装置まで
上昇するが、該フアセツト合せ位置に於て該テー
ブル3の回転中心にウエハ2の中心を合致させる
べく前記アーム4,4が揺動し、さらにテーブル
3が1対のセンサ5,5の位置にフアセツト2a
が位置するまでモータ19により回転する。これ
を更に説明すれば、各アーム4,4はその先端に
テーブル3の外周に一致した円弧状部21aとウ
エハ2の周縁2bを押す略円形の突縁21bとを
有するウエハ受皿21を備え、真空室1と一体の
ベースブラケツト22のピン23に揺動自在に取
付けられるもので、これらアーム4,4の後端に
捲回して設けたワイヤ24が捲取ローラ25によ
り捲取られると各アーム4,4はばね26,26
に抗して閉じ側に揺動し、この場合ウエハ受皿2
1の当接部21aがテーブル3に当接するのでウ
エハ2をアーム4,4で挟圧破損することなくテ
ーブル3の回転中心位置に移動させ得る。また各
センサ5は例えば第4図示のように投光器5aと
受光器5bで構成され、1対のセンサ5は真空室
1の外部のシリンダ27で出没作動する腕杵28
の先端に多少の間隔を存して並設されるもので、
該腕杵28は前記したアーム4,4によるウエハ
2とテーブル3の回転中心の合致作動が終ると突
出して各センサ5の投受光器5a,5b間にウエ
ハ2を介在させる。そしてこれと同時にモータ1
9がテーブル3を回転すべく作動するがウエハ2
のフアセツト2aが両センサ5,5下に来てその
光線がウエハ2に遮ぎられることなく検知される
に至るとモータ19にはその回転を停止させる信
号が発せられ、かくてウエハ2はそのフアセツト
2aを両センサ5,5下に位置して止る。34は
捲取ローラ25を正逆転するロータリアクチユエ
ータ、29,30は各電極6,8と対向すべくタ
ーンテーブル10の透孔14を介して上下に出没
自在の基板電極、31,32は各電極29,30
内に上下に出没自在であると共にターンテーブル
10の小孔16を通過し得る大きさを有するウエ
ハホルダ、33は真空室1外のインデツクスドラ
イブを備えたターンテーブル10の駆動源であ
る。
FIG. 1 shows one example, in which a cleaning device 7 equipped with a cleaning RF electrode 6 and an etching device 9 equipped with an etching RF electrode 8 are provided in the vacuum chamber 1, and the wafer 2 is Each device 7, 9 is mounted on a turntable 10 in the chamber 1.
transported to the processing location. The wafer 2 is approximately circular and has a facet 2a in a part thereof, and is turned from one of a pair of cassette devices 35, 35 on the side of the vacuum chamber 1 via a conveyor-like transfer device 11a and a facet alignment device 12. The cassettes are delivered onto the table 10, or are received from the turntable 10 into the other cassette device 35 via the storage lift device 13 and the transport device 11b. Reference numeral 14 indicates through holes formed at a plurality of locations in the turntable 10, and the wafer 2 is connected to one side of each through hole 14 via a long hole 15.
A small hole 16 having a smaller diameter than the above is provided. The table 3 of the facet alignment device 12 is formed in a circular shape, and is supported by a support shaft 20 that can be rotated up and down by a cylinder 18 inserted into the bottom 1a of the vacuum chamber 1 via a fixed bearing 17 and a motor 19. ,
A part of the support shaft 20 is configured as a spline shaft 20a so that the rotation of the motor 19 is transmitted. The table 3 is raised by a cylinder 18 from further below the conveying device 11a provided below the turntable 10, and as it rises, the conveying device 1
The wafer 2 is placed on the wafer 1a and ascends through the through hole 14 of the turntable 10 to the facet alignment device above, and at the facet alignment position, the center of the wafer 2 is aligned with the center of rotation of the table 3. The arms 4, 4 swing to move the table 3 facet 2a to the position of the pair of sensors 5, 5.
is rotated by the motor 19 until it is located. To explain this further, each arm 4, 4 is equipped with a wafer tray 21 having at its tip an arcuate portion 21a that matches the outer circumference of the table 3 and a substantially circular protrusion 21b that presses the peripheral edge 2b of the wafer 2. It is swingably attached to a pin 23 of a base bracket 22 that is integrated with the vacuum chamber 1, and when the wire 24 wound around the rear ends of these arms 4, 4 is wound up by a winding roller 25, each arm 4, 4 are springs 26, 26
In this case, the wafer tray 2
Since the contact portion 21a of the wafer 1 contacts the table 3, the wafer 2 can be moved to the rotation center position of the table 3 without being pinched by the arms 4, 4 and damaged. Further, each sensor 5 is composed of a light emitter 5a and a light receiver 5b, for example, as shown in the fourth figure, and a pair of sensors 5 is connected to an arm punch 28 which is moved in and out by a cylinder 27 outside the vacuum chamber 1.
They are placed side by side with some distance at the tip of the
The arm punch 28 protrudes after the arms 4, 4 have finished aligning the rotation centers of the wafer 2 and the table 3, and interposes the wafer 2 between the light emitters and receivers 5a, 5b of each sensor 5. At the same time, motor 1
9 operates to rotate table 3, but wafer 2
When the facet 2a of the wafer 2a comes under both sensors 5, 5 and its light beam is detected without being blocked by the wafer 2, a signal is sent to the motor 19 to stop its rotation, and the wafer 2 is thus The facet 2a is positioned below both sensors 5, 5 and stopped. 34 is a rotary actuator that rotates the winding roller 25 in the forward and reverse directions; 29 and 30 are substrate electrodes that can be vertically retracted through the through holes 14 of the turntable 10 to face the respective electrodes 6 and 8; Each electrode 29, 30
A wafer holder 33, which can move up and down inside the vacuum chamber 10 and is large enough to pass through the small hole 16 of the turntable 10, is a drive source for the turntable 10 provided with an index drive outside the vacuum chamber 1.

本考案装置の作動を説明すると、搬送装置11
aでカセツト装置35からフアセツト2bを備え
たウエハ2が送り出されると、下方に待機するテ
ーブル3が上昇してその上にウエハ2を載せ、さ
らにターンテーブル10の透孔14を介してフア
セツト合せ位置まで上昇する。テーブル3がこの
位置に達するとローラ25が回動してアーム4,
4が閉じ側に揺動し、ウエハ2はその周縁2bを
突縁21bで押されてテーブル3の回転中心に位
置すべく移動する。続いてアーム4,4は開かれ
センサ5,5が腕杵28によりウエハ2の周縁2
bに臨むべく突出すると同時にモータ19でテー
ブル3が回転するが、フアセツト2aが両センサ
5,5の光線を共に遮ぎることのない位置に来る
とモータ19の停止信号が出されてその位置にウ
エハ2は停止する。このあと腕杵28は退去し、
さらにターンテーブル10が多少施回して小孔1
6内に支軸20が位置するとテーブル3は該小孔
16を介して下降し、この下降の際に該小孔16
よりも大径のウエハ2はターンテーブル10上に
方向を一定として載置される。該小孔16上のウ
エハ2はターンテーブル10の旋回で電極6の下
方へ送られ、そこで下方から上昇するウエハホル
ダ31で持ち上げ、ターンテーブル10が電極6
の下方に透孔14を位置すべく多少旋回すると基
板電極29が該透孔14を介して上昇しウエハ2
にクリーニング処理が施される。その処理終了後
には基板電極29の下降とターンテーブル10の
逆旋回とウエハホルダ31下降とを順次行ない再
びウエハ2をターンテーブル10の原位置に載せ
る。さらに電極8の下方にウエハ2が位置した場
合にもこれと略同様の作動を基板電極30及びウ
エハホルダ32が行ない、エツチング処理が施さ
れる。
To explain the operation of the device of the present invention, the conveying device 11
When the wafer 2 with the facet 2b is sent out from the cassette device 35 at step a, the table 3 waiting below rises, the wafer 2 is placed thereon, and the wafer 2 is placed at the facet alignment position through the through hole 14 of the turntable 10. rises to. When the table 3 reaches this position, the roller 25 rotates and the arm 4,
4 swings toward the closing side, and the wafer 2 is moved to be positioned at the center of rotation of the table 3 with its peripheral edge 2b being pushed by the protruding edge 21b. Subsequently, the arms 4, 4 are opened, and the sensors 5, 5 are attached to the peripheral edge 2 of the wafer 2 by the arm punch 28.
The table 3 is rotated by the motor 19 at the same time as the facet 2a protrudes to face the sensor 5, but when the facet 2a comes to a position where it does not block the light beams of both sensors 5, a stop signal for the motor 19 is issued and the table 3 is rotated at that position. Wafer 2 stops. After this, Armsuki 28 left,
Furthermore, the turntable 10 is rotated a little and the small hole 1
When the spindle 20 is located inside the small hole 16, the table 3 is lowered through the small hole 16, and during this descent, the table 3 is lowered through the small hole 16.
A wafer 2 having a larger diameter than the wafer 2 is placed on the turntable 10 in a constant direction. The wafer 2 on the small hole 16 is sent below the electrode 6 by the rotation of the turntable 10, where it is lifted by the wafer holder 31 rising from below, and the turntable 10
When the substrate electrode 29 is rotated slightly to position the through hole 14 below the wafer 2, the substrate electrode 29 rises through the through hole 14, and the wafer 2
A cleaning process is applied to the After the processing is completed, the substrate electrode 29 is lowered, the turntable 10 is rotated backwards, and the wafer holder 31 is lowered in this order, and the wafer 2 is again placed on the turntable 10 at its original position. Further, when the wafer 2 is located below the electrode 8, the substrate electrode 30 and the wafer holder 32 perform substantially the same operation as described above, and the etching process is performed.

処理の終えたウエハ2が収容リフト装置13の
上方に移動するとウエハ2は該装置13の上昇で
ターンテーブル10の上方に持ち上げられ、その
下方に透孔14が位置するように該ターンテーブ
ル10が旋回したとき該装置13は下降しその際
搬送装置11bはウエハ2を受取りカセツト装置
35内に収容する。
When the processed wafer 2 is moved above the accommodation lift device 13, the wafer 2 is lifted above the turntable 10 by the lifting of the device 13, and the turntable 10 is moved so that the through hole 14 is located below the wafer 2. When pivoted, the device 13 is lowered, and the transfer device 11b receives the wafer 2 and stores it in the receiving cassette device 35.

以上のように本考案によるときは、真空室1内
に昇降、回転自在のテーブル3を設け、その外周
の開閉自在のアーム4,4で該テーブル3の回転
中心にウエハ2を位置させると共に1対のセンサ
5,5でフアセツト2aの位置を知りテーブル3
の回転を止めるもので、これによれば真空室1内
に於てウエハ2の方向を自動的に揃えることが出
来、その構成も比較的簡単で真空性の維持が容易
であり、真空室1内に歯車等の塵芥発生源がない
ので内部の清浄を保ち得、テーブル3の外周にア
ーム4,4とセンサ5,5を配置するので装置の
上下寸法を小さく出来、比較的手狭な真空室1に
設備するに好都合である等の効果がある。
As described above, according to the present invention, a table 3 that can be raised and lowered and rotated is provided in a vacuum chamber 1, and the wafer 2 is positioned at the center of rotation of the table 3 using the arms 4, 4 that can be opened and closed on the outer periphery. The position of the facet 2a is known by the pair of sensors 5, 5, and the table 3
According to this, the direction of the wafer 2 can be automatically aligned in the vacuum chamber 1, and its structure is relatively simple and it is easy to maintain the vacuum property. Since there are no sources of dust such as gears inside, the interior can be kept clean, and since the arms 4, 4 and sensors 5, 5 are arranged around the outer periphery of the table 3, the vertical dimensions of the device can be reduced, allowing for a relatively small vacuum chamber. It has the advantage that it is convenient to install it in 1.

さらに本考案によるときは、ロータリアクチユ
エータ34の回転力をワイヤ24で各アーム4,
4に伝達することによりアーム4,4をばね2
6,26に抗して閉じ側に揺動するようにしたの
で、アーム4,4を動かす手段が簡単となる効果
がある。
Further, according to the present invention, the rotational force of the rotary actuator 34 is transferred to each arm 4,
4, the arms 4, 4 are connected to the spring 2.
Since the arms 4, 26 are swung toward the closing side in opposition to the arms 4, 26, the means for moving the arms 4, 4 can be simplified.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案装置の全体斜視図、第2図はそ
の要部の斜視図、第3図はその平面図、第4図は
センサの拡大斜視図である。 1……真空室、2……ウエハ、2a……フアセ
ツト、2b……周縁、3……テーブル、4,4…
…アーム、5,5……センサ、22……ベースブ
ラケツト、23……ピン、24……ワイヤ、25
……捲取ローラ、26……ばね、34……ロータ
リアクチユエータ。
FIG. 1 is an overall perspective view of the device of the present invention, FIG. 2 is a perspective view of its essential parts, FIG. 3 is a plan view thereof, and FIG. 4 is an enlarged perspective view of the sensor. 1...Vacuum chamber, 2...Wafer, 2a...Facet, 2b...Periphery, 3...Table, 4, 4...
...Arm, 5,5...Sensor, 22...Base bracket, 23...Pin, 24...Wire, 25
... winding roller, 26 ... spring, 34 ... rotary actuator.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model claims] 真空室1内にフアセツト2aを備えた略円形の
ウエハ2を載置して昇降と回転自在のテーブル3
を設け、該テーブル3の外周に該ウエハ2の周縁
2bを押圧する開閉自在のアーム4,4と、該フ
アセツト2aを介しての光線を受光して該テーブ
ル3の回転を停止させる2組のセンサ5,5を設
け、各アーム4,4は真空室1と一体のベースブ
ラケツト22のピン23に揺動自在に取付けら
れ、これらアーム4,4の後端に捲回して設けた
ワイヤ24がロータリアクチユエータ34により
正逆回転する捲取ローラ25で捲取られると各ア
ーム4,4はばね26,26に抗して閉じ側に揺
動するようにしたことを特徴とするウエハのフア
セツト合せ装置。
A substantially circular wafer 2 with a facet 2a is placed in a vacuum chamber 1, and a table 3 is movable up and down and rotatable.
and two sets of openable and closable arms 4, 4 which press the peripheral edge 2b of the wafer 2 on the outer periphery of the table 3, and two sets of arms 4, 4 which receive the light beam through the facet 2a and stop the rotation of the table 3. Sensors 5, 5 are provided, each arm 4, 4 is swingably attached to a pin 23 of a base bracket 22 integrated with the vacuum chamber 1, and a wire 24 wound around the rear end of these arms 4, 4 is attached. A wafer facet characterized in that each arm 4, 4 swings toward the closing side against springs 26, 26 when the wafer is wound up by a winding roller 25 which is rotated forward and backward by a rotary actuator 34. Matching device.
JP12852882U 1982-08-27 1982-08-27 Wafer face alignment equipment Granted JPS5933248U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12852882U JPS5933248U (en) 1982-08-27 1982-08-27 Wafer face alignment equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12852882U JPS5933248U (en) 1982-08-27 1982-08-27 Wafer face alignment equipment

Publications (2)

Publication Number Publication Date
JPS5933248U JPS5933248U (en) 1984-03-01
JPS6211001Y2 true JPS6211001Y2 (en) 1987-03-16

Family

ID=30291534

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12852882U Granted JPS5933248U (en) 1982-08-27 1982-08-27 Wafer face alignment equipment

Country Status (1)

Country Link
JP (1) JPS5933248U (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5565445A (en) * 1978-11-13 1980-05-16 Toshiba Corp Positioning device for plate-shaped body

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5749390Y2 (en) * 1977-03-30 1982-10-29
JPS55149951U (en) * 1979-04-16 1980-10-29

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5565445A (en) * 1978-11-13 1980-05-16 Toshiba Corp Positioning device for plate-shaped body

Also Published As

Publication number Publication date
JPS5933248U (en) 1984-03-01

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