JPS62102148A - 塗装膜劣化診断方法 - Google Patents
塗装膜劣化診断方法Info
- Publication number
- JPS62102148A JPS62102148A JP24196685A JP24196685A JPS62102148A JP S62102148 A JPS62102148 A JP S62102148A JP 24196685 A JP24196685 A JP 24196685A JP 24196685 A JP24196685 A JP 24196685A JP S62102148 A JPS62102148 A JP S62102148A
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- impedance
- frequency
- waveform
- current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP24196685A JPS62102148A (ja) | 1985-10-29 | 1985-10-29 | 塗装膜劣化診断方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP24196685A JPS62102148A (ja) | 1985-10-29 | 1985-10-29 | 塗装膜劣化診断方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62102148A true JPS62102148A (ja) | 1987-05-12 |
JPH0528781B2 JPH0528781B2 (fr) | 1993-04-27 |
Family
ID=17082226
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP24196685A Granted JPS62102148A (ja) | 1985-10-29 | 1985-10-29 | 塗装膜劣化診断方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62102148A (fr) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0452071A2 (fr) * | 1990-04-09 | 1991-10-16 | Kabushiki Kaisha Toshiba | Procédé et dispositif pour le diagnostic de la détérioration des films de peinture |
JPH04190149A (ja) * | 1990-04-09 | 1992-07-08 | Toshiba Corp | 塗膜劣化診断装置 |
JPH04218756A (ja) * | 1991-03-29 | 1992-08-10 | Toshiba Corp | 塗膜劣化診断方法 |
US5221893A (en) * | 1990-04-09 | 1993-06-22 | Kabushiki Kaisha Toshiba | Method and device for diagnosis of paint film deterioration |
KR100508877B1 (ko) * | 2002-02-07 | 2005-08-18 | 금호석유화학 주식회사 | 전기화학적 임피던스 스펙트럼 측정 및 분석을 이용한지하매설배관의 피복 손상부 및 부식 위치 탐지 방법 |
EP2275800A3 (fr) * | 2009-07-14 | 2011-03-16 | Mitsubishi Heavy Industries, Ltd. | Appareil de détection de corrosion et structure extérieure |
JP2011102756A (ja) * | 2009-11-11 | 2011-05-26 | Yokogawa Electric Corp | インピーダンス計測方法およびインピーダンス計測装置 |
JP2022063073A (ja) * | 2020-10-09 | 2022-04-21 | 株式会社豊田中央研究所 | 塗膜評価システム |
-
1985
- 1985-10-29 JP JP24196685A patent/JPS62102148A/ja active Granted
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0452071A2 (fr) * | 1990-04-09 | 1991-10-16 | Kabushiki Kaisha Toshiba | Procédé et dispositif pour le diagnostic de la détérioration des films de peinture |
JPH04190149A (ja) * | 1990-04-09 | 1992-07-08 | Toshiba Corp | 塗膜劣化診断装置 |
US5221893A (en) * | 1990-04-09 | 1993-06-22 | Kabushiki Kaisha Toshiba | Method and device for diagnosis of paint film deterioration |
JPH04218756A (ja) * | 1991-03-29 | 1992-08-10 | Toshiba Corp | 塗膜劣化診断方法 |
KR100508877B1 (ko) * | 2002-02-07 | 2005-08-18 | 금호석유화학 주식회사 | 전기화학적 임피던스 스펙트럼 측정 및 분석을 이용한지하매설배관의 피복 손상부 및 부식 위치 탐지 방법 |
EP2275800A3 (fr) * | 2009-07-14 | 2011-03-16 | Mitsubishi Heavy Industries, Ltd. | Appareil de détection de corrosion et structure extérieure |
JP2011102756A (ja) * | 2009-11-11 | 2011-05-26 | Yokogawa Electric Corp | インピーダンス計測方法およびインピーダンス計測装置 |
JP2022063073A (ja) * | 2020-10-09 | 2022-04-21 | 株式会社豊田中央研究所 | 塗膜評価システム |
Also Published As
Publication number | Publication date |
---|---|
JPH0528781B2 (fr) | 1993-04-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |