JPS62100671A - 磁界測定方法 - Google Patents

磁界測定方法

Info

Publication number
JPS62100671A
JPS62100671A JP60240868A JP24086885A JPS62100671A JP S62100671 A JPS62100671 A JP S62100671A JP 60240868 A JP60240868 A JP 60240868A JP 24086885 A JP24086885 A JP 24086885A JP S62100671 A JPS62100671 A JP S62100671A
Authority
JP
Japan
Prior art keywords
probe
magnetic field
axis
sensor
components
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60240868A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0535834B2 (enrdf_load_stackoverflow
Inventor
Hiroaki Kase
加瀬　博昭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Denki Onkyo Co Ltd
Original Assignee
Denki Onkyo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Denki Onkyo Co Ltd filed Critical Denki Onkyo Co Ltd
Priority to JP60240868A priority Critical patent/JPS62100671A/ja
Publication of JPS62100671A publication Critical patent/JPS62100671A/ja
Publication of JPH0535834B2 publication Critical patent/JPH0535834B2/ja
Granted legal-status Critical Current

Links

Classifications

    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10—Energy storage using batteries

Landscapes

  • Measuring Magnetic Variables (AREA)
JP60240868A 1985-10-28 1985-10-28 磁界測定方法 Granted JPS62100671A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60240868A JPS62100671A (ja) 1985-10-28 1985-10-28 磁界測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60240868A JPS62100671A (ja) 1985-10-28 1985-10-28 磁界測定方法

Publications (2)

Publication Number Publication Date
JPS62100671A true JPS62100671A (ja) 1987-05-11
JPH0535834B2 JPH0535834B2 (enrdf_load_stackoverflow) 1993-05-27

Family

ID=17065890

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60240868A Granted JPS62100671A (ja) 1985-10-28 1985-10-28 磁界測定方法

Country Status (1)

Country Link
JP (1) JPS62100671A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6204599B1 (en) 1996-12-25 2001-03-20 Kabushiki Kaisha Toshiba Color cathode ray tube with graded shadow mask apertures
JP2011525980A (ja) * 2008-06-25 2011-09-29 セントル ナショナル デチュード スパシアル （セー．エヌ．エ．エス） 単方向プローブに基づいて電子デバイスを多次元的に試験するための方法及び装置
WO2017098753A1 (ja) * 2015-12-08 2017-06-15 三菱電機株式会社 磁界測定方法、コイル位置修正方法及び磁界測定装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS561370A (en) * 1979-06-18 1981-01-09 Tech Res & Dev Inst Of Japan Def Agency Magnetometer

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS561370A (en) * 1979-06-18 1981-01-09 Tech Res & Dev Inst Of Japan Def Agency Magnetometer

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6204599B1 (en) 1996-12-25 2001-03-20 Kabushiki Kaisha Toshiba Color cathode ray tube with graded shadow mask apertures
JP2011525980A (ja) * 2008-06-25 2011-09-29 セントル ナショナル デチュード スパシアル （セー．エヌ．エ．エス） 単方向プローブに基づいて電子デバイスを多次元的に試験するための方法及び装置
WO2017098753A1 (ja) * 2015-12-08 2017-06-15 三菱電機株式会社 磁界測定方法、コイル位置修正方法及び磁界測定装置
JP6234619B2 (ja) * 2015-12-08 2017-11-22 三菱電機株式会社 磁界測定方法及び磁界測定装置
JPWO2017098753A1 (ja) * 2015-12-08 2017-12-14 三菱電機株式会社 磁界測定方法及び磁界測定装置
US10690732B2 (en) 2015-12-08 2020-06-23 Mitsubishi Electric Corporation Magnetic field measuring method and magnetic field measuring apparatus

Also Published As

Publication number Publication date
JPH0535834B2 (enrdf_load_stackoverflow) 1993-05-27

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Legal Events

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