JPS62100643A - 粒子解析装置 - Google Patents

粒子解析装置

Info

Publication number
JPS62100643A
JPS62100643A JP60241006A JP24100685A JPS62100643A JP S62100643 A JPS62100643 A JP S62100643A JP 60241006 A JP60241006 A JP 60241006A JP 24100685 A JP24100685 A JP 24100685A JP S62100643 A JPS62100643 A JP S62100643A
Authority
JP
Japan
Prior art keywords
flow cell
section
particle analysis
analysis device
laser beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60241006A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0513454B2 (enrdf_load_stackoverflow
Inventor
Shinichi Oe
慎一 大江
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP60241006A priority Critical patent/JPS62100643A/ja
Priority to US06/918,981 priority patent/US4732479A/en
Publication of JPS62100643A publication Critical patent/JPS62100643A/ja
Publication of JPH0513454B2 publication Critical patent/JPH0513454B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Investigating Or Analysing Materials By Optical Means (AREA)
JP60241006A 1985-10-18 1985-10-28 粒子解析装置 Granted JPS62100643A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP60241006A JPS62100643A (ja) 1985-10-28 1985-10-28 粒子解析装置
US06/918,981 US4732479A (en) 1985-10-18 1986-10-15 Particle analyzing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60241006A JPS62100643A (ja) 1985-10-28 1985-10-28 粒子解析装置

Publications (2)

Publication Number Publication Date
JPS62100643A true JPS62100643A (ja) 1987-05-11
JPH0513454B2 JPH0513454B2 (enrdf_load_stackoverflow) 1993-02-22

Family

ID=17067926

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60241006A Granted JPS62100643A (ja) 1985-10-18 1985-10-28 粒子解析装置

Country Status (1)

Country Link
JP (1) JPS62100643A (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0295241A (ja) * 1988-09-30 1990-04-06 Shimadzu Corp キャピラリセル検出器の調整方法及び調整機構
JP2016090292A (ja) * 2014-10-31 2016-05-23 日本光電工業株式会社 フロー解析装置、フローサイトメータ、及びフロー解析方法
CN105699276A (zh) * 2016-03-07 2016-06-22 广东工业大学 一种超分辨成像装置及方法
JP2016191715A (ja) * 2012-03-30 2016-11-10 ソニー株式会社 マイクロチップ型光学測定装置及び該装置における光学位置調整方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20220349806A1 (en) * 2019-11-06 2022-11-03 Sony Group Corporation Position adjusting method, microparticle analysis device, and program

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0295241A (ja) * 1988-09-30 1990-04-06 Shimadzu Corp キャピラリセル検出器の調整方法及び調整機構
JP2016191715A (ja) * 2012-03-30 2016-11-10 ソニー株式会社 マイクロチップ型光学測定装置及び該装置における光学位置調整方法
US9915935B2 (en) 2012-03-30 2018-03-13 Sony Corporation Microchip-type optical measuring apparatus and optical position adjusting method thereof
JP2018059943A (ja) * 2012-03-30 2018-04-12 ソニー株式会社 マイクロチップ型光学測定装置及び該装置における光学位置調整方法
US10180676B2 (en) 2012-03-30 2019-01-15 Sony Corporation Microchip-type optical measuring apparatus and optical position adjusting method thereof
US10859996B2 (en) 2012-03-30 2020-12-08 Sony Corporation Microchip-type optical measuring apparatus and optical position adjusting method thereof
JP2016090292A (ja) * 2014-10-31 2016-05-23 日本光電工業株式会社 フロー解析装置、フローサイトメータ、及びフロー解析方法
US10101259B2 (en) 2014-10-31 2018-10-16 Nihon Kohden Corporation Flow analyzer, flow cytometer and flow analyzing method
CN105699276A (zh) * 2016-03-07 2016-06-22 广东工业大学 一种超分辨成像装置及方法

Also Published As

Publication number Publication date
JPH0513454B2 (enrdf_load_stackoverflow) 1993-02-22

Similar Documents

Publication Publication Date Title
US4936676A (en) Surface position sensor
US4732479A (en) Particle analyzing apparatus
DE69331188T2 (de) Vorrichtung und verfahren zur molekularen charakterisierung
US5803606A (en) Surface photothermic testing device
JP2641927B2 (ja) 微粒子測定装置
US4806015A (en) Agglutination detection apparatus
US4402607A (en) Automatic detector for microscopic dust on large-area, optically unpolished surfaces
DE3784231T2 (de) Verfahren und vorrichtung zur beruehrungslosen automatischen fokussierung.
JPS62100643A (ja) 粒子解析装置
DE19651737A1 (de) Vorrichtung zum Messen des Neigungsgrads einer für einen optischen Aufnehmer vorgesehenen Objektivlinse
EP0427943B1 (de) Faseroptischer Sensor zum Nachweis von photothermischen Effekten
DE20102192U1 (de) Winkelgeber
US5742382A (en) Refractometer
US4814624A (en) Method and apparatus for measuring the position of an object boundary
JPS628038A (ja) 粒子解析装置
DE4130526C2 (de) Laser-Flugzeit-Anemometer
DE3028564A1 (de) Automatisches wechsellichtrefraktometer
JPS62100642A (ja) 粒子解析装置
JPS61294334A (ja) 粒子解析装置
DE3229264C2 (de) Optisch-elektrische Meßeinrichtung zum Messen der Lage und/oder der Abmessung von Gegenständen
DE3100182A1 (de) Vorrichtung zur photoelektrischen oberflaechenpruefung
JPS63182547A (ja) 粒子解析装置
SU1702178A1 (ru) Устройство дл измерени шероховатости полированной поверхности образца
JPS6291836A (ja) 粒子解析装置
JPH03197841A (ja) 検体検査装置