JPS6199254A - 荷電粒子ビ−ム装置における集束レンズの調整方法 - Google Patents
荷電粒子ビ−ム装置における集束レンズの調整方法Info
- Publication number
- JPS6199254A JPS6199254A JP59219425A JP21942584A JPS6199254A JP S6199254 A JPS6199254 A JP S6199254A JP 59219425 A JP59219425 A JP 59219425A JP 21942584 A JP21942584 A JP 21942584A JP S6199254 A JPS6199254 A JP S6199254A
- Authority
- JP
- Japan
- Prior art keywords
- charged particle
- particle beam
- focusing lens
- target
- wien
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/05—Electron or ion-optical arrangements for separating electrons or ions according to their energy or mass
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59219425A JPS6199254A (ja) | 1984-10-19 | 1984-10-19 | 荷電粒子ビ−ム装置における集束レンズの調整方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59219425A JPS6199254A (ja) | 1984-10-19 | 1984-10-19 | 荷電粒子ビ−ム装置における集束レンズの調整方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6199254A true JPS6199254A (ja) | 1986-05-17 |
JPH0453068B2 JPH0453068B2 (enrdf_load_stackoverflow) | 1992-08-25 |
Family
ID=16735188
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59219425A Granted JPS6199254A (ja) | 1984-10-19 | 1984-10-19 | 荷電粒子ビ−ム装置における集束レンズの調整方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6199254A (enrdf_load_stackoverflow) |
-
1984
- 1984-10-19 JP JP59219425A patent/JPS6199254A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPH0453068B2 (enrdf_load_stackoverflow) | 1992-08-25 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4912326A (en) | Direct imaging type SIMS instrument | |
JP2810797B2 (ja) | 反射電子顕微鏡 | |
JPS5871545A (ja) | 可変成形ビ−ム電子光学系 | |
US6455848B1 (en) | Particle-optical apparatus involving detection of Auger electronics | |
US2547994A (en) | Electronic microscope | |
US4423305A (en) | Method and apparatus for controlling alignment of an electron beam of a variable shape | |
JPS61240553A (ja) | イオンビ−ム描画装置 | |
JPS61101944A (ja) | 荷電粒子ビ−ム用集束装置 | |
JPS6334844A (ja) | 絶縁材料のイオン分析方法および装置 | |
JP3014210B2 (ja) | 直接写像型反射電子顕微鏡 | |
JPH0378739B2 (enrdf_load_stackoverflow) | ||
JPS6199254A (ja) | 荷電粒子ビ−ム装置における集束レンズの調整方法 | |
JPS63216256A (ja) | 荷電粒子線装置 | |
JP3390541B2 (ja) | 荷電粒子投射装置 | |
US6555824B1 (en) | Method and device for focusing a charged particle beam | |
JP3790646B2 (ja) | 低エネルギー反射電子顕微鏡 | |
JPS5983336A (ja) | 荷電粒子線集束偏向装置 | |
JPS613098A (ja) | 荷電ビ−ム装置 | |
JPH0864163A (ja) | 荷電粒子ビーム装置 | |
JPH0234414B2 (enrdf_load_stackoverflow) | ||
JPS60121654A (ja) | イオンビーム装置 | |
SU469159A1 (ru) | Способ получени растра пучка зар женных частиц | |
JP3356554B2 (ja) | 多極子レンズ電子光学装置 | |
JPH02121252A (ja) | 荷電粒子ビーム複合装置 | |
JPS5811073B2 (ja) | 粒子線による試料走査形試料像表示装置 |