JPS6196437A - Fine leakage position detector - Google Patents

Fine leakage position detector

Info

Publication number
JPS6196437A
JPS6196437A JP21890984A JP21890984A JPS6196437A JP S6196437 A JPS6196437 A JP S6196437A JP 21890984 A JP21890984 A JP 21890984A JP 21890984 A JP21890984 A JP 21890984A JP S6196437 A JPS6196437 A JP S6196437A
Authority
JP
Japan
Prior art keywords
gas
pipe
gan
gun
leakage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP21890984A
Other languages
Japanese (ja)
Inventor
Shigeki Okamoto
岡本 茂樹
Katsuhide Natori
名取 勝英
Tsutomu Iikawa
勤 飯川
Isao Kawamura
勲 川村
Takeshi Yamada
毅 山田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP21890984A priority Critical patent/JPS6196437A/en
Publication of JPS6196437A publication Critical patent/JPS6196437A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M3/00Investigating fluid-tightness of structures
    • G01M3/02Investigating fluid-tightness of structures by using fluid or vacuum
    • G01M3/04Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Examining Or Testing Airtightness (AREA)

Abstract

PURPOSE:To limit easily a leaked position and to improve detecting accuracy by adhering a rubber ring to the head of a leakage detecting gas blowing gan having coaxial double pipe structure to blow testing gas only upon a fine part of the head part. CONSTITUTION:The leakage detecting gas blowing gan is constituted of an inner pipe 1 made of cupper alloy and connected to a testing gas source through a gas pipe connection terminal 5 formed at its one end and an outer pipe 2 coaxially arranged on the outside of the inner piper 1 and having a branch pipe 3 forming a part of an exhaust pipe on its one side and the rubber ring 4 is adhered to the head part of the gan. When the blowing gan is abutted upon a specimen through the ring 4 and the detecting gas is blown upon the specimen through the inner pipe 1, the gas collides with the outer wall of the speciment, returned by the shielding of the ring 4 and led into the outer pipe 2 and the branch pipe 3. Consequently, the testing position of airtight leakage can be limited.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は気密性が要請される半導体用パッケージ等を試
験体とする微少洩れ位置検出装置に関す。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to a micro-leak position detection device whose test specimen is a semiconductor package or the like that requires airtightness.

気密性を検出する試験装置は、気密封止がされた試験体
全体の洩れ量を検出する場合と試験体の気密性れ位置を
検出する場合とがあるが9本発明は洩れ検出用ガスとし
て例えばヘリウムガスを用いた後者の真空・吹き付け法
と呼ばれる洩れ位置の検出を精度良く行うための装置の
改良に係る。
There are two types of test equipment for detecting airtightness: one for detecting the amount of leakage from the entire hermetically sealed specimen, and the other for detecting the position of leakage in the specimen. For example, the present invention relates to the improvement of a device for accurately detecting the location of a leak, which is the latter vacuum/spraying method using helium gas.

〔従来の技術〕[Conventional technology]

従来、ヘリウム(He)ガスを用いる微少漏洩試験装置
の概要を第3図の模式図により説明する。
An outline of a conventional micro-leakage test device using helium (He) gas will be explained with reference to a schematic diagram in FIG.

模式図に於いて、 10は試験体に対してスプレー状に
吹き付けるヘリウムガン、 20は気密性がa・要とさ
れる試験体(例えば適宜容積の半導体用パッケージ等)
、30はパッケージ内を排気する真空ポンプ、及び40
は漏れ検出器である。
In the schematic diagram, 10 is a helium gun that sprays onto the test object, and 20 is a test object that requires airtightness (for example, a semiconductor package with an appropriate volume).
, 30 is a vacuum pump for evacuating the inside of the package, and 40
is a leak detector.

図から明らかな様に、パンケージ等試験体20内をポン
プ30で真空とした後、パンケージ外壁側から前記ガン
20によりガスを吹き付けて漏洩するlleガスを検出
器40で検出して気密性が試験される。
As is clear from the figure, after the inside of the test object 20 such as a pan cage is evacuated by the pump 30, gas is blown from the outside wall of the pan cage by the gun 20, and the leaking lle gas is detected by the detector 40, and the airtightness is tested. be done.

ヘリウムガン20は半導体用パッケージ等の気密接合部
の表面に沿って動かずことにより洩れ位置の検出がされ
る。
The helium gun 20 does not move along the surface of the hermetic joint of a semiconductor package, etc., thereby detecting the leak position.

図中、50は試験体を含む測定系全体の洩れ量等を校正
するために設けた標準リーク源で2通常の形状が限定さ
れた試験体の検査時は不要である。
In the figure, reference numeral 50 denotes a standard leak source provided to calibrate the leakage amount of the entire measurement system including the test specimen, and 2 is not necessary when inspecting a test specimen with a limited shape.

前記の試験装置は、標準リーク源50により定量的な洩
れ検出感度が約lXl0” (std−cc/s )と
する検出能力がある。但し試験体形状の大小により応答
速度、検出感度は異なる(参考文献、非破壊検査:第3
2巻、第11号)。
The above-mentioned test device has a detection capability with a quantitative leak detection sensitivity of about 1X10" (std-cc/s) using the standard leak source 50. However, the response speed and detection sensitivity vary depending on the size of the test specimen shape ( References, Nondestructive Testing: Part 3
Volume 2, No. 11).

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

前記洩れ検出ガス吹き付けガンは、計測対象の気密接合
面に対して、近接するガン先端との距離に比例してガス
が分散し試験体の気密接合面に広く接触することから正
確な漏洩個所を検出しがたいと云う欠点がある。
The leak detection gas spray gun is able to accurately locate leaks because the gas is dispersed in proportion to the distance between the gas-tight joint surface of the test object and the tip of the gun, and widely contacts the gas-tight joint surface of the test object. The disadvantage is that it is difficult to detect.

〔問題点を解決するための手段〕[Means for solving problems]

前記の問題点は、真空・吹き付け法による気密漏洩試験
において、洩れ検出用ガス吹き付けガン先端にゴムリン
グを備え、且つ吹き付けガンは同軸の二重管構成になる
ガンを用いた本発明による微少洩れ位置検出装置として
解決される。
The above-mentioned problem is solved by the present invention, which uses a gun with a rubber ring at the tip of a gas spray gun for leak detection and a coaxial double tube configuration in an airtight leak test using a vacuum/spray method. Solved as a position detection device.

〔作 用〕 本発明の検出用ガス吹き付けガンは、試験体の気密洩れ
検出個所にガン先端を直かに当接させ該当接のガン先端
部の微少部分にのみ検出用ガスを吹き付け可能となる様
な内管と外管を備える二重管構成にしたものである。も
ちろん、ガン先端が当接しない試験体の他の部分には検
出用ガスが出ないので、微少洩れの位置の限定(検出)
が容易になされる。
[Function] The detection gas spraying gun of the present invention makes it possible to directly contact the tip of the gun to the location where airtight leakage is detected on the test specimen and spray the detection gas only to a minute portion of the tip of the gun that comes into contact. It has a double-tube structure with an inner tube and an outer tube of different types. Of course, the detection gas does not come out in other parts of the specimen that the gun tip does not touch, so the position of the slight leak can be limited (detected).
is easily done.

〔実施例〕〔Example〕

第1図は本発明の一実施例図とするガン断面図である。 FIG. 1 is a sectional view of a gun showing an embodiment of the present invention.

第1図の洩れ検出用ガス吹き付けガンは1例えば銅合金
から形成される内管lと、その外側に同軸的に配置され
る外管2からなる。又、外管2の一側面には原管と連通
して排気管の一部を形成する枝管3が設けられる。枝管
3の開放端7は第3図で説明した真空ポンプ30に連接
される。
The gas spray gun for leak detection shown in FIG. 1 consists of an inner tube 1 made of, for example, a copper alloy, and an outer tube 2 disposed coaxially outside the inner tube 1. Furthermore, a branch pipe 3 is provided on one side of the outer pipe 2 and communicates with the original pipe to form a part of the exhaust pipe. The open end 7 of the branch pipe 3 is connected to the vacuum pump 30 described in FIG.

図示ガンの左方、は、試験体に当接する部分である。そ
の先端部分はゴムリング4が被着される。
The left side of the illustrated gun is the part that comes into contact with the test specimen. A rubber ring 4 is attached to its tip.

ガンの右方は内管が外管2より突出させ、検出用ガス源
側へのガス管接続端5となる。尚、前記外管2と枝管3
の接続部及び外管2の右方端6は銀鑞付けされる。図の
如く配置された同軸二重管構成ガンの動作を、ガン先端
を拡大した第2図の断面図を参照しながら説明する。
On the right side of the gun, the inner tube protrudes from the outer tube 2 and becomes the gas tube connection end 5 to the detection gas source side. In addition, the outer pipe 2 and the branch pipe 3
The connections and the right end 6 of the outer tube 2 are silver-brazed. The operation of the coaxial double tube configuration gun arranged as shown in the figure will be explained with reference to the sectional view of FIG. 2, which shows an enlarged view of the gun tip.

第2図は、ゴムリング4を介して試験体20の一側壁と
当接するガン先端部の断面図である。
FIG. 2 is a sectional view of the tip of the gun that comes into contact with one side wall of the test piece 20 via the rubber ring 4.

内管1を経て圧入された検出用ガス9は気密洩れが問題
とされる試験体20の外壁に衝突する。しかし周囲のゴ
ムリングの遮蔽により衝突のガスはUターンして外管2
及び枝管3側へ導出されるので気密洩れの試験個所が限
定される。例えば、ゴムリング4の内径8(外管2の内
径)を略11程度とすれば該寸法面内の気密性を見る微
少洩れ試験がされる。
The detection gas 9 press-injected through the inner tube 1 collides with the outer wall of the test specimen 20 where airtight leakage is a problem. However, due to the shielding of the surrounding rubber ring, the colliding gas makes a U-turn and enters the outer tube 2.
and is led out to the branch pipe 3 side, so the test locations for airtight leakage are limited. For example, if the inner diameter 8 of the rubber ring 4 (the inner diameter of the outer tube 2) is approximately 11, a micro-leakage test is performed to check the airtightness within this dimensional plane.

然し、ゴムリング4を試験体壁から開放すれば。However, if the rubber ring 4 is released from the wall of the specimen.

従来と同一構成ガンによる微少洩れ試験も出来ることは
云うまでもない。
Needless to say, it is also possible to perform a minute leakage test using a gun with the same configuration as the conventional gun.

〔発明の効果〕〔Effect of the invention〕

以上、説明した本発明のガンによれば、気密が問題とさ
れる特に洩れ位置の限定が容易となり。
According to the gun of the present invention as described above, it is easy to limit the leakage position, especially where airtightness is a problem.

検出装置の精度が向上する利点がある。This has the advantage of improving the accuracy of the detection device.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の実施例とするガン断面図第2図は前回
のガン動作説明用の拡大断面図。 第3図は微少洩れ試験装置全体の模式図である。 図中、lと2は夫々二重管構成の内管と外管。 4はゴムリング。 10は従来のヘリウムガン。 及び20は試験体である。
FIG. 1 is a sectional view of a gun according to an embodiment of the present invention. FIG. 2 is an enlarged sectional view for explaining the previous gun operation. FIG. 3 is a schematic diagram of the entire micro-leakage test device. In the figure, 1 and 2 are the inner and outer tubes of a double tube configuration, respectively. 4 is a rubber ring. 10 is a conventional helium gun. and 20 are test specimens.

Claims (1)

【特許請求の範囲】[Claims] 真空・吹き付け法による気密漏洩試験において、洩れ検
出用ガス吹き付けガン先端にゴムリングを備え、且つ吹
き付けガンは同軸の二重管構成になることを特徴とする
微少洩れ位置検出装置。
A device for detecting the position of minute leaks in an airtight leak test using a vacuum/spraying method, characterized by having a rubber ring at the tip of a gas spray gun for detecting leaks, and the spray gun having a coaxial double tube configuration.
JP21890984A 1984-10-18 1984-10-18 Fine leakage position detector Pending JPS6196437A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21890984A JPS6196437A (en) 1984-10-18 1984-10-18 Fine leakage position detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21890984A JPS6196437A (en) 1984-10-18 1984-10-18 Fine leakage position detector

Publications (1)

Publication Number Publication Date
JPS6196437A true JPS6196437A (en) 1986-05-15

Family

ID=16727213

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21890984A Pending JPS6196437A (en) 1984-10-18 1984-10-18 Fine leakage position detector

Country Status (1)

Country Link
JP (1) JPS6196437A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0351595A2 (en) * 1988-07-16 1990-01-24 Dr. Johannes Heidenhain GmbH Encapsulated position measuring device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0351595A2 (en) * 1988-07-16 1990-01-24 Dr. Johannes Heidenhain GmbH Encapsulated position measuring device

Similar Documents

Publication Publication Date Title
JP4829326B2 (en) Method for inspecting and locating leaks and apparatus suitable for carrying out the method
EP1370844B1 (en) Method and device at testing for leaks and leakage finding
US5375457A (en) Apparatus and method for detecting leaks in piping
SU1281179A3 (en) Leak detector
US4583394A (en) Device and method for leak location
WO2018223441A1 (en) High-speed suction gun leakage detection method and device for sealed element of large-sized transformer
JP2012514743A (en) Leak detection method
US2706398A (en) Leak detection
JP2003240670A (en) Air leakage test method and device
JPS6196437A (en) Fine leakage position detector
JP3701394B2 (en) Leak test method for thin specimens with helium leak detector
CN114136552A (en) Welding seam sealing detection tool and welding seam sealing detection method and system
JP4026579B2 (en) Airtight leak inspection method and apparatus
EP0219250A2 (en) A leak detector
CN221685813U (en) Leakage detection system of gas sniffing probe
JPH07128262A (en) Fluorescent x-ray analyzing device and analyzing method
JPS63157030A (en) Probe for leak test
JPS6217627A (en) Method for transmitting signal of leak detector
JP2964045B2 (en) Slow leak measurement method for envelopes
JP3348489B2 (en) Leak test method
JPH09292302A (en) Leak detector
JPS6365901B2 (en)
McKinney Practical application of leak detection methods
JPS6353432A (en) Masking of leak tester
CN117890028A (en) Leakage detection method of helium mass spectrum injection probe