JPS6193699A - Inspection device for characteristic of electronic part - Google Patents

Abstract

(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

[Detailed Description of the Invention] [Industrial Application Field 1] This invention inspects and measures electronic components manufactured through a manufacturing process, such as non-defective products, defective products, and grades of semiconductor elements, and automatically measures them. The present invention relates to a characteristic testing device for electronic components that are classified, aligned, and stored in magazines.

[Prior Art] FIG. 7 is an explanatory diagram schematically showing a conventional characteristic testing apparatus for this type of electronic component, here a semiconductor element.

In Figure 7, the guide rail (2) on the stage (1) is shown.
) The semiconductor elements (3) guided by the measuring terminal block (4) are classified in advance into good products, defective products, and grades based on withstand voltage, and the results are controlled by the OII device (5).
Store it in memory.

This control device (5) is connected to a pulse motor (7) that rotates the rotary cylinder (6) by a predetermined angle, and at a predetermined operation timing, the pulse motor (7) is rotated by a predetermined angle based on the contents stored in the memory. Rotate the opening of the rotating cylinder (6) (
6a) into multiple classification storage boxes (7a), (7b>
・<7n).

Semiconductor element guided by guide rail (2)
3) is the classification storage box (7a), (7) via the rotary tube (6).
b) ... (7n).

[Problems to be Solved by the Invention] Semiconductor devices that fall into the classification storage box are in different positions and directions, so it is complicated and takes a lot of man-hours to store them in the storage magazine in the same direction later. was there.

This invention was made to solve these problems, and it is possible to automatically store semiconductor devices classified into good, defective, and grade in a storage magazine in the same direction without requiring complicated and man-hours. The object of the present invention is to provide a characteristic testing device.

[Means for Solving the Problems] The characteristic testing device according to the present invention is capable of ensuring that the position and direction of the electronic components are always regulated during each means of supplying, transporting, inspecting, measuring, and discharging the electronic components. This is what I did.

[Operation] Electronic components after characteristic inspection and formulation are classified into good products, defective products, and grades, and are stored in storage boxes according to classification in the same position and direction.

[Example] Fig. 1 is a side view showing the general configuration of the characteristic testing device of the present invention, Fig. 2 is a plan view showing the discharge section of the above device, and Fig. 3
The figure is an explanatory diagram schematically showing the mechanism of the above-mentioned discharge part,
The figures are a plan view and a side view showing an example of a magazine as a classified storage box.

In this embodiment, a characteristic testing apparatus for a semiconductor element among electronic components will be explained as an example, but the present invention can of course be applied as a characteristic testing apparatus for other electronic components.

In FIG. 1, (10) is a magazine for supplying semiconductor elements (11), and the semiconductor elements (11) are stored in this magazine (10) with their positions and directions regulated. At one end of this magazine (10) there is a shooter (12
) is connected to the semiconductor element (11) in the magazine (10).
are successively pushed forward through this shooter (12).

Near the tip of the chute (12) is an elevator (
13) and the semiconductor element (11) supplied from the chute (12) is placed on the elevator (13), the elevator (13) rises to a certain height and stops.

Next, a conveying means that moves intermittently in the horizontal direction, for example, a feeding rod mechanism (with a pair of bars protruding in the width direction).
14) on the stage (15) to measure the terminal block (16)
The semiconductor element (11) is transferred to just below.

The measurement terminal block (16) has two electrical property test and measurement parts, for example, a withstand voltage property test and measurement part (16a), and a forward current property test and measurement part (16b). .

These measurement units (16a) and (16b) are connected to a control device (17).

Near the other end of the stage (15), a guide rail (18
A movable shooter (19) guided by a) and (18b) and movable in a direction perpendicular to the lettuce station (15) is arranged. This movable shooter (19) is a semiconductor rope (
A shutter (20) that opens and closes in response to a command signal from a control device m (17) is provided at the lower end of the movable chute (19), which is inclined so that the shutter (11) slides down.

driving the moving shooter (19) and shutter (20);
The n i structure is configured as shown in FIG. 3, for example.

In other words, the movable shooter (19) is connected to the free roller (2).
2), and the middle part of the wire (21) is wound around a wheel (24) fixed to the output shaft of a pulse motor (23). The pulse motor (23) is connected to the control device (17),
Therefore, the pulse motor (2
3) rotates by a predetermined angle, the wire (21) moves via the wheel (24), and the movable shooter (19) connected to the wire (21) moves by a predetermined distance.

Further, one end of the shaft V vine (20) is connected to a pulse motor (25).
), the pulse motor (25) is driven by a command signal from the control device (17), and the shutter (20) is opened and closed. This shutter consists of a bar with an abbreviated cross section and is driven by a pulse motor (
25) Opens and closes by 1/4 rotation forward and reverse.

In front of the shutter (20) are multiple storage boxes (26
a), (26b)-(26n) are arranged. This classified storage box (26a).

(26b) ・<26n) is, for example, shown in Fig. 4 (A
).

It consists of a magazine that defines the position and direction of semiconductor elements (11) as shown in (B), and a certain number of semiconductor elements (11).
11) is R-shaped so that when it is stored, it can be replaced with an empty new magazine in a cassette style. In any case, it is a classified storage box (26a).

(26b)--(26n) inspects the electrical characteristics,
The measured semiconductor element (one piece) is stored with its position and direction regulated.

A control device (17) for driving each of the devices or component parts of the device at mutually related operation timings is configured as shown in FIG. 5, for example.

That is, the control device (17) is connected to each elevator (1).
3), is connected to the feeder (14), measurement terminal block (16), movable shooter (19), and shutter (20), and also connects to each screen! Descending command output means (130), feed rod drive command output means (140), measuring needle elevation command output means (1
60), a moving chute drive command output means (190), and a shutter opening/closing command output means (200), which are driven in response to command signals.

The control device (17) also includes a buffer memory (17a).
This buffer 1 memory (17a
) is configured such that command signals are outputted by the respective means via an arithmetic unit (not shown) based on the results stored in ().

Next, the operation sequence of each of the above-mentioned devices or constituent parts will be explained according to the flow chart shown in FIG.

That is, in (6-1>), the semiconductor rope (11) naturally falls into the magazine (10) and the cowl (12),
At (6-2), the user moves onto the elevator (13), and here the elevator (13) rises to a predetermined position. Then (
6-3) and (6-4), the feed rod (14) moves horizontally to transfer the semiconductor rope (11) to the measurement terminal block (16).
). The elevator (13) descends simultaneously with the movement of the feeder (14). Next, in (6-5), the measurement terminal block (16) is lowered and the measurement needle (not shown) comes into contact with the lead portion of the semiconductor element.

As mentioned above, the measurement terminal block (16) is equipped with two electrical characteristic testing and measuring sections (16a) and (16b), and the measuring section (16a) measures, for example, the withstand voltage characteristics, and the measuring section In (16b), the forward voltage characteristics are inspected and measured (6-6). This test, the measured results (6-7)
In the buffer memory (17a) of the control device @ (17)
). Next, at (6-8), the feed rod further advances to move the semiconductor element (11) onto the stage (15).
) from above to the movable shooter (19) (6-9>).

A semiconductor element (11) guided onto a moving shooter (19)
) slid down with the help of the slope of the moving chute (19),
Further fall is prevented by the shutter (20) (
6-10). Next, at (6-11), the movable shooter (one) moves in a direction perpendicular to the shooter (15) in response to a command signal from the control device (17). In this case, based on the information stored in the buffer memory (17a), the arithmetic unit of the control device (17) calculates the classification storage boxes (26a) that are classified into good products, defective products, and grades.
), (26b) to (26n), the chute drive command output means (190) outputs a command (6-12) for the chute (15) to move to and stop at any of the frontage positions (6-12). ).When the movable shooter (one) stops, the shutter (20) is opened (6-13>,
The semiconductor element (11) in the movable shooter (19) falls into one of the classified storage boxes (26a>, (26b>.(26n)) with its direction and position regulated (6-14).
), (6-15>.

The above process is repeated as one cycle (storage box by classification)
26a), (26b), and (26n) are filled with new ones.

[Effects of the Invention] Since the present invention is configured as described above, the supply, movement, inspection of electrical characteristics, measurement, discharge, and storage by classification of semiconductor devices are all automated, and the semiconductor devices are sorted in the same position and direction. Since it is stored separately, it is convenient for use in the next process or for shipping, and it is possible to reduce the product cost without requiring special man-hours for these steps.

[Brief explanation of the drawing]

FIG. 1 is a side view showing the general configuration of the electrical component characteristic testing device of the present invention, FIG. 2 is a plan view showing the discharge section of the device, and FIG. 3 is a schematic view of the structure of the discharge section. 4 shows an example of a magazine as a classified storage box, FIG. FIG. 6 is a block diagram showing an example of the configuration of a control device, FIG. 6 is a diagram showing the operation sequence of the device, and FIG. 7 is a schematic diagram of a conventional electric component characteristic testing device. In the figure, (10) is a magazine for supplying semiconductor devices, (11) is a semiconductor device, (12) is a shooter, and (13) is a magazine for supplying semiconductor devices.
) is the elevator, (14) is the feed, (15) is the 4th stage, (16) is the measurement terminal block, (17) is the 1til
J control device, (19) is a movable shooter, (20) is a shutter, (26a >, (26b)... (26n) is a storage box by classification. Applicant

Claims (1)

[Scope of Claims] 1. A means for supplying electronic components onto a stage in the same direction, and a means for inspecting and measuring the electrical characteristics of the electronic components supplied by this means, and for transporting the electronic components to the position of the measuring means. A transfer means for transferring the parts, an inspection and measurement means for inspecting and measuring the electrical characteristics of the electronic components transferred by this means, and a means for inspecting and measuring the electronic components to a predetermined position based on the results of the inspection and measurement by this means. 1. A characteristic testing device for electronic components, comprising a means for transporting the electronic components and a means for arranging the directions of the electronic components transported by the means and storing them in classified storage boxes. 2. The means for supplying the electronic components onto the stage in the same direction includes a supply magazine that regulates the direction of the electronic components;
Claim 1, characterized in that the device is equipped with a chute that receives electronic components falling naturally from the magazine, and an elevator that places the electronic components from the chute and raises and lowers the electronic components near one end of the stage. Characteristic testing equipment for electronic components. 3. Characteristic inspection of electronic components according to claim 1 or 2, characterized in that the transfer means for transferring the electronic components on the stage includes means for transferring a plurality of electronic components intermittently. Device. 4. The characteristics of an electronic component as set forth in any one of claims 1 to 3, wherein the testing and measuring means includes means for testing and measuring a plurality of different electrical characteristics. Inspection equipment. 5. The means for transporting the inspected and measured electronic components includes a moving shooter that is provided near the other end of the stage and moves in a direction perpendicular to the stage. An electronic component characteristic inspection device according to any one of items 1 to 4. 6. The movable shooter having one end inclined as a means for arranging the electronic components and storing them in the classified storage boxes, and closing the inclined end of this shooter and opening the inclined end at a predetermined position to store the electronic components. An apparatus for testing characteristics of electronic components according to any one of claims 1 to 5, further comprising a shutter for allowing the parts to fall naturally.