JPS6190246U - - Google Patents

Info

Publication number
JPS6190246U
JPS6190246U JP17611584U JP17611584U JPS6190246U JP S6190246 U JPS6190246 U JP S6190246U JP 17611584 U JP17611584 U JP 17611584U JP 17611584 U JP17611584 U JP 17611584U JP S6190246 U JPS6190246 U JP S6190246U
Authority
JP
Japan
Prior art keywords
chip
wafer
probe card
hairline
aligning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17611584U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0621242Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1984176115U priority Critical patent/JPH0621242Y2/ja
Publication of JPS6190246U publication Critical patent/JPS6190246U/ja
Application granted granted Critical
Publication of JPH0621242Y2 publication Critical patent/JPH0621242Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1984176115U 1984-11-20 1984-11-20 集積回路試験装置 Expired - Lifetime JPH0621242Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1984176115U JPH0621242Y2 (ja) 1984-11-20 1984-11-20 集積回路試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1984176115U JPH0621242Y2 (ja) 1984-11-20 1984-11-20 集積回路試験装置

Publications (2)

Publication Number Publication Date
JPS6190246U true JPS6190246U (US07534539-20090519-C00280.png) 1986-06-12
JPH0621242Y2 JPH0621242Y2 (ja) 1994-06-01

Family

ID=30733712

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1984176115U Expired - Lifetime JPH0621242Y2 (ja) 1984-11-20 1984-11-20 集積回路試験装置

Country Status (1)

Country Link
JP (1) JPH0621242Y2 (US07534539-20090519-C00280.png)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57110946A (en) * 1980-12-27 1982-07-10 Seiko Epson Corp Heating device for specimen
JPS5939934A (ja) * 1982-08-27 1984-03-05 Yamaha Motor Co Ltd 小型発動発電機

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57110946A (en) * 1980-12-27 1982-07-10 Seiko Epson Corp Heating device for specimen
JPS5939934A (ja) * 1982-08-27 1984-03-05 Yamaha Motor Co Ltd 小型発動発電機

Also Published As

Publication number Publication date
JPH0621242Y2 (ja) 1994-06-01

Similar Documents

Publication Publication Date Title
JPS6190246U (US07534539-20090519-C00280.png)
JPH01180675U (US07534539-20090519-C00280.png)
JPS6473629A (en) Semiconductor integrated circuit
JPS59140442U (ja) 半導体素子のマ−キング装置
JPS6398633U (US07534539-20090519-C00280.png)
JPS60183442U (ja) 集積回路測定治具
JPS62168480U (US07534539-20090519-C00280.png)
JPS60114978U (ja) Icテスト装置
JPS61164039U (US07534539-20090519-C00280.png)
JPS5939934U (ja) 触針位置合せ用補助カ−ド
JPH0316069U (US07534539-20090519-C00280.png)
JPS63132434U (US07534539-20090519-C00280.png)
JPH01121867U (US07534539-20090519-C00280.png)
JPS62196339U (US07534539-20090519-C00280.png)
JPS6142480U (ja) オ−トハンドラ
JPH01121866U (US07534539-20090519-C00280.png)
JPH02150570U (US07534539-20090519-C00280.png)
JPS59103441U (ja) 半導体集積回路
JPS6117678U (ja) 試験器
JPH044754U (US07534539-20090519-C00280.png)
JPH0323368U (US07534539-20090519-C00280.png)
JPS59115642U (ja) 半導体ウエフア
JPH02729U (US07534539-20090519-C00280.png)
JPS6021966U (ja) ハンドラ−用スリツト型接触子
JPS6343435U (US07534539-20090519-C00280.png)