JPS6187872A - Anode electrode in parallel plane sheet type plasma cvd apparatus - Google Patents
Anode electrode in parallel plane sheet type plasma cvd apparatusInfo
- Publication number
- JPS6187872A JPS6187872A JP20815984A JP20815984A JPS6187872A JP S6187872 A JPS6187872 A JP S6187872A JP 20815984 A JP20815984 A JP 20815984A JP 20815984 A JP20815984 A JP 20815984A JP S6187872 A JPS6187872 A JP S6187872A
- Authority
- JP
- Japan
- Prior art keywords
- cylinder
- anode electrode
- gas
- piston
- pipe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Electrodes Of Semiconductors (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
【発明の詳細な説明】
〔発明の利用分野〕
本発明は平行平板型プラズマCVD装置の均一成膜に係
り、特に他の成膜条件の変化に対応して均一成膜を実現
する場合に好適な濃度分布可変ガス吹出口に関する。[Detailed Description of the Invention] [Field of Application of the Invention] The present invention relates to uniform film formation using a parallel plate plasma CVD apparatus, and is particularly suitable for achieving uniform film formation in response to changes in other film formation conditions. This invention relates to a gas outlet with variable concentration distribution.
従来の装置は、特開昭56−94748に記載のように
、アノード電極内に仕切り板が固定されており、ある特
定の成膜条件にのみ対応する様になっていた。しかし、
同一の装置を分解、追加工することなく他の成膜条件に
対応させる点については配慮されていなかった。As described in Japanese Patent Application Laid-open No. 56-94748, the conventional apparatus has a partition plate fixed within the anode electrode, and is adapted to only meet certain specific film-forming conditions. but,
No consideration was given to adapting the same device to other film forming conditions without disassembling or performing additional work.
本発明の目的は、成膜条件の変化に対応して原料ガス吹
出口に任意の濃度分布を与え、成膜条件が変わっても均
一な膜厚分布を実現するガス吹出口を提供することにあ
る。An object of the present invention is to provide a gas outlet that provides an arbitrary concentration distribution to the raw material gas outlet in response to changes in film-forming conditions and achieves a uniform film thickness distribution even when the film-forming conditions change. be.
原料ガスを一様な濃度で吹出した場合、2枚の平行平板
電極の間の領域では濃度はほぼ一様となるが、プラズマ
の電子密度のばらつきや、流速の違いによって発生する
ラジカルの濃度に分布が生ずる。したがって、電子密度
や流速のばらつきを相殺する様に原料ガスの濃度にあら
かじめ分布を与えておけば1発生するラジカルの濃度を
一様にすることができ、均一な膜厚分布が得られる。こ
のとき、成膜条件によって原料ガスの濃度に与えるべき
分布が異なるから、ガス吹出口を数個の同心円状の板で
仕切り、高濃度の原料ガスと不活性のキャリアガスの吹
出しの位置を単純な機構で変え得る様にした。When raw material gas is blown out at a uniform concentration, the concentration is almost uniform in the area between the two parallel plate electrodes, but the concentration of radicals generated due to variations in plasma electron density and differences in flow velocity may vary. A distribution occurs. Therefore, if the concentration of the source gas is distributed in advance so as to offset variations in electron density and flow rate, the concentration of generated radicals can be made uniform, and a uniform film thickness distribution can be obtained. At this time, since the distribution that should be given to the concentration of the raw material gas differs depending on the film forming conditions, the gas outlet is partitioned by several concentric plates, and the positions of the high-concentration raw material gas and inert carrier gas are simplified. I made it possible to change it with a mechanism.
以下、本発明の一実施例を第1図、第2図により説明す
る。第1図は平行平板型プラズマCVD装置の真空チャ
ンバ内の構造を示す断面図である。アノード電極1とカ
ソード電極2に高周波電力を印加し、これらの間にプラ
ズマ領域生させるつアノード電極より吹出した原料ガス
は、プラズマ領域を通過する際に活性化され、基板3上
に膜を堆積する。An embodiment of the present invention will be described below with reference to FIGS. 1 and 2. FIG. 1 is a sectional view showing the structure inside a vacuum chamber of a parallel plate type plasma CVD apparatus. High-frequency power is applied to the anode electrode 1 and the cathode electrode 2 to generate a plasma region between them. The raw material gas blown out from the anode electrode is activated as it passes through the plasma region and deposits a film on the substrate 3. do.
第2図は、原料ガスに任意の濃度分布をつけるためのガ
ス吹出口兼アノード電極である。電極の外壁1に多孔板
4がついており、中央部にシリンダー7が組込まれてい
る。多孔板の穴は数枚の円錐状の仕切り6によって、シ
リンダ7の側壁に設けられた穴に通じている。またシリ
ンダ7のl!Im上部にパイプ9が取付けられており、
このパイプより不活性のキャリアガスン導入する。一方
シリンダ7内をパイプ8乞取付ケたピストン5がスライ
ドする。パイプ8からは高濃度の原料ガスを導入する。FIG. 2 shows a gas outlet and an anode electrode for imparting an arbitrary concentration distribution to the raw material gas. A porous plate 4 is attached to the outer wall 1 of the electrode, and a cylinder 7 is installed in the center. The holes in the perforated plate communicate with holes provided in the side wall of the cylinder 7 by means of several conical partitions 6. Again, cylinder 7 l! Pipe 9 is attached to the top of Im.
Inert carrier gas is introduced through this pipe. On the other hand, the piston 5 to which the pipe 8 is attached slides inside the cylinder 7. A highly concentrated raw material gas is introduced through the pipe 8.
したがって原料ガスは、ピストン5よりも下にあるシリ
ンダ側壁の穴より出て、円錐状の仕切り6で狭まれた領
域を通り多孔板2の穴よりチャンバ内へ吹出シ、一方キ
ャリアガスは、ピストンより上にあるシリンダ側壁の穴
より出て、同様にチャンバ内へ吹出す。多孔板の穴のう
ち、ある半径内より内側にある穴からは高濃度の原料ガ
スが、これより外側にある穴からはキャリアガスが吹出
すことになり、またこの半径をピストンのスライドによ
り変えることができる。Therefore, the raw material gas comes out from the hole in the cylinder side wall below the piston 5, passes through the area narrowed by the conical partition 6, and is blown into the chamber from the hole in the perforated plate 2. On the other hand, the carrier gas It exits from a hole in the cylinder side wall located higher up and blows out into the chamber as well. Among the holes in the perforated plate, high-concentration raw material gas is blown out from holes located inside a certain radius, and carrier gas is blown out from holes outside this radius, and this radius can be changed by sliding the piston. be able to.
一般には中央部がガス流速が速く、プラズマ領域の滞在
時間が短かいので活性化されff<<中央部を高濃度に
してやる必要があるが、成膜条件によっては、パイプ8
にキャリアガス、パイプ9に高濃度の原料ガスを導入し
て、多孔板の周辺部を高濃度とすることも可能である。Generally, the central part has a high gas flow rate and the residence time of the plasma region is short, so it is activated and it is necessary to make the central part a high concentration.
It is also possible to introduce a carrier gas into the pipe 9 and a highly concentrated raw material gas into the pipe 9 to make the peripheral area of the porous plate highly concentrated.
本発明によれば、成膜条件の変更(例えば、圧力の変化
、RFパワーの変化、原料ガスの変更など)によるプラ
ズマの電子密度の変化や流速の変化に応じて、これらを
相殺する様にガス吹出口における原料ガスの濃度分布を
変えることができる。またその際1f、装置の分解、追
加工は必要でなくピストンのスライドのみで調整可能で
あるから、簡便に均一成膜が実現できる効果がある。ま
た、ピストンとシリンダとの摺動面は成膜中に動かすこ
とはないので、そのシールは特に技術的に困Wな点はな
い。According to the present invention, in accordance with changes in plasma electron density and flow velocity due to changes in film forming conditions (for example, changes in pressure, changes in RF power, changes in raw material gas, etc.), these can be offset. The concentration distribution of the source gas at the gas outlet can be changed. Further, in this case, there is no need to disassemble the device or perform additional work, and adjustment can be made only by sliding the piston, which has the effect of easily realizing uniform film formation. Furthermore, since the sliding surfaces between the piston and the cylinder do not move during film formation, there is no particular technical problem with the sealing.
第1図は本発明に係る平行平板型プラズマCVD装置の
チャンバ内の構造を示す断面図、第2図は本発明の実施
例であるガス吹出口兼アノード電極の断面図である。
1・・・アノード電極、 2・・・カソード電極、
311.基板、 4・・・多孔板、5・・
・ピストン、 6・・・円錐上仕切り、7・・
・シリンダ、 8・・・ガス導入パイプ、9・
・・ガス導入パイ1つFIG. 1 is a cross-sectional view showing the structure inside a chamber of a parallel plate plasma CVD apparatus according to the present invention, and FIG. 2 is a cross-sectional view of a gas outlet and anode electrode according to an embodiment of the present invention. 1... Anode electrode, 2... Cathode electrode,
311. Substrate, 4... Perforated plate, 5...
・Piston, 6... Conical upper partition, 7...
・Cylinder, 8...Gas introduction pipe, 9・
...1 gas introduction pipe
Claims (1)
有するアノード電極とこれに対向し基板を取付けたカソ
ード電極と、これらの電極を含み所定の低圧雰囲気を保
持するチャンバを有する平行平板型プラズマCVD装置
において、多孔のガス吹出口を有するアノード電極内に
、ガス供給口を有しかつ側面に多孔の吹出口を有するシ
リンダと、該シリンダの小孔ヒアノード電極の小孔とを
連結する流路を形成する複数個の部材と、該シリンダ内
を摺動可能に、かつ中央部にガス供給口を備えたピスト
ンを取付けたことを特徴とする平行平板型プラズマCV
D装置のアノード電極。1. A parallel plate type having a vacuum evacuation means, a gas supply means, an anode electrode having a porous gas outlet, a cathode electrode opposite to the anode electrode with a substrate attached thereto, and a chamber containing these electrodes and maintaining a predetermined low-pressure atmosphere. In a plasma CVD apparatus, a cylinder having a gas supply port in an anode electrode having a porous gas outlet and a porous outlet on the side surface, and a flow connecting the small hole of the small hole hyanodic electrode of the cylinder. A parallel plate type plasma CV characterized by having a plurality of members forming passages and a piston slidable within the cylinder and equipped with a gas supply port in the center.
Anode electrode of D device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20815984A JPS6187872A (en) | 1984-10-05 | 1984-10-05 | Anode electrode in parallel plane sheet type plasma cvd apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20815984A JPS6187872A (en) | 1984-10-05 | 1984-10-05 | Anode electrode in parallel plane sheet type plasma cvd apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6187872A true JPS6187872A (en) | 1986-05-06 |
Family
ID=16551624
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP20815984A Pending JPS6187872A (en) | 1984-10-05 | 1984-10-05 | Anode electrode in parallel plane sheet type plasma cvd apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6187872A (en) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62172716A (en) * | 1986-01-27 | 1987-07-29 | Canon Inc | Deposit film formation device |
JPS63274126A (en) * | 1987-05-06 | 1988-11-11 | Mitsui Toatsu Chem Inc | High frequency wave application electrode constituent body |
JPH0189957U (en) * | 1987-12-09 | 1989-06-13 | ||
JPH02200784A (en) * | 1989-01-30 | 1990-08-09 | Koujiyundo Kagaku Kenkyusho:Kk | Cvd electrode |
JPH05345979A (en) * | 1992-06-15 | 1993-12-27 | Chugai Ro Co Ltd | Film forming method in plasma film forming device |
US5532190A (en) * | 1994-05-26 | 1996-07-02 | U.S. Philips Corporation | Plasma treatment method in electronic device manufacture |
KR20030078203A (en) * | 2002-03-28 | 2003-10-08 | (주)한백 | Gas shower of reactor for metal organic chemical vapor deposition system |
KR20140095440A (en) * | 2013-01-24 | 2014-08-01 | 도쿄엘렉트론가부시키가이샤 | Plasma processing apparatus |
-
1984
- 1984-10-05 JP JP20815984A patent/JPS6187872A/en active Pending
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62172716A (en) * | 1986-01-27 | 1987-07-29 | Canon Inc | Deposit film formation device |
JPS63274126A (en) * | 1987-05-06 | 1988-11-11 | Mitsui Toatsu Chem Inc | High frequency wave application electrode constituent body |
JPH0189957U (en) * | 1987-12-09 | 1989-06-13 | ||
JPH0543096Y2 (en) * | 1987-12-09 | 1993-10-29 | ||
JPH02200784A (en) * | 1989-01-30 | 1990-08-09 | Koujiyundo Kagaku Kenkyusho:Kk | Cvd electrode |
JPH05345979A (en) * | 1992-06-15 | 1993-12-27 | Chugai Ro Co Ltd | Film forming method in plasma film forming device |
US5532190A (en) * | 1994-05-26 | 1996-07-02 | U.S. Philips Corporation | Plasma treatment method in electronic device manufacture |
KR20030078203A (en) * | 2002-03-28 | 2003-10-08 | (주)한백 | Gas shower of reactor for metal organic chemical vapor deposition system |
KR20140095440A (en) * | 2013-01-24 | 2014-08-01 | 도쿄엘렉트론가부시키가이샤 | Plasma processing apparatus |
JP2014143101A (en) * | 2013-01-24 | 2014-08-07 | Tokyo Electron Ltd | Plasma processing device |
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