JPS6186664A - 素子測定装置 - Google Patents

素子測定装置

Info

Publication number
JPS6186664A
JPS6186664A JP20879284A JP20879284A JPS6186664A JP S6186664 A JPS6186664 A JP S6186664A JP 20879284 A JP20879284 A JP 20879284A JP 20879284 A JP20879284 A JP 20879284A JP S6186664 A JPS6186664 A JP S6186664A
Authority
JP
Japan
Prior art keywords
voltage
external power
power source
pulse
power supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP20879284A
Other languages
English (en)
Japanese (ja)
Other versions
JPS649595B2 (enrdf_load_stackoverflow
Inventor
Ryoichi Sakai
良一 酒井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Japan Ltd
Original Assignee
Sony Tektronix Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Tektronix Corp filed Critical Sony Tektronix Corp
Priority to JP20879284A priority Critical patent/JPS6186664A/ja
Priority to NL8502385A priority patent/NL8502385A/nl
Priority to GB08522462A priority patent/GB2165363B/en
Priority to DE19853533636 priority patent/DE3533636C2/de
Priority to US06/780,957 priority patent/US4727318A/en
Priority to CA000491897A priority patent/CA1242813A/en
Priority to FR8514776A priority patent/FR2571501B1/fr
Publication of JPS6186664A publication Critical patent/JPS6186664A/ja
Priority to US07/074,910 priority patent/US4782290A/en
Priority to CA000547089A priority patent/CA1248600A/en
Publication of JPS649595B2 publication Critical patent/JPS649595B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP20879284A 1984-10-04 1984-10-04 素子測定装置 Granted JPS6186664A (ja)

Priority Applications (9)

Application Number Priority Date Filing Date Title
JP20879284A JPS6186664A (ja) 1984-10-04 1984-10-04 素子測定装置
NL8502385A NL8502385A (nl) 1984-10-04 1985-08-30 Inrichting voor het meten van de karakteristieken van elektronische inrichtingen.
GB08522462A GB2165363B (en) 1984-10-04 1985-09-11 Waveform generator and apparatus for measuring characteristics of electronic devices
DE19853533636 DE3533636C2 (de) 1984-10-04 1985-09-20 Vorrichtung zum Messen von Kenndaten elektronischer Bauelemente
US06/780,957 US4727318A (en) 1984-10-04 1985-09-27 Apparatus for measuring characteristics of electronic devices
CA000491897A CA1242813A (en) 1984-10-04 1985-09-30 Apparatus for measuring characteristics of electronic devices
FR8514776A FR2571501B1 (fr) 1984-10-04 1985-10-04 Appareil de mesure des caracteristiques de dispositifs electroniques
US07/074,910 US4782290A (en) 1984-10-04 1987-07-17 Apparatus for measuring characteristics or electronic devices
CA000547089A CA1248600A (en) 1984-10-04 1987-09-16 Sine-wave generator

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20879284A JPS6186664A (ja) 1984-10-04 1984-10-04 素子測定装置

Publications (2)

Publication Number Publication Date
JPS6186664A true JPS6186664A (ja) 1986-05-02
JPS649595B2 JPS649595B2 (enrdf_load_stackoverflow) 1989-02-17

Family

ID=16562187

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20879284A Granted JPS6186664A (ja) 1984-10-04 1984-10-04 素子測定装置

Country Status (1)

Country Link
JP (1) JPS6186664A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63255670A (ja) * 1987-04-13 1988-10-21 Sony Tektronix Corp 素子測定装置
US7466253B2 (en) 2006-08-03 2008-12-16 Kabushiki Kaisha Toshiba Integrated circuit, self-test method for the integrated circuit, and optical disc apparatus including the integrated circuit

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63255670A (ja) * 1987-04-13 1988-10-21 Sony Tektronix Corp 素子測定装置
US7466253B2 (en) 2006-08-03 2008-12-16 Kabushiki Kaisha Toshiba Integrated circuit, self-test method for the integrated circuit, and optical disc apparatus including the integrated circuit

Also Published As

Publication number Publication date
JPS649595B2 (enrdf_load_stackoverflow) 1989-02-17

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