GB2165363B - Waveform generator and apparatus for measuring characteristics of electronic devices - Google Patents

Waveform generator and apparatus for measuring characteristics of electronic devices

Info

Publication number
GB2165363B
GB2165363B GB08522462A GB8522462A GB2165363B GB 2165363 B GB2165363 B GB 2165363B GB 08522462 A GB08522462 A GB 08522462A GB 8522462 A GB8522462 A GB 8522462A GB 2165363 B GB2165363 B GB 2165363B
Authority
GB
United Kingdom
Prior art keywords
electronic devices
waveform generator
measuring characteristics
measuring
waveform
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB08522462A
Other versions
GB8522462D0 (en
GB2165363A (en
Inventor
Ryoichi Sakai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Japan Ltd
Original Assignee
Sony Tektronix Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP20879284A external-priority patent/JPS6186664A/en
Priority claimed from JP59208791A external-priority patent/JPS6187429A/en
Application filed by Sony Tektronix Corp filed Critical Sony Tektronix Corp
Publication of GB8522462D0 publication Critical patent/GB8522462D0/en
Publication of GB2165363A publication Critical patent/GB2165363A/en
Application granted granted Critical
Publication of GB2165363B publication Critical patent/GB2165363B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G01R31/2603—Apparatus or methods therefor for curve tracing of semiconductor characteristics, e.g. on oscilloscope
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
GB08522462A 1984-10-04 1985-09-11 Waveform generator and apparatus for measuring characteristics of electronic devices Expired GB2165363B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP20879284A JPS6186664A (en) 1984-10-04 1984-10-04 Apparatus for measuring element
JP59208791A JPS6187429A (en) 1984-10-04 1984-10-04 Generating circuit of repetitive voltage

Publications (3)

Publication Number Publication Date
GB8522462D0 GB8522462D0 (en) 1985-10-16
GB2165363A GB2165363A (en) 1986-04-09
GB2165363B true GB2165363B (en) 1989-01-18

Family

ID=26517045

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08522462A Expired GB2165363B (en) 1984-10-04 1985-09-11 Waveform generator and apparatus for measuring characteristics of electronic devices

Country Status (5)

Country Link
CA (1) CA1242813A (en)
DE (1) DE3533636C2 (en)
FR (1) FR2571501B1 (en)
GB (1) GB2165363B (en)
NL (1) NL8502385A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0721526B2 (en) * 1987-08-18 1995-03-08 ソニ−・テクトロニクス株式会社 Element measuring device
CN108508342B (en) * 2018-05-28 2020-07-17 中国科学院上海微系统与信息技术研究所 IGBT short circuit overcurrent detection circuit

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2980853A (en) * 1958-04-28 1961-04-18 Ryan Aeronautical Co Component output characteristic tracer
DE3144040A1 (en) * 1981-11-05 1983-05-19 Elektronikus Mérökészülékek Gyára, 1631 Budapest Circuit arrangement for generating a dependent and an independent variable and digital quantities corresponding to parameter values and for the digital processing thereof
FR2555758B1 (en) * 1983-11-25 1986-09-26 Ecole Nale Sup Electro Applica APPARATUS FOR MEASURING STATIC CHARACTERISTICS OF TRANSISTORS AND DIODES

Also Published As

Publication number Publication date
NL8502385A (en) 1986-05-01
GB8522462D0 (en) 1985-10-16
CA1242813A (en) 1988-10-04
GB2165363A (en) 1986-04-09
FR2571501B1 (en) 1989-01-20
DE3533636C2 (en) 1995-04-06
FR2571501A1 (en) 1986-04-11
DE3533636A1 (en) 1986-04-10

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19940911