JPS6183912A - Signal detection mechanism for optical type displacement measuring apparatus - Google Patents
Signal detection mechanism for optical type displacement measuring apparatusInfo
- Publication number
- JPS6183912A JPS6183912A JP59205854A JP20585484A JPS6183912A JP S6183912 A JPS6183912 A JP S6183912A JP 59205854 A JP59205854 A JP 59205854A JP 20585484 A JP20585484 A JP 20585484A JP S6183912 A JPS6183912 A JP S6183912A
- Authority
- JP
- Japan
- Prior art keywords
- detection signal
- incident
- amplifier
- optical path
- beam splitter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 title claims abstract description 26
- 230000003287 optical effect Effects 0.000 title claims description 23
- 238000006073 displacement reaction Methods 0.000 title claims description 8
- 230000002452 interceptive effect Effects 0.000 abstract description 3
- 230000010287 polarization Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 6
- 241000981595 Zoysia japonica Species 0.000 description 2
- 206010041662 Splinter Diseases 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000006187 pill Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
- G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
- G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
- G01D5/36—Forming the light into pulses
- G01D5/38—Forming the light into pulses by diffraction gratings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
- G01B9/02078—Caused by ambiguity
- G01B9/02079—Quadrature detection, i.e. detecting relatively phase-shifted signals
- G01B9/02081—Quadrature detection, i.e. detecting relatively phase-shifted signals simultaneous quadrature detection, e.g. by spatial phase shifting
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/70—Using polarization in the interferometer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Optical Transform (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、元の干渉?利用してスケールの移動を検出す
るようにした光学式変位測定装置の信号検出機(14に
関し、q¥にり、 C,成分子除いた検出信号が得られ
ろようにした信号検出機構に関するもり〕である。[Detailed Description of the Invention] [Field of Industrial Application] Is the present invention an original interference? A signal detector of an optical displacement measuring device that is used to detect the movement of a scale (regarding 14, a signal detection mechanism that can obtain a detection signal excluding the q\n and C components) ].
移動゛■る回折格子?スケールとして用い回折光ン干渉
させて回折格子の位匝父化(移動距離)?検出1−るよ
うにした光学式変位測定装置として、実公昭57−81
510号公報又は特開昭詔−191907号公報に示さ
れるような2つのビームの回折光どうしの干渉?利用し
た技術が知られている。A moving diffraction grating? Used as a scale to interfere with diffracted light to change the position of the diffraction grating (distance traveled)? As an optical displacement measuring device designed to detect 1-
Interference between diffracted lights of two beams as shown in Japanese Patent Application Laid-Open No. 510 or Japanese Patent Application Laid-Open No. 191907? The technology used is known.
このような測定装置における回折格子の位置変化?検出
するための信号検出機構としては、第5図に示されるよ
うな構成のものが用いられることが多い、、第5図にお
いてlは2つのビームによる干渉光、2はハーフミラ−
13,4はIIi元仮1sはλ/4&、6.7はフォト
ディテクタである。Changes in the position of the diffraction grating in such a measuring device? As a signal detection mechanism for detection, a structure as shown in Fig. 5 is often used. In Fig. 5, l indicates interference light of two beams, and 2 indicates a half mirror.
13 and 4 are IIi elements, 1s is λ/4&, and 6.7 is a photodetector.
こグ)イiり或のものは、第6図(aL (hJに示す
ような方向の判別のため90′位相の異なった検出信号
A、 B¥得ることを目的としているので、入射された
上記干渉ft、iは・・−7ミラー2によって2分され
てm元+f13. 4に出射される。The purpose of the above is to obtain detection signals A and B with different phases of 90' in order to determine the direction as shown in Figure 6 (aL (hJ). The above interference ft,i is divided into two by the -7 mirror 2 and emitted to the m element +f13.4.
ところでこのようにして鞠られた第6図(at r f
b)の検出18号A、Hには外光やゴミ等に因るpc、
成分が含ま才するため、DC6成分キャンセル回路とし
て第7図のようTK li’¥成のものか用いられてい
た。By the way, Figure 6 (at r f
b) Detection No. 18 A and H are caused by external light, dust, etc.
Because of the large number of components included, a TKli' component circuit as shown in FIG. 7 was used as a DC 6 component canceling circuit.
第7図においてDI + D2はフォトダイオード、
AへIPI〜へMF、はアンプでk)る。In FIG. 7, DI + D2 is a photodiode,
A to IPI to MF is k) by an amplifier.
〔発明が1μ決1−ようとする問題点〕しかしながら上
記キャンセル回路においては、初段のアンプのゲイン?
上げにくく、またゲインのばらつきやオフセットが発生
して良質の検出信号が柘られなくなると(・う欠点か住
じた。またり、 C0成分のみ?別に検出するようにし
ているために光?3分割1する必吸があるので、検出信
号はさらに少なくなる1唄向にあった。[Problem that the invention attempts to solve] However, in the above cancellation circuit, the gain of the first stage amplifier?
It is difficult to increase the signal, and gain variation and offset occur, making it impossible to obtain a high-quality detection signal. Since there is a necessity for dividing into 1, the detection signal was in the direction of 1 song where it became even smaller.
本発明は上記問題点に対処してなされたもので、大きな
検出信号が傅られるようにした光学式変位測定装置にの
イに号検出(幾構′IX:提供すること?目的と−する
ものである。The present invention has been made in response to the above-mentioned problems, and is intended to provide an optical displacement measuring device capable of receiving a large detection signal. It is.
このような目的を達成するために本発明は、2つのビー
ムによる干渉光が入射されこの入射ft?人射入射直進
方向の第1の光路および入射元とぐ隔たった方向の第2
の光路へ2分して出射するための一元ビームヌプリツタ
と、直列に接続された上記第五の光路に位Itする第1
のフォトダイオードおよび上記第2の光路に位置する第
2のフォトダイオードと、これら第1および第2のフォ
トダイオードに接続された逆バイアス電源と、第1およ
び@2のフォトダイオードの接続点に入力端が接続され
たアンプと?含み、上記tlia′/lビームスプリッ
タに干渉光が入射きれた時アンプからDC成分Y除いた
検出(g @ k出力させるように構成した光学式変位
測定装置の信号検出機構?提供するものである。In order to achieve such an object, the present invention provides interference light of two beams to be incident and this incident ft? A first optical path in the direction in which the human incident occurs, and a second optical path in a direction far away from the incident source.
a one-dimensional beam nuplitter for dividing into two optical paths and emitting the beam, and a first beam nucleator located in the fifth optical path connected in series.
and a second photodiode located in the second optical path, a reverse bias power supply connected to these first and second photodiodes, and input to the connection point of the first and @2 photodiodes. With the amp connected at the end? The present invention provides a signal detection mechanism for an optical displacement measuring device configured to detect (g @ k) output from the amplifier by removing the DC component Y when the interference light enters the tlia'/l beam splitter. .
上記構成によれば第1および第2のフォトダイオードの
接続点における各々のフォトダイオードのり、 C,成
分はキャンセルされ、アンプのゲインヶ上げることがで
きるので大きな検出信号を得ることができる。According to the above configuration, the respective photodiode components at the connection point of the first and second photodiodes are canceled, and the gain of the amplifier can be increased, so that a large detection signal can be obtained.
以下図面?参照して本発明実施例?説明する。 Is the drawing below? Refer to the embodiment of the present invention? explain.
第1図は本発明実施例による信号検出機構?示す構成図
で、8,9は調向ビームスプリッタ、10〜13はフォ
トディテクタである。第2図は偏向ビームスプリンタ8
,9の具体的構成?示している。Fig. 1 shows a signal detection mechanism according to an embodiment of the present invention? In the configuration diagram shown, 8 and 9 are tuning beam splitters, and 10 to 13 are photodetectors. Figure 2 shows the deflection beam splinter 8
, the specific structure of 9? It shows.
2つのビームによる干渉光1はハーフミラ−2によって
2分された後、IA、1Bの各々はさらにI#i元ビー
ムスプリッタ8,9によって互いにガ隔てた方向[2分
されてフォトディテクタ10〜13に入射される。′f
なわちフォトディテクタ10の方向には砥面平行な成分
が、またフォトディテクタ11の方向には紙面垂直な成
分がそれぞれ干渉し出射される。After the interference light 1 from the two beams is split into two by a half mirror 2, each of IA and 1B is further split into two by I#i source beam splitters 8 and 9 in a direction separated from each other [and sent to photodetectors 10 to 13]. It is incident. 'f
That is, a component parallel to the abrasive surface in the direction of the photodetector 10 and a component perpendicular to the plane of the paper interfere in the direction of the photodetector 11 and are emitted.
ここで2つの干渉信号の位相は180°異なり強度はほ
とんど等しい。Here, the phases of the two interference signals differ by 180° and the intensities are almost equal.
一方、ハーフミラ−2によ、つてλ14&5¥介して入
射した光も、ディテクタ12,13では上記10゜11
と同様な関係にある。On the other hand, the light incident on the half mirror 2 through λ14&5\ is also detected at the detectors 12 and 13 at the angle of 10°11.
There is a similar relationship.
第3図は本発明のキャンセル回路?示すモので、D3
+ D4はフォトダイオード、AMP 4はアンプであ
る。このキャンセル回路は偏光ビームスプリツタ8.9
に対応して2個用意される。Is Fig. 3 the cancellation circuit of the present invention? Since it is shown, D3
+D4 is a photodiode, and AMP4 is an amplifier. This cancellation circuit is a polarizing beam splitter 8.9
Two pieces are prepared correspondingly.
説明のためIJiiI元ビームスプリッタ8の場合に例
?とると、第1のフォトダイオードD3はフォトディテ
クタIOの位置に配置され、第2のフォトダイオードD
4はフォトディテクタ11の位置に配置ft’gねる。For explanation, let's take an example of IJiii source beam splitter 8. When taken, the first photodiode D3 is placed at the position of the photodetector IO, and the second photodiode D3 is placed at the position of the photodetector IO.
4 is placed at the position of the photodetector 11.
またこれら第1および第2のフォトダイオードD3 t
D4は直列に接続されると共に接続点GはアンプA
MP4の入力端に接続され、さらに第1および第2のダ
イオードD3 e D4に対し℃は逆バイアス電源が接
続される。Moreover, these first and second photodiodes D3 t
D4 is connected in series and connection point G is connected to amplifier A.
It is connected to the input terminal of MP4, and furthermore, a reverse bias power supply is connected to the first and second diodes D3 e D4.
以上において第1および第2のフォトダイオードD3*
D4の接続点Gでは各々のフォトダイオードのD−C,
成分かキャンセルされるので、振幅はく倍となり、第4
図(a)のような大きな検出(g号がアンプAMP4か
ら出力される。In the above, the first and second photodiodes D3*
At the connection point G of D4, each photodiode's D-C,
Since the component is canceled, the amplitude is multiplied and the fourth
A large detection signal (g) is output from the amplifier AMP4 as shown in Figure (a).
同@にして偏光ビームスプリッタ9の場合においても同
じ動作が行われるので、第4図(b)のようにlalと
は匍゛位相の異なった大きな検出信号が出力される。Since the same operation is performed in the case of the polarizing beam splitter 9, a large detection signal having a different phase from lal is output as shown in FIG. 4(b).
本発明においては直列に接続される2つのフォトダイオ
ードの特性が揃っていれ1f1元のqq酸成分よびダー
クカレント等の不快成分が除かれた(g号がアンプAM
P vc大入力れ、高いゲインで増幅されるので出力信
号?大さくとることができる。In the present invention, the characteristics of the two photodiodes connected in series are made uniform, and unpleasant components such as the 1f1 original qq acid component and dark current are removed (g is the amplifier AM).
P vc large input, output signal because it is amplified with high gain? It can be taken in large quantities.
またさらに第8図に示す様に一枚基板上に作成された2
つのフォトディテクタ?使用した場合にはさらに良質の
信号χ得る皇ができる。Further, as shown in Fig. 8, two
Two photodetectors? When used, it is possible to obtain even better quality signals.
以上説明して明らかなように本発明によれば、ビームス
プリッタの第1および第2の出射光路に各々フォトダイ
オード5−[Feし、これら2つのフォトダイオード?
直列に接続すると共に接続点にアンプ?払続し、各々フ
ォトダイオードには逆バイアス電蝕を接続するように構
成゛したものであるから、大きな検出信号ケ得ろことが
できる。As is clear from the above description, according to the present invention, photodiodes 5-[Fe and 5-Fe are connected to each other in the first and second output optical paths of the beam splitter, and these two photodiodes 5-[Fe]
Connect in series and add an amplifier at the connection point? Since each photodiode is connected to a reverse bias electrode, a large detection signal can be obtained.
!侍にIii′IQな光学部品とキャンセル回路と?組
み合せるだけで少ない部品でり、 C0成分?キャンセ
ルすることができるので、大きいだけでなく良質な検出
18号?得ることができるので傷和性?向上させること
かできる。! Samurai with Iiii'IQ optical parts and cancellation circuit? Few parts required just by combining, C0 component? Detection No. 18 that is not only large but also of good quality because it can be canceled? So vulnerabilities that can be obtained? It can be improved.
第1図および第3し1は本発明実施(+Ilx示す構成
図および回路図、第2図および第4図(aJ + (b
jは本発明¥説明するための斜視図および特性図、第5
図乃至第7図はいずれも従来例?示す斜視図、特性図お
よび回路図である。第8図は本発明の一基板上に作成さ
れたフォトディテクタ?使用する場合の列を示す。
1・・・干渉光、2・・・ハーフミラ−18,9・・・
114ft。
ビームスプリッタ、10〜13・・・フォトディテクタ
、DI%D4・・・フォトダイオード、AMPl〜AM
P4・・・アンプ。
第1′図
第2図
第5図
第6図
1粒
」ビイ立′
第7図
第8図
手続補正書
1 事件の表示
昭和59年特許JlII 第205854号2・
発明の名称
光字式変位測定!F−直の信号検出機構3、 補正をす
る者
事件との関係 特許出動式
住所
名 称 ソニーマグネスクール株式会社4、代理人〒1
05
住 所 東京都港区芝3丁目2番14号芝三丁目ピル
5 補正の対象
明細1−の爵ff詣求のIILg囲1発明の詳細な説明
の欄及び図面
(1)本願の特許請求の範囲を下記の辿り補正する。
[1,2つのビームによる干渉光が入射されこの入射光
を入射光の直進方向の第1の光路および入射光と男隔た
った第2の光路へ2分して出射てるタメの−1ビームス
プリツタと、直列に接続された上記第1の光路に位置す
る第1のフォトダイオードおよび上記第2の光路に位置
する第2のフォトダイオードと、これら第1および第2
のフォトダイオードに接続された逆バイアス−諒と、第
1および第2のフォトダイオードの接続点に入力端が接
続されたアンプとを含み、上記ビームスプリッタに干渉
光が入射された時アンプかうり、C,成分ケ除いた検出
信号ン出力させるように構成したことを特徴とする光学
式変位測定装置の信号検出機構。」
(2)本願明細V第3頁第18行「解形」を「解決」に
補正する。
(31同1第4頁第6行「方向の」ン削除イる。
(4) 第7図ケ別紙の命辿り補正する。1 and 3 are block diagrams and circuit diagrams showing the present invention (+Ilx), and FIGS. 2 and 4 (aJ + (b
j is a perspective view and characteristic diagram for explaining the present invention, No. 5
Are all of Figures 7 to 7 conventional examples? FIG. 2 is a perspective view, a characteristic diagram, and a circuit diagram shown in FIG. Fig. 8 shows a photodetector fabricated on one substrate of the present invention? Indicates the column when used. 1... Interference light, 2... Half mirror 18, 9...
114ft. Beam splitter, 10 to 13... Photodetector, DI%D4... Photodiode, AMPl to AM
P4... Amplifier. Fig. 1' Fig. 2 Fig. 5 Fig. 6 Fig. 6 1 grain 'B'
Name of the invention: Optical displacement measurement! F- Direct Signal Detection Mechanism 3, Relationship with the Amendment Person Case Patent Dispatch Type Address Name Name Sony Magne School Co., Ltd. 4, Agent Address: 1
05 Address Pill 5, Shiba 3-chome, 3-2-14 Shiba, Minato-ku, Tokyo Specifications to be amended 1 - No. ff Visit IILg Box 1 Detailed description of the invention and drawings (1) Claims of the present application Correct the range as follows. [1. Interfering light from two beams is incident, and the -1 beam splitter splits the incident light into two into a first optical path in the straight direction of the incident light and a second optical path separated from the incident light and outputs it. a first photodiode located in the first optical path and a second photodiode located in the second optical path connected in series;
and an amplifier whose input end is connected to the connection point of the first and second photodiodes, and when the interference light is incident on the beam splitter, the amplifier is connected to the first and second photodiodes. , C. A signal detection mechanism for an optical displacement measuring device, characterized in that it is configured to output a detection signal excluding components. ” (2) “Solution” in line 18 of page 3 of Specification V of the present application is amended to “solution”. (31, page 4, line 6, ``direction'' is deleted. (4) Correct the instructions in the attached sheet of Figure 7.
Claims (1)
入射光の直進方向の第1の光路および入射光と90°隔
たつた方向の第2の光路へ2分して出射するための偏光
ビームスプリッタと、直列に接続された上記第1の光路
に位置する第1のフォトダイオードおよび上記第2の光
路に位置する第2のフォトダイオードと、これら第1お
よび第2のフォトダイオードに接続された逆バイアス電
源と、第1および第2のフォトダイオードの接続点に入
力端が接続されたアンプとを含み、上記ビームスプリッ
タに干渉光が入射された時アンプからD.C.成分を除
いた検出信号を出力させるように構成したことを特徴と
する光学式変位測定装置の信号検出機構。1. Polarized light for inputting interference light from two beams and dividing the incident light into two into a first optical path in the straight direction of the incident light and a second optical path in a direction separated by 90 degrees from the incident light. a beam splitter; a first photodiode located in the first optical path and a second photodiode located in the second optical path connected in series; and a beam splitter connected to the first and second photodiodes. and an amplifier whose input end is connected to the connection point of the first and second photodiodes, and when interference light is incident on the beam splitter, a D. C. A signal detection mechanism for an optical displacement measuring device, characterized in that it is configured to output a detection signal excluding components.
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59205854A JPS6183912A (en) | 1984-10-01 | 1984-10-01 | Signal detection mechanism for optical type displacement measuring apparatus |
EP84307484A EP0146244B2 (en) | 1983-11-04 | 1984-10-31 | Optical instrument for measuring displacement |
DE8484307484T DE3484649D1 (en) | 1983-11-04 | 1984-10-31 | OPTICAL INSTRUMENT FOR MEASURING A SHIFT. |
EP88117622A EP0311144B1 (en) | 1983-11-04 | 1984-10-31 | Optical instrument for measuring displacement |
DE88117622T DE3486178T2 (en) | 1983-11-04 | 1984-10-31 | Optical instrument for measuring a displacement. |
US06/668,097 US4676645A (en) | 1983-11-04 | 1984-11-05 | Optical instrument for measuring displacement |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59205854A JPS6183912A (en) | 1984-10-01 | 1984-10-01 | Signal detection mechanism for optical type displacement measuring apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6183912A true JPS6183912A (en) | 1986-04-28 |
JPH0513243B2 JPH0513243B2 (en) | 1993-02-22 |
Family
ID=16513808
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59205854A Granted JPS6183912A (en) | 1983-11-04 | 1984-10-01 | Signal detection mechanism for optical type displacement measuring apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6183912A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2343745A (en) * | 1998-11-11 | 2000-05-17 | Ando Electric | Light receiving circuit for use in electrooptic sampling oscilloscope |
JP2008209556A (en) * | 2007-02-26 | 2008-09-11 | Epson Imaging Devices Corp | Electro-optical device, semiconductor device, display device and electronic equipment having the same |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4113381A (en) * | 1976-11-18 | 1978-09-12 | Hewlett-Packard Company | Surveying instrument and method |
JPS5892819A (en) * | 1981-11-28 | 1983-06-02 | Nippon Kogaku Kk <Nikon> | Photoelectric encoder device |
-
1984
- 1984-10-01 JP JP59205854A patent/JPS6183912A/en active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4113381A (en) * | 1976-11-18 | 1978-09-12 | Hewlett-Packard Company | Surveying instrument and method |
JPS5892819A (en) * | 1981-11-28 | 1983-06-02 | Nippon Kogaku Kk <Nikon> | Photoelectric encoder device |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2343745A (en) * | 1998-11-11 | 2000-05-17 | Ando Electric | Light receiving circuit for use in electrooptic sampling oscilloscope |
US6384590B1 (en) | 1998-11-11 | 2002-05-07 | Ando Electric Co., Ltd. | Light receiving circuit for use in electro-optic sampling oscilloscope |
GB2343745B (en) * | 1998-11-11 | 2003-07-16 | Ando Electric | Light receiving circuit for use in electro-optic sampling oscilloscope |
JP2008209556A (en) * | 2007-02-26 | 2008-09-11 | Epson Imaging Devices Corp | Electro-optical device, semiconductor device, display device and electronic equipment having the same |
Also Published As
Publication number | Publication date |
---|---|
JPH0513243B2 (en) | 1993-02-22 |
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Legal Events
Date | Code | Title | Description |
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EXPY | Cancellation because of completion of term |